{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,29]],"date-time":"2025-11-29T16:22:57Z","timestamp":1764433377651},"reference-count":7,"publisher":"Springer Science and Business Media LLC","issue":"4","license":[{"start":{"date-parts":[[2020,11,19]],"date-time":"2020-11-19T00:00:00Z","timestamp":1605744000000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2020,11,19]],"date-time":"2020-11-19T00:00:00Z","timestamp":1605744000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Sci. China Inf. Sci."],"published-print":{"date-parts":[[2021,4]]},"DOI":"10.1007\/s11432-019-2854-9","type":"journal-article","created":{"date-parts":[[2020,11,23]],"date-time":"2020-11-23T18:14:59Z","timestamp":1606155299000},"update-policy":"http:\/\/dx.doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":4,"title":["Simulations of single event effects on the ferroelectric capacitor-based non-volatile SRAM design"],"prefix":"10.1007","volume":"64","author":[{"given":"Jianjian","family":"Wang","sequence":"first","affiliation":[]},{"given":"Jinshun","family":"Bi","sequence":"additional","affiliation":[]},{"given":"Gang","family":"Liu","sequence":"additional","affiliation":[]},{"given":"Hua","family":"Bai","sequence":"additional","affiliation":[]},{"given":"Kai","family":"Xi","sequence":"additional","affiliation":[]},{"given":"Bo","family":"Li","sequence":"additional","affiliation":[]},{"given":"Sandip","family":"Majumdar","sequence":"additional","affiliation":[]},{"given":"Lanlong","family":"Ji","sequence":"additional","affiliation":[]},{"given":"Ming","family":"Liu","sequence":"additional","affiliation":[]},{"given":"Zhangang","family":"Zhang","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2020,11,19]]},"reference":[{"key":"2854_CR1","doi-asserted-by":"publisher","first-page":"522","DOI":"10.1109\/4.910492","volume":"36","author":"T Miwa","year":"2001","unstructured":"Miwa T, Yamada J, Koike H, et al. NV-SRAM: a nonvolatile SRAM with backup ferroelectric capacitors. IEEE J Solid-State Circ, 2001, 36: 522\u2013527","journal-title":"IEEE J Solid-State Circ"},{"key":"2854_CR2","doi-asserted-by":"publisher","first-page":"280","DOI":"10.1109\/JEDS.2018.2800090","volume":"6","author":"M Kobayashi","year":"2018","unstructured":"Kobayashi M, Ueyama N, Jang K, et al. Experimental demonstration of a nonvolatile SRAM with ferroelectric hfo2 capacitor for normally off application. IEEE J Electron Devices Soc, 2018, 6: 280\u2013285","journal-title":"IEEE J Electron Devices Soc"},{"key":"2854_CR3","first-page":"504","volume":"62","author":"J S Bi","year":"2013","unstructured":"Bi J S, Liu G, Luo J J. Numerical simulation of single-event-transient effects on ultra-thin-body fully-depleted silicon-on-insulator transistor based on 22 nm process node. Acta Physica Sinica, 2013, 62: 504\u2013511","journal-title":"Acta Physica Sinica"},{"key":"2854_CR4","doi-asserted-by":"publisher","first-page":"098501","DOI":"10.1088\/1674-1056\/27\/9\/098501","volume":"27","author":"J S Bi","year":"2018","unstructured":"Bi J S, Xi K, Li B, et al. Heavy ion induced upset errors in 90-nm 64 Mb NOR-type floating-gate flash memory. Chin Phys B, 2018, 27: 098501","journal-title":"Chin Phys B"},{"key":"2854_CR5","unstructured":"Wang J J, Bi J S, Bai H, et al. CMOS-compatible Hf0.5Zr0.5O2-based ferroelectric capacitors for negative capacitance and non-volatile application. In: Proceedings of the 2018 14th IEEE International Conference on Solid-state & Integrated CircuitsTechnology, 2018"},{"key":"2854_CR6","unstructured":"Wang J J, Bi J S, Bai H, et al. Simulation macro-model for Hf0.5Zr0.5O2-based ferroelectric capacitor. In: Proceedings of the 2020 33th IEEE International Conference on Microelectronic Test Structures, 2020"},{"key":"2854_CR7","doi-asserted-by":"publisher","first-page":"3079","DOI":"10.1109\/TNS.2006.882497","volume":"53","author":"S Buchner","year":"2006","unstructured":"Buchner S, McMorrow D. Single-event transients in bipolar linear integrated circuits. IEEE Trans Nucl Sci, 2006, 53: 3079\u20133102","journal-title":"IEEE Trans Nucl Sci"}],"container-title":["Science China Information Sciences"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s11432-019-2854-9.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s11432-019-2854-9\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s11432-019-2854-9.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,20]],"date-time":"2022-05-20T22:31:08Z","timestamp":1653085868000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s11432-019-2854-9"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,11,19]]},"references-count":7,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2021,4]]}},"alternative-id":["2854"],"URL":"https:\/\/doi.org\/10.1007\/s11432-019-2854-9","relation":{},"ISSN":["1674-733X","1869-1919"],"issn-type":[{"value":"1674-733X","type":"print"},{"value":"1869-1919","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,11,19]]},"assertion":[{"value":"5 October 2019","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"8 January 2020","order":2,"name":"revised","label":"Revised","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"18 March 2020","order":3,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"19 November 2020","order":4,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}}],"article-number":"149401"}}