{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,1,23]],"date-time":"2025-01-23T05:36:20Z","timestamp":1737610580544,"version":"3.33.0"},"reference-count":25,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[2007,12,1]],"date-time":"2007-12-01T00:00:00Z","timestamp":1196467200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Sign Process Syst Sign Image Video Technol"],"published-print":{"date-parts":[[2008,9]]},"DOI":"10.1007\/s11265-007-0154-6","type":"journal-article","created":{"date-parts":[[2007,11,30]],"date-time":"2007-11-30T19:59:34Z","timestamp":1196452774000},"page":"231-247","source":"Crossref","is-referenced-by-count":0,"title":["Fault Tolerance Analysis of Communication System Interleavers: the 802.11a Case Study"],"prefix":"10.1007","volume":"52","author":[{"given":"P.","family":"Reyes","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Reviriego","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J. A.","family":"Maestro","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"O.","family":"Ruano","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2007,12,1]]},"reference":[{"key":"154_CR1","doi-asserted-by":"crossref","unstructured":"C. W. Slayman, \u201cCache and Memory Error Detection, Correction and Reduction Techniques for Terrestrial Servers and Workstations\u201d, IEEE Transactions on Device and Material Reliability, vol. 5, no. 3, September 2005, pp. 397\u2013404.","DOI":"10.1109\/TDMR.2005.856487"},{"key":"154_CR2","doi-asserted-by":"crossref","unstructured":"D. Schrimpf, D.M. Fleetwood, \u201cRadiation effects and soft errors in integrated circuits and electronic devices\u201d, Eds., World Scientific Publishing, Singapore 2004.","DOI":"10.1142\/9789812794703"},{"key":"154_CR3","unstructured":"J. E. Mazur, \u201cAn Overview of the Space Radiation Environment\u201d, The Aerospace Corporation Magazine of Advances in Aerospace Technology\u2019, vol. 4, no. 2, Summer 2003."},{"issue":"3","key":"154_CR4","doi-asserted-by":"crossref","first-page":"258","DOI":"10.1109\/MDT.2005.69","volume":"22","author":"R. Baumann","year":"2005","unstructured":"R. Baumann, \u201cSoft Errors in Advanced Computer Systems\u201d IEEE Des. Test Comput., vol. 22, no. 3, May 2005, pp. 258\u20132618.","journal-title":"IEEE Des. Test Comput."},{"key":"154_CR5","doi-asserted-by":"crossref","unstructured":"M. Nicolaidis, \u201cDesign for Soft Error Mitigation\u201d, IEEE Transactions on Device and Material Reliability, vol. 5, no. 3, September 2005, pp. 405\u2013418.","DOI":"10.1109\/TDMR.2005.855790"},{"key":"154_CR6","doi-asserted-by":"crossref","unstructured":"W. Heidergott, \u201cSEU Tolerant Device, Circuit and Processor Design\u201d DAC 2005, June 13\u201317, 2005, pp. 5\u201310, Anaheim, CA, USA. Copyright 2005 ACM 1-59593-058-2\/05\/0006.","DOI":"10.1109\/DAC.2005.193763"},{"key":"154_CR7","doi-asserted-by":"crossref","unstructured":"E. C. Regla, V. K. Konangi, M. A. Seibert, \u201cProtocols for inter-satellite communication in a formation flying system\u201d 20th AIAA International Communication Satellite Systems Conference and Exhibit, 12\u201315 May 2002, Montreal, Quebec, Canada.","DOI":"10.2514\/6.2002-1960"},{"key":"154_CR8","unstructured":"J. Heiskala, J. Terry, \u201cOFDM Wireless LANs: A Theoretical and Practical Guide.\u201d SAMS."},{"key":"154_CR9","doi-asserted-by":"crossref","unstructured":"P. Reyes, P. Reviriego, J.A. Maestro, O. Ruano, \u201cA new Protection Technique for Finite Impulse Response (FIR) Filters in the Presence of Soft Errors\u201d, IEEE International Symposium on Industrial Electronics, ISIE 2007, June 4\u20137, 2007, pp. 3328\u20133333, Vigo (Spain).","DOI":"10.1109\/ISIE.2007.4375149"},{"issue":"4","key":"154_CR10","doi-asserted-by":"crossref","first-page":"957","DOI":"10.1109\/TNS.2007.892118","volume":"54","author":"P. Reyes","year":"2007","unstructured":"P. Reyes, P. Reviriego, J.A. Maestro, O. Ruano, \u201cNew Protection Techniques against SEUs for Moving Average Filters in a Radiation Environment\u201d, IEEE Trans. Nucl. Sci., vol. 54, no.4, August 2007, pp. 957\u2013964.","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"154_CR11","unstructured":"P. Reyes, P. Reviriego, O. Ruano, J.A. Maestro, \u201cEfficient Structures for the Implementation of Moving Average Filters in the Presence of SEUs. using System Knowledge\u201d, the 2006 Radiation Effects on Components and Systems Workshop, RADECs 06, September 27\u201331th, Athens, (Greece)."},{"key":"154_CR12","doi-asserted-by":"crossref","unstructured":"P. Reviriego, P. Reyes, J.A. Maestro, O. Ruano, \u201cSystem Knowledge-Based Techniques against SEUs for Adaptive Filters\u201d, the 2007 Radiation Effects on Components and Systems Workshop, RADECs 07, September 10\u201314, 2007 Deauville (France).","DOI":"10.1109\/RADECS.2007.5205605"},{"key":"154_CR13","doi-asserted-by":"crossref","unstructured":"P. J. Meaney, S.B. Swaney, P.N. Sanda, L. Spainhower, \u201cIBM z990 Soft Error Detection and Recovery\u201d, IEEE Transactions on Device and Materials Reliability, vol.5, no. 3, September 2005, pp. 419\u2013427.","DOI":"10.1109\/TDMR.2005.859577"},{"key":"154_CR14","unstructured":"F. G. Lima, S. Rezgui, E. Cota, L. Carro, M. Lubaszewski, R. Velazco, R. Reis. \u201cDesigning and Testing a Radiation Hardened 8051-like Micro-controller\u201d, 13th Symposium on Integrated Circuits and Systems Design, 18\u201324 September, 2000, pp. 250\u2013260 (SBCCI'00)."},{"key":"154_CR15","unstructured":"Z. Stamenkovi, C. Wolf, G. Schoof, J. Gaisler, \u201cAn Implementation Study on Fault Tolerant LEON-3 Processor System\u201d D & R Industry Articles, http:\/\/www.us.design-reuse.com\/articles\/article15502.html ."},{"issue":"10","key":"154_CR16","doi-asserted-by":"crossref","first-page":"1304","DOI":"10.1109\/12.59860","volume":"39","author":"A. Reddy","year":"1990","unstructured":"A. Reddy, P. Banarjee, \u201cAlgorithm Based fault detection for signal processing applications\u201d, IEEE Trans. Comput., vol. 39, no. 10, October 1990, pp. 1304\u20131308.","journal-title":"IEEE Trans. Comput."},{"issue":"4","key":"154_CR17","doi-asserted-by":"crossref","first-page":"336","DOI":"10.1109\/TVLSI.2006.874359","volume":"14","author":"B. Shim","year":"2006","unstructured":"B. Shim, N. R. Shanbhag, S.Lee, \u201cEnergy-Efficient Soft Error-Tolerant Digital Signal Processing\u201d, IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 14, no. 4, April 2006, pp. 336\u2013348.","journal-title":"IEEE Trans. Very Large Scale Integr. (VLSI) Syst."},{"key":"154_CR18","doi-asserted-by":"crossref","unstructured":"E. Sch\u00fcler, L. Carro, \u201cReliable digital circuits design using Sigma-Delta modulated signals\u201d 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 3\u20135 October 2005, pp. 314\u2013324.","DOI":"10.1109\/DFTVS.2005.57"},{"key":"154_CR19","doi-asserted-by":"crossref","unstructured":"E. Sch\u00fcler, D. S. Farenzena, L. Carro, \u201cEvaluating Sigma-Delta modulated signals to develop fault-tolerant circuits\u201d, Eleventh IEEE European Test Symposium, 21\u201324 May 2006, pp. 137\u2013144 (ETS\u201906).","DOI":"10.1109\/ETS.2006.19"},{"key":"154_CR20","doi-asserted-by":"crossref","unstructured":"K. D. Wolfram, H. J. Bloom, \u201cNew Radiation- Hardened High-Speed Serial Data Bus For Satellite Onboard Communications\u201d IEEE International Symposium on Geoscience and Remote Sensing, 2004. IGARSS 04. vol. 1, 20\u201324 September 2004.","DOI":"10.1109\/IGARSS.2004.1368969"},{"key":"154_CR21","unstructured":"J.B. Destro-Filho, D. W. Matolak, \u201cEffects of Single Event Upsets on Satellite Communications: Issues for Blind Equalizer Design\u201d, 6th European Conference on Radiation and Its Effects on Components and Systems, 10\u201314 September 2001."},{"key":"154_CR22","unstructured":"E. Tell, D. Liu, \u201cA Hardware Architecture for a multi block interleaver\u201d, IEEE International Conference on Circuits and Systems for Communications, June 30\u2013July 2, 2004, Moscow, Russia."},{"issue":"6","key":"154_CR23","doi-asserted-by":"crossref","first-page":"2433","DOI":"10.1109\/TNS.2005.860675","volume":"52","author":"D. Radaelli","year":"2005","unstructured":"D. Radaelli, H. Puchner, S. Wong, S. Daniel, \u201cInvestigation of Multi-Bit Upsets in a 150\u00a0nm Technology SRAM Device\u201d, IEEE Trans. Nucl. Sci., vol. 52, no. 6, December 2005, pp. 2433\u20132437.","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"154_CR24","unstructured":"\u201cPart 11: Wireless LAN Medium Access Control (MAC) and Physical Layer (PHY) specifications High-speed Physical Layer in the 5\u00a0GHz Band\u201d LAN\/MAN Standards Committee of the IEEE Computer Society. Adopted by the ISO\/IEC and redesignated as ISO\/IEC 8802-11:1999\/Amd 1:2000(E)."},{"key":"154_CR25","doi-asserted-by":"crossref","unstructured":"T.H. Meng, B. McFarland, D. Su and J. Thomson, \u201cDesign and Implementation of an All-CMOS 802.11a Wireless LAN Chipset\u201d, IEEE Communications Magazine, Topics in Circuits for Communications, vol. 41, no. 8, August 2003, pp. 160\u2013168.","DOI":"10.1109\/MCOM.2003.1222734"}],"container-title":["Journal of Signal Processing Systems"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11265-007-0154-6.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s11265-007-0154-6\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11265-007-0154-6","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,23]],"date-time":"2025-01-23T02:33:00Z","timestamp":1737599580000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s11265-007-0154-6"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,12,1]]},"references-count":25,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2008,9]]}},"alternative-id":["154"],"URL":"https:\/\/doi.org\/10.1007\/s11265-007-0154-6","relation":{},"ISSN":["1939-8018","1939-8115"],"issn-type":[{"type":"print","value":"1939-8018"},{"type":"electronic","value":"1939-8115"}],"subject":[],"published":{"date-parts":[[2007,12,1]]}}}