{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,23]],"date-time":"2026-03-23T11:09:25Z","timestamp":1774264165248,"version":"3.50.1"},"reference-count":41,"publisher":"Springer Science and Business Media LLC","issue":"11","license":[{"start":{"date-parts":[[2008,10,16]],"date-time":"2008-10-16T00:00:00Z","timestamp":1224115200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sci. China Ser. F-Inf. Sci."],"published-print":{"date-parts":[[2008,11]]},"DOI":"10.1007\/s11432-008-0156-4","type":"journal-article","created":{"date-parts":[[2008,10,15]],"date-time":"2008-10-15T19:21:56Z","timestamp":1224098516000},"page":"1703-1722","source":"Crossref","is-referenced-by-count":9,"title":["A TTCN-3-based protocol testing system and its extension"],"prefix":"10.1007","volume":"51","author":[{"given":"Xia","family":"Yin","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"ZhiLiang","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"ChuanMing","family":"Jing","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"XinGang","family":"Shi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2008,10,16]]},"reference":[{"key":"156_CR1","unstructured":"ETSI: ETSI standard ES 201 873-1 V3.2.1 (2007-03): The Testing and Test Control Notation version 3; Part 1: TTCN-3 Core Language. European Telecommunications Standards Institute (ETSI), Sophia-Antipolis, France. 2007"},{"key":"156_CR2","unstructured":"Piatkowski T F. An engineering discipline for distributed protocol systems. In: Proceedings of IFIP Workshop on Protocol Testing. 1981"},{"key":"156_CR3","volume-title":"Research on theory and application of protocol integrated testing (in Chinese)","author":"X. Yin","year":"2000","unstructured":"Yin X. Research on theory and application of protocol integrated testing (in Chinese). Ph.D Thesis. Beijing: Tsinghua University, 2000"},{"key":"156_CR4","volume-title":"Information Technology, Open Systems Interconnection, Conformance Testing Methodology and Framework","author":"ISO\/IEC: ISO\/IEC 9646.","year":"1991","unstructured":"ISO\/IEC: ISO\/IEC 9646. Information Technology, Open Systems Interconnection, Conformance Testing Methodology and Framework. Geneva: ISO\/IEC, 1991"},{"issue":"3","key":"156_CR5","doi-asserted-by":"crossref","first-page":"375","DOI":"10.1016\/S1389-1286(03)00249-4","volume":"42","author":"J. Grabowski","year":"2003","unstructured":"Grabowski J, Hogrefe D, Rethy G, et al. An introduction to the testing and test control notation (TTCN-3). COMPUT NETW, 2003, 42(3): 375\u2013403","journal-title":"COMPUT NETW"},{"key":"156_CR6","doi-asserted-by":"crossref","first-page":"161","DOI":"10.1007\/978-0-387-35516-0_10","volume-title":"Proc. of 13th IFIP International Conference on Testing of Communicating Systems (TestCom 2000)","author":"J. Grabowski","year":"2000","unstructured":"Grabowski J, Wiles A, Willcock C, et al. On the design of the new testing language TTCN-3. In: Ural H, Probert R L, Bochmann G V, eds. Proc. of 13th IFIP International Conference on Testing of Communicating Systems (TestCom 2000). Ottawa: Kluwer Academic Publishers, 2000. 161\u2013176"},{"key":"156_CR7","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"crossref","first-page":"148","DOI":"10.1007\/3-540-48213-X_10","volume-title":"Proc. of the 10th International SDL Forum (SDL 2001)","author":"P. Baker","year":"2001","unstructured":"Baker P, Rudolph E, Schieferdecker I. Graphical test specification\u2014The graphical format of TTCN-3. In: Reed R, Reed J, eds. Proc. of the 10th International SDL Forum (SDL 2001). Lecture Notes in Computer Science, vol. 2078. Copenhagen: Springer, 2001. 148\u2013167"},{"key":"156_CR8","doi-asserted-by":"crossref","first-page":"425","DOI":"10.1007\/978-0-387-35497-2_29","volume-title":"Proc. of the 14th IFIP International Conference on Testing of Communicating Systems (TestCom 2002)","author":"S. Schulz","year":"2002","unstructured":"Schulz S, Vassiliou-Gioles T. Implementation of TTCN-3 test systems using the TRI. In: Schieferdecker I, K\u00f6nig H, Wolisz A, eds. Proc. of the 14th IFIP International Conference on Testing of Communicating Systems (TestCom 2002). Berlin: Kluwer Academic Publishers, 2002. 425\u2013442"},{"key":"156_CR9","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"crossref","first-page":"95","DOI":"10.1007\/3-540-44830-6_8","volume-title":"Proc. of the 15th IFIP International Conference on Testing of Communicating Systems (TestCom 2003)","author":"I. Schieferdecker","year":"2003","unstructured":"Schieferdecker I, Vassiliou-Gioles T. Realizing distributed TTCN-3 test systems with TCI. In: Hogrefe D, Wiles A, eds. Proc. of the 15th IFIP International Conference on Testing of Communicating Systems (TestCom 2003). Lecture Notes in Computer Science, vol. 2644. Sophia Antipolis: Springer, 2003. 95\u2013109"},{"key":"156_CR10","unstructured":"Telelogic TAU\/Tester, http:\/\/www.telelogic.com"},{"key":"156_CR11","unstructured":"OpenTTCN, http:\/\/www.openttcn.com"},{"key":"156_CR12","unstructured":"Danet\u2019s TTCN-3 Toolbox, http:\/\/www.danet.com"},{"key":"156_CR13","unstructured":"Testing Technology, http:\/\/www.testingtech.de"},{"key":"156_CR14","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"crossref","first-page":"318","DOI":"10.1007\/11430230_22","volume-title":"Proc. of the 17th IFIP International Conference of Testing of Communicating Systems (TestCom 2005)","author":"A. Floch","year":"2005","unstructured":"Floch A, Roudaut F, Sabiguero A, et al. Some lessons from an experiment using TTCN-3 for the RIPng testing. In: Khendek F, Dssouli R, eds. Proc. of the 17th IFIP International Conference of Testing of Communicating Systems (TestCom 2005). Lecture Notes in Computer Science, vol. 3502. Montreal: Springer, 2005. 318\u2013332"},{"key":"156_CR15","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"crossref","first-page":"198","DOI":"10.1007\/11506843_14","volume-title":"Proc. of the 12th International SDL Forum (SDL 2005)","author":"F. N. Noudem","year":"2005","unstructured":"Noudem F N, Viho C. Modeling, verifying and testing mobility protocol from SDL language. In: Prinz A, Reed R, Reed J, eds. Proc. of the 12th International SDL Forum (SDL 2005). Lecture Notes in Computer Science, vol. 3530. Grimstad, Norway: Springer, 2005. 198\u2013209"},{"key":"156_CR16","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"crossref","first-page":"50","DOI":"10.1007\/978-3-540-24704-3_4","volume-title":"Proc. of the 16th IFIP International Conference of Testing of Communicating Systems (TestCom 2004)","author":"S. Dibuz","year":"2004","unstructured":"Dibuz S, Szabo T, Torpis Z. BCMP performance test with TTCN-3 mobile node emulator. In: Groz R, Hierons R M, eds. Proc. of the 16th IFIP International Conference of Testing of Communicating Systems (TestCom 2004), Lecture Notes in Computer Science, vol. 2978. Oxford: Springer, 2004. 50\u201359"},{"key":"156_CR17","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"crossref","first-page":"177","DOI":"10.1007\/11754008_12","volume-title":"Proc. of the 18th IFIP International Conference on Testing of Communicating Systems (TestCom 2006)","author":"G. Din","year":"2006","unstructured":"Din G, Tolea S, Schieferdecker I. Distributed load tests with TTCN-3. In: Uyar M \u00dc, Duale A Y, Fecko M A, eds. Proc. of the 18th IFIP International Conference on Testing of Communicating Systems (TestCom 2006), Lecture Notes in Computer Science, vol. 3964. New York: Springer, 2006. 177\u2013196"},{"key":"156_CR18","first-page":"177","volume-title":"Proc. of the 6th International Symposium on Autonomous Decentralized Systems (ISADS 2003)","author":"P. H. Deussen","year":"2003","unstructured":"Deussen P H, Din G, Schieferdecker I. A TTCN-3 based online test and validation platform for Internet services. In: Proc. of the 6th International Symposium on Autonomous Decentralized Systems (ISADS 2003). Pisa: IEEE Computer Society, 2003. 177\u2013184"},{"key":"156_CR19","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"crossref","first-page":"161","DOI":"10.1007\/11754008_11","volume-title":"Proc. of the 18th IFIP International Conference on Testing of Communicating Systems (TestCom 2006)","author":"A. J. Nyberg","year":"2006","unstructured":"Nyberg A J. Use of TTCN-3 for software module testing. In: Uyar M \u00dc, Duale A Y, Fecko M A, eds. Proc. of the 18th IFIP International Conference on Testing of Communicating Systems (TestCom 2006). Lecture Notes in Computer Science, vol. 3964. New York: Springer, 2006. 161\u2013176"},{"key":"156_CR20","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"crossref","first-page":"98","DOI":"10.1007\/978-3-540-70881-0_11","volume-title":"Proc. of the 6th International Andrei Ershov Memorial Conference\u2014Perspectives of System Informatics (PSI 2006)","author":"S. Blom","year":"2007","unstructured":"Blom S, Dei\u00df T, Ioustinova N, et al. TTCN-3 for distributed testing embedded software. In: Virbitskaite I, Voronkov A, eds. Proc. of the 6th International Andrei Ershov Memorial Conference\u2014Perspectives of System Informatics (PSI 2006). Lecture Notes in Computer Science, vol. 4378. Novosibirsk, Russia: Springer, 2007. 98\u2013111"},{"key":"156_CR21","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"crossref","first-page":"79","DOI":"10.1007\/978-3-540-73614-1_5","volume-title":"Proc. of the 4th International Conference on Detection of Intrusions and Malware, and Vulnerability Assessment (DIMVA 2007)","author":"K. M. Brzezinski","year":"2007","unstructured":"Brzezinski K M. Intrusion detection as passive testing-linguistic support with TTCN-3 (Extended Abstract). In: H\u00e4mmerli B M, Sommer R, eds. Proc. of the 4th International Conference on Detection of Intrusions and Malware, and Vulnerability Assessment (DIMVA 2007). Lecture Notes in Computer Science, vol 4579. Lucerne: Springer, 2007. 79\u201388"},{"key":"156_CR22","volume-title":"Research on TTCN-3 compiling techniques and implementation (in Chinese)","author":"X. H. Qian","year":"2004","unstructured":"Qian X H. Research on TTCN-3 compiling techniques and implementation (in Chinese). Master Thesis. Chengdu: Southwest Jiaotong University, 2004"},{"key":"156_CR23","volume-title":"The design and implementation of test manager in TTCN-3 test system (in Chinese)","author":"Z. H. Sa","year":"2005","unstructured":"Sa Z H. The design and implementation of test manager in TTCN-3 test system (in Chinese). Master Thesis. Huhhot: Inner Mongolia University, 2005"},{"issue":"9","key":"156_CR24","first-page":"1155","volume":"37","author":"F. Jiang","year":"2007","unstructured":"Jiang F, Zhang H. Design and implementation of TTCN-3 test executor using language translation (in Chinese). J Univ Sci Tech China, 2007, 37(9): 1155\u20131158","journal-title":"J Univ Sci Tech China"},{"key":"156_CR25","first-page":"64","volume":"10","author":"H. Zhang","year":"2007","unstructured":"Zhang H, Jiang F. Design and implementation of TTCN-3 test system using C++ language translation (in Chinese). Comput Syst Appl, 2007, 10: 64\u201367","journal-title":"Comput Syst Appl"},{"issue":"9","key":"156_CR26","first-page":"1614","volume":"28","author":"C. D. Huang","year":"2007","unstructured":"Huang C D, Jiang F. TTCN-3 based conformance testing of SIP (in Chinese). J Chin Comput Syst, 2007, 28(9): 1614\u20131618","journal-title":"J Chin Comput Syst"},{"issue":"S1","key":"156_CR27","first-page":"26","volume":"38","author":"J. P. Wu","year":"1998","unstructured":"Wu J P, Chen X H, Hao R B, et al. Protocol integrated test system based on formal technology-PITS (in Chinese). J Tsinghua Univ (Sci Tech), 1998, 38(S1): 26\u201329","journal-title":"J Tsinghua Univ (Sci Tech)"},{"key":"156_CR28","volume-title":"Design and implementation of core modules of IPv6 protocol test system (in Chinese)","author":"Z. L. Wang","year":"2003","unstructured":"Wang Z L. Design and implementation of core modules of IPv6 protocol test system (in Chinese). Master Thesis. Beijing: Tsinghua University, 2003"},{"key":"156_CR29","doi-asserted-by":"crossref","first-page":"407","DOI":"10.1007\/978-0-387-35497-2_28","volume-title":"Proc. of the 14th IFIP International Conference on Testing of Communicating Systems (TestCom 2002)","author":"Z. R. Dai","year":"2002","unstructured":"Dai Z R, Grabowski J, Neukirchen H. TIMEDTTCN-3\u2014a real-time extension for TTCN-3. In: Schieferdecker I, K\u00f6nig H, Wolisz A, eds. Proc. of the 14th IFIP International Conference on Testing of Communicating Systems (TestCom 2002). Berlin: Kluwer Academic Publishers, 2002. 407\u2013424"},{"key":"156_CR30","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"crossref","first-page":"110","DOI":"10.1007\/3-540-44830-6_9","volume-title":"Proc. of the 15th IFIP International Conference on Testing of Communicating Systems (TestCom 2003)","author":"Z. R. Dai","year":"2003","unstructured":"Dai Z R, Grabowski J, Neukirchen H. TIMEDTTCN-3 based graphical real-time test specification. In: Hogrefe D, Wiles A, eds. Proc. of the 15th IFIP International Conference on Testing of Communicating Systems (TestCom 2003). Lecture Notes in Computer Science, vol. 2644. Sophia Antipolis: Springer, 2003. 110\u2013127"},{"key":"156_CR31","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"crossref","first-page":"324","DOI":"10.1007\/11754008_21","volume-title":"Proc. of the 18th IFIP International Conference on Testing of Communicating Systems (TestCom 2006)","author":"Z. L. Wang","year":"2006","unstructured":"Wang Z L, Wu J P, Yin X, et al. Using TIMEDTTCN-3 in interoperability testing for real-time communication systems. In: Uyar M \u00dc, Duale A Y, Fecko M A, eds. Proc. of the 18th IFIP International Conference on Testing of Communicating Systems (TestCom 2006). Lecture Notes in Computer Science, vol. 3964. New York: Springer, 2006. 324\u2013340"},{"key":"156_CR32","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"crossref","first-page":"16","DOI":"10.1007\/978-3-540-30233-9_2","volume-title":"Proc. of FORTE 2004 Workshops on the FormEMC, EPEW, ITM","author":"R. Probert","year":"2004","unstructured":"Probert R, Xiong P, Stepien B. Life-cycle e-commerce testing with OO-TTCN-3. In: N\u00fa\u00f1ez M, Maamar Z, Pelayo F L, et al., eds. Proc. of FORTE 2004 Workshops on the FormEMC, EPEW, ITM. Lecture Notes in Computer Science, vol. 3236. Toledo: Springer, 2004. 16\u201329"},{"key":"156_CR33","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"crossref","first-page":"125","DOI":"10.1007\/978-3-540-75664-4_13","volume-title":"Proc. of the 5th IFIP Workshop on Software Technologies for Future Embedded and Ubiquitous Systems (SEUS 2007)","author":"I. Schieferdecker","year":"2007","unstructured":"Schieferdecker I, Gro\u00dfmann J. Testing embedded control systems with TTCN-3\u2014an overview on TTCN-3 continuous. In: Obermaisser R, Nah Y, Puschner P P, et al., eds. Proc. of the 5th IFIP Workshop on Software Technologies for Future Embedded and Ubiquitous Systems (SEUS 2007). Lecture Notes in Computer Science, vol. 4761. Santorini Island: Springer, 2007. 125\u2013136"},{"key":"156_CR34","first-page":"254","volume-title":"Proc. of the 3rd IEEE International Symposium on High-Assurance Systems Engineering (HASE 1998)","author":"Y. Lei","year":"1998","unstructured":"Lei Y, Tai K C. In-parameter-order: a test generation strategy for pairwise testing. In: Proc. of the 3rd IEEE International Symposium on High-Assurance Systems Engineering (HASE 1998). Washington, DC: Proceedings. IEEE Computer Society, 1998. 254\u2013261"},{"issue":"1","key":"156_CR35","doi-asserted-by":"crossref","first-page":"109","DOI":"10.1109\/32.979992","volume":"28","author":"K. C. Tai","year":"2002","unstructured":"Tai K C, Lei Y. A test generation strategy for pairwise testing. IEEE T Software Eng, 2002, 28(1): 109\u2013111","journal-title":"IEEE T Software Eng"},{"key":"156_CR36","unstructured":"ETSI: ETSI Standard ES 201 873-6 (V3.2.1): Methods for Testing and Specification (MTS); The Testing and Test Control Notation version 3; Part 6: TTCN-3 Control Interface, 2007"},{"key":"156_CR37","unstructured":"ETSI: ETSI Standard ES 201 873-5 (V3.2.1): Methods for Testing and Specification (MTS); The Testing and Test Control Notation version 3; Part 5: TTCN-3 Runtime Interface, 2007"},{"key":"156_CR38","doi-asserted-by":"crossref","unstructured":"Rekhter Y, Li T, Hares S. A Border Gateway Protocol 4 (BGP-4), RFC 4271. 2006","DOI":"10.17487\/rfc4271"},{"key":"156_CR39","doi-asserted-by":"crossref","unstructured":"Bates T, Rekhter Y, Chandra R, et al. Multiprotocol extensions for BGPv4, RFC 2858. 2000","DOI":"10.17487\/rfc2858"},{"key":"156_CR40","doi-asserted-by":"crossref","unstructured":"Moy J. OSPF Version 2, RFC 2328. 1998","DOI":"10.17487\/rfc2328"},{"key":"156_CR41","unstructured":"Zebra-0.94. Available: http:\/\/www.zebra.org"}],"container-title":["Science in China Series F: Information Sciences"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11432-008-0156-4.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s11432-008-0156-4\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11432-008-0156-4","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,5,20]],"date-time":"2023-05-20T13:57:43Z","timestamp":1684591063000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s11432-008-0156-4"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10,16]]},"references-count":41,"journal-issue":{"issue":"11","published-print":{"date-parts":[[2008,11]]}},"alternative-id":["156"],"URL":"https:\/\/doi.org\/10.1007\/s11432-008-0156-4","relation":{},"ISSN":["1009-2757","1862-2836"],"issn-type":[{"value":"1009-2757","type":"print"},{"value":"1862-2836","type":"electronic"}],"subject":[],"published":{"date-parts":[[2008,10,16]]}}}