{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,7,8]],"date-time":"2024-07-08T00:51:25Z","timestamp":1720399885274},"reference-count":8,"publisher":"Springer Science and Business Media LLC","issue":"6","license":[{"start":{"date-parts":[[2017,9,14]],"date-time":"2017-09-14T00:00:00Z","timestamp":1505347200000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Sci. China Inf. Sci."],"published-print":{"date-parts":[[2018,6]]},"DOI":"10.1007\/s11432-017-9145-2","type":"journal-article","created":{"date-parts":[[2017,9,17]],"date-time":"2017-09-17T23:10:46Z","timestamp":1505689846000},"update-policy":"http:\/\/dx.doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["A study of residual characteristics in floating gate transistors"],"prefix":"10.1007","volume":"61","author":[{"given":"Jia","family":"Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yiqiang","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ruishan","family":"Xin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mao","family":"Ye","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2017,9,14]]},"reference":[{"key":"9145_CR1","first-page":"062402","volume":"57","author":"F. Y. Qiao","year":"2014","unstructured":"Qiao F Y, Pan L Y, Yu X, et al. Total ionizing radiation effects of 2-T SONOS for 130 nm\/4 Mb NOR flash memory technology. Sci China Inf Sci, 2014, 57: 062402","journal-title":"Sci China Inf Sci"},{"key":"9145_CR2","first-page":"39","volume-title":"Proceedings of the 10th Conference on USENIX Security Symposium, Berkeley","author":"P. Gutmann","year":"2001","unstructured":"Gutmann P. Data remanence in semiconductor devices. In: Proceedings of the 10th Conference on USENIX Security Symposium, Berkeley, 2001. 39\u201354"},{"key":"9145_CR3","first-page":"339","volume-title":"Proceedings of the 7th International Workshop on Cryptographic Hardware and Embedded Systems","author":"S. Skorobogatov","year":"2005","unstructured":"Skorobogatov S. Data remanence in flash memory devices. In: Proceedings of the 7th International Workshop on Cryptographic Hardware and Embedded Systems. Berlin: Springer, 2005. 339\u2013353"},{"key":"9145_CR4","volume-title":"National Industrial Security Program","author":"B. S. Waker","year":"1995","unstructured":"Waker B S. National Industrial Security Program. Operating Manual, 1995"},{"key":"9145_CR5","first-page":"158","volume-title":"Proceedings of the 26th Annual Proceedings Reliability Physics Symposium, Monterey","author":"G. Verma","year":"1988","unstructured":"Verma G, Mielke N. Reliability performance of ETOX based flash memories. In: Proceedings of the 26th Annual Proceedings Reliability Physics Symposium, Monterey, 1988. 158\u2013166"},{"key":"9145_CR6","first-page":"042405","volume":"58","author":"L. F. Liu","year":"2015","unstructured":"Liu L F, Wu D, Liu X M,et al. A 1G-cell floatinggate NOR flash memory in 65 nm technology with 100 ns random access time. Sci China Inf Sci, 2015, 58: 042405","journal-title":"Sci China Inf Sci"},{"key":"9145_CR7","doi-asserted-by":"crossref","first-page":"60","DOI":"10.1007\/978-90-481-9431-5","volume-title":"Inside NAND Flash Memories","author":"R. Micheloni","year":"2010","unstructured":"Micheloni R, Crippa L, Marelli A. Inside NAND Flash Memories. New York: Springer Science & Business Media, 2010. 60\u201362"},{"key":"9145_CR8","volume-title":"Atlas User\u2019s Manual","author":"C. Santa","year":"2010","unstructured":"Santa C. Atlas User\u2019s Manual, 2010"}],"container-title":["Science China Information Sciences"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11432-017-9145-2.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s11432-017-9145-2\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11432-017-9145-2.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,9,17]],"date-time":"2017-09-17T23:10:48Z","timestamp":1505689848000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s11432-017-9145-2"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,9,14]]},"references-count":8,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2018,6]]}},"alternative-id":["9145"],"URL":"https:\/\/doi.org\/10.1007\/s11432-017-9145-2","relation":{},"ISSN":["1674-733X","1869-1919"],"issn-type":[{"value":"1674-733X","type":"print"},{"value":"1869-1919","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,9,14]]},"article-number":"069402"}}