{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T11:53:43Z","timestamp":1781870023516,"version":"3.54.5"},"reference-count":46,"publisher":"Springer Science and Business Media LLC","issue":"13","license":[{"start":{"date-parts":[[2025,8,27]],"date-time":"2025-08-27T00:00:00Z","timestamp":1756252800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2025,8,27]],"date-time":"2025-08-27T00:00:00Z","timestamp":1756252800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Supercomput"],"DOI":"10.1007\/s11227-025-07771-0","type":"journal-article","created":{"date-parts":[[2025,8,27]],"date-time":"2025-08-27T06:43:15Z","timestamp":1756276995000},"update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":15,"title":["TRSBi-YOLO: Transformer based lightweight and high-performance model for PCB defects detection"],"prefix":"10.1007","volume":"81","author":[{"given":"Vinod Kumar","family":"Ancha","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Venkateswarlu","family":"Gonuguntla","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ramesh","family":"Vaddi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2025,8,27]]},"reference":[{"issue":"no. 11","key":"7771_CR1","doi-asserted-by":"publisher","first-page":"12207","DOI":"10.1109\/TPEL.2020.2984055","volume":"35","author":"Y Shi","year":"2020","unstructured":"Shi Y, Xin Z, Loh PC, Blaabjerg F (2020) A review of traditional helical to recent miniaturized printed circuit board Rogowski coils for power-electronic applications. IEEE Trans Power Electron 35(11):12207\u201312222. https:\/\/doi.org\/10.1109\/TPEL.2020.2984055","journal-title":"IEEE Trans Power Electron"},{"key":"7771_CR2","doi-asserted-by":"publisher","first-page":"103596","DOI":"10.1016\/j.compind.2021.103596","volume":"136","author":"D Powell","year":"2022","unstructured":"Powell D, Magnanini MC, Colledani M, Myklebust O (2022) \u2018Advancing zero defect manufacturing: a state-of-the-art perspective and future research directions.\u2019 Comput. Ind. 136:103596","journal-title":"Comput. Ind."},{"issue":"1","key":"7771_CR3","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1080\/00207543.2019.1605228","volume":"58","author":"F Psarommatis","year":"2020","unstructured":"Psarommatis F, May G, Dreyfus P-A, Kiritsis D (2020) Zero defect manufacturing: state-of-the-art review, shortcomings and future directions in research. Int J Prod Res 58(1):1\u201317","journal-title":"Int J Prod Res"},{"issue":"4","key":"7771_CR4","first-page":"041013","volume":"29","author":"K Goto","year":"2020","unstructured":"Goto K, Kato K, Saito T, Aizawa H (2020) Adversarial autoencoder for detecting anomalies in soldered joints on printed circuit boards. Proc SPIE 29(4):041013","journal-title":"Proc SPIE"},{"issue":"4","key":"7771_CR5","doi-asserted-by":"publisher","first-page":"133","DOI":"10.1108\/CW-09-2014-0039","volume":"41","author":"G Qiang","year":"2015","unstructured":"Qiang G, Shanshan Z, Yang Z, Mao C (2015) Detection method of PCB component based on automatic optical stitching algorithm. Circuit World 41(4):133\u2013136","journal-title":"Circuit World"},{"key":"7771_CR6","doi-asserted-by":"crossref","unstructured":"Lin SC, Chou CH, Su CH (2007) A development of visual inspection system for surface mounted devices on printed circuit board. \u0130n: Proc. IECON 33rd Annu. Conf. IEEE Ind. Electron. Soc. pp 2440\u20132445","DOI":"10.1109\/IECON.2007.4459975"},{"issue":"7","key":"7771_CR7","doi-asserted-by":"publisher","first-page":"4692","DOI":"10.1109\/TIM.2019.2957866","volume":"69","author":"D-M Tsai","year":"2020","unstructured":"Tsai D-M, Chou Y-H (2020) Fast and precise positioning in PCBs using deep neural network regression. IEEE Trans Instrum Meas 69(7):4692\u20134701","journal-title":"IEEE Trans Instrum Meas"},{"issue":"1","key":"7771_CR8","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1080\/15599612.2018.1444829","volume":"12","author":"R Ye","year":"2018","unstructured":"Ye R, Chang M, Pan C-S, Chiang CA, Gabayno JL (2018) Highresolution optical inspection system for fast detection and classification of surface defects. Int J Optomechatronics 12(1):1\u201310","journal-title":"Int J Optomechatronics"},{"key":"7771_CR9","doi-asserted-by":"crossref","unstructured":"Deng YS, Luo AC, Dai MJ (2018) Building an automatic defect verification system using deep neural network for PCB defect classification. In: Proc. 4th Int. Conf. Frontiers Signal Process. (ICFSP), pp 145\u2013149","DOI":"10.1109\/ICFSP.2018.8552045"},{"issue":"2","key":"7771_CR10","doi-asserted-by":"publisher","first-page":"110","DOI":"10.1049\/trit.2019.0019","volume":"4","author":"R Ding","year":"2019","unstructured":"Ding R, Dai L, Li G, Liu H (2019) TDD-net: a tiny defect detection network for printed circuit boards. CAAI Trans Intell Technol 4(2):110\u2013116","journal-title":"CAAI Trans Intell Technol"},{"key":"7771_CR11","doi-asserted-by":"publisher","first-page":"112247","DOI":"10.1016\/j.measurement.2022.112247","volume":"206","author":"G Ustabas Kaya","year":"2023","unstructured":"Ustabas Kaya G (2023) Development of hybrid optical sensor based on deep learning to detect and classify the micro-size defects in printed circuit board\u201d. Measurement 206:112247","journal-title":"Measurement"},{"key":"7771_CR12","doi-asserted-by":"publisher","first-page":"5029410","DOI":"10.1109\/TIM.2023.3322483","volume":"72","author":"J Yang","year":"2023","unstructured":"Yang J, Liu Z, Du W, Zhang S (2023) A PCB defect detector based on coordinate feature refinement. IEEE Trans Instrum Meas 72:5029410. https:\/\/doi.org\/10.1109\/TIM.2023.3322483","journal-title":"IEEE Trans Instrum Meas"},{"key":"7771_CR13","doi-asserted-by":"crossref","unstructured":"Liu W, Anguelov D, Erhan D, Szegedy C, Reed S, Fu CY, Berg AC (2016) SSD: Single Shot Multibox Detector. In: Proc. Eur. Conf. Comput. Vis. Cham, Switzerland: Springer, pp 21\u201337","DOI":"10.1007\/978-3-319-46448-0_2"},{"key":"7771_CR14","doi-asserted-by":"crossref","unstructured":"Redmon J, Divvala S, Girshick R, Farhadi A (2016) You only look once: unified, real-time object detection. In: Proc. IEEE Conf. Comput. Vis. Pattern Recognit. (CVPR), pp 779\u2013788","DOI":"10.1109\/CVPR.2016.91"},{"key":"7771_CR15","doi-asserted-by":"crossref","unstructured":"Redmon J, Farhadi A (2017) YOLO9000: Better, faster, stronger. In: Proc. IEEE Conf. Comput. Vis. Pattern Recognit. (CVPR), pp 7263\u20137271","DOI":"10.1109\/CVPR.2017.690"},{"key":"7771_CR16","unstructured":"Redmon J, Farhadi A (2018) YOLOv3: an incremental improvement. arXiv:1804.02767"},{"key":"7771_CR17","unstructured":"Bochkovskiy A, Wang CY, Liao HYM (2020) \u2018\u2018YOLOv4: Optimal speed and accuracy of object detection. arXiv:2004.10934"},{"key":"7771_CR18","doi-asserted-by":"crossref","unstructured":"Girshick R, Donahue J, Darrell T, Malik J (2014) Rich feature hierarchies for accurate object detection and semantic segmentation. In: Proc. IEEE Conf. Comput. Vis. Pattern Recognit., pp 580\u2013587","DOI":"10.1109\/CVPR.2014.81"},{"key":"7771_CR19","doi-asserted-by":"crossref","unstructured":"Girshick R (2015) Fast R-CNN. In: Proc. IEEE Int. Conf. Comput. Vis. (ICCV), pp 1440\u20131448","DOI":"10.1109\/ICCV.2015.169"},{"key":"7771_CR20","unstructured":"Ren S, He K, Girshick R, Sun J (2015) Faster R-CNN: towards real-time object detection with region proposal networks. In Proc. Adv. Neural Inf. Process. Syst., pp 91\u201399"},{"key":"7771_CR21","doi-asserted-by":"publisher","first-page":"261","DOI":"10.1007\/s11227-024-06739-w","volume":"81","author":"Y Xie","year":"2025","unstructured":"Xie Y, Zhao Y (2025) Lightweight improved YOLOv5 algorithm for PCB defect detection. J Supercomput 81:261. https:\/\/doi.org\/10.1007\/s11227-024-06739-w","journal-title":"J Supercomput"},{"key":"7771_CR22","doi-asserted-by":"publisher","first-page":"19062","DOI":"10.1007\/s11227-024-06223-5","volume":"80","author":"Y Zhang","year":"2024","unstructured":"Zhang Y, Xu M, Zhu Q et al (2024) Improved YOLOv5s combining enhanced backbone network and optimized self-attention for PCB defect detection. J Supercomput 80:19062\u201319090. https:\/\/doi.org\/10.1007\/s11227-024-06223-5","journal-title":"J Supercomput"},{"key":"7771_CR23","doi-asserted-by":"publisher","first-page":"108582","DOI":"10.1016\/j.compeleceng.2023.108582","volume":"106","author":"L Liu","year":"2023","unstructured":"Liu L, Liang J, Wang J, Hu P, Wan L, Zheng Q (2023) An improved YOLOv5-based approach to soybean phenotype information perception. Comput Electr Eng 106:108582. https:\/\/doi.org\/10.1016\/j.compeleceng.2023.108582","journal-title":"Comput Electr Eng"},{"key":"7771_CR24","doi-asserted-by":"publisher","first-page":"418","DOI":"10.3390\/sym16040418","volume":"16","author":"Z Yuan","year":"2024","unstructured":"Yuan Z, Tang X, Ning H, Yang Z (2024) Lw-yolo: lightweight deep learning model for fast and precise defect detection in printed circuit boards. Symmetry 16:418. https:\/\/doi.org\/10.3390\/sym16040418","journal-title":"Symmetry"},{"key":"7771_CR25","doi-asserted-by":"publisher","first-page":"74288","DOI":"10.1109\/ACCESS.2025.3564734","volume":"13","author":"Y Zhao","year":"2025","unstructured":"Zhao Y, Jiang Z (2025) YOLO-WWBi: an optimized YOLO11 algorithm for PCB defect detection. IEEE Access 13:74288\u201374297. https:\/\/doi.org\/10.1109\/ACCESS.2025.3564734","journal-title":"IEEE Access"},{"key":"7771_CR26","doi-asserted-by":"publisher","first-page":"48136","DOI":"10.1109\/ACCESS.2023.3275023","volume":"11","author":"S Xue","year":"2023","unstructured":"Xue S, Li Z, Wu R, Zhu T, Yuan Y, Ni C (2023) Few-shot learning for small impurities in tobacco stems with improved YOLOv7. IEEE Access 11:48136\u201348144. https:\/\/doi.org\/10.1109\/ACCESS.2023.3275023","journal-title":"IEEE Access"},{"key":"7771_CR27","doi-asserted-by":"publisher","first-page":"3343","DOI":"10.3390\/foods13203343","volume":"13","author":"X Li","year":"2024","unstructured":"Li X, Xue S, Li Z, Fang X, Zhu T, Ni C (2024) A candy defect detection method based on StyleGAN2 and improved YOLOv7 for imbalanced data. Foods 13:3343. https:\/\/doi.org\/10.3390\/foods13203343","journal-title":"Foods"},{"issue":"1\u201312","key":"7771_CR28","doi-asserted-by":"publisher","first-page":"2008312","DOI":"10.1109\/TIM.2025.3551584","volume":"74","author":"K Li","year":"2025","unstructured":"Li K, Zhong X, Han Y (2025) A High-performance small target defect detection method for PCB boards based on a novel YOLO-DFA algorithm. IEEE Trans Instrum Meas 74(1\u201312):2008312. https:\/\/doi.org\/10.1109\/TIM.2025.3551584","journal-title":"IEEE Trans Instrum Meas"},{"key":"7771_CR29","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TIM.2025.3563011","volume":"74","author":"C Mo","year":"2025","unstructured":"Mo C, Hu Z, Wang J, Xiao X (2025) SGT-YOLO: a lightweight method for PCB defect detection. IEEE Trans Instrum Meas 74:1\u201311. https:\/\/doi.org\/10.1109\/TIM.2025.3563011","journal-title":"IEEE Trans Instrum Meas"},{"key":"7771_CR30","unstructured":"Glenn J (2021) ultralytics\/yolov5: v6.0 - YOLOv5n \u2018Nano\u2019 models, Roboflow integration, TensorFlow export, OpenCV DNN support. Zenodo, Oct. 12, 2021. 10.5281\/zenodo.5563715"},{"key":"7771_CR31","doi-asserted-by":"crossref","unstructured":"Lin T, Doll\u00e1r P, Girshick R, He K, Hariharan B, Belongie S (2017) Feature pyramid networks for object detection. In: Proc. IEEE Conf. Comput. Vis. Pattern Recognit. (CVPR), pp 936\u2013944","DOI":"10.1109\/CVPR.2017.106"},{"key":"7771_CR32","doi-asserted-by":"crossref","unstructured":"Liu S, Qi L, Qin H, Shi J, Jia J (2018) Path aggregation network for instance segmentation. In: Proc. IEEE\/CVF Conf. Comput. Vis. Pattern Recognit., pp 8759\u20138768","DOI":"10.1109\/CVPR.2018.00913"},{"key":"7771_CR33","unstructured":"Vaswani A et al. (2017) Attention Is All You Need. arxiv.org\/abs\/1706.03762"},{"key":"7771_CR34","doi-asserted-by":"crossref","unstructured":"Zhu X et al. (2021) TPH-YOLOv5: Improved YOLOv5 Based on Transformer Prediction Head for Object Detection on Drone-Captured Scenarios.\u201d ArXiv:2108.11539 [Cs], arxiv.org\/abs\/2108.11539","DOI":"10.1109\/ICCVW54120.2021.00312"},{"key":"7771_CR35","doi-asserted-by":"publisher","first-page":"106217","DOI":"10.1016\/j.engappai.2023.106217","volume":"123","author":"G Liu","year":"2023","unstructured":"Liu G, Hu Y, Chen Z, Guo J, Ni P (2023) \u2018Lightweight object detection algorithm for robots with improved YOLOv5.\u2019 Eng. Appl. Artif. Intell. 123:106217","journal-title":"Eng. Appl. Artif. Intell."},{"key":"7771_CR36","doi-asserted-by":"publisher","first-page":"1323301","DOI":"10.3389\/fpls.2023.1323301","volume":"14","author":"M Lv","year":"2024","unstructured":"Lv M, Su W-H (2024) YOLOV5-CBAM-C3TR: an optimized model based on transformer module and attention mechanism for apple leaf disease detection. Front Plant Sci 14:1323301. https:\/\/doi.org\/10.3389\/fpls.2023.1323301","journal-title":"Front Plant Sci"},{"key":"7771_CR37","doi-asserted-by":"publisher","unstructured":"Hu J, Shen L, Sun G (2018) Squeeze-and-excitation networks. In: 2018 IEEE\/CVF Conference on Computer Vision and Pattern Recognition, Salt Lake City, UT, USA, pp 7132\u20137141 https:\/\/doi.org\/10.1109\/CVPR.2018.00745.","DOI":"10.1109\/CVPR.2018.00745"},{"key":"7771_CR38","doi-asserted-by":"publisher","unstructured":"Woo G, Park J, Lee JY, Kweon IS (2018) CBAM: convolutional block attention module. In: Computer Vision \u2013 ECCV 2018, V. Ferrari, M. Hebert, C. Sminchisescu, Y. Weiss (Eds.), Lecture Notes in Computer Science, vol. 11211, Springer, Cham, https:\/\/doi.org\/10.1007\/978-3-030-01234-2_1","DOI":"10.1007\/978-3-030-01234-2_1"},{"key":"7771_CR39","doi-asserted-by":"crossref","unstructured":"Wang Q et al. (2020) ECA-Net: Efficient Channel Attention for Deep Convolutional Neural Networks. ArXiv:1910.03151 [Cs], arxiv.org\/abs\/1910.03151","DOI":"10.1109\/CVPR42600.2020.01155"},{"key":"7771_CR40","unstructured":"Yang L, Zhang RY, Li L, Xie X (2021) SimAM: a simple, parameter-free attention module for convolutional neural networks. In: Proceedings of the 38th International Conference on Machine Learning, pp 11863\u201311874"},{"key":"7771_CR41","doi-asserted-by":"crossref","unstructured":"Tan M, Ruoming P, Le QV (2020) Efficientdet: Scalable and efficient object detection. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition.","DOI":"10.1109\/CVPR42600.2020.01079"},{"key":"7771_CR42","doi-asserted-by":"publisher","unstructured":"Ancha V, Gonuguntla V, Vaddi R (2024) M\u0131xed PCB defect dataset. Mendeley Data, V2, https:\/\/doi.org\/10.17632\/fj4krvmrr5.2","DOI":"10.17632\/fj4krvmrr5.2"},{"key":"7771_CR43","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3430329","author":"VK Ancha","year":"2024","unstructured":"Ancha VK, Sibai FN, Gonuguntla V, Vaddi R (2024) Utilizing YOLO models for real-world scenarios: assessing novel mixed defect detection dataset in PCBs. IEEE Access. https:\/\/doi.org\/10.1109\/ACCESS.2024.3430329","journal-title":"IEEE Access"},{"issue":"1","key":"7771_CR44","doi-asserted-by":"publisher","first-page":"91","DOI":"10.1016\/j.gltp.2022.04.020","volume":"3","author":"K Maharana","year":"2022","unstructured":"Maharana K, Mondal S, Nemade B (2022) A review: data pre-processing and data augmentation techniques. Global Transit Proc 3(1):91\u201399. https:\/\/doi.org\/10.1016\/j.gltp.2022.04.020","journal-title":"Global Transit Proc"},{"key":"7771_CR45","unstructured":"He F, Tang S, Mehrkanoon S, Huang X, Yang J (2020) A real-time PCB defect detector based on supervised and semi-supervised learning, ESANN 2020."},{"key":"7771_CR46","doi-asserted-by":"publisher","first-page":"23650","DOI":"10.1038\/s41598-024-74368-7","volume":"14","author":"Y Gao","year":"2024","unstructured":"Gao Y, Li Z, Wang Y et al (2024) A novel YOLOv5_ES based on lightweight small object detection head for PCB surface defect detection. Sci Rep 14:23650. https:\/\/doi.org\/10.1038\/s41598-024-74368-7","journal-title":"Sci Rep"}],"container-title":["The Journal of Supercomputing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s11227-025-07771-0.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s11227-025-07771-0\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s11227-025-07771-0.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,9]],"date-time":"2025-09-09T18:28:20Z","timestamp":1757442500000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s11227-025-07771-0"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,8,27]]},"references-count":46,"journal-issue":{"issue":"13","published-online":{"date-parts":[[2025,8]]}},"alternative-id":["7771"],"URL":"https:\/\/doi.org\/10.1007\/s11227-025-07771-0","relation":{},"ISSN":["1573-0484"],"issn-type":[{"value":"1573-0484","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,8,27]]},"assertion":[{"value":"20 March 2025","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"14 August 2025","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"27 August 2025","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The authors declare no competing interest","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflict of interest"}}],"article-number":"1277"}}