{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,22]],"date-time":"2026-07-22T16:57:22Z","timestamp":1784739442994,"version":"3.55.0"},"reference-count":29,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[2010,11,18]],"date-time":"2010-11-18T00:00:00Z","timestamp":1290038400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Sign Process Syst"],"published-print":{"date-parts":[[2012,6]]},"DOI":"10.1007\/s11265-010-0556-8","type":"journal-article","created":{"date-parts":[[2010,11,17]],"date-time":"2010-11-17T01:56:39Z","timestamp":1289958999000},"page":"279-290","source":"Crossref","is-referenced-by-count":26,"title":["A Flexible PCB Inspection System Based on Statistical Learning"],"prefix":"10.1007","volume":"67","author":[{"given":"Chia-Te","family":"Liao","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wen-Hao","family":"Lee","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shang-Hong","family":"Lai","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2010,11,18]]},"reference":[{"issue":"2","key":"556_CR1","doi-asserted-by":"crossref","first-page":"287","DOI":"10.1006\/cviu.1996.0020","volume":"63","author":"M Moganti","year":"1996","unstructured":"Moganti, M., Ercal, F., Dagli, C. H., & Tsunekawa, S. (1996). Automatic PCB inspection algorithms: a survey. Computer Vision and Image Understanding, 63(2), 287\u2013313.","journal-title":"Computer Vision and Image Understanding"},{"issue":"6","key":"556_CR2","doi-asserted-by":"crossref","first-page":"557","DOI":"10.1109\/TPAMI.1982.4767309","volume":"4","author":"RT Chin","year":"1982","unstructured":"Chin, R. T., & Harlow, C. A. (1982). Automated visual inspection: a survey. IEEE Transactions on Pattern Analysis and Machine Intelligence, 4(6), 557\u2013573.","journal-title":"IEEE Transactions on Pattern Analysis and Machine Intelligence"},{"issue":"3","key":"556_CR3","doi-asserted-by":"crossref","first-page":"346","DOI":"10.1016\/0734-189X(88)90108-9","volume":"41","author":"RT Chin","year":"1988","unstructured":"Chin, R. T. (1988). Automated visual inspection: 1981 to 1987. Computer Vision, Graphics, and Image Processing, 41(3), 346\u2013381.","journal-title":"Computer Vision, Graphics, and Image Processing"},{"issue":"2","key":"556_CR4","doi-asserted-by":"crossref","first-page":"231","DOI":"10.1006\/cviu.1995.1017","volume":"61","author":"TS Newman","year":"1995","unstructured":"Newman, T. S., & Jain, A. K. (1995). A survey of automated visual inspection. Computer Vision and Image Understanding, 61(2), 231\u2013262.","journal-title":"Computer Vision and Image Understanding"},{"key":"556_CR5","doi-asserted-by":"crossref","first-page":"623","DOI":"10.1109\/TPAMI.1983.4767453","volume":"5","author":"Y Akiyarnai","year":"1983","unstructured":"Akiyarnai, Y., Hara, N., & Karasaki, K. (1983). Automation inspection for printed circuit board. IEEE Transactions on Pattern Analysis and Machine Intelligence, 5, 623\u2013630.","journal-title":"IEEE Transactions on Pattern Analysis and Machine Intelligence"},{"issue":"7","key":"556_CR6","doi-asserted-by":"crossref","first-page":"658","DOI":"10.1109\/34.85656","volume":"13","author":"S Tominaga","year":"1991","unstructured":"Tominaga, S. (1991). Surface identification using the dichromatic reflection model. IEEE Transactions on Pattern Analysis and Machine Intelligence, 13(7), 658\u2013670.","journal-title":"IEEE Transactions on Pattern Analysis and Machine Intelligence"},{"key":"556_CR7","doi-asserted-by":"crossref","unstructured":"Spence, H. F. (1993). Printed circuit board diagnosis using artificial neural networks and circuit magnetic fields. In Proc. IEEE Systems Readiness Technology Conference, pp. 41\u201345.","DOI":"10.1109\/AUTEST.1993.396361"},{"key":"556_CR8","doi-asserted-by":"crossref","unstructured":"Hodges, S. E., & Richards, R. J. (1995). Fast multi-resolution image processing for PCB manufacture. IEE Colloquium on Multi-resolution Modeling and Analysis in Image Processing and Computer Vision, pp. 1\u20138.","DOI":"10.1049\/ic:19950505"},{"issue":"4","key":"556_CR9","doi-asserted-by":"crossref","first-page":"675","DOI":"10.1109\/96.475274","volume":"18","author":"ME Scaman","year":"1995","unstructured":"Scaman, M. E., & Economikos, L. (1995). Computer vision for automatic inspection of complex metal patterns on multichip modules (MCD-M). IEEE Transactions on Components, Packaging and Manufacturing Technology, 18(4), 675\u2013684.","journal-title":"IEEE Transactions on Components, Packaging and Manufacturing Technology"},{"issue":"2","key":"556_CR10","doi-asserted-by":"crossref","first-page":"103","DOI":"10.1016\/0166-3615(95)00063-1","volume":"28","author":"WY Wu","year":"1996","unstructured":"Wu, W. Y., Wang, M.-J. J., & Liu, C. M. (1996). Automated inspection of printed circuit boards through machine vision. Computers in Industry, 28(2), 103\u2013111.","journal-title":"Computers in Industry"},{"issue":"2","key":"556_CR11","doi-asserted-by":"crossref","first-page":"426","DOI":"10.1109\/28.753638","volume":"35","author":"HH Loh","year":"1999","unstructured":"Loh, H. H., & Lu, M. S. (1999). Printed circuit board inspection using image analysis. IEEE Transactions on Industry Applications, 35(2), 426\u2013432.","journal-title":"IEEE Transactions on Industry Applications"},{"key":"556_CR12","unstructured":"Kim, N. H., Pyun, J. Y., Choi, K. S., Choi, B. D., & Ko, S. J. (2001). Real-time inspection system for printed circuit boards. In Proc. 6th IEEE Int. Symp. Industrial Electronics, pp. 12\u201316."},{"key":"556_CR13","doi-asserted-by":"crossref","unstructured":"Tominaga, S., & Okamoto, S. (2003). Reflectance-based material classification for printed circuit boards. In Proc. 12th Int. Conf. Image Analysis and Processing, pp. 238\u2013243.","DOI":"10.1109\/ICIAP.2003.1234056"},{"issue":"1","key":"556_CR14","first-page":"73","volume":"1","author":"Z Ibrahim","year":"2004","unstructured":"Ibrahim, Z., & Al-Attas, S. A. R. (2004). Wavelet-based printed circuit board inspection system. International Journal of Signal Processing, 1(1), 73\u201379.","journal-title":"International Journal of Signal Processing"},{"issue":"4","key":"556_CR15","doi-asserted-by":"crossref","first-page":"394","DOI":"10.1109\/TASE.2006.877399","volume":"3","author":"HC Garcia","year":"2006","unstructured":"Garcia, H. C., Villalobos, J. R., & Runger, G. C. (2006). An automated feature selection method for visual inspection systems. IEEE Transactions on Automation Science and Engineering, 3(4), 394\u2013406.","journal-title":"IEEE Transactions on Automation Science and Engineering"},{"issue":"3","key":"556_CR16","doi-asserted-by":"crossref","first-page":"200","DOI":"10.1109\/TII.2006.877265","volume":"2","author":"G Acciani","year":"2006","unstructured":"Acciani, G., Brunetti, G., & Fornarelli, G. (2006). Application of neural networks in optical inspection and classification of solder joints in surface mount technology. IEEE Transactions on Industrial Informatics, 2(3), 200\u2013209.","journal-title":"IEEE Transactions on Industrial Informatics"},{"issue":"2","key":"556_CR17","doi-asserted-by":"crossref","first-page":"203","DOI":"10.1007\/s10845-008-0074-8","volume":"19","author":"PC Chang","year":"2008","unstructured":"Chang, P. C., Chen, L. Y., & Fan, C. Y. (2008). A case-based evolutionary model for defect feature segmentation of printed circuit board images. Journal of Intelligent Manufacturing, 19(2), 203\u2013214.","journal-title":"Journal of Intelligent Manufacturing"},{"issue":"9","key":"556_CR18","doi-asserted-by":"crossref","first-page":"850","DOI":"10.1109\/34.232073","volume":"15","author":"D Huttenlocher","year":"1993","unstructured":"Huttenlocher, D., Klanderman, G., & Rucklidge, W. (1993). Comparing images using the Hausdorff distance. IEEE Transactions on Pattern Analysis and Machine Intelligence, 15(9), 850\u2013863.","journal-title":"IEEE Transactions on Pattern Analysis and Machine Intelligence"},{"key":"556_CR19","first-page":"273","volume":"20","author":"C Cortes","year":"1995","unstructured":"Cortes, C., & Vapnik, V. (1995). Support vector networks. Machine Learning, 20, 273\u2013297.","journal-title":"Machine Learning"},{"key":"556_CR20","volume-title":"Statistical learning theory","author":"V Vapnik","year":"1998","unstructured":"Vapnik, V. (1998). Statistical learning theory. Chichester: Wiley."},{"key":"556_CR21","doi-asserted-by":"crossref","unstructured":"Sch\u00f6lkopf, B., & Smola, A. J. (2001). Learning with kernels: Support vector machines, regularization, optimization, and beyond. MIT Press.","DOI":"10.7551\/mitpress\/4175.001.0001"},{"key":"556_CR22","volume-title":"Nonlinear programming","author":"M Bazaraa","year":"1979","unstructured":"Bazaraa, M., & Shetty, C. M. (1979). Nonlinear programming. New York: Wiley."},{"key":"556_CR23","unstructured":"Platt, J. C., Cristianini, N., & Shawe-Taylor, J. (2000). Large margin DAG\u2019s for multiclass classification. Adv. Neural Information Processing Systems, vol. 12, pp. 547\u2013553. MIT Press."},{"issue":"2","key":"556_CR24","doi-asserted-by":"crossref","first-page":"415","DOI":"10.1109\/72.991427","volume":"13","author":"CW Hsu","year":"2002","unstructured":"Hsu, C. W., & Lin, C. J. (2002). A comparison of methods for multi-class SVMs. IEEE Transactions on Neural Networks, 13(2), 415\u2013425.","journal-title":"IEEE Transactions on Neural Networks"},{"key":"556_CR25","first-page":"975","volume":"5","author":"TF Wu","year":"2004","unstructured":"Wu, T. F., Lin, C. J., & Weng, R. C. (2004). Probability estimates for multi-class classification by pairwise coupling. Journal of Machine learning Research, 5, 975\u20131005.","journal-title":"Journal of Machine learning Research"},{"key":"556_CR26","doi-asserted-by":"crossref","unstructured":"Cover, T. M., & Thomas, J. A. (1991). Elements of information theory. Wiley.","DOI":"10.1002\/0471200611"},{"key":"556_CR27","unstructured":"Gonzalez, R. C., & Woods, R. E. (2001). Digital image processing (2nd edn.). Prentice Hall."},{"issue":"2","key":"556_CR28","first-page":"1034","volume":"5","author":"B Benhabib","year":"1990","unstructured":"Benhabib, B., Charette, C. R., Smith, K. C., & Yip, A. M. (1990). Automatic visual inspection of printed circuit boards: an experimental system. International Journal of Robotics & Automation, 5(2), 1034\u20131044.","journal-title":"International Journal of Robotics & Automation"},{"key":"556_CR29","doi-asserted-by":"crossref","first-page":"96","DOI":"10.21236\/AD0241531","volume-title":"Adaptive switching circuits. IRE WESCON Convention Record, Part 4","author":"B Widrow","year":"1960","unstructured":"Widrow, B., & Hoff, M. E. (1960). Adaptive switching circuits. IRE WESCON Convention Record, Part 4 (pp. 96\u2013104). New York: IRE."}],"container-title":["Journal of Signal Processing Systems"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11265-010-0556-8.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s11265-010-0556-8\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11265-010-0556-8","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,27]],"date-time":"2025-02-27T21:50:24Z","timestamp":1740693024000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s11265-010-0556-8"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,11,18]]},"references-count":29,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2012,6]]}},"alternative-id":["556"],"URL":"https:\/\/doi.org\/10.1007\/s11265-010-0556-8","relation":{},"ISSN":["1939-8018","1939-8115"],"issn-type":[{"value":"1939-8018","type":"print"},{"value":"1939-8115","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,11,18]]}}}