{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,19]],"date-time":"2026-05-19T15:09:30Z","timestamp":1779203370932,"version":"3.51.4"},"reference-count":35,"publisher":"Springer Science and Business Media LLC","issue":"6","license":[{"start":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T00:00:00Z","timestamp":1760140800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T00:00:00Z","timestamp":1760140800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Real-Time Image Proc"],"published-print":{"date-parts":[[2025,12]]},"DOI":"10.1007\/s11554-025-01780-1","type":"journal-article","created":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T04:53:10Z","timestamp":1760158390000},"update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["YOLOv8n-SSSL: a lightweight and efficient model for textile defect detection"],"prefix":"10.1007","volume":"22","author":[{"given":"Zewei","family":"Zhao","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yangyi","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaotong","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaotie","family":"Ma","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2025,10,11]]},"reference":[{"key":"1780_CR1","doi-asserted-by":"crossref","first-page":"5947","DOI":"10.1109\/ACCESS.2017.2675940","volume":"5","author":"L Tong","year":"2017","unstructured":"Tong, L., Wong, W.K., Kwong, C.K.: Fabric defect detection for apparel industry: a nonlocal sparse representation approach. IEEE Access 5, 5947\u20135964 (2017)","journal-title":"IEEE Access"},{"key":"1780_CR2","doi-asserted-by":"publisher","DOI":"10.1007\/s11633-010-0086-7","author":"L-W Han","year":"2010","unstructured":"Han, L.-W., Xu, D.: Statistic learning-based defect detection for twill fabrics. Int. J. Autom. Comput. (2010). https:\/\/doi.org\/10.1007\/s11633-010-0086-7","journal-title":"Int. J. Autom. Comput."},{"key":"1780_CR3","doi-asserted-by":"publisher","first-page":"1267","DOI":"10.1109\/28.871274","volume":"36","author":"C-H Chan","year":"2000","unstructured":"Chan, C.-H., Pang, G.K.: Fabric defect detection by Fourier analysis. IEEE Trans. Ind. Appl. 36, 1267\u20131276 (2000)","journal-title":"IEEE Trans. Ind. Appl."},{"key":"1780_CR4","doi-asserted-by":"publisher","DOI":"10.1007\/s00371-020-02040-y","author":"G Liu","year":"2022","unstructured":"Liu, G., Li, F.: Fabric defect detection based on low-rank decomposition with structural constraints. Vis. Comput. (2022). https:\/\/doi.org\/10.1007\/s00371-020-02040-y","journal-title":"Vis. Comput."},{"key":"1780_CR5","doi-asserted-by":"publisher","DOI":"10.1108\/IJCST-12-2015-0134","author":"C Li","year":"2016","unstructured":"Li, C., Yang, R., Liu, Z., Gao, G., Liu, Q.: Fabric defect detection via learned dictionary-based visual saliency. Int. J. Cloth. Sci. Technol. (2016). https:\/\/doi.org\/10.1108\/IJCST-12-2015-0134","journal-title":"Int. J. Cloth. Sci. Technol."},{"key":"1780_CR6","doi-asserted-by":"crossref","unstructured":"Girshick, R., Donahue, J., Darrell, T., Malik, J.: Rich feature hierarchies for accurate object detection and semantic segmentation. In: Proceedings of the IEEE conference on computer vision and pattern recognition, pp. 580\u2013587 (2014)","DOI":"10.1109\/CVPR.2014.81"},{"key":"1780_CR7","doi-asserted-by":"crossref","unstructured":"Girshick, R.: Fast R-CNN. In: Proceedings of the IEEE international conference on computer vision, pp. 1440\u20131448 (2015)","DOI":"10.1109\/ICCV.2015.169"},{"issue":"6","key":"1780_CR8","doi-asserted-by":"publisher","first-page":"1137","DOI":"10.1109\/TPAMI.2016.2577031","volume":"39","author":"S Ren","year":"2016","unstructured":"Ren, S., He, K., Girshick, R., Sun, J.: Faster R-CNN: towards real-time object detection with region proposal networks. IEEE Trans. Pattern Anal. Mach. Intell. 39(6), 1137\u20131149 (2016)","journal-title":"IEEE Trans. Pattern Anal. Mach"},{"key":"1780_CR9","doi-asserted-by":"crossref","unstructured":"Liu, W., Anguelov, D., Erhan, D., Szegedy, C., Reed, S., Fu, C.-Y., Berg, A. C.: SSD: single shot multibox detector. In: Computer Vision\u2014ECCV 2016: 14th European Conference, Amsterdam, The Netherlands, October 11\u201314, 2016, Proceedings, Part I 14, pp. 21\u201337 (2016)","DOI":"10.1007\/978-3-319-46448-0_2"},{"key":"1780_CR10","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2023.101882","author":"H Shang","year":"2023","unstructured":"Shang, H., Sun, C., Liu, J., Chen, X., Yan, R.: Defect-aware transformer network for intelligent visual surface defect detection. Adv. Eng. Inform. (2023). https:\/\/doi.org\/10.1016\/j.aei.2023.101882","journal-title":"Adv. Eng. Inform."},{"key":"1780_CR11","doi-asserted-by":"publisher","first-page":"109681","DOI":"10.1016\/j.cie.2023.109681","volume":"185","author":"S Zhao","year":"2023","unstructured":"Zhao, S., Zhong, R.Y., Wang, J., Xu, C., Zhang, J.: Unsupervised fabric defects detection based on spatial domain saliency and features clustering. Comput. Ind. Eng. 185, 109681 (2023). https:\/\/doi.org\/10.1016\/j.cie.2023.109681 .","journal-title":"Comput. Ind. Eng."},{"issue":"2","key":"1780_CR12","first-page":"123","volume":"40","author":"Z Zhang","year":"2025","unstructured":"Zhang, Z., Huang, T., Zhang, W., Yang, Y., Yu, Q. J.: DGHR-YOLO: fabric defect detection based on High-level Screening-feature Pyramid Networks and deformable convolution. Nondestruct. Test. Eval. 40(2), 123\u2013138 (2025)","journal-title":"Nondestruct. Test. Eval"},{"issue":"2","key":"1780_CR13","doi-asserted-by":"publisher","first-page":"340","DOI":"10.1108\/IJCST-12-2023-0187","volume":"37","author":"K Qi","year":"2025","unstructured":"Qi, K., Guo, Y., Zhou, J.: Self-supervised learning fabric defect segmentation using anomaly generation. Int. J. Cloth. Sci. Technol. 37(2), 340\u2013354 (2025)","journal-title":"Int. J. Cloth. Sci. Technol."},{"key":"1780_CR14","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-024-02387-2","author":"S Zhao","year":"2025","unstructured":"Zhao, S., Zhong, R.Y., Xu, C., Wang, J., Zhang, J.: A dynamic inference network (DI-Net) for online fabric defect detection in smart manufacturing. J. Intell. Manuf. (2025). https:\/\/doi.org\/10.1007\/s10845-024-02387-2","journal-title":"J. Intell. Manuf."},{"key":"1780_CR15","doi-asserted-by":"publisher","first-page":"5205","DOI":"10.1007\/s00371-024-03716-5","volume":"41","author":"Z Zhao","year":"2025","unstructured":"Zhao, Z., Ma, X., Shi, Y., Yang, X.: Multi-scale defect detection for plaid fabrics using scale sequence feature fusion and triple encoding. Vis. Comput. 41, 5205\u20135221 (2024)","journal-title":"Vis. Comput"},{"key":"1780_CR16","doi-asserted-by":"crossref","unstructured":"Hu, J., Shen, L., Sun, G.: Squeeze-and-excitation networks. In: Proceedings of the IEEE conference on computer vision and pattern recognition, pp. 7132\u20137141 (2018)","DOI":"10.1109\/CVPR.2018.00745"},{"key":"1780_CR17","doi-asserted-by":"crossref","unstructured":"Woo, S., Park, J., Lee, J.-Y., Kweon, I.S.: CBAM: convolutional block attention module. In: Proceedings of the European conference on computer vision (ECCV), pp. 3\u201319 (2018)","DOI":"10.1007\/978-3-030-01234-2_1"},{"key":"1780_CR18","unstructured":"Yang, L., Zhang, R.-Y., Li, L., Xie, X.: SimAM: a simple, parameter-free attention module for convolutional neural networks. In International conference on machine learning, pp. 11863\u201311874 (2021)"},{"key":"1780_CR19","doi-asserted-by":"crossref","unstructured":"Ma, X., Dai, X., Bai, Y., Wang, Y., Fu, Y.: Rewrite the stars. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition, pp. 5694\u20135703 (2024)","DOI":"10.1109\/CVPR52733.2024.00544"},{"key":"1780_CR20","doi-asserted-by":"crossref","unstructured":"Zheng, Z., Wang, P., Liu, W., Li, J., Ye, R., Ren, D.: Distance-IoU loss: faster and better learning for bounding box regression. In: Proceedings of the AAAI conference on artificial intelligence, pp. 12993\u201313000 (2020)","DOI":"10.1609\/aaai.v34i07.6999"},{"key":"1780_CR21","doi-asserted-by":"publisher","unstructured":"Gevorgyan, Z.: SIoU loss: more powerful learning for bounding box regression. arXiv preprint,\narXiv:2205.12740 (2022). https:\/\/doi.org\/10.48550\/arXiv.2205.12740","DOI":"10.48550\/arXiv.2205.12740"},{"key":"1780_CR22","doi-asserted-by":"publisher","DOI":"10.1007\/s40747-023-01317-8","author":"X Li","year":"2024","unstructured":"Li, X., Zhu, Y.J.C.: A real-time and accurate convolutional neural network for fabric defect detection. Complex Intell. Syst. (2024). https:\/\/doi.org\/10.1007\/s40747-023-01317-8","journal-title":"Complex Intell. Syst."},{"key":"1780_CR23","doi-asserted-by":"publisher","DOI":"10.1108\/IJCST-11-2021-0165","author":"S Zhou","year":"2023","unstructured":"Zhou, S., Zhao, J., Shi, Y.S., Wang, Y.F., Mei, S.Q.: Research on improving YOLOv5s algorithm for fabric defect detection. Int. J. Cloth. Sci. Technol. (2023). https:\/\/doi.org\/10.1108\/IJCST-11-2021-0165","journal-title":"Int. J. Cloth. Sci. Technol."},{"key":"1780_CR24","doi-asserted-by":"crossref","unstructured":"Selvaraju, R.R., Cogswell, M., Das, A., Vedantam, R., Parikh, D., Batra, D.: Grad-CAM: visual explanations from deep networks via gradient-based localization. In: Proceedings of the IEEE international conference on computer vision, pp. 618\u2013626 (2017)","DOI":"10.1109\/ICCV.2017.74"},{"key":"1780_CR25","doi-asserted-by":"crossref","unstructured":"Duan, K., Bai, S., Xie, L., Qi, H., Huang, Q., Tian, Q.: CenterNet: keypoint triplets for object detection. In: Proceedings of the IEEE\/CVF international conference on computer vision, pp. 6569\u20136578 (2019)","DOI":"10.1109\/ICCV.2019.00667"},{"key":"1780_CR26","doi-asserted-by":"crossref","unstructured":"Lin, T.-Y., Goyal, P., Girshick, R., He, K., Doll\u00e1r, P.: Focal loss for dense object detection. In: Proceedings of the IEEE international conference on computer vision, pp. 2980\u20132988 (2017)","DOI":"10.1109\/ICCV.2017.324"},{"key":"1780_CR27","doi-asserted-by":"crossref","unstructured":"Tan, M., Pang, R., Le, Q.V.: EfficientDet: scalable and efficient object detection. In: Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition, pp. 10781\u201310790 (2020)","DOI":"10.1109\/CVPR42600.2020.01079"},{"key":"1780_CR28","doi-asserted-by":"crossref","unstructured":"Zhu, X., Lyu, S., Wang, X., Zhao, Q.: TPH-YOLOv5: improved YOLOv5 based on transformer prediction head for object detection on drone-captured scenarios. In: Proceedings of the IEEE\/CVF international conference on computer vision, pp. 2778\u20132788 (2021)","DOI":"10.1109\/ICCVW54120.2021.00312"},{"key":"1780_CR29","doi-asserted-by":"crossref","unstructured":"Wang, C.-Y., Bochkovskiy, A., Liao, H.-Y. M.: YOLOv7: trainable bag-of-freebies sets new state-of-the-art for real-time object detectors. In: Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition, pp. 7464\u20137475 (2023)","DOI":"10.1109\/CVPR52729.2023.00721"},{"key":"1780_CR30","doi-asserted-by":"crossref","unstructured":"Zhao, Y., Lv, W., Xu, S., Wei, J., Wang, G., Dang, Q., Liu, Y., Chen, J.: DETRs beat YOLOs on real-time object detection. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition, pp. 16965\u201316974 (2024)","DOI":"10.1109\/CVPR52733.2024.01605"},{"key":"1780_CR31","unstructured":"Wang, A., Chen, H., Liu, L., Chen, K., Lin, Z., Han, J., Ding, G.: YOLOv10: real-time end-to-end object detection.In Advances in Neural Information Processing Systems 37 (NeurIPS 2024) (2024)"},{"key":"1780_CR32","doi-asserted-by":"publisher","unstructured":"Khanam, R., Hussain, M. J. a. P. A.: YOLOv11: an overview of the key architectural enhancements. arXiv preprint, arXiv:2410.17725 (2024) https:\/\/doi.org\/10.48550\/arXiv.2410.17725","DOI":"10.48550\/arXiv.2410.17725"},{"key":"1780_CR33","doi-asserted-by":"publisher","DOI":"10.1007\/s10921-024-01084-7","author":"C Xu","year":"2024","unstructured":"Xu, C., Li, J., Li, X.: A highly efficient and lightweight detection method for steel surface defect. J. Nondestruct. Eval. (2024). https:\/\/doi.org\/10.1007\/s10921-024-01084-7","journal-title":"J. Nondestruct. Eval."},{"key":"1780_CR34","doi-asserted-by":"publisher","first-page":"99570","DOI":"10.1109\/ACCESS.2024.3429555","volume":"12","author":"H Kong","year":"2024","unstructured":"Kong, H., You, C.: Improved steel surface defect detection algorithm based on YOLOv8. IEEE Access 12, 99570\u201399577 (2024)","journal-title":"IEEE Access"},{"key":"1780_CR35","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2024.3359218","author":"L Zuo","year":"2024","unstructured":"Zuo, L., Su, S., Fan, S., Li, H., Wen, L., Li, X., Xiong, K.: A new dual-branch network with global information for the surface defect detection on solar PV wafer. IEEE Sens. J. (2024). https:\/\/doi.org\/10.1109\/JSEN.2024.3359218","journal-title":"IEEE Sens. J."}],"container-title":["Journal of Real-Time Image Processing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s11554-025-01780-1.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s11554-025-01780-1\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s11554-025-01780-1.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,10]],"date-time":"2025-11-10T07:04:22Z","timestamp":1762758262000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s11554-025-01780-1"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10,11]]},"references-count":35,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2025,12]]}},"alternative-id":["1780"],"URL":"https:\/\/doi.org\/10.1007\/s11554-025-01780-1","relation":{},"ISSN":["1861-8200","1861-8219"],"issn-type":[{"value":"1861-8200","type":"print"},{"value":"1861-8219","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,10,11]]},"assertion":[{"value":"11 July 2025","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"29 September 2025","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"11 October 2025","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The authors declare no competing interests.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflict of interest"}},{"value":"This study does not contain any studies with human or animal subjects performed by any of the authors.","order":3,"name":"Ethics","group":{"name":"EthicsHeading","label":"Ethical approval"}}],"article-number":"199"}}