{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,24]],"date-time":"2026-01-24T00:44:59Z","timestamp":1769215499965,"version":"3.49.0"},"reference-count":29,"publisher":"Springer Science and Business Media LLC","issue":"4","license":[{"start":{"date-parts":[[2025,7,18]],"date-time":"2025-07-18T00:00:00Z","timestamp":1752796800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2025,7,18]],"date-time":"2025-07-18T00:00:00Z","timestamp":1752796800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Real-Time Image Proc"],"published-print":{"date-parts":[[2025,8]]},"DOI":"10.1007\/s11554-025-01722-x","type":"journal-article","created":{"date-parts":[[2025,7,18]],"date-time":"2025-07-18T15:32:41Z","timestamp":1752852761000},"update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["A real-time detection method for small-sized solder joint defect detection"],"prefix":"10.1007","volume":"22","author":[{"given":"Li","family":"Ang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Raseeda","family":"Hamzah","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wan","family":"Quanxing","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2025,7,18]]},"reference":[{"key":"1722_CR1","doi-asserted-by":"publisher","first-page":"107924","DOI":"10.1016\/j.optlaseng.2023.107924","volume":"173","author":"Meiyun Chen","year":"2024","unstructured":"Chen, Meiyun, Chen, Jinbiao, Li, Cheng, Wang, Qianxue, Takamasu, Kiyoshi: Defect detection of microled with low distinction based on deep learning. Optics Lasers Eng. 173, 107924 (2024)","journal-title":"Optics Lasers Eng."},{"issue":"1","key":"1722_CR2","doi-asserted-by":"publisher","first-page":"885","DOI":"10.1007\/s40747-023-01180-7","volume":"10","author":"Zhaoguo Li","year":"2024","unstructured":"Li, Zhaoguo, Wei, Xiumei, Hassaballah, M., Li, Yihong, Jiang, Xuesong: A deep learning model for steel surface defect detection. Complex Intell. Syst. 10(1), 885\u2013897 (2024)","journal-title":"Complex Intell. Syst."},{"key":"1722_CR3","doi-asserted-by":"publisher","first-page":"107628","DOI":"10.1016\/j.engappai.2023.107628","volume":"129","author":"Longxin Zhang","year":"2024","unstructured":"Zhang, Longxin, Chen, Jingsheng, Chen, Jianguo, Wen, Zhicheng, Zhou, Xusheng: Ldd-net: lightweight printed circuit board defect detection network fusing multi-scale features. Eng. Appl. Artif. Intell. 129, 107628 (2024)","journal-title":"Eng. Appl. Artif. Intell."},{"key":"1722_CR4","unstructured":"Ren, Shaoqing, He, Kaiming, Girshick, Ross, Sun, Jian: Faster r-cnn: Towards real-time object detection with region proposal networks. Advances in neural information processing systems 28, (2015)"},{"key":"1722_CR5","doi-asserted-by":"crossref","unstructured":"Redmon, Joseph, Divvala, Santosh, Girshick, Ross, Farhadi, Ali: You only look once: Unified, real-time object detection. In: Proceedings of the IEEE conference on computer vision and pattern recognition, pp. 779\u2013788 (2016)","DOI":"10.1109\/CVPR.2016.91"},{"key":"1722_CR6","doi-asserted-by":"crossref","unstructured":"Zhou, Wen, Li, Changyi, Ye, Zhiwei, He, Qiyi, Ming, Zhe, Chen, Jingliang, Wan, Fang, Xiao, Zhenhua: An efficient tiny defect detection method for pcb with improved yolo through a compression training strategy. IEEE Transactions on Instrumentation and Measurement (2024)","DOI":"10.1109\/TIM.2024.3390198"},{"key":"1722_CR7","first-page":"1","volume":"73","author":"Minghao Yuan","year":"2024","unstructured":"Yuan, Minghao, Zhou, Yongbing, Ren, Xiaoyu, Zhi, Hui, Zhang, Jian, Chen, Haojie: Yolo-hmc: an improved method for pcb surface defect detection. IEEE Trans. Instrumentation Measurement 73, 1\u201311 (2024)","journal-title":"IEEE Trans. Instrumentation Measurement"},{"key":"1722_CR8","doi-asserted-by":"crossref","unstructured":"Mamidi, Jaya Sai Sowmya\u00a0Vaishnavi, Sameer, Shaik, Bayana, Jayanag: A light weight version of pcb defect detection system using yolo v4 tiny. In: 2022 International mobile and embedded technology conference (MECON), pp. 441\u2013445. IEEE (2022)","DOI":"10.1109\/MECON53876.2022.9752361"},{"key":"1722_CR9","first-page":"1","volume":"73","author":"Yuan Cao","year":"2023","unstructured":"Cao, Yuan, Ni, Yubin, Zhou, You, Li, Haotian, Huang, Zhao, Yao, Enyi: An auto chip package surface defect detection based on deep learning. IEEE Trans. Instrumentation Measurement 73, 1\u201315 (2023)","journal-title":"IEEE Trans. Instrumentation Measurement"},{"key":"1722_CR10","doi-asserted-by":"crossref","unstructured":"Li, Ang, Hamzah, Raseeda, Rahim, Siti Khatijah Nor\u00a0Abdu, Gao, Yousheng: Yolo algorithm with hybrid attention feature pyramid network for solder joint defect detection. IEEE transactions on components, packaging and manufacturing technology (2024)","DOI":"10.1109\/TCPMT.2024.3409773"},{"issue":"14","key":"1722_CR11","doi-asserted-by":"publisher","first-page":"3060","DOI":"10.3390\/electronics12143060","volume":"12","author":"Jie Wang","year":"2023","unstructured":"Wang, Jie, Lin, Bin, Li, Gaomin, Zhou, Yuezheng, Zhong, Lijun, Li, Xuan, Zhang, Xiaohu: Yolo-xray: a bubble defect detection algorithm for chip x-ray images based on improved yolov5. Electronics 12(14), 3060 (2023)","journal-title":"Electronics"},{"issue":"11","key":"1722_CR12","doi-asserted-by":"publisher","first-page":"1890","DOI":"10.1109\/TCPMT.2022.3224997","volume":"12","author":"Shuaidong Liao","year":"2022","unstructured":"Liao, Shuaidong, Huang, Chunyue, Liang, Ying, Zhang, Huaiquan, Liu, Shoufu: Solder joint defect inspection method based on convnext-yolox. IEEE Trans. Components, Packaging Manuf. Technol. 12(11), 1890\u20131898 (2022)","journal-title":"IEEE Trans. Components, Packaging Manuf. Technol."},{"key":"1722_CR13","doi-asserted-by":"publisher","first-page":"128575","DOI":"10.1016\/j.neucom.2024.128575","volume":"610","author":"Qin Ling","year":"2024","unstructured":"Ling, Qin, Isa, Nor Ashidi Mat., Asaari, Mohd Shahrimie Mohd.: Sdd-net: soldering defect detection network for printed circuit boards. Neurocomputing 610, 128575 (2024)","journal-title":"Neurocomputing"},{"key":"1722_CR14","doi-asserted-by":"crossref","unstructured":"Wang, Xinyao, Xuan, Yubo, Huang, Xuetong, Yan, Qianhua: Yolo-afk: advanced fine-grained object detection for complex solder joints defect. IEEE Access (2024)","DOI":"10.1109\/ACCESS.2024.3495540"},{"key":"1722_CR15","doi-asserted-by":"crossref","unstructured":"Ren, Fei, Fei, Jiajie, Li, Hongsheng, Doma, Bonifacio\u00a0T.: Steel surface defect detection using improved deep learning algorithm: Eca-simsppf-siou-yolov5. IEEE Access (2024)","DOI":"10.1109\/ACCESS.2024.3371584"},{"issue":"1","key":"1722_CR16","doi-asserted-by":"publisher","first-page":"327","DOI":"10.3390\/app15010327","volume":"15","author":"Pei Shi","year":"2024","unstructured":"Shi, Pei, Zhang, Yuyang, Cao, Yunqin, Sun, Jiadong, Chen, Deji, Kuang, Liang: Dvcw-yolo for printed circuit board surface defect detection. Appl. Sci. 15(1), 327 (2024)","journal-title":"Appl. Sci."},{"issue":"1","key":"1722_CR17","doi-asserted-by":"publisher","first-page":"7351","DOI":"10.1038\/s41598-024-57491-3","volume":"14","author":"Gaoshang Xiao","year":"2024","unstructured":"Xiao, Gaoshang, Hou, Shuling, Zhou, Huiying: Pcb defect detection algorithm based on cdi-yolo. Sci. Rep. 14(1), 7351 (2024)","journal-title":"Sci. Rep."},{"issue":"3","key":"1722_CR18","doi-asserted-by":"publisher","first-page":"62","DOI":"10.1007\/s11554-024-01436-6","volume":"21","author":"Hulin Li","year":"2024","unstructured":"Li, Hulin, Li, Jun, Wei, Hanbing, Liu, Zheng, Zhan, Zhenfei, Ren, Qiliang: Slim-neck by gsconv: a lightweight-design for real-time detector architectures. J. Real-Time Image Process. 21(3), 62 (2024)","journal-title":"J. Real-Time Image Process."},{"key":"1722_CR19","doi-asserted-by":"crossref","unstructured":"Ma, Xu, Dai, Xiyang, Bai, Yue, Wang, Yizhou, Fu, Yun: Rewrite the stars. In: Proceedings of the IEEE\/cvf conference on computer vision and pattern recognition, pp. 5694\u20135703 (2024)","DOI":"10.1109\/CVPR52733.2024.00544"},{"key":"1722_CR20","unstructured":"Yang, Lingxiao, Zhang, Ru-Yuan, Li, Lida, Xie, Xiaohua: Simam: A simple, parameter-free attention module for convolutional neural networks. In: International conference on machine learning, pp. 11863\u201311874. PMLR (2021)"},{"key":"1722_CR21","doi-asserted-by":"crossref","unstructured":"Wang, Qilong, Wu, Banggu, Zhu, Pengfei, Li, Peihua, Zuo, Wangmeng, Hu, Qinghua: Eca-net: Efficient channel attention for deep convolutional neural networks. In: Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition, pp. 11534\u201311542 (2020)","DOI":"10.1109\/CVPR42600.2020.01155"},{"key":"1722_CR22","unstructured":"Wang, Jinwang, Xu, Chang, Yang, Wen, Yu, Lei: A normalized gaussian wasserstein distance for tiny object detection. arXiv preprint arXiv:2110.13389 (2021)"},{"key":"1722_CR23","doi-asserted-by":"crossref","unstructured":"Wang, Chien-Yao, Bochkovskiy, Alexey, Liao, Hong-Yuan\u00a0Mark: Yolov7: Trainable bag-of-freebies sets new state-of-the-art for real-time object detectors. In: Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition, pp. 7464\u20137475 (2023)","DOI":"10.1109\/CVPR52729.2023.00721"},{"key":"1722_CR24","unstructured":"Jocher G.: Yolov8. (2023)"},{"key":"1722_CR25","doi-asserted-by":"crossref","unstructured":"Wang, Chien-Yao, Yeh, I-Hau, Liao, Hong-Yuan\u00a0Mark: Yolov9: Learning what you want to learn using programmable gradient information. arXiv preprint arXiv:2402.13616 (2024)","DOI":"10.1007\/978-3-031-72751-1_1"},{"key":"1722_CR26","first-page":"107984","volume":"37","author":"Ao Wang","year":"2024","unstructured":"Wang, Ao., Chen, Hui, Liu, Lihao, Chen, Kai, Lin, Zijia, Han, Jungong, et al.: Yolov10: real-time end-to-end object detection. Adv. Neural Inform. Process. Syst. 37, 107984\u2013108011 (2024)","journal-title":"Adv. Neural Inform. Process. Syst."},{"key":"1722_CR27","unstructured":"Khanam, Rahima, Hussain, Muhammad: Yolov11: An overview of the key architectural enhancements. arXiv preprint arXiv:2410.17725 (2024)"},{"key":"1722_CR28","doi-asserted-by":"crossref","unstructured":"Zhao, Yian, Lv, Wenyu, Xu, Shangliang, Wei, Jinman, Wang, Guanzhong, Dang, Qingqing, Liu, Yi, Chen, Jie: Detrs beat yolos on real-time object detection. In: Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition, pp. 16965\u201316974 (2024)","DOI":"10.1109\/CVPR52733.2024.01605"},{"key":"1722_CR29","doi-asserted-by":"crossref","unstructured":"Tan, Mingxing, Pang, Ruoming, Le, Quoc\u00a0V.: Efficientdet: Scalable and efficient object detection. In: Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition, pp. 10781\u201310790 (2020)","DOI":"10.1109\/CVPR42600.2020.01079"}],"container-title":["Journal of Real-Time Image Processing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s11554-025-01722-x.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s11554-025-01722-x\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s11554-025-01722-x.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,8]],"date-time":"2025-09-08T17:01:07Z","timestamp":1757350867000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s11554-025-01722-x"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,7,18]]},"references-count":29,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2025,8]]}},"alternative-id":["1722"],"URL":"https:\/\/doi.org\/10.1007\/s11554-025-01722-x","relation":{},"ISSN":["1861-8200","1861-8219"],"issn-type":[{"value":"1861-8200","type":"print"},{"value":"1861-8219","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,7,18]]},"assertion":[{"value":"31 March 2025","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"16 June 2025","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"18 July 2025","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"All authors declare that they have no conflict of interest affecting the work reported in this article.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflict of interest"}}],"article-number":"149"}}