{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T14:25:44Z","timestamp":1740147944361,"version":"3.37.3"},"reference-count":27,"publisher":"Springer Science and Business Media LLC","issue":"3-4","license":[{"start":{"date-parts":[[2018,2,7]],"date-time":"2018-02-07T00:00:00Z","timestamp":1517961600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["71671026"],"award-info":[{"award-number":["71671026"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Prod. Eng. Res. Devel."],"published-print":{"date-parts":[[2018,6]]},"DOI":"10.1007\/s11740-018-0801-8","type":"journal-article","created":{"date-parts":[[2018,2,7]],"date-time":"2018-02-07T08:22:55Z","timestamp":1517991775000},"page":"319-330","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Cycle time prediction and improvement of chipset assembly and test production line based on variability"],"prefix":"10.1007","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1082-2732","authenticated-orcid":false,"given":"Changjun","family":"Li","sequence":"first","affiliation":[]},{"given":"Bo","family":"Li","sequence":"additional","affiliation":[]},{"given":"Qiang","family":"Hu","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2018,2,7]]},"reference":[{"key":"801_CR1","doi-asserted-by":"publisher","first-page":"247","DOI":"10.1016\/j.cie.2016.12.036","volume":"105","author":"ZH Che","year":"2017","unstructured":"Che ZH (2017) A multi-objective optimization algorithm for solving the supplier selection problem with assembly sequence planning and assembly line balancing. Comput Ind Eng 105:247\u2013259. \n                    https:\/\/doi.org\/10.1016\/j.cie.2016.12.036","journal-title":"Comput Ind Eng"},{"issue":"9","key":"801_CR2","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1371\/journal.pone.0134343","volume":"10","author":"LH Li","year":"2015","unstructured":"Li LH, Mo R (2015) Production task queue optimization based on multi-attribute evaluation for complex product assembly workshop. Plos One 10(9):1\u201324. \n                    https:\/\/doi.org\/10.1371\/journal.pone.0134343","journal-title":"Plos One"},{"issue":"1","key":"801_CR3","doi-asserted-by":"publisher","first-page":"453","DOI":"10.1016\/S0007-8506(07)60457-0","volume":"55","author":"M Colledani","year":"2006","unstructured":"Colledani M, Tolio T (2006) Impact of quality control on production system performance. Cirp Ann Manuf Technol 55 (1):453\u2013456. \n                    https:\/\/doi.org\/10.1016\/s0007-8506(07)60457-0","journal-title":"Cirp Ann Manuf Technol"},{"issue":"3","key":"801_CR4","doi-asserted-by":"publisher","first-page":"71","DOI":"10.1108\/15982688200800028","volume":"9","author":"YC Lin","year":"2008","unstructured":"Lin YC, Tsai CH, Li RK, Chen CP, Chen HC (2008) The study of the cycle time improvement by work-in-process statistical process control method for IC Foundry manufacturing. Asian J Quality 9(3):71\u201391. \n                    https:\/\/doi.org\/10.1108\/15982688200800028","journal-title":"Asian J Quality"},{"key":"801_CR5","doi-asserted-by":"publisher","first-page":"67","DOI":"10.1016\/j.cor.2015.01.009","volume":"60","author":"SY Kose","year":"2015","unstructured":"Kose SY, Kilincci O (2015) Hybrid approach for buffer allocation in open serial production lines. Comput Oper Res 60:67\u201378. \n                    https:\/\/doi.org\/10.1016\/j.cor.2015.01.009","journal-title":"Comput Oper Res"},{"key":"801_CR6","doi-asserted-by":"publisher","first-page":"637","DOI":"10.4028\/www.scientific.net\/AMM.793.637","volume":"793","author":"M Shihabudin Ismail","year":"2015","unstructured":"Shihabudin Ismail M, Hussain MI, Zain ZM, Muhd N (2015) A management guide for determination of optimal buffer allocation in unpaced production line using 6 steps OBA. Appl Mech Mater 793:637\u2013641. \n                    https:\/\/doi.org\/10.4028\/www.scientific.net\/AMM.793.637","journal-title":"Appl Mech Mater"},{"issue":"1","key":"801_CR7","doi-asserted-by":"publisher","first-page":"85","DOI":"10.1007\/s10845-014-0963-y","volume":"28","author":"N Nahas","year":"2014","unstructured":"Nahas N (2014) Buffer allocation and preventive maintenance optimization in unreliable production lines. J Intell Manuf 28(1):85\u201393. \n                    https:\/\/doi.org\/10.1007\/s10845-014-0963-y","journal-title":"J Intell Manuf"},{"issue":"9","key":"801_CR8","doi-asserted-by":"publisher","first-page":"2083","DOI":"10.2166\/wst.2013.096","volume":"67","author":"J Krampe","year":"2013","unstructured":"Krampe J (2013) Cycle-time determination and process control of sequencing batch membrane bioreactors. Water Sci Technol 67 (9):2083\u20132090. \n                    https:\/\/doi.org\/10.2166\/wst.2013.096","journal-title":"Water Sci Technol"},{"issue":"1","key":"801_CR9","doi-asserted-by":"publisher","first-page":"48","DOI":"10.1109\/66.909654","volume":"14","author":"E Akcalt","year":"2001","unstructured":"Akcalt E, Nemoto K, Uzsoy R (2001) Cycle-time improvements for photolithography process in semiconductor manufacturing. IEEE Trans Semicond Manuf 14(1):48\u201356","journal-title":"IEEE Trans Semicond Manuf"},{"issue":"3","key":"801_CR10","doi-asserted-by":"publisher","first-page":"551","DOI":"10.1080\/00207549108930088","volume":"29","author":"PM Swamidass","year":"1991","unstructured":"Swamidass PM, Majerus C (1991) Statistical control of manufacturing cycle time and project time: lessons from statistical process control. Int J Prod Res 29(3):551\u2013563. \n                    https:\/\/doi.org\/10.1080\/00207549108930088","journal-title":"Int J Prod Res"},{"issue":"2","key":"801_CR11","doi-asserted-by":"publisher","first-page":"195","DOI":"10.1007\/s10951-014-0381-1","volume":"18","author":"C Yugma","year":"2014","unstructured":"Yugma C, Blue J, Dauz\u00e8re-P\u00e9r\u00e8s S, Obeid A (2014) Integration of scheduling and advanced process control in semiconductor manufacturing: review and outlook. J Sched 18(2):195\u2013205. \n                    https:\/\/doi.org\/10.1007\/s10951-014-0381-1","journal-title":"J Sched"},{"issue":"3","key":"801_CR12","doi-asserted-by":"publisher","first-page":"1022","DOI":"10.1016\/j.cie.2009.04.013","volume":"57","author":"N Cheikhrouhou","year":"2009","unstructured":"Cheikhrouhou N, Hachen C, Glardon R (2009) A Markovian model for the hybrid manufacturing planning and control method \u2018double speed single production line\u2019. Comput Ind Eng 57(3):1022\u20131032. \n                    https:\/\/doi.org\/10.1016\/j.cie.2009.04.013","journal-title":"Comput Ind Eng"},{"issue":"1","key":"801_CR13","doi-asserted-by":"publisher","first-page":"40","DOI":"10.5937\/jemc1501040K","volume":"5","author":"Z Kotevski","year":"2015","unstructured":"Kotevski Z, Jovanoski B, Minovski R (2015) Simulation model for improved production planning and control through quality, cycle time and batch size management. J Eng Manag Compet 5(1):40\u201345. \n                    https:\/\/doi.org\/10.5937\/jemc1501040K","journal-title":"J Eng Manag Compet"},{"issue":"1","key":"801_CR14","doi-asserted-by":"publisher","first-page":"69","DOI":"10.1109\/TEM.2005.861805","volume":"53","author":"HME Abdelsalam","year":"2006","unstructured":"Abdelsalam HME, Bao HP (2006) A simulation-based optimization framework for product development cycle time reduction. IEEE Trans Eng Manage 53(1):69\u201385. \n                    https:\/\/doi.org\/10.1109\/tem.2005.861805","journal-title":"IEEE Trans Eng Manage"},{"key":"801_CR15","doi-asserted-by":"crossref","unstructured":"Marsudi M, Shafeek H (2013) Production Line Performance by Using Queuing Model. In: Paper presented at the 7th IFAC Conference on Manufacturing Modelling, Management, and Control, Saint Petersburg, Russia, June 19\u201321, 2013","DOI":"10.3182\/20130619-3-RU-3018.00515"},{"issue":"2","key":"801_CR16","doi-asserted-by":"publisher","first-page":"123","DOI":"10.1163\/156856401316891925","volume":"8","author":"GH Shahkar","year":"2001","unstructured":"Shahkar GH, Tareghian HR (2001) Designing a production line through optimisation of M\/G\/c\/ using simulation. Math Eng Indus 8(2):123\u2013136","journal-title":"Math Eng Indus"},{"key":"801_CR17","doi-asserted-by":"crossref","unstructured":"Gilenson M, Hassoun M, Yedidsion L (2014) Setting quality control requirements to balance between cycle time and yield in a semiconductor production line. In: Paper presented at the Winter Simulation Conference, 7\u201310 Dec 2014","DOI":"10.1109\/WSC.2014.7020086"},{"key":"801_CR18","doi-asserted-by":"crossref","unstructured":"Chien C, Hu C (2006) Segmented WIP Control for Cycle Time Reduction. In: Paper presented at the IEEE International Symposium on Semiconductor Manufacturing, 25\u201327 Sept 2006","DOI":"10.1109\/ISSM.2006.4493079"},{"key":"801_CR19","doi-asserted-by":"crossref","unstructured":"Chien C, Hsiao C, Meng C, Hong K (2005) Cycle time prediction and control based on production line status and manufacturing data mining. In: Paper presented at the IEEE International Symposium on Semiconductor Manufacturing, 13\u201315 Sept 2005","DOI":"10.1109\/ISSM.2005.1513369"},{"issue":"6","key":"801_CR20","doi-asserted-by":"publisher","first-page":"529","DOI":"10.1080\/0953728021000014954","volume":"13","author":"YH Lee","year":"2002","unstructured":"Lee YH, Kim T (2002) Manufacturing cycle time reduction using balance control in the semiconductor fabrication line. Prod Plan Control 13(6):529\u2013540. \n                    https:\/\/doi.org\/10.1080\/0953728021000014954","journal-title":"Prod Plan Control"},{"key":"801_CR21","doi-asserted-by":"crossref","unstructured":"Kalisch S, Ringel R, Weigang J (2008) Managing WIP and cycle time with the help of loop control. In: Paper presented at the Simulation Conference, 7\u201310 Dec. 2008","DOI":"10.1109\/WSC.2008.4736334"},{"key":"801_CR22","doi-asserted-by":"crossref","unstructured":"Ming CC, Ling T, Subramaniam M, Guan O (2006) Integrated production control system in managing tool uptime, cycle-time and capacity. In: Paper presented at the Semiconductor Manufacturing, 25\u201327 Sept 2006","DOI":"10.1109\/ISSM.2006.4493083"},{"issue":"2","key":"801_CR23","doi-asserted-by":"publisher","first-page":"153","DOI":"10.1109\/70.282540","volume":"10","author":"V Kouikoglou","year":"1994","unstructured":"Kouikoglou V, Phillis Y (1994) Discrete event modeling and optimization of unreliable production lines with random rates. IEEE Trans Robot Autom 10(2):153\u2013159","journal-title":"IEEE Trans Robot Autom"},{"issue":"19","key":"801_CR24","doi-asserted-by":"publisher","first-page":"5761","DOI":"10.1080\/00207543.2016.1177236","volume":"54","author":"P Mehmet","year":"2016","unstructured":"Mehmet P, Mustafa Y, Bilal T (2016) Variability modelling and balancing of stochastic assembly lines. Int J Prod Res 54(19):5761\u20135782. \n                    https:\/\/doi.org\/10.1080\/00207543.2016.1177236","journal-title":"Int J Prod Res"},{"issue":"2","key":"801_CR25","doi-asserted-by":"publisher","first-page":"35","DOI":"10.1016\/j.simpat.2012.01.004","volume":"24","author":"L Tiacci","year":"2012","unstructured":"Tiacci L (2012) Event and object oriented simulation to fast evaluate operational objectives of mixed model assembly lines problems. Simul Model Pract Theory 24(2):35\u201348","journal-title":"Simul Model Pract Theory"},{"key":"801_CR26","volume-title":"Factory physics","author":"WJ Hopp","year":"2000","unstructured":"Hopp WJ, Spearman ML (2000) Factory physics. McGraw-Hill\/Irwin, New York"},{"issue":"3","key":"801_CR27","doi-asserted-by":"publisher","first-page":"511","DOI":"10.1109\/TSM.2003.815215","volume":"16","author":"J Jacobs","year":"2003","unstructured":"Jacobs J, Etman L, Campen EV, Rooda J (2003) Characterization of operational time variability using effective process times. IEEE Trans Semicond Manuf 16(3):511\u2013520","journal-title":"IEEE Trans Semicond Manuf"}],"container-title":["Production Engineering"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s11740-018-0801-8\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11740-018-0801-8.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11740-018-0801-8.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,2,6]],"date-time":"2019-02-06T19:31:26Z","timestamp":1549481486000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s11740-018-0801-8"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,2,7]]},"references-count":27,"journal-issue":{"issue":"3-4","published-print":{"date-parts":[[2018,6]]}},"alternative-id":["801"],"URL":"https:\/\/doi.org\/10.1007\/s11740-018-0801-8","relation":{},"ISSN":["0944-6524","1863-7353"],"issn-type":[{"type":"print","value":"0944-6524"},{"type":"electronic","value":"1863-7353"}],"subject":[],"published":{"date-parts":[[2018,2,7]]},"assertion":[{"value":"25 June 2017","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"24 January 2018","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"7 February 2018","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}}]}}