{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,8,8]],"date-time":"2023-08-08T11:19:46Z","timestamp":1691493586773},"reference-count":6,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2016,12,29]],"date-time":"2016-12-29T00:00:00Z","timestamp":1482969600000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Sci. China Inf. Sci."],"published-print":{"date-parts":[[2017,2]]},"DOI":"10.1007\/s11432-016-0015-7","type":"journal-article","created":{"date-parts":[[2017,1,6]],"date-time":"2017-01-06T00:31:04Z","timestamp":1483662664000},"update-policy":"http:\/\/dx.doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":2,"title":["Testing of 1TnR RRAM array with sneak path technique"],"prefix":"10.1007","volume":"60","author":[{"given":"Xiaole","family":"Cui","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Qiang","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaoxin","family":"Cui","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xinan","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jinfeng","family":"Kang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaoyan","family":"Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2016,12,29]]},"reference":[{"key":"15_CR1","doi-asserted-by":"crossref","first-page":"28","DOI":"10.1109\/MSPEC.2008.4687366","volume":"45","author":"R S Williams","year":"2008","unstructured":"Williams R S. How we found the missing memristor. IEEE Spectrum, 2008, 45: 28\u201335","journal-title":"IEEE Spectrum"},{"key":"15_CR2","first-page":"746","volume-title":"Proceedings of International Electron Devices Meeting (IEDM), Washington","author":"A Chen","year":"2005","unstructured":"Chen A, Haddad S, Wu Y C, et al. Non-volatile resistive switching for advanced memory applications. In: Proceedings of International Electron Devices Meeting (IEDM), Washington, 2005. 746\u2013749"},{"key":"15_CR3","doi-asserted-by":"crossref","first-page":"1692","DOI":"10.1587\/transele.E93.C.1692","volume":"93","author":"J Zhang","year":"2010","unstructured":"Zhang J, Ding Y, Xue X, et al. A 3D RRAM using a stackable multi-layer 1TXR cell. IEICE Trans Electron, 2010, 93: 1692\u20131699","journal-title":"IEICE Trans Electron"},{"key":"15_CR4","doi-asserted-by":"crossref","first-page":"1299","DOI":"10.1109\/JSSC.2015.2402217","volume":"50","author":"C W S Yeh","year":"2015","unstructured":"Yeh C W S, Wong S S. Compact one-transistor-NRRAM array architecture for advanced CMOS technology. Solid-State Circ, 2015, 50: 1299\u20131309","journal-title":"Solid-State Circ"},{"key":"15_CR5","doi-asserted-by":"crossref","first-page":"247","DOI":"10.1109\/TC.2013.206","volume":"64","author":"S Hamdioui","year":"2013","unstructured":"Hamdioui S, Taouil M, Haron N Z. Testing open defects in memristor-based memories. IEEE Trans Comput, 2013, 64: 247\u2013257","journal-title":"IEEE Trans Comput"},{"key":"15_CR6","doi-asserted-by":"crossref","first-page":"180","DOI":"10.1109\/TC.2014.12","volume":"64","author":"C Y Chen","year":"2015","unstructured":"Chen C Y, Shih H C, Wu C W, et al. RRAM defect modeling and failure analysis based on march test and a novel squeeze-search scheme. IEEE Trans Comput, 2015, 64: 180\u2013190","journal-title":"IEEE Trans Comput"}],"container-title":["Science China Information Sciences"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11432-016-0015-7.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s11432-016-0015-7\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11432-016-0015-7.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,25]],"date-time":"2017-06-25T07:25:25Z","timestamp":1498375525000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s11432-016-0015-7"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,12,29]]},"references-count":6,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2017,2]]}},"alternative-id":["15"],"URL":"https:\/\/doi.org\/10.1007\/s11432-016-0015-7","relation":{},"ISSN":["1674-733X","1869-1919"],"issn-type":[{"value":"1674-733X","type":"print"},{"value":"1869-1919","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,12,29]]},"article-number":"029402"}}