{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,22]],"date-time":"2026-07-22T16:12:42Z","timestamp":1784736762525,"version":"3.55.0"},"reference-count":53,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2018,2,15]],"date-time":"2018-02-15T00:00:00Z","timestamp":1518652800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Front. Comput. Sci."],"published-print":{"date-parts":[[2018,4]]},"DOI":"10.1007\/s11704-017-6015-y","type":"journal-article","created":{"date-parts":[[2018,2,15]],"date-time":"2018-02-15T09:56:03Z","timestamp":1518688563000},"page":"280-296","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":34,"title":["Combined classifier for cross-project defect prediction: an extended empirical study"],"prefix":"10.1007","volume":"12","author":[{"given":"Yun","family":"Zhang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"David","family":"Lo","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xin","family":"Xia","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jianling","family":"Sun","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2018,2,15]]},"reference":[{"key":"6015_CR1","first-page":"531","volume-title":"Proceedings of the 30th International Conference on Software Engineering","author":"T Zimmermann","year":"2008","unstructured":"Zimmermann T, Nagappan N. Predicting defects using network analysis on dependency graphs. In: Proceedings of the 30th International Conference on Software Engineering. 2008, 531\u2013540"},{"issue":"4","key":"6015_CR2","doi-asserted-by":"publisher","first-page":"375","DOI":"10.1007\/s10515-010-0069-5","volume":"17","author":"T Menzies","year":"2010","unstructured":"Menzies T, Milton Z, Turhan B, Cukic B, Jiang Y, Bener A. Defect prediction from static code features: current results, limitations, new approaches. Automated Software Engineering, 2010, 17(4): 375\u2013407","journal-title":"Automated Software Engineering"},{"key":"6015_CR3","first-page":"279","volume-title":"Proceedings of the 28th IEEE International Conference on Automated Software Engineering","author":"T Jiang","year":"2013","unstructured":"Jiang T, Tan L, Kim S. Personalized defect prediction. In: Proceedings of the 28th IEEE International Conference on Automated Software Engineering. 2013, 279\u2013289"},{"issue":"4","key":"6015_CR4","doi-asserted-by":"publisher","first-page":"485","DOI":"10.1109\/TSE.2008.35","volume":"34","author":"S Lessmann","year":"2008","unstructured":"Lessmann S, Baesens B, Mues C, Pietsch S. Benchmarking classification models for software defect prediction: a proposed framework and novel findings. IEEE Transactions on Software Engineering, 2008, 34(4): 485\u2013496","journal-title":"IEEE Transactions on Software Engineering"},{"issue":"6","key":"6015_CR5","doi-asserted-by":"publisher","first-page":"852","DOI":"10.1109\/TSE.2010.51","volume":"36","author":"Y Liu","year":"2010","unstructured":"Liu Y, Khoshgoftaar T M, Seliya N. Evolutionary optimization of software quality modeling with multiple repositories. IEEE Transactions on Software Engineering, 2010, 36(6): 852\u2013864","journal-title":"IEEE Transactions on Software Engineering"},{"issue":"4\u20135","key":"6015_CR6","doi-asserted-by":"publisher","first-page":"531","DOI":"10.1007\/s10664-011-9173-9","volume":"17","author":"M D\u2019Ambros","year":"2012","unstructured":"D\u2019Ambros M, Lanza M, Robbes R. Evaluating defect prediction approaches: a benchmark and an extensive comparison. Empirical Software Engineering, 2012, 17(4\u20135): 531\u2013577","journal-title":"Empirical Software Engineering"},{"key":"6015_CR7","doi-asserted-by":"crossref","first-page":"452","DOI":"10.1145\/1134285.1134349","volume-title":"Proceedings of the 28th International Conference on Software Engineering","author":"N Nagappan","year":"2006","unstructured":"Nagappan N, Ball T, Zeller A. Mining metrics to predict component failures. In: Proceedings of the 28th International Conference on Software Engineering. 2006, 452\u2013461"},{"issue":"5","key":"6015_CR8","doi-asserted-by":"publisher","first-page":"316","DOI":"10.1109\/TSE.2007.1001","volume":"33","author":"B A Kitchenham","year":"2007","unstructured":"Kitchenham B A, Mendes E, Travassos G H. Cross versus withincompany cost estimation studies: a systematic review. IEEE Transactions on Software Engineering, 2007, 33(5): 316\u2013329","journal-title":"IEEE Transactions on Software Engineering"},{"key":"6015_CR9","first-page":"91","volume-title":"Proceedings of the European Software Engineering Conference and the ACM Sigsoft International Symposium on Foundations of Software Engineering","author":"T Zimmermann","year":"2009","unstructured":"Zimmermann T, Nagappan N, Gall H, Giger E, Murphy B. Crossproject defect prediction: a large scale experiment on data vs. domain vs. process. In: Proceedings of the European Software Engineering Conference and the ACM Sigsoft International Symposium on Foundations of Software Engineering. 2009, 91\u2013100"},{"issue":"5","key":"6015_CR10","doi-asserted-by":"publisher","first-page":"540","DOI":"10.1007\/s10664-008-9103-7","volume":"14","author":"B Turhan","year":"2009","unstructured":"Turhan B, Menzies T, Bener A B, Di Stefano J. On the relative value of cross-company and within-company data for defect prediction. Empirical Software Engineering, 2009, 14(5): 540\u2013578","journal-title":"Empirical Software Engineering"},{"key":"6015_CR11","first-page":"164","volume-title":"Proceedings of Software Evolution Week-IEEE Conference on Software Maintenance, Reengineering and Reverse Engineering","author":"A Panichella","year":"2014","unstructured":"Panichella A, Oliveto R, De Lucia A. Cross-project defect prediction models: L\u2019union fait la force. In: Proceedings of Software Evolution Week-IEEE Conference on Software Maintenance, Reengineering and Reverse Engineering. 2014, 164\u2013173"},{"key":"6015_CR12","first-page":"215","volume-title":"Proceedings of the 18th IEEE International Symposium on Software Reliability","author":"E Arisholm","year":"2007","unstructured":"Arisholm E, Briand L C, Fuglerud M. Data mining techniques for building fault-proneness models in telecom java software. In: Proceedings of the 18th IEEE International Symposium on Software Reliability. 2007, 215\u2013224"},{"key":"6015_CR13","first-page":"432","volume-title":"Proceedings of the International Conference on Software Engineering","author":"F Rahman","year":"2013","unstructured":"Rahman F, Devanbu P. How, and why, process metrics are better. In: Proceedings of the International Conference on Software Engineering. 2013, 432\u2013441"},{"key":"6015_CR14","first-page":"61","volume-title":"Proceedings of the 20th ACM SIGSOFT International Symposium on the Foundations of Software Engineering","author":"F Rahman","year":"2012","unstructured":"Rahman F, Posnett D, Devanbu P. Recalling the imprecision of crossproject defect prediction. In: Proceedings of the 20th ACM SIGSOFT International Symposium on the Foundations of Software Engineering. 2012, 61"},{"key":"6015_CR15","first-page":"147","volume-title":"Proceedings of the 9th Joint Meeting on Foundations of Software Engineering","author":"F Rahman","year":"2013","unstructured":"Rahman F, Posnett D, Herraiz I, Devanbu P. Sample size vs. bias in defect prediction. In: Proceedings of the 9th Joint Meeting on Foundations of Software Engineering. 2013, 147\u2013157"},{"key":"6015_CR16","first-page":"409","volume-title":"Proceedings of the 10th IEEEWorking Conference on Mining Software Repositories","author":"F Peters","year":"2013","unstructured":"Peters F, Menzies T, Marcus A. Better cross company defect prediction. In: Proceedings of the 10th IEEEWorking Conference on Mining Software Repositories. 2013, 409\u2013418"},{"key":"6015_CR17","first-page":"382","volume-title":"Proceedings of the International Conference on Software Engineering","author":"J Nam","year":"2013","unstructured":"Nam J, Pan S J, Kim S. Transfer defect learning. In: Proceedings of the International Conference on Software Engineering. 2013, 382\u2013391"},{"key":"6015_CR18","first-page":"252","volume-title":"Proceedings of the 6th IEEE International Conference on Software Testing, Verification and Validation","author":"G Canfora","year":"2013","unstructured":"Canfora G, De Lucia A, Di Penta M, Oliveto R, Panichella A, Panichella S. Multi-objective cross-project defect prediction. In: Proceedings of the 6th IEEE International Conference on Software Testing, Verification and Validation. 2013, 252\u2013261"},{"key":"6015_CR19","volume-title":"Modern Information Retrieval","author":"R Baeza-Yates","year":"1999","unstructured":"Baeza-Yates R, Ribeiro-Neto B. Modern Information Retrieval. Vol 463. New York: ACM Press, 1999"},{"key":"6015_CR20","volume-title":"Proceedings of the International Communication of Association for Computing Machinery Conference","author":"H I t i retrieval Sch\u00fctze","year":"2008","unstructured":"Sch\u00fctze H. Introduction to information retrieval. In: Proceedings of the International Communication of Association for Computing Machinery Conference. 2008"},{"key":"6015_CR21","first-page":"264","volume-title":"Proceedings of the 39th IEEE Annual Computer Software and Applications Conference","author":"Y Zhang","year":"2015","unstructured":"Zhang Y, Lo D, Xia X, Sun J. An empirical study of classifier combination for cross-project defect prediction. In: Proceedings of the 39th IEEE Annual Computer Software and Applications Conference. 2015, 264\u2013269"},{"issue":"6","key":"6015_CR22","doi-asserted-by":"publisher","first-page":"476","DOI":"10.1109\/32.295895","volume":"20","author":"S R Chidamber","year":"1994","unstructured":"Chidamber S R, Kemerer C F. A metrics suite for object oriented design. IEEE Transactions on Software Engineering, 1994, 20(6): 476\u2013493","journal-title":"IEEE Transactions on Software Engineering"},{"key":"6015_CR23","volume-title":"Object-Oriented Metrics, Measures of Complexity","author":"B Henderson-Sellers","year":"1996","unstructured":"Henderson-Sellers B. Object-Oriented Metrics, Measures of Complexity. Upper Saddle River, NJ: Prentice Hall, 1996"},{"issue":"1","key":"6015_CR24","doi-asserted-by":"publisher","first-page":"4","DOI":"10.1109\/32.979986","volume":"28","author":"J Bansiya","year":"2002","unstructured":"Bansiya J, Davis C G. A hierarchical model for object-oriented design quality assessment. IEEE Transactions on Software Engineering, 2002, 28(1): 4\u201317","journal-title":"IEEE Transactions on Software Engineering"},{"key":"6015_CR25","first-page":"242","volume-title":"Proceedings of the 6th International Symposium on Software Metrics","author":"M Tang","year":"1999","unstructured":"Tang M, Kao M, Chen M. An empirical study on object-oriented metrics. In: Proceedings of the 6th International Symposium on Software Metrics. 1999, 242\u2013249"},{"issue":"6","key":"6015_CR26","doi-asserted-by":"publisher","first-page":"476","DOI":"10.1109\/32.295895","volume":"20","author":"R Martin","year":"1994","unstructured":"Martin R. OO design quality metrics \u2014 an analysis of dependencies. IEEE Transactions on Software Engineering, 1994, 20(6): 476\u2013493","journal-title":"IEEE Transactions on Software Engineering"},{"issue":"4","key":"6015_CR27","doi-asserted-by":"publisher","first-page":"308","DOI":"10.1109\/TSE.1976.233837","volume":"2","author":"T McCabe","year":"1976","unstructured":"McCabe T. A complexity measure. IEEE Transactions on Software Engineering, 1976, 2(4): 308\u2013320","journal-title":"IEEE Transactions on Software Engineering"},{"key":"6015_CR28","volume-title":"Proceedings of the 6th International Conference on Predictive Models in Software Engineering","author":"M Jureczko","year":"2010","unstructured":"Jureczko M, Madeyski L. Towards identifying software project clusters with regard to defect prediction. In: Proceedings of the 6th International Conference on Predictive Models in Software Engineering. 2010"},{"issue":"10","key":"6015_CR29","doi-asserted-by":"publisher","first-page":"751","DOI":"10.1109\/32.544352","volume":"22","author":"V R Basili","year":"1996","unstructured":"Basili V R, Briand L C, Melo W L. A validation of object-oriented design metrics as quality indicators. IEEE Transactions on Software Engineering, 1996, 22(10): 751\u2013761","journal-title":"IEEE Transactions on Software Engineering"},{"issue":"10","key":"6015_CR30","doi-asserted-by":"publisher","first-page":"897","DOI":"10.1109\/TSE.2005.112","volume":"31","author":"T Gyimothy","year":"2005","unstructured":"Gyimothy T, Ferenc R, Siket I. Empirical validation of object-oriented metrics on open source software for fault prediction. IEEE Transactions on Software Engineering, 2005, 31(10): 897\u2013910","journal-title":"IEEE Transactions on Software Engineering"},{"key":"6015_CR31","first-page":"2869","volume-title":"Proceedings of the International Joint Conference on Neural Networks","author":"M E Bezerra","year":"2007","unstructured":"Bezerra M E, Oliveira A L, Meira S R. A constructive rbf neural network for estimating the probability of defects in software modules. In: Proceedings of the International Joint Conference on Neural Networks. 2007, 2869\u20132874"},{"key":"6015_CR32","first-page":"240","volume-title":"Proceedings of the 32nd EUROMICRO Conference on Software Engineering and Advanced Applications","author":"E Ceylan","year":"2006","unstructured":"Ceylan E, Kutlubay F O, Bener A B. Software defect identification using machine learning techniques. In: Proceedings of the 32nd EUROMICRO Conference on Software Engineering and Advanced Applications. 2006, 240\u2013247"},{"issue":"1","key":"6015_CR33","doi-asserted-by":"publisher","first-page":"154","DOI":"10.1007\/s10664-012-9218-8","volume":"19","author":"A Okutan","year":"2014","unstructured":"Okutan A, Y\u0131ld\u0131z O T. Software defect prediction using bayesian networks. Empirical Software Engineering, 2014, 19(1): 154\u2013181","journal-title":"Empirical Software Engineering"},{"issue":"3","key":"6015_CR34","first-page":"283","volume":"41","author":"A Nelson","year":"2011","unstructured":"Nelson A, Menzies T, Gay G. Sharing experiments using open-source software. Software: Practice and Experience, 2011, 41(3): 283\u2013305","journal-title":"Software: Practice and Experience"},{"key":"6015_CR35","volume-title":"Data Mining: Concepts and Techniques","author":"J Han","year":"2006","unstructured":"Han J, Kamber M. Data Mining: Concepts and Techniques. 2nd ed. San Francisco: Morgan Kaufmann, 2006","edition":"2"},{"key":"6015_CR36","volume-title":"Probabilistic Graphical Models: Principles and Techniques","author":"D Koller","year":"2009","unstructured":"Koller D, Friedman N. Probabilistic Graphical Models: Principles and Techniques. Cambridge: MIT Press, 2009"},{"key":"6015_CR37","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1017\/S0962492900000015","volume":"9","author":"M D Buhmann","year":"2000","unstructured":"Buhmann M D. Radial basis functions. Acta Numerica, 2000, 9: 1\u201338","journal-title":"Acta Numerica"},{"key":"6015_CR38","first-page":"725","volume-title":"Proceedings of the 13th National Conference on Artificial Intelligence and Eighth Innovative Applications of Artificial Intelligence Conference","author":"J R Quinlan","year":"1996","unstructured":"Quinlan J R. Bagging, boosting, and c4. 5. In: Proceedings of the 13th National Conference on Artificial Intelligence and Eighth Innovative Applications of Artificial Intelligence Conference. 1996, 725\u2013730"},{"issue":"1","key":"6015_CR39","doi-asserted-by":"publisher","first-page":"5","DOI":"10.1023\/A:1010933404324","volume":"45","author":"L Breiman","year":"2001","unstructured":"Breiman L. Random forests. Machine Learning, 2001, 45(1): 5\u201332","journal-title":"Machine Learning"},{"issue":"1","key":"6015_CR40","doi-asserted-by":"publisher","first-page":"10","DOI":"10.1145\/1656274.1656278","volume":"11","author":"M Hall","year":"2009","unstructured":"Hall M, Frank E, Holmes G, Pfahringer B, Reutemann P, Witten I H. The weka data mining software: an update. ACM SIGKDD Explorations Newsletter, 2009, 11(1): 10\u201318","journal-title":"ACM SIGKDD Explorations Newsletter"},{"key":"6015_CR41","first-page":"15","volume-title":"Proceedings of the ACM Sigsoft Symposium and the European Conference on Foundations of Software Engineering","author":"R Wu","year":"2011","unstructured":"Wu R, Zhang H, Kim S, Cheung S C. Relink: recovering links between bugs and changes. In: Proceedings of the ACM Sigsoft Symposium and the European Conference on Foundations of Software Engineering. 2011, 15\u201325"},{"key":"6015_CR42","first-page":"386","volume-title":"Proceedings of the 34th International Conference on Software Engineering","author":"Y Tian","year":"2012","unstructured":"Tian Y, Lawall J, Lo D. Identifying linux bug fixing patches. In: Proceedings of the 34th International Conference on Software Engineering. 2012, 386\u2013396"},{"key":"6015_CR43","doi-asserted-by":"publisher","first-page":"43","DOI":"10.1145\/1985441.1985451","volume-title":"Proceedings of the 8th Working Conference on Mining Software Repositories","author":"S Rao","year":"2011","unstructured":"Rao S, Kak A. Retrieval from software libraries for bug localization: a comparative study of generic and composite text models. In: Proceedings of the 8th Working Conference on Mining Software Repositories. 2011, 43\u201352"},{"issue":"2","key":"6015_CR44","doi-asserted-by":"publisher","first-page":"181","DOI":"10.1109\/TSE.2007.70773","volume":"34","author":"S Kim","year":"2008","unstructured":"Kim S, Whitehead E J, Zhang Y. Classifying software changes: Clean or buggy? IEEE Transactions on Software Engineering, 2008, 34(2): 181\u2013196","journal-title":"IEEE Transactions on Software Engineering"},{"issue":"6","key":"6015_CR45","doi-asserted-by":"publisher","first-page":"476","DOI":"10.1109\/32.295895","volume":"20","author":"S R Chidamber","year":"1994","unstructured":"Chidamber S R, Kemerer C F. A metrics suite for object oriented design. IEEE Transactions on Software Engineering, 1994, 20(6): 476\u2013493","journal-title":"IEEE Transactions on Software Engineering"},{"key":"6015_CR46","first-page":"181","volume-title":"Proceedings of the 30th ACM\/IEEE International Conference on Software Engineering","author":"R Moser","year":"2008","unstructured":"Moser R, Pedrycz W, Succi G. A comparative analysis of the efficiency of change metrics and static code attributes for defect prediction. In: Proceedings of the 30th ACM\/IEEE International Conference on Software Engineering. 2008, 181\u2013190"},{"key":"6015_CR47","first-page":"31","volume-title":"Proceedings of the 7th IEEE Working Conference on Mining Software Repositories","author":"M D\u2019Ambros","year":"2010","unstructured":"D\u2019Ambros M, Lanza M, Robbes R. An extensive comparison of bug prediction approaches. In: Proceedings of the 7th IEEE Working Conference on Mining Software Repositories. 2010, 31\u201341"},{"issue":"3","key":"6015_CR48","doi-asserted-by":"publisher","first-page":"248","DOI":"10.1016\/j.infsof.2011.09.007","volume":"54","author":"Y Ma","year":"2012","unstructured":"Ma Y, Luo G, Zeng X, Chen A. Transfer learning for cross-company software defect prediction. Information and Software Technology, 2012, 54(3): 248\u2013256","journal-title":"Information and Software Technology"},{"key":"6015_CR49","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TR.2016.2625998","volume":"65","author":"X Xia","year":"2016","unstructured":"Xia X, Lo D, Wang X, Yang X. Collective personalized change classification with multiobjective search. IEEE Transactions on Reliability, 2016, 65: 1\u201320","journal-title":"IEEE Transactions on Reliability"},{"key":"6015_CR50","doi-asserted-by":"crossref","first-page":"17","DOI":"10.1109\/QRS.2015.14","volume-title":"Proceedings of the IEEE International Conference on Software Quality, Reliability and Security","author":"X Yang","year":"2015","unstructured":"Yang X, Lo D, Xia X, Zhang Y. Deep learning for just-in-time defect prediction. In: Proceedings of the IEEE International Conference on Software Quality, Reliability and Security. 2015, 17\u201326"},{"key":"6015_CR51","doi-asserted-by":"publisher","first-page":"1644","DOI":"10.1145\/2695664.2695959","volume-title":"Proceedings of the 30th Annual ACM Symposium on Applied Computing","author":"X Xuan","year":"2015","unstructured":"Xuan X, Lo D, Xia X, Tian Y. Evaluating defect prediction approaches using a massive set of metrics: an empirical study. In: Proceedings of the 30th Annual ACM Symposium on Applied Computing. 2015, 1644\u20131647"},{"issue":"3","key":"6015_CR52","first-page":"283","volume":"41","author":"A Nelson","year":"2011","unstructured":"Nelson A, Menzies T, Gay G. Sharing experiments using open-source software. Software: Practice and Experience, 2011, 41(3): 283\u2013305","journal-title":"Software: Practice and Experience"},{"key":"6015_CR53","doi-asserted-by":"publisher","first-page":"977","DOI":"10.1109\/TSE.2016.2543218","volume":"42","author":"X Xia","year":"2016","unstructured":"Xia X, Lo D, Pan S J, Nagappan N, Wang X. Hydra: massively compositional model for cross-project defect prediction. IEEE Transactions on Software Engineering, 2016, 42: 977\u2013998","journal-title":"IEEE Transactions on Software Engineering"}],"container-title":["Frontiers of Computer Science"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s11704-017-6015-y\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11704-017-6015-y.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11704-017-6015-y.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,8,14]],"date-time":"2022-08-14T11:11:28Z","timestamp":1660475488000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s11704-017-6015-y"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,2,15]]},"references-count":53,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2018,4]]}},"alternative-id":["6015"],"URL":"https:\/\/doi.org\/10.1007\/s11704-017-6015-y","relation":{},"ISSN":["2095-2228","2095-2236"],"issn-type":[{"value":"2095-2228","type":"print"},{"value":"2095-2236","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,2,15]]},"assertion":[{"value":"7 January 2016","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"29 December 2016","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"15 February 2018","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}}]}}