{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,22]],"date-time":"2026-02-22T06:00:03Z","timestamp":1771740003644,"version":"3.50.1"},"reference-count":59,"publisher":"Springer Science and Business Media LLC","issue":"4","license":[{"start":{"date-parts":[[2026,2,22]],"date-time":"2026-02-22T00:00:00Z","timestamp":1771718400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2026,2,22]],"date-time":"2026-02-22T00:00:00Z","timestamp":1771718400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"funder":[{"name":"Research and Practice of Smart Inspection and Testing Scenario in Customs Mechanical and Electrical Laboratory","award":["2024HK078"],"award-info":[{"award-number":["2024HK078"]}]}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Supercomput"],"DOI":"10.1007\/s11227-026-08335-6","type":"journal-article","created":{"date-parts":[[2026,2,22]],"date-time":"2026-02-22T05:18:38Z","timestamp":1771737518000},"update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["A low-complexity and lightweight detection network for surface defects on liquid crystal display"],"prefix":"10.1007","volume":"82","author":[{"given":"Guanqiang","family":"Ruan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zewei","family":"Liao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Honggang","family":"Shan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yilin","family":"Ni","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Long","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiangdong","family":"Kong","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kuo","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2026,2,22]]},"reference":[{"key":"8335_CR1","doi-asserted-by":"publisher","first-page":"103754","DOI":"10.1016\/j.infrared.2021.103754","volume":"116","author":"Y He","year":"2021","unstructured":"He Y, Deng B, Wang H et al (2021) Infrared machine vision and infrared thermography with deep learning: a review. Infrared Phys Technol 116:103754","journal-title":"Infrared Phys Technol"},{"key":"8335_CR2","doi-asserted-by":"publisher","first-page":"661","DOI":"10.1007\/s40684-021-00343-6","volume":"9","author":"Z Ren","year":"2022","unstructured":"Ren Z, Fang F, Yan N, Wu Y (2022) State of the art in defect detection based on machine vision. Int J Precis Eng Manuf Green Technol 9:661\u2013691","journal-title":"Int J Precis Eng Manuf Green Technol"},{"key":"8335_CR3","doi-asserted-by":"publisher","first-page":"1033","DOI":"10.1007\/s11998-018-00178-y","volume":"16","author":"KK Kieselbach","year":"2019","unstructured":"Kieselbach KK, N\u00f6then M, Heuer H (2019) Development of a visual inspection system and the corresponding algorithm for the detection and subsequent classification of paint defects on car bodies in the automotive industry. J Coat Technol Res 16:1033\u20131042","journal-title":"J Coat Technol Res"},{"key":"8335_CR4","doi-asserted-by":"publisher","first-page":"310","DOI":"10.1109\/TNSM.2023.3301718","volume":"21","author":"H Li","year":"2023","unstructured":"Li H, Li X, Fan Q et al (2023) Transfer learning for real-time surface defect detection with multi-access edge-cloud computing networks. IEEE Trans Netw Serv Manag 21:310\u2013323","journal-title":"IEEE Trans Netw Serv Manag"},{"key":"8335_CR5","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3413170","author":"R Chen","year":"2024","unstructured":"Chen R, Yu G, Qin Z et al (2024) Patch matching for few-shot industrial defect detection. IEEE Trans Instrum Meas. https:\/\/doi.org\/10.1109\/tim.2024.3413170","journal-title":"IEEE Trans Instrum Meas"},{"key":"8335_CR6","doi-asserted-by":"publisher","first-page":"108036","DOI":"10.1016\/j.optlaseng.2024.108036","volume":"175","author":"Z-Y Xu","year":"2024","unstructured":"Xu Z-Y, Yang Y-T, Lei Y-J et al (2024) Development of an intelligent multi-scale defect detection system for aspheric lenses with high accuracy and efficiency. Opt Lasers Eng 175:108036","journal-title":"Opt Lasers Eng"},{"key":"8335_CR7","doi-asserted-by":"publisher","first-page":"115060","DOI":"10.1016\/j.measurement.2024.115060","volume":"236","author":"M Lu","year":"2024","unstructured":"Lu M, Sheng W, Zou Y et al (2024) WSS-YOLO: an improved industrial defect detection network for steel surface defects. Measurement 236:115060","journal-title":"Measurement"},{"key":"8335_CR8","doi-asserted-by":"publisher","first-page":"1833","DOI":"10.1007\/s10845-020-01670-2","volume":"32","author":"R Hao","year":"2021","unstructured":"Hao R, Lu B, Cheng Y et al (2021) A steel surface defect inspection approach towards smart industrial monitoring. J Intell Manuf 32:1833\u20131843","journal-title":"J Intell Manuf"},{"key":"8335_CR9","doi-asserted-by":"publisher","first-page":"2798","DOI":"10.1109\/TII.2018.2887145","volume":"15","author":"H Wang","year":"2018","unstructured":"Wang H, Zhang J, Tian Y et al (2018) A simple guidance template-based defect detection method for strip steel surfaces. IEEE Trans Industr Inform 15:2798\u20132809","journal-title":"IEEE Trans Industr Inform"},{"key":"8335_CR10","doi-asserted-by":"publisher","first-page":"16","DOI":"10.1016\/j.rcim.2015.09.008","volume":"38","author":"Q Luo","year":"2016","unstructured":"Luo Q, He Y (2016) A cost-effective and automatic surface defect inspection system for hot-rolled flat steel. Robot Comput Integr Manuf 38:16\u201330","journal-title":"Robot Comput Integr Manuf"},{"key":"8335_CR11","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2024.3524584","author":"P Wu","year":"2025","unstructured":"Wu P, Zhou H, Yu Y et al (2025) SSGDD-YOLO: Multiscale feature fusion and multi-attention based YOLO for smartphone screen glass defect detection. IEEE Sens J. https:\/\/doi.org\/10.1109\/jsen.2024.3524584","journal-title":"IEEE Sens J"},{"key":"8335_CR12","doi-asserted-by":"publisher","first-page":"10651","DOI":"10.1007\/s10462-023-10438-y","volume":"56","author":"D Zhang","year":"2023","unstructured":"Zhang D, Hao X, Wang D et al (2023) An efficient lightweight convolutional neural network for industrial surface defect detection. Artif Intell Rev 56:10651\u201310677","journal-title":"Artif Intell Rev"},{"key":"8335_CR13","unstructured":"Bahdanau D, Cho K, Bengio Y (2014) Neural machine translation by jointly learning to align and translate. Preprint at 14090473"},{"key":"8335_CR14","doi-asserted-by":"publisher","first-page":"199","DOI":"10.1109\/TNN.2010.2091281","volume":"22","author":"SJ Pan","year":"2010","unstructured":"Pan SJ, Tsang IW, Kwok JT, Yang Q (2010) Domain adaptation via transfer component analysis. IEEE Trans Neural Netw 22:199\u2013210","journal-title":"IEEE Trans Neural Netw"},{"key":"8335_CR15","doi-asserted-by":"crossref","unstructured":"Chollet F (2017) Xception: Deep Learning with Depthwise Separable Convolutions. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition. pp 1251\u20131258","DOI":"10.1109\/CVPR.2017.195"},{"key":"8335_CR16","doi-asserted-by":"crossref","unstructured":"Sandler M, Howard A, Zhu M, et al (2018) Mobilenetv2: Inverted Residuals and Linear Bottlenecks. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition. pp 4510\u20134520","DOI":"10.1109\/CVPR.2018.00474"},{"key":"8335_CR17","first-page":"1","volume":"71","author":"C-C Yeung","year":"2022","unstructured":"Yeung C-C, Lam K-M (2022) Efficient fused-attention model for steel surface defect detection. IEEE Trans Instrum Meas 71:1\u201311","journal-title":"IEEE Trans Instrum Meas"},{"key":"8335_CR18","first-page":"1","volume":"71","author":"N Zeng","year":"2022","unstructured":"Zeng N, Wu P, Wang Z et al (2022) A small-sized object detection oriented multi-scale feature fusion approach with application to defect detection. IEEE Trans Instrum Meas 71:1\u201314","journal-title":"IEEE Trans Instrum Meas"},{"key":"8335_CR19","doi-asserted-by":"publisher","first-page":"1502","DOI":"10.1049\/iet-ipr.2019.0057","volume":"14","author":"M Wu","year":"2020","unstructured":"Wu M, Yue H, Wang J et al (2020) Object detection based on RGC mask R-CNN. IET Image Process 14:1502\u20131508","journal-title":"IET Image Process"},{"key":"8335_CR20","doi-asserted-by":"crossref","unstructured":"Bastian BT, Jiji C V (2022) RMSOD: A RetinaNet Based Mixed Supervised Object Detection Framework. In: 2022 IEEE 19th India Council International Conference (INDICON). IEEE, pp 1\u20136","DOI":"10.1109\/INDICON56171.2022.10039939"},{"key":"8335_CR21","doi-asserted-by":"publisher","first-page":"105522","DOI":"10.1016\/j.compag.2020.105522","volume":"174","author":"L Jiao","year":"2020","unstructured":"Jiao L, Dong S, Zhang S et al (2020) AF-RCNN: an anchor-free convolutional neural network for multi-categories agricultural pest detection. Comput Electron Agric 174:105522","journal-title":"Comput Electron Agric"},{"key":"8335_CR22","doi-asserted-by":"crossref","unstructured":"Chen Z, Zha Y, Wu Z, Zeng D (2021) Detection of Mobile Phone Screen Defect Based on Faster R-CNN Fusion Model. In: 2021 China automation congress (CAC). IEEE, pp 6601\u20136606","DOI":"10.1109\/CAC53003.2021.9728077"},{"key":"8335_CR23","doi-asserted-by":"publisher","first-page":"1137","DOI":"10.1109\/TPAMI.2016.2577031","volume":"39","author":"S Ren","year":"2016","unstructured":"Ren S, He K, Girshick R, Sun J (2016) Faster R-CNN: towards real-time object detection with region proposal networks. IEEE Trans Pattern Anal Mach Intell 39:1137\u20131149","journal-title":"IEEE Trans Pattern Anal Mach Intell"},{"key":"8335_CR24","doi-asserted-by":"crossref","unstructured":"Redmon J, Divvala S, Girshick R, Farhadi A (2016) You only look once: Unified, real-time object detection. In: Proceedings of the IEEE conference on computer vision and pattern recognition. pp 779\u2013788","DOI":"10.1109\/CVPR.2016.91"},{"key":"8335_CR25","doi-asserted-by":"publisher","first-page":"8221","DOI":"10.3390\/s22218221","volume":"22","author":"B Yan","year":"2022","unstructured":"Yan B, Li J, Yang Z et al (2022) AIE-YOLO: auxiliary information enhanced YOLO for small object detection. Sensors 22:8221","journal-title":"Sensors"},{"key":"8335_CR26","doi-asserted-by":"publisher","first-page":"3467","DOI":"10.3390\/s22093467","volume":"22","author":"Z Guo","year":"2022","unstructured":"Guo Z, Wang C, Yang G et al (2022) Msft-yolo: Improved yolov5 based on transformer for detecting defects of steel surface. Sensors 22:3467","journal-title":"Sensors"},{"key":"8335_CR27","doi-asserted-by":"publisher","first-page":"72","DOI":"10.1016\/j.patrec.2025.05.011","volume":"196","author":"P Shi","year":"2025","unstructured":"Shi P, Li X, Feng Z, Shang X (2025) Mobile phone screen defect detection based on improved YOLOv8n network. Pattern Recognit Lett 196:72\u201378. https:\/\/doi.org\/10.1016\/j.patrec.2025.05.011","journal-title":"Pattern Recognit Lett"},{"key":"8335_CR28","unstructured":"Khanam R, Hussain M (2024) Yolov11: An overview of the key architectural enhancements. Preprint at 241017725"},{"key":"8335_CR29","doi-asserted-by":"publisher","DOI":"10.1007\/s11227-025-07625-9","author":"Z Zhou","year":"2025","unstructured":"Zhou Z, Lu Y, Lv L (2025) Real-time surface defect detection algorithm for printed circuit boards based on improved YOLOv11n. J Supercomput. https:\/\/doi.org\/10.1007\/s11227-025-07625-9","journal-title":"J Supercomput"},{"key":"8335_CR30","unstructured":"Tian Y, Ye Q, Doermann D (2025) Yolov12: Attention-centric real-time object detectors. Preprint at 250212524"},{"key":"8335_CR31","doi-asserted-by":"crossref","unstructured":"Zhao Y, Lv W, Xu S, et al (2024) Detrs Beat Yolos on Real-Time Object Detection. In: Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition. pp 16965\u201316974","DOI":"10.1109\/CVPR52733.2024.01605"},{"key":"8335_CR32","unstructured":"Peng Y, Li H, Wu P, et al (2024) D-FINE: Redefine regression task in DETRs as fine-grained distribution refinement. Preprint at 241013842"},{"key":"8335_CR33","unstructured":"Robinson I, Robicheaux P, Popov M, et al (2025) Rf-detr: Neural architecture search for real-time detection transformers. Preprint at 251109554"},{"key":"8335_CR34","doi-asserted-by":"publisher","first-page":"112776","DOI":"10.1016\/j.measurement.2023.112776","volume":"214","author":"C Zhao","year":"2023","unstructured":"Zhao C, Shu X, Yan X et al (2023) RDD-YOLO: A modified YOLO for detection of steel surface defects. Measurement 214:112776","journal-title":"Measurement"},{"key":"8335_CR35","doi-asserted-by":"publisher","DOI":"10.1007\/s11227-025-07947-8","author":"B Jin","year":"2025","unstructured":"Jin B, Lu Z, He L, Yu P (2025) FT-YOLO: a UAV-oriented small-object detection algorithm based on feature enhancement and task synchronization. J Supercomput. https:\/\/doi.org\/10.1007\/s11227-025-07947-8","journal-title":"J Supercomput"},{"key":"8335_CR36","doi-asserted-by":"publisher","first-page":"3477","DOI":"10.3390\/s24113477","volume":"24","author":"Y Wen","year":"2024","unstructured":"Wen Y, Gao X, Luo L, Li J (2024) Improved YOLOv8-based target precision detection algorithm for train wheel tread defects. Sensors 24:3477","journal-title":"Sensors"},{"key":"8335_CR37","doi-asserted-by":"publisher","first-page":"102280","DOI":"10.1016\/j.aei.2023.102280","volume":"59","author":"G-Q Wang","year":"2024","unstructured":"Wang G-Q, Zhang C-Z, Chen M-S et al (2024) A high-accuracy and lightweight detector based on a graph convolution network for strip surface defect detection. Adv Eng Inform 59:102280","journal-title":"Adv Eng Inform"},{"key":"8335_CR38","doi-asserted-by":"publisher","DOI":"10.1007\/s11227-025-07949-6","author":"X Wu","year":"2025","unstructured":"Wu X, Yu S (2025) CSP-YOLO: an efficient and lightweight real-time algorithm for internal rail defect detection. J Supercomput. https:\/\/doi.org\/10.1007\/s11227-025-07949-6","journal-title":"J Supercomput"},{"key":"8335_CR39","unstructured":"Ultralytics, \u201cYOLOv8: GitHub Repository,\u201d 2023. [Online]. https:\/\/github.com\/ultralytics\/ultralytics"},{"key":"8335_CR40","unstructured":"Li C, Yao A (2024) KernelWarehouse: rethinking the design of dynamic convolution. Preprint at 240607879"},{"key":"8335_CR41","doi-asserted-by":"publisher","first-page":"127488","DOI":"10.1016\/j.neucom.2024.127488","volume":"583","author":"D Yi","year":"2024","unstructured":"Yi D, Ahmedov HB, Jiang S et al (2024) Coordinate-aware mask R-CNN with group normalization: a underwater marine animal instance segmentation framework. Neurocomputing 583:127488","journal-title":"Neurocomputing"},{"key":"8335_CR42","unstructured":"Ioffe S, Szegedy C (2015) Batch Normalization: Accelerating Deep Network Training by Reducing Internal Covariate Shift. In: International conference on machine learning. pmlr, pp 448\u2013456"},{"key":"8335_CR43","doi-asserted-by":"publisher","first-page":"1562","DOI":"10.3390\/s20061562","volume":"20","author":"X Lv","year":"2020","unstructured":"Lv X, Duan F, Jiang J et al (2020) Deep metallic surface defect detection: the new benchmark and detection network. Sensors 20:1562","journal-title":"Sensors"},{"key":"8335_CR44","doi-asserted-by":"crossref","unstructured":"Liu W, Anguelov D, Erhan D, et al (2016) Ssd: Single Shot Multibox Detector. In: Computer vision\u2013ECCV 2016: 14th European conference, Amsterdam, The Netherlands, Proceedings, Part I 14. Springer, pp 21\u201337. Accessed 11\u201314 Oct 2016","DOI":"10.1007\/978-3-319-46448-0_2"},{"key":"8335_CR45","unstructured":"Ultralytics, \u201cYOLOv:GitHub Repository,\u201d 2020. [Online]. https:\/\/github.com\/ultralytics\/ yolov5"},{"key":"8335_CR46","doi-asserted-by":"crossref","unstructured":"Wang C-Y, Bochkovskiy A, Liao H-YM (2023) YOLOv7: Trainable Bag-of-Freebies Sets New State-of-the-art for Real-time Object Detectors. In: Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition. pp 7464\u20137475","DOI":"10.1109\/CVPR52729.2023.00721"},{"key":"8335_CR47","doi-asserted-by":"crossref","unstructured":"Wang C-Y, Yeh I-H, Mark Liao H-Y (2024) Yolov9: Learning What You Want to Learn Using Programmable Gradient Information. In: European conference on computer vision. Springer, pp 1\u201321","DOI":"10.1007\/978-3-031-72751-1_1"},{"key":"8335_CR48","first-page":"107984","volume":"37","author":"A Wang","year":"2024","unstructured":"Wang A, Chen H, Liu L et al (2024) Yolov10: real-time end-to-end object detection. Adv Neural Inf Process Syst 37:107984\u2013108011","journal-title":"Adv Neural Inf Process Syst"},{"key":"8335_CR49","doi-asserted-by":"crossref","unstructured":"Huang S, Lu Z, Cun X, et al (2025) Deim: Detr with Improved Matching for Fast Convergence. In: Proceedings of the computer vision and pattern recognition conference. pp 15162\u201315171","DOI":"10.1109\/CVPR52734.2025.01412"},{"key":"8335_CR50","doi-asserted-by":"publisher","first-page":"5875","DOI":"10.1109\/TIP.2021.3089943","volume":"30","author":"P-T Jiang","year":"2021","unstructured":"Jiang P-T, Zhang C-B, Hou Q et al (2021) Layercam: exploring hierarchical class activation maps for localization. IEEE Trans Image Process 30:5875\u20135888","journal-title":"IEEE Trans Image Process"},{"key":"8335_CR51","doi-asserted-by":"crossref","unstructured":"Tan M, Pang R, Le Q V (2020) Efficientdet: Scalable and Efficient Object Detection. In: Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition. pp 10781\u201310790","DOI":"10.1109\/CVPR42600.2020.01079"},{"key":"8335_CR52","unstructured":"Li C, Li L, Jiang H, et al (2022) YOLOv6: A single-stage object detection framework for industrial applications. Preprint at 220902976"},{"key":"8335_CR53","doi-asserted-by":"publisher","first-page":"105057","DOI":"10.1016\/j.imavis.2024.105057","volume":"147","author":"M Kang","year":"2024","unstructured":"Kang M, Ting C-M, Ting FF, Phan RC-W (2024) ASF-YOLO: a novel YOLO model with attentional scale sequence fusion for cell instance segmentation. Image Vis Comput 147:105057","journal-title":"Image Vis Comput"},{"key":"8335_CR54","doi-asserted-by":"publisher","first-page":"4974","DOI":"10.3390\/rs15204974","volume":"15","author":"J Zhang","year":"2023","unstructured":"Zhang J, Chen Z, Yan G et al (2023) Faster and lightweight: an improved YOLOv5 object detector for remote sensing images. Remote Sens 15:4974","journal-title":"Remote Sens"},{"key":"8335_CR55","doi-asserted-by":"publisher","first-page":"4340","DOI":"10.3390\/rs16224340","volume":"16","author":"Q Cao","year":"2024","unstructured":"Cao Q, Chen H, Wang S et al (2024) Lh-yolo: a lightweight and high-precision SAR ship detection model based on the improved YOLOv8n. Remote Sens 16:4340","journal-title":"Remote Sens"},{"key":"8335_CR56","doi-asserted-by":"publisher","first-page":"110714","DOI":"10.1016\/j.patcog.2024.110714","volume":"155","author":"Z Yu","year":"2024","unstructured":"Yu Z, Huang H, Chen W et al (2024) Yolo-facev2: a scale and occlusion aware face detector. Pattern Recognit 155:110714","journal-title":"Pattern Recognit"},{"key":"8335_CR57","doi-asserted-by":"crossref","unstructured":"Liu X, Peng H, Zheng N, et al (2023) Efficientvit: Memory Efficient Vision Transformer with Cascaded Group Attention. In: Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition. pp 14420\u201314430","DOI":"10.1109\/CVPR52729.2023.01386"},{"key":"8335_CR58","doi-asserted-by":"crossref","unstructured":"Ma X, Dai X, Bai Y, et al (2024) Rewrite the Stars. In: Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition. pp 5694\u20135703","DOI":"10.1109\/CVPR52733.2024.00544"},{"key":"8335_CR59","doi-asserted-by":"crossref","unstructured":"Qin D, Leichner C, Delakis M, et al (2024) MobileNetV4: universal models for the mobile ecosystem. In: European Conference on Computer Vision. Springer, pp 78\u201396","DOI":"10.1007\/978-3-031-73661-2_5"}],"container-title":["The Journal of Supercomputing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s11227-026-08335-6.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s11227-026-08335-6","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s11227-026-08335-6.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,22]],"date-time":"2026-02-22T05:18:45Z","timestamp":1771737525000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s11227-026-08335-6"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,2,22]]},"references-count":59,"journal-issue":{"issue":"4","published-online":{"date-parts":[[2026,3]]}},"alternative-id":["8335"],"URL":"https:\/\/doi.org\/10.1007\/s11227-026-08335-6","relation":{},"ISSN":["1573-0484"],"issn-type":[{"value":"1573-0484","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,2,22]]},"assertion":[{"value":"16 September 2025","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"11 February 2026","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"22 February 2026","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflict of interest"}}],"article-number":"192"}}