{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,6]],"date-time":"2026-03-06T02:23:50Z","timestamp":1772763830505,"version":"3.50.1"},"reference-count":33,"publisher":"Springer Science and Business Media LLC","issue":"5","license":[{"start":{"date-parts":[[2025,9,14]],"date-time":"2025-09-14T00:00:00Z","timestamp":1757808000000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2025,9,14]],"date-time":"2025-09-14T00:00:00Z","timestamp":1757808000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"funder":[{"name":"Jilin Provincial Education Department","award":["JJKH20240742KJ"],"award-info":[{"award-number":["JJKH20240742KJ"]}]},{"name":"Changchun University","award":["2023JBE01L02"],"award-info":[{"award-number":["2023JBE01L02"]}]}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Real-Time Image Proc"],"published-print":{"date-parts":[[2025,10]]},"DOI":"10.1007\/s11554-025-01759-y","type":"journal-article","created":{"date-parts":[[2025,9,14]],"date-time":"2025-09-14T03:19:35Z","timestamp":1757819975000},"update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":3,"title":["Backend-free multi-scale feature fusion network for defect detection in printed circuit board images"],"prefix":"10.1007","volume":"22","author":[{"given":"Yapin","family":"Zhang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ruiqiang","family":"Guo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Min","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2025,9,14]]},"reference":[{"key":"1759_CR1","doi-asserted-by":"crossref","unstructured":"Ghosh S, Sathiaseelan M A M, Asadizanjani N. Deep learning-based approaches for text recognition in PCB optical inspection: A survey[C]\/\/2021 IEEE Physical Assurance and Inspection of Electronics (PAINE). IEEE, 2021: 1\u20138.","DOI":"10.1109\/PAINE54418.2021.9707712"},{"key":"1759_CR2","doi-asserted-by":"publisher","first-page":"557","DOI":"10.1016\/j.jmsy.2023.08.019","volume":"70","author":"Y Zhou","year":"2023","unstructured":"Zhou, Y., Yuan, M., Zhang, J., et al.: Review of vision-based defect detection research and its perspectives for printed circuit board. J. Manuf. Syst. 70, 557\u2013578 (2023)","journal-title":"J. Manuf. Syst."},{"issue":"2","key":"1759_CR3","doi-asserted-by":"publisher","first-page":"95","DOI":"10.3390\/a16020095","volume":"16","author":"A Saberironaghi","year":"2023","unstructured":"Saberironaghi, A., Ren, J., El-Gindy, M.: Defect detection methods for industrial products using deep learning techniques: a review. Algorithms 16(2), 95 (2023)","journal-title":"Algorithms"},{"key":"1759_CR4","first-page":"1","volume":"73","author":"J Shen","year":"2024","unstructured":"Shen, J., Liu, N., Sun, H., et al.: An instrument indication acquisition algorithm based on lightweight deep convolutional neural network and hybrid attention fine-grained features. IEEE Trans. Instrum. Meas. 73, 1\u201316 (2024)","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"1","key":"1759_CR5","doi-asserted-by":"publisher","DOI":"10.1038\/s40494-025-01565-6","volume":"13","author":"J Shen","year":"2025","unstructured":"Shen, J., Liu, N., Sun, H., et al.: An algorithm based on lightweight semantic features for ancient mural element object detection. NPJ Herit. Sci. 13(1), 70 (2025)","journal-title":"NPJ Herit. Sci."},{"key":"1759_CR6","first-page":"1","volume":"71","author":"J Shen","year":"2021","unstructured":"Shen, J., Liu, N., Xu, C., et al.: Finger vein recognition algorithm based on lightweight deep convolutional neural network. IEEE Trans. Instrum. Meas. 71, 1\u201313 (2021)","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"2","key":"1759_CR7","doi-asserted-by":"publisher","first-page":"110","DOI":"10.1049\/trit.2019.0019","volume":"4","author":"R Ding","year":"2019","unstructured":"Ding, R., Dai, L., Li, G., et al.: TDD-net: a tiny defect detection network for printed circuit boards. CAAI Trans. Intell. Technol. 4(2), 110\u2013116 (2019)","journal-title":"CAAI Trans. Intell. Technol."},{"key":"1759_CR8","doi-asserted-by":"crossref","unstructured":"Girshick R. Fast r-cnn[C]\/\/Proceedings of the IEEE international conference on computer vision. 2015: 1440\u20131448.","DOI":"10.1109\/ICCV.2015.169"},{"key":"1759_CR9","unstructured":"Ren S, He K, Girshick R, et al. Faster r-cnn: Towards real-time object detection with region proposal networks. Adv. Neural Inf. Proc. Syst. 2015, 28."},{"key":"1759_CR10","doi-asserted-by":"crossref","unstructured":"Sun P, Zhang R, Jiang Y, et al. Sparse r-cnn: End-to-end object detection with learnable proposals[C]\/\/Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition. 2021: 14454\u201314463.","DOI":"10.1109\/CVPR46437.2021.01422"},{"key":"1759_CR11","unstructured":"Redmon J, Farhadi A. Yolov3: An incremental improvement. arXiv preprint arXiv:1804.02767, 2018."},{"key":"1759_CR12","doi-asserted-by":"crossref","unstructured":"Bolya D, Zhou C, Xiao F, et al. Yolact: Real-time instance segmentation[C]\/\/Proceedings of the IEEE\/CVF international conference on computer vision. 2019: 9157\u20139166.","DOI":"10.1109\/ICCV.2019.00925"},{"key":"1759_CR13","unstructured":"Bochkovskiy A, Wang C Y, Liao H Y M. Yolov4: Optimal speed and accuracy of object detection. arXiv preprint arXiv:2004.10934, 2020."},{"key":"1759_CR14","unstructured":"Mohamed E, Shaker A, El-Sallab A, et al. Insta-yolo: Real-time instance segmentation. arXiv preprint arXiv:2102.06777, 2021."},{"issue":"4","key":"1759_CR15","doi-asserted-by":"publisher","first-page":"400","DOI":"10.1166\/jno.2024.3584","volume":"19","author":"RQ Guo","year":"2024","unstructured":"Guo, R.Q., Zhang, Y.P., Hu, J.Q., et al.: Printed circuit board defect detection algorithm based on yolov5s structure improvement. J. Nanoelectron. Optoelectron. 19(4), 400\u2013407 (2024)","journal-title":"J. Nanoelectron. Optoelectron."},{"key":"1759_CR16","unstructured":"G. Jocher, A. Chaurasia, J. Qiu, YOLO by ultralytics (version 8.0.0), GitHub, https:\/\/github.com\/ultralytics\/ultralytics, 2023."},{"key":"1759_CR17","doi-asserted-by":"crossref","unstructured":"Liu W, Anguelov D, Erhan D, et al. Ssd: Single shot multibox detector[C]\/\/Computer Vision\u2013ECCV 2016: 14th European Conference, Amsterdam, The Netherlands, October 11\u201314, 2016, Proceedings, Part I 14. Springer International Publishing, 2016: 21\u201337.","DOI":"10.1007\/978-3-319-46448-0_2"},{"key":"1759_CR18","doi-asserted-by":"crossref","unstructured":"Tan M, Pang R, Le Q V. Efficientdet: Scalable and efficient object detection[C]\/\/Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition. 2020: 10781\u201310790.","DOI":"10.1109\/CVPR42600.2020.01079"},{"key":"1759_CR19","doi-asserted-by":"crossref","unstructured":"Zhang S, Chi C, Yao Y, et al. Bridging the gap between anchor-based and anchor-free detection via adaptive training sample selection[C]\/\/Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition. 2020: 9759\u20139768.","DOI":"10.1109\/CVPR42600.2020.00978"},{"key":"1759_CR20","doi-asserted-by":"crossref","unstructured":"Duan K, Bai S, Xie L, et al. Centernet: Keypoint triplets for object detection[C]\/\/Proceedings of the IEEE\/CVF international conference on computer vision. 2019: 6569\u20136578.","DOI":"10.1109\/ICCV.2019.00667"},{"key":"1759_CR21","doi-asserted-by":"publisher","first-page":"109908","DOI":"10.1109\/ACCESS.2022.3214306","volume":"10","author":"J Zheng","year":"2022","unstructured":"Zheng, J., Sun, X., Zhou, H., et al.: Printed circuit boards defect detection method based on improved fully convolutional networks. IEEE Access 10, 109908\u2013109918 (2022)","journal-title":"IEEE Access"},{"key":"1759_CR22","doi-asserted-by":"publisher","DOI":"10.1016\/j.rineng.2023.100968","volume":"17","author":"JY Lim","year":"2023","unstructured":"Lim, J.Y., Lim, J.Y., Baskaran, V.M., et al.: A deep context learning based PCB defect detection model with anomalous trend alarming system. Results Eng. 17, 100968 (2023)","journal-title":"Results Eng."},{"issue":"1","key":"1759_CR23","doi-asserted-by":"publisher","first-page":"9805","DOI":"10.1038\/s41598-023-36854-2","volume":"13","author":"K Xia","year":"2023","unstructured":"Xia, K., Lv, Z., Liu, K., et al.: Global contextual attention augmented YOLO with ConvMixer prediction heads for PCB surface defect detection. Sci. Rep. 13(1), 9805 (2023)","journal-title":"Sci. Rep."},{"issue":"3","key":"1759_CR24","doi-asserted-by":"publisher","first-page":"1409","DOI":"10.1007\/s10845-021-01864-2","volume":"34","author":"F Huang","year":"2023","unstructured":"Huang, F., Wang, B., Li, Q., et al.: Texture surface defect detection of plastic relays with an enhanced feature pyramid network. J. Intell. Manuf. 34(3), 1409\u20131425 (2023)","journal-title":"J. Intell. Manuf."},{"issue":"9","key":"1759_CR25","doi-asserted-by":"publisher","first-page":"9667","DOI":"10.1109\/TII.2022.3233654","volume":"19","author":"S Ma","year":"2023","unstructured":"Ma, S., Song, K., Niu, M., et al.: Shape-consistent one-shot unsupervised domain adaptation for rail surface defect segmentation. IEEE Trans. Ind. Inform. 19(9), 9667\u20139679 (2023)","journal-title":"IEEE Trans. Ind. Inform."},{"key":"1759_CR26","doi-asserted-by":"crossref","unstructured":"Zhao Y, Lv W, Xu S, et al. Detrs beat yolos on real-time object detection[C]\/\/Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition. 2024: 16965\u201316974.","DOI":"10.1109\/CVPR52733.2024.01605"},{"key":"1759_CR27","doi-asserted-by":"publisher","DOI":"10.1016\/j.imavis.2024.105057","volume":"147","author":"M Kang","year":"2024","unstructured":"Kang, M., Ting, C.M., Ting, F.F., et al.: Asf-yolo: a novel yolo model with attentional scale sequence fusion for cell instance segmentation. Image Vis. Comput. 147, 105057 (2024)","journal-title":"Image Vis. Comput."},{"key":"1759_CR28","doi-asserted-by":"crossref","unstructured":"Hou Q, Zhou D, Feng J. Coordinate attention for efficient mobile network design[C]\/\/Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition. 2021: 13713\u201313722.","DOI":"10.1109\/CVPR46437.2021.01350"},{"key":"1759_CR29","doi-asserted-by":"crossref","unstructured":"Chen C, Liu M Y, Tuzel O, et al. R-CNN for small object detection[C]\/\/Asian conference on computer vision. Cham: Springer International Publishing, 2016: 214\u2013230.","DOI":"10.1007\/978-3-319-54193-8_14"},{"issue":"11","key":"1759_CR30","doi-asserted-by":"publisher","first-page":"1958","DOI":"10.1109\/TPAMI.2008.128","volume":"30","author":"A Torralba","year":"2008","unstructured":"Torralba, A., Fergus, R., Freeman, W.T.: 80 million tiny images: a large data set for nonparametric object and scene recognition. IEEE Trans. Pattern Anal. Mach. Intell. 30(11), 1958\u20131970 (2008)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"1759_CR31","unstructured":"Tian Y, Ye Q, Doermann D. Yolov12: Attention-centric real-time object detectors[J]. arXiv preprint arXiv:2502.12524, 2025."},{"issue":"1","key":"1759_CR32","doi-asserted-by":"publisher","first-page":"7351","DOI":"10.1038\/s41598-024-57491-3","volume":"14","author":"G Xiao","year":"2024","unstructured":"Xiao, G., Hou, S., Zhou, H.: PCB defect detection algorithm based on CDI-YOLO. Sci. Rep. 14(1), 7351 (2024)","journal-title":"Sci. Rep."},{"key":"1759_CR33","first-page":"51094","volume":"36","author":"C Wang","year":"2023","unstructured":"Wang, C., He, W., Nie, Y., et al.: Gold-YOLO: Efficient object detector via gather-and-distribute mechanism. Adv. Neural. Inf. Process. Syst. 36, 51094\u201351112 (2023)","journal-title":"Adv. Neural. Inf. Process. Syst."}],"container-title":["Journal of Real-Time Image Processing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s11554-025-01759-y.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s11554-025-01759-y\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s11554-025-01759-y.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,6]],"date-time":"2025-10-06T14:39:49Z","timestamp":1759761589000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s11554-025-01759-y"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,9,14]]},"references-count":33,"journal-issue":{"issue":"5","published-print":{"date-parts":[[2025,10]]}},"alternative-id":["1759"],"URL":"https:\/\/doi.org\/10.1007\/s11554-025-01759-y","relation":{},"ISSN":["1861-8200","1861-8219"],"issn-type":[{"value":"1861-8200","type":"print"},{"value":"1861-8219","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,9,14]]},"assertion":[{"value":"1 July 2025","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"26 August 2025","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"14 September 2025","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The authors declare no competing interests.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflict of interest"}}],"article-number":"187"}}