{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T11:46:45Z","timestamp":1759146405760,"version":"3.33.0"},"reference-count":15,"publisher":"Springer Science and Business Media LLC","issue":"5","license":[{"start":{"date-parts":[[2007,9,1]],"date-time":"2007-09-01T00:00:00Z","timestamp":1188604800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Comput Sci Technol"],"published-print":{"date-parts":[[2007,9]]},"DOI":"10.1007\/s11390-007-9089-4","type":"journal-article","created":{"date-parts":[[2007,9,18]],"date-time":"2007-09-18T00:53:36Z","timestamp":1190076816000},"page":"681-694","source":"Crossref","is-referenced-by-count":1,"title":["Low Cost Scan Test by Test Correlation Utilization"],"prefix":"10.1007","volume":"22","author":[{"given":"Ozgur","family":"Sinanoglu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2007,9,25]]},"reference":[{"key":"9089_CR1","doi-asserted-by":"crossref","unstructured":"Jas A, Touba N. Test vector decompression via cyclical scan chains and its application to testing core-based designs. In Proc. International Test Conference, Washington DC, USA, 1998, pp.458\u2013464.","DOI":"10.1109\/TEST.1998.743186"},{"issue":"3","key":"9089_CR2","doi-asserted-by":"crossref","first-page":"355","DOI":"10.1109\/43.913754","volume":"20","author":"A Chandra","year":"March 2001","unstructured":"Chandra A, Chakrabarty K. System-on-a-chip test-data compression architectures based on Golomb codes. IEEE Trans. Computer-Aided Design, March 2001, 20(3): 355\u2013368.","journal-title":"IEEE Trans. Computer-Aided Design"},{"key":"9089_CR3","doi-asserted-by":"crossref","unstructured":"Bayraktaroglu I, Orailoglu A. Test volume and application time reduction through scan chain concealment. In Proc. Design Automation Conference, Las Vegas, NV, USA, 2001, pp.151\u2013155.","DOI":"10.1145\/378239.378388"},{"key":"9089_CR4","unstructured":"Wunderlich H J, Gerstendorfer S. Minimized power consumption for scan based BIST. In Proc. International Test Conference, Atlantic City, NJ, USA, 1999, pp.85\u201394."},{"key":"9089_CR5","doi-asserted-by":"crossref","unstructured":"Whetsel L. Adapting scan architectures for low power operation. In Proc. International Test Conference, Atlantic City, NJ, USA, 2000, pp.863\u2013872.","DOI":"10.1109\/TEST.2000.894297"},{"key":"9089_CR6","doi-asserted-by":"crossref","unstructured":"Sinanoglu O, Bayraktaroglu I, Orailoglu A. Scan power reduction through test data transition frequency analysis. In Proc. International Test Conference, Baltimore, MD, USA, 2002, pp.844\u2013850.","DOI":"10.1109\/TEST.2002.1041838"},{"key":"9089_CR7","doi-asserted-by":"crossref","unstructured":"Sinanoglu O, Orailoglu A. Modeling scan chain modifications for scan-in test power minimization. In Proc. International Test Conference, Charlotte, USA, 2003, pp.602\u2013611.","DOI":"10.1109\/TEST.2003.1270887"},{"key":"9089_CR8","doi-asserted-by":"crossref","unstructured":"Sinanoglu O, Orailoglu A. Aggressive test power reduction through test stimuli transformation. In Proc. International Conference on Computer Design, San Jose, USA, 2003, pp.542\u2013547.","DOI":"10.1109\/ICCD.2003.1240953"},{"key":"9089_CR9","doi-asserted-by":"crossref","unstructured":"Jas A, Pouya B, Touba N. Virtual scan chains: A means for reducing scan length in cores. In Proc. VLSI Test Symposium, Montreal, Canada, 2000, pp.73\u201378.","DOI":"10.1109\/VTEST.2000.843829"},{"key":"9089_CR10","doi-asserted-by":"crossref","unstructured":"Hamzaoglu I, Patel J H. Reducing test application time for full scan embedded cores. In Proc. International Symposium on Fault-Tolerant Computing, Madison, USA, 1999, pp.260\u2013267.","DOI":"10.1109\/FTCS.1999.781060"},{"issue":"10","key":"9089_CR11","doi-asserted-by":"crossref","first-page":"1604","DOI":"10.1109\/43.256936","volume":"12","author":"H Fujiwara","year":"October 1993","unstructured":"Fujiwara H, Yamamoto A. Parity-scan design to reduce the cost of test application. IEEE Transactions on Computer-Aided Design, October 1993, 12(10): 1604\u20131611.","journal-title":"IEEE Transactions on Computer-Aided Design"},{"key":"9089_CR12","unstructured":"Garey M, Johnson D S. Computers and Intractability: A Guide to the Theory of NP-Completeness. Freeman, 1979."},{"key":"9089_CR13","unstructured":"Brglez F, Fujiwara H. A neutral netlist of 10 combinational benchmark circuits and a target translator in Fortran. In Proc. IEEE Int. Symp. Circuits and Systems, Kyoto, Japan, June 1985, 3(3): 785\u2013794."},{"key":"9089_CR14","doi-asserted-by":"crossref","unstructured":"Brglez F, Bryan D, Kozminski K. Combinational Profiles of Sequential Benchmark Circuits. IEEE Int. Symp. Circuits and Systems, Portland, USA, May 1989, 14(2): 1929\u20131934.","DOI":"10.1109\/ISCAS.1989.100747"},{"key":"9089_CR15","unstructured":"Lee H K, Ha D S. On the generation of test patterns for combinational circuits. Technical Report 12\u201393, Department of Electrical Eng., Virginia Polytechnic Institute and State University."}],"container-title":["Journal of Computer Science and Technology"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11390-007-9089-4.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s11390-007-9089-4\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11390-007-9089-4","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,21]],"date-time":"2025-01-21T01:15:45Z","timestamp":1737422145000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s11390-007-9089-4"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,9]]},"references-count":15,"journal-issue":{"issue":"5","published-print":{"date-parts":[[2007,9]]}},"alternative-id":["9089"],"URL":"https:\/\/doi.org\/10.1007\/s11390-007-9089-4","relation":{},"ISSN":["1000-9000","1860-4749"],"issn-type":[{"type":"print","value":"1000-9000"},{"type":"electronic","value":"1860-4749"}],"subject":[],"published":{"date-parts":[[2007,9]]}}}