{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,29]],"date-time":"2022-03-29T00:31:00Z","timestamp":1648513860151},"reference-count":29,"publisher":"Springer Science and Business Media LLC","issue":"1","license":[{"start":{"date-parts":[[2008,1,31]],"date-time":"2008-01-31T00:00:00Z","timestamp":1201737600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Prod. Eng. Res. Devel."],"published-print":{"date-parts":[[2008,4]]},"DOI":"10.1007\/s11740-008-0078-4","type":"journal-article","created":{"date-parts":[[2008,1,30]],"date-time":"2008-01-30T08:13:08Z","timestamp":1201680788000},"page":"47-54","source":"Crossref","is-referenced-by-count":2,"title":["Further potentials of CAQ tools for fault handling in automotive manufacturing processes"],"prefix":"10.1007","volume":"2","author":[{"given":"G.","family":"Reinhart","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"Rashidy","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2008,1,31]]},"reference":[{"key":"78_CR1","volume-title":"Quality control","author":"D Besterfield","year":"1990","unstructured":"Besterfield D (1990) Quality control, 3rd edn. Prentice Hall, New Jersey","edition":"3rd edn"},{"key":"78_CR2","volume-title":"The potential for assembly modeling in product development and manufacturing","author":"D Whitney","year":"1996","unstructured":"Whitney D (1996) The potential for assembly modeling in product development and manufacturing. MIT OpenCourseWare, Cambridge"},{"key":"78_CR3","volume-title":"Statistical process adjustment for quality control","author":"E Castillo Del","year":"2002","unstructured":"Del Castillo E (2002) Statistical process adjustment for quality control. Wiley and Sons, New York"},{"key":"78_CR4","volume-title":"Taguchi techniques for quality engineering: loss function, orthogonal experiments, parameter and tolerance design","author":"P Ross","year":"1996","unstructured":"Ross P (1996) Taguchi techniques for quality engineering: loss function, orthogonal experiments, parameter and tolerance design, 2nd edn. McGraw-Hill, New York","edition":"2nd edn"},{"key":"78_CR5","volume-title":"Statistical procedures for machine and process qualification","author":"E Dietrich","year":"1999","unstructured":"Dietrich E, Schulze A (1999) Statistical procedures for machine and process qualification. ASQ Quality Press, Milwaukee"},{"key":"78_CR6","first-page":"449","volume":"36\/2","author":"S Sakai","year":"1999","unstructured":"Sakai S, Tosaka T, Guh R-S, Hsieh Y-C (1999) A neural network based model for abnormal pattern recognition of control charts. Comput Ind Eng 36\/2:449\u2013462","journal-title":"Comput Ind Eng"},{"key":"78_CR7","doi-asserted-by":"crossref","first-page":"695","DOI":"10.1016\/S0952-1976(00)00049-X","volume":"13\/6","author":"P Ball\u00e9","year":"2000","unstructured":"Ball\u00e9 P, Fuessel D (2000) Closed-loop fault diagnosis based on a nonlinear process model and automatic fuzzy rule generation. Eng Appl Artif Intell 13\/6:695\u2013704","journal-title":"Eng Appl Artif Intell"},{"key":"78_CR8","volume-title":"Principles of artificial intelligence and expert systems development","author":"D Rolston","year":"1988","unstructured":"Rolston D (1988) Principles of artificial intelligence and expert systems development. McGraw Hill, New York"},{"key":"78_CR9","unstructured":"Pan R (2002) Statistical process adjustment methods for quality control in short-run manufacturing, Ph.D. thesis, Pennsylvania State University"},{"key":"78_CR10","first-page":"301","volume":"16\/3","author":"C-H Kuo","year":"2000","unstructured":"Kuo C-H, Huang H-P (2000) Failure modeling and process monitoring for flexible manufacturing systems using colored timed petri nets. IEEE Trans Rob Autom 16\/3:301\u2013312","journal-title":"IEEE Trans Rob Autom"},{"key":"78_CR11","unstructured":"Scheffczyk H (2000) Analyse komplexer Produktionssysteme mit Methoden der Nichtlinearen Dynamik, Dissertation, Universit\u00e4t Hannover"},{"key":"78_CR12","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1016\/S0007-8506(07)60763-X","volume":"46\/1","author":"S Hu","year":"1997","unstructured":"Hu S (1997) Stream-of-variation theory for automotive body assembly. Ann CIRP 46\/1:1\u20136","journal-title":"Ann CIRP"},{"key":"78_CR13","doi-asserted-by":"crossref","first-page":"296","DOI":"10.1109\/TRA.2003.808852","volume":"19\/2","author":"S Zhou","year":"2003","unstructured":"Zhou S, Huang Q, Shi J (2003) State space modeling of dimensional variation propagation in multistage machining process using differential motion vectors. IEEE Trans Rob Autom 19\/2:296\u2013309","journal-title":"IEEE Trans Rob Autom"},{"key":"78_CR14","first-page":"314","volume":"124\/2","author":"Y Ding","year":"2002","unstructured":"Ding Y, Ceglarek D, Shi J (2002) Fault diagnosis of multistage manufacturing processes by using state space approach. J Manuf Sci Eng 124\/2:314\u2013322","journal-title":"J Manuf Sci Eng"},{"key":"78_CR15","unstructured":"Von Euler-Chelpin A, Kimura F-K, Nielsen J (2006) A runtime model for capturing operational knowledge of machining resources, 39th CIRP international seminar on manufacturing systems, Ljubljana, 7\u20139 June"},{"key":"78_CR16","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4471-3829-7","volume-title":"Model-based fault diagnosis in dynamic systems using identification techniques","author":"S Simani","year":"2003","unstructured":"Simani S, Fantuzzi C, Patton R (2003) Model-based fault diagnosis in dynamic systems using identification techniques. Springer, London"},{"key":"78_CR17","doi-asserted-by":"crossref","first-page":"113","DOI":"10.1023\/A:1024453207632","volume":"15\/2","author":"J Carlson","year":"2003","unstructured":"Carlson J, S\u00f6derberg R (2003) Assembly root cause analysis: a way to reduce dimensional variation in assembled products. Int J Flexible Manuf Syst 15\/2:113\u2013150","journal-title":"Int J Flexible Manuf Syst"},{"key":"78_CR18","doi-asserted-by":"crossref","first-page":"26","DOI":"10.1109\/66.350755","volume":"8\/1","author":"E Sachs","year":"1995","unstructured":"Sachs E, Hu A, Ingolfsson A (1995) Run-by-run process control: combining SPC and feedback control. IEEE Trans Semiconductor Manuf 8\/1:26\u201343","journal-title":"IEEE Trans Semiconductor Manuf"},{"key":"78_CR19","volume-title":"Cycle-to-cycle manufacturing process control","author":"D Hardt","year":"2002","unstructured":"Hardt D, Siu T (2002) Cycle-to-cycle manufacturing process control. MIT D-Space, Cambridge"},{"key":"78_CR20","volume-title":"Multiple-input-multiple-output cycle-to-cycle control of manufacturing processes","author":"A Rzepniewski","year":"2003","unstructured":"Rzepniewski A, Hardt D (2003) Multiple-input-multiple-output cycle-to-cycle control of manufacturing processes. MIT D-Space, Cambridge"},{"key":"78_CR21","doi-asserted-by":"crossref","first-page":"261","DOI":"10.1115\/1.1411966","volume":"1\/3","author":"C Baydar","year":"2001","unstructured":"Baydar C, Saitou K (2001) Prediction and diagnosis of propagated errors in assembly systems using virtual factories. J Comput Inf Sci Eng 1\/3:261\u2013265","journal-title":"J Comput Inf Sci Eng"},{"key":"78_CR22","doi-asserted-by":"crossref","first-page":"51","DOI":"10.1016\/0360-8352(94)00024-H","volume":"28\/1","author":"C Cheng","year":"1995","unstructured":"Cheng C (1995) A multi-layer neural network model for detection changes in the process mean. Comput Ind Eng 28\/1:51\u201361","journal-title":"Comput Ind Eng"},{"key":"78_CR23","doi-asserted-by":"crossref","first-page":"79","DOI":"10.1080\/00224065.1994.11979508","volume":"26\/2","author":"D Montgomery","year":"1994","unstructured":"Montgomery D, Keats J (1994) Integrating statistical process control and engineering process control. J Qual Technol 26\/2:79\u201387","journal-title":"J Qual Technol"},{"key":"78_CR24","doi-asserted-by":"crossref","first-page":"4","DOI":"10.1109\/34.824819","volume":"22\/1","author":"A Jain","year":"2000","unstructured":"Jain A, Duin R, Mao J (2000) Statistical pattern recognition: a review. IEEE Trans Pattern Anal Mach Intell 22\/1:4\u201336","journal-title":"IEEE Trans Pattern Anal Mach Intell"},{"key":"78_CR25","unstructured":"Larpkiattaworn S (2003) A neural network approach for multi-attribute process control with comparison of two current techniques and guidelines for practical use, Doctoral thesis, University of Pittsburgh"},{"key":"78_CR26","doi-asserted-by":"crossref","first-page":"493","DOI":"10.1002\/qre.535","volume":"19\/6","author":"R Noorossana","year":"2003","unstructured":"Noorossana R, Farrokhi M, Saghaei A (2003) Using neural networks to detect and classify out-of-control signals in autocorrelated processes. Qual Reliability Eng Int 19\/6:493\u2013504","journal-title":"Qual Reliability Eng Int"},{"key":"78_CR27","unstructured":"Goebel K (2006) Management of uncertainty in sensor validation, sensor fusion, and diagnosis of mechanical systems using soft computing techniques, Doctoral thesis, University of California at Berkeley"},{"key":"78_CR28","doi-asserted-by":"crossref","first-page":"554","DOI":"10.1016\/j.asoc.2006.06.003","volume":"7\/2","author":"C Lo","year":"2007","unstructured":"Lo C, Chan P, Wong Y, Rad A, Cheung K (2007) Fuzzy-genetic algorithm for automatic fault detection in HVAC systems. Appl Soft Comput 7\/2:554\u2013560","journal-title":"Appl Soft Comput"},{"key":"78_CR29","volume-title":"Bayesian data analysis","author":"A Gelman","year":"2004","unstructured":"Gelman A, Carlin J, Stern H, Rubin D (2004) Bayesian data analysis, 2nd edn. Chapman Hall, New York","edition":"2nd edn"}],"container-title":["Production Engineering"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11740-008-0078-4.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s11740-008-0078-4\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11740-008-0078-4","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T21:28:59Z","timestamp":1559424539000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s11740-008-0078-4"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,1,31]]},"references-count":29,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2008,4]]}},"alternative-id":["78"],"URL":"https:\/\/doi.org\/10.1007\/s11740-008-0078-4","relation":{},"ISSN":["0944-6524","1863-7353"],"issn-type":[{"value":"0944-6524","type":"print"},{"value":"1863-7353","type":"electronic"}],"subject":[],"published":{"date-parts":[[2008,1,31]]}}}