{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,16]],"date-time":"2026-04-16T15:00:03Z","timestamp":1776351603038,"version":"3.51.2"},"reference-count":22,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2016,1,29]],"date-time":"2016-01-29T00:00:00Z","timestamp":1454025600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Wireless Pers Commun"],"published-print":{"date-parts":[[2016,9]]},"DOI":"10.1007\/s11277-016-3196-x","type":"journal-article","created":{"date-parts":[[2016,1,29]],"date-time":"2016-01-29T15:05:21Z","timestamp":1454079921000},"page":"713-728","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":4,"title":["Test Data Compression and Power Reduction Using Similarity Based Reordering Technique for Wireless Systems"],"prefix":"10.1007","volume":"90","author":[{"given":"R.","family":"HariKumar","sequence":"first","affiliation":[]},{"given":"B.","family":"Manjurathi","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2016,1,29]]},"reference":[{"key":"3196_CR1","doi-asserted-by":"crossref","first-page":"449","DOI":"10.1109\/ICECS.2002.1046192","volume":"2","author":"A El-Maleh","year":"2002","unstructured":"El-Maleh, A., & Al-Abaji, R. (2002). Extended frequency-directed run-length code with Improved application to system-on-a-chip test data compression. Proceedings of the International Conference on Electronics, Circuits and Systems, 2, 449\u2013452.","journal-title":"Proceedings of the International Conference on Electronics, Circuits and Systems"},{"issue":"8","key":"3196_CR2","doi-asserted-by":"crossref","first-page":"1076","DOI":"10.1109\/TC.2003.1223641","volume":"52","author":"A Chandra","year":"2003","unstructured":"Chandra, A., & Chakrabarty, K. (2003). Test Data Compression and test resource partitioning for system-on-a-chip using frequency-directed run-length (FDR) codes. IEEE Transactions on Computers, 52(8), 1076\u20131088.","journal-title":"IEEE Transactions on Computers"},{"key":"3196_CR3","doi-asserted-by":"crossref","unstructured":"Feng, J. & Li, G. (2008). A test data compression method for system-on-a- chip.In Proceedings of the 4th IEEE International Symposium on Electronic Design, Test and Applications.","DOI":"10.1109\/DELTA.2008.30"},{"issue":"4","key":"3196_CR4","doi-asserted-by":"crossref","first-page":"294","DOI":"10.1109\/MDT.2006.105","volume":"23","author":"NA Touba","year":"2006","unstructured":"Touba, N. A. (2006). Survey of test vector compression techniques. IEEE Design & Test Magazine, 23(4), 294\u2013303.","journal-title":"IEEE Design & Test Magazine"},{"key":"3196_CR5","doi-asserted-by":"crossref","unstructured":"Chandra, A., & Chakrabarty, K. (2001). Efficient test data compression and decompression for system-on-a-chip using internal scan chains and Golomb coding. In DATE \u201801: Conference on design, automation and test in Europe.","DOI":"10.1109\/DATE.2001.915015"},{"key":"3196_CR6","doi-asserted-by":"crossref","unstructured":"Chandra, A., & Chakrabarty, K. (2001b) Frequency\u2014Directed run-length (FDR) codes with application to system-on-a-chip Test data compression. In the Proceedings of the 19th IEEE VLSI Test Symposium.","DOI":"10.1007\/978-1-4615-1113-7_8"},{"key":"3196_CR7","doi-asserted-by":"crossref","unstructured":"Chandra, A., & Chakrabarty, K. (2002d) Reduction of SOC test data volume, scan power and testing time using alternating run-length codes. In DAC \u201802: Proceedings of the 39th conference on Design automation.","DOI":"10.1145\/513918.514090"},{"issue":"1","key":"3196_CR8","doi-asserted-by":"crossref","first-page":"91","DOI":"10.1145\/1044111.1044117","volume":"10","author":"Mehrdad Nourani","year":"2005","unstructured":"Nourani, Mehrdad, & Tehranipour, Mohammad. (2005). RL-Huffman encoding for test compression and power reduction in scan application. ACM Transactions on Design Automation of Electronic Systems, 10(1), 91\u2013115.","journal-title":"ACM Transactions on Design Automation of Electronic Systems"},{"key":"3196_CR9","first-page":"114","volume":"1999","author":"A Jas","year":"1999","unstructured":"Jas, A., Jayabrata, G., & Touba, N. A. (1999). Scan vector compression\/decompression using statistical coding. Proceedings of IEEE VLSI Test Symposium, IEEE, LosAlamitos, CA, UnitedStates, 1999, 114\u2013120.","journal-title":"Proceedings of IEEE VLSI Test Symposium, IEEE, LosAlamitos, CA, UnitedStates"},{"issue":"6","key":"3196_CR10","doi-asserted-by":"crossref","first-page":"783","DOI":"10.1109\/TCAD.2003.811451","volume":"22","author":"PT Gonciari","year":"2003","unstructured":"Gonciari, P. T., AlHashimi, B. M., & Nicolici, N. (2003). Va-riable-length input Huffman coding for system-on-a-chip test. IEEE Transaction Computer-Aided Design Integrration Circuits Systems, 22(6), 783\u2013796.","journal-title":"IEEE Transaction Computer-Aided Design Integrration Circuits Systems"},{"issue":"7","key":"3196_CR11","doi-asserted-by":"crossref","first-page":"1333","DOI":"10.1109\/TCAD.2008.923100","volume":"27","author":"X Kavousianos","year":"2008","unstructured":"Kavousianos, X., Kalligeros, E., & Nikolos, D. (2008). Test data compression based on variable-to-variable Huffman encoding with code word reusability. IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems, 27(7), 1333\u20131338.","journal-title":"IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems"},{"issue":"6","key":"3196_CR12","doi-asserted-by":"crossref","first-page":"797","DOI":"10.1109\/TCAD.2003.811452","volume":"22","author":"A Jas","year":"2003","unstructured":"Jas, A., Ghosh-Dastidar, J., & Touba, M. N. (2003). An efficient test vector compression scheme using selective Huffman coding. IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems, 22(6), 797\u2013806.","journal-title":"IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems"},{"issue":"8","key":"3196_CR13","doi-asserted-by":"crossref","first-page":"1146","DOI":"10.1109\/TC.2007.1057","volume":"56","author":"X Kavousianos","year":"2007","unstructured":"Kavousianos, X., Kalligeros, E., & Nikolos, D. (2007). Optimal selective Huffman coding for test-data compression. IEEE Transactions on Computer, 56(8), 1146\u20131152.","journal-title":"IEEE Transactions on Computer"},{"key":"3196_CR14","doi-asserted-by":"crossref","unstructured":"Lu, S. -K., Chuang, H. M., Lai G. Y., Lai, B. -T., & Huang Y. -C. (2009). Efficient test pattern compression techniques based on complementary Huffman coding. In: IEEE Circuitsand Systems International Conferenceon Testing and Diagnosis, ICTD009.","DOI":"10.1109\/CAS-ICTD.2009.4960811"},{"key":"3196_CR15","first-page":"9","volume":"2011","author":"US Mehta","year":"2010","unstructured":"Mehta, U. S., Dasgupta, K. S., & Devashrayee, N. M. (2010). Weighted transition based reordering, columnwise bit filling, and difference vector: a power-aware test data compression method. VLSI Design, 2011, 9.","journal-title":"VLSI Design"},{"issue":"3","key":"3196_CR16","doi-asserted-by":"crossref","first-page":"376","DOI":"10.1016\/j.compeleceng.2011.03.008","volume":"37","author":"A ElMaleh","year":"2011","unstructured":"ElMaleh, A., AlZahir, S., & Khan, E. (2011). Test data compression based on geometric shapes. Computers and Electrical Engineering, 37(3), 376\u2013391.","journal-title":"Computers and Electrical Engineering"},{"issue":"2","key":"3196_CR17","doi-asserted-by":"crossref","first-page":"103","DOI":"10.1016\/j.vlsi.2010.11.004","volume":"44","author":"B Ye","year":"2011","unstructured":"Ye, B., Zhao, Q., & Duo, Z. (2011). Test data compression using Alternating variable run length code. Integration, the VLSI Journal, 44(2), 103\u2013110.","journal-title":"Integration, the VLSI Journal"},{"key":"3196_CR18","doi-asserted-by":"crossref","unstructured":"Mehta U. S., Dasgupta K. S., & Devashrayee N. M. (2010a) Hamming distance based reordering and column wise bit stuffing with difference vector: a better scheme for test data compression with run length based codes. In International Conference on VLSI Design.","DOI":"10.1109\/VLSI.Design.2010.18"},{"key":"3196_CR19","doi-asserted-by":"crossref","unstructured":"Mehta U. S., Dasgupta K. S., & Devashrayee N. M. (2010b) Hamming distance based 2-D reordering with power efficient dont care bit filling optimizing the test data compression method. In 9th International Symposium on System-on-Chip. Tampare, Finland.","DOI":"10.1109\/ISSOC.2010.5625560"},{"key":"3196_CR20","first-page":"359","volume-title":"Principles of numerical taxonomy","author":"RR Sokal","year":"1963","unstructured":"Sokal, R. R., & Sneath, P. H. A. (1963). Principles of numerical taxonomy (p. 359). San Francisco: Freeman."},{"issue":"6","key":"3196_CR21","doi-asserted-by":"crossref","first-page":"719","DOI":"10.1109\/TVLSI.2005.844311","volume":"13","author":"M Tehranipoor","year":"2005","unstructured":"Tehranipoor, M., Nourani, M., & Chakrabarty, K. (2005). Nine coded compression technique for testing embedded cores in SoCs. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 13(6), 719\u2013731.","journal-title":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems"},{"issue":"5","key":"3196_CR22","doi-asserted-by":"crossref","first-page":"327","DOI":"10.1049\/iet-cdt:20070003","volume":"2","author":"AH El-Maleh","year":"2008","unstructured":"El-Maleh, A. H. (2008). An efficient test vector compression technique based on block merging. IET Computers and Digital Techniques, 2(5), 327\u2013335.","journal-title":"IET Computers and Digital Techniques"}],"container-title":["Wireless Personal Communications"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11277-016-3196-x.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s11277-016-3196-x\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11277-016-3196-x.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11277-016-3196-x","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,2]],"date-time":"2022-06-02T19:43:54Z","timestamp":1654199034000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s11277-016-3196-x"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,1,29]]},"references-count":22,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2016,9]]}},"alternative-id":["3196"],"URL":"https:\/\/doi.org\/10.1007\/s11277-016-3196-x","relation":{},"ISSN":["0929-6212","1572-834X"],"issn-type":[{"value":"0929-6212","type":"print"},{"value":"1572-834X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,1,29]]}}}