{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T14:16:11Z","timestamp":1740147371543,"version":"3.37.3"},"reference-count":34,"publisher":"Springer Science and Business Media LLC","issue":"4","license":[{"start":{"date-parts":[[2017,12,19]],"date-time":"2017-12-19T00:00:00Z","timestamp":1513641600000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["SIViP"],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1007\/s11760-017-1219-z","type":"journal-article","created":{"date-parts":[[2017,12,19]],"date-time":"2017-12-19T15:56:50Z","timestamp":1513699010000},"page":"775-782","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Automatic localization of signal sources in photon emission images for integrated circuit analysis"],"prefix":"10.1007","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2961-9803","authenticated-orcid":false,"given":"Anthony","family":"Boscaro","sequence":"first","affiliation":[]},{"given":"Sabir","family":"Jacquir","sequence":"additional","affiliation":[]},{"given":"Samuel","family":"Chef","sequence":"additional","affiliation":[]},{"given":"Kevin","family":"Sanchez","sequence":"additional","affiliation":[]},{"given":"Philippe","family":"Perdu","sequence":"additional","affiliation":[]},{"given":"St\u00e9phane","family":"Binczak","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2017,12,19]]},"reference":[{"issue":"2","key":"1219_CR1","doi-asserted-by":"crossref","first-page":"129","DOI":"10.1007\/s00138-008-0146-y","volume":"21","author":"M Zontak","year":"2010","unstructured":"Zontak, M., Cohen, I.: Defect detection in patterned wafers using anisotropic kernels. Mach. Vis. Appl. 21(2), 129\u2013141 (2010)","journal-title":"Mach. Vis. Appl."},{"key":"1219_CR2","unstructured":"Anderson, R.E., Soden, J.M., Henderson, Christopher.L.: Future technology challenges for failure analysis. Technical report, Sandia National Labs., Albuquerque, NM (1995)"},{"issue":"16","key":"1219_CR3","doi-asserted-by":"crossref","first-page":"1066","DOI":"10.1063\/1.96598","volume":"48","author":"HK Heinrich","year":"1986","unstructured":"Heinrich, H.K., Bloom, D.M., Hemenway, B.R.: Noninvasive sheet charge density probe for integrated silicon devices. Appl. Phys. Lett. 48(16), 1066\u20131068 (1986)","journal-title":"Appl. Phys. Lett."},{"key":"1219_CR4","doi-asserted-by":"crossref","unstructured":"Yee, W.M., Paniccia, M., Eiles, T., Rao, V.: Laser voltage probe (lVP): a novel optical probing technology for flip-chip packaged microprocessors. In: Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits, pp.15\u201320. IEEE (1999)","DOI":"10.31399\/asm.cp.istfa2000p0003"},{"issue":"6","key":"1219_CR5","doi-asserted-by":"crossref","first-page":"1374","DOI":"10.1016\/S0006-3495(91)82175-0","volume":"60","author":"G Marriott","year":"1991","unstructured":"Marriott, G., Clegg, R.M., Donna, J.A.-J., Jovin, T.M.: Time resolved imaging microscopy. Phosphorescence and delayed fluorescence imaging. Biophys. J. 60(6), 1374 (1991)","journal-title":"Biophys. J."},{"key":"1219_CR6","doi-asserted-by":"crossref","unstructured":"Bascoul, G., Perdu P., Celi, G., Dudit, S., Lewis, D.: Time resolved imaging at low power supply on 45\u00a0nm technology. In: 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), pp. 1\u20134. IEEE (2011)","DOI":"10.1109\/IPFA.2011.5992726"},{"key":"1219_CR7","doi-asserted-by":"crossref","unstructured":"Uchikado, A., Kawanab, S., Okubo, T., Shimase, A., Majima, T., Hirai, N., Ito, Y., Nakamura, T.: Case studies on application of time resolved imaging emission microscopy for backside timing analysis. In: 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), pp. 1\u20134, July (2012)","DOI":"10.1109\/IPFA.2012.6306291"},{"key":"1219_CR8","doi-asserted-by":"crossref","unstructured":"Song, P., Stellari, F., Weger, A.: Counterfeit IC detection using light emission. In: 2014 IEEE International Test Conference (ITC), pp. 1\u20138 (2014)","DOI":"10.1109\/TEST.2014.7035356"},{"key":"1219_CR9","doi-asserted-by":"crossref","unstructured":"Skorobogatov, S.: Using optical emission analysis for estimating contribution to power analysis. In: 2009 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), pp. 111\u2013119 (2009)","DOI":"10.1109\/FDTC.2009.39"},{"key":"1219_CR10","doi-asserted-by":"crossref","unstructured":"Tajik, S., Nedospasov, D., Seifert, J.P., Helfmeier, C., Boit, C.: Emission analysis of hardware implementations. In: 17th Euromicro Conference on Digital System Design, pp. 528\u2013534. IEEE (2014)","DOI":"10.1109\/DSD.2014.64"},{"key":"1219_CR11","doi-asserted-by":"crossref","unstructured":"Perdu, P., Bascoul, G., Chef, S., Celi, G., Sanchez, K.: Optical probing (EOFM\/TRI): a large set of complementary applications for ultimate VLSI. In: 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), pp. 119\u2013126. IEEE (2013)","DOI":"10.1109\/IPFA.2013.6599138"},{"key":"1219_CR12","doi-asserted-by":"crossref","unstructured":"Khurana, N., Chiang, C.L.: Analysis of product hot electron problems by gated emission microscopy. In: Reliability Physics Symposium, 1986. 24th Annual, pp. 189\u2013194. IEEE (1986)","DOI":"10.1109\/IRPS.1986.362132"},{"key":"1219_CR13","unstructured":"Khurana, N.: Image emission microscope with improved image processing capability, March (1989)"},{"key":"1219_CR14","doi-asserted-by":"crossref","unstructured":"Barton, D.L., Tangyunyong, P., Soden, J.M., Liang, A.Y., Zaplatin, A.N.,\u00a0Shivanandan, K.,\u00a0Donohoe, G.: Infrared light emission from semiconductor devices. In: Conference Proceedings of the 22nd Symposium for Test and Failure Analysis (ISTFA), pp. 9\u201317 (1996)","DOI":"10.31399\/asm.cp.istfa1996p0009"},{"key":"1219_CR15","doi-asserted-by":"crossref","unstructured":"Desplats, R., Eral, A., Beaudoin, F., Perdu, P., Chion, A., Shah, K., Lundquist, T.R.: IC diagnostic with time resolved photon emission and cad auto-channeling. In: International Symposium of Testing and Failure Analysis, pp. 45\u201355. ASM International; 1998 (2003)","DOI":"10.31399\/asm.cp.istfa2003p0045"},{"issue":"1","key":"1219_CR16","doi-asserted-by":"crossref","first-page":"013019","DOI":"10.1117\/1.JEI.24.1.013019","volume":"24","author":"S Chef","year":"2015","unstructured":"Chef, S., Jacquir, S., Sanchez, K., Perdu, P., Binczak, S.: Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location. J. Electron. Imaging 24(1), 013019\u2013013019 (2015)","journal-title":"J. Electron. Imaging"},{"issue":"4","key":"1219_CR17","doi-asserted-by":"crossref","first-page":"217","DOI":"10.1007\/s00138-005-0175-8","volume":"16","author":"AC Jalba","year":"2005","unstructured":"Jalba, A.C., Wilkinson, M.H.F., Roerdink, J.B.T.M., Bayer, M.M., Juggins, S.: Automatic diatom identification using contour analysis by morphological curvature scale spaces. Mach. Vis. Appl. 16(4), 217\u2013228 (2005)","journal-title":"Mach. Vis. Appl."},{"issue":"1","key":"1219_CR18","doi-asserted-by":"crossref","first-page":"159","DOI":"10.1007\/s10796-014-9527-0","volume":"18","author":"P Jain","year":"2016","unstructured":"Jain, P., Tyagi, V.: A survey of edge-preserving image denoising methods. Inf. Syst. Front. 18(1), 159\u2013170 (2016)","journal-title":"Inf. Syst. Front."},{"issue":"6","key":"1219_CR19","doi-asserted-by":"crossref","first-page":"1211","DOI":"10.1007\/s11760-012-0389-y","volume":"7","author":"BKS Kumar","year":"2013","unstructured":"Kumar, B.K.S.: Image denoising based on non-local means filter and its method noise thresholding. Signal Image Video Process. 7(6), 1211\u20131227 (2013)","journal-title":"Signal Image Video Process."},{"key":"1219_CR20","doi-asserted-by":"crossref","unstructured":"Arbel\u00e1ez, P., Hariharan, B., Gu, C., Gupta, S., Bourdev, L., Malik, J.: Semantic segmentation using regions and parts. In: 2012 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), pp. 3378\u20133385. IEEE (2012)","DOI":"10.1109\/CVPR.2012.6248077"},{"key":"1219_CR21","doi-asserted-by":"crossref","unstructured":"Chef, S., Jacquir, S., Sanchez, K., Perdu, P., Binczak, S.: Filtering and emission area identification in the time resolved imaging data. In: ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis: November 11\u201315, 2012, Phoenix Convention Center, Phoenix, Arizona, USA, p. 264. ASM International (2012)","DOI":"10.31399\/asm.cp.istfa2012p0264"},{"key":"1219_CR22","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1007\/s11760-017-1070-2","volume":"11","author":"Z Hadjadj","year":"2017","unstructured":"Hadjadj, Z., Cheriet, M., Meziane, A., Cherfa, Y.: A new efficient binarization method: application to degraded historical document images. Signal Image Video Process. 11, 1\u20138 (2017)","journal-title":"Signal Image Video Process."},{"key":"1219_CR23","doi-asserted-by":"publisher","unstructured":"Khiyal, M.S.H, Khan, A., Bibi, A.: Modified watershed algorithm for segmentation of 2D images. Issues Informing Sci. Inf. Technol. 6, 877\u2013886 (2009). https:\/\/doi.org\/10.28945\/1077","DOI":"10.28945\/1077"},{"issue":"2","key":"1219_CR24","doi-asserted-by":"crossref","first-page":"301","DOI":"10.1007\/s11760-014-0742-4","volume":"10","author":"A Parsi","year":"2016","unstructured":"Parsi, A., Sorkhi, A.G., Zahedi, M.: Improving the unsupervised LBG clustering algorithm performance in image segmentation using principal component analysis. Signal Image Video Process. 10(2), 301\u2013309 (2016)","journal-title":"Signal Image Video Process."},{"issue":"7","key":"1219_CR25","doi-asserted-by":"crossref","first-page":"1343","DOI":"10.1007\/s11760-016-0926-1","volume":"10","author":"M Shahbaba","year":"2016","unstructured":"Shahbaba, M., Beheshti, S.: Signature test as statistical testing in clustering. Signal Image Video Process. 10(7), 1343\u20131351 (2016)","journal-title":"Signal Image Video Process."},{"key":"1219_CR26","doi-asserted-by":"crossref","unstructured":"Chef, C., Perdu, P., Bascoul, G., Jacquir, S., Sanchez, K., Binczak, S.: New statistical post processing approach for precise fault and defect localization in tri database acquired on complex VLSI. In: 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), pp. 136\u2013141. IEEE (2013)","DOI":"10.1109\/IPFA.2013.6599141"},{"key":"1219_CR27","doi-asserted-by":"crossref","unstructured":"Chef, C., Jacquir, S., Perdu, P., Sanchez, K., Binczak, S.: Cluster matching in time resolved imaging for VLSI analysis. In: 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), pp. 379\u2013382. IEEE (2014)","DOI":"10.1109\/IPFA.2014.6898157"},{"issue":"4","key":"1219_CR28","doi-asserted-by":"crossref","first-page":"669","DOI":"10.1007\/s11760-010-0196-2","volume":"6","author":"S Nirmala","year":"2012","unstructured":"Nirmala, S., Nagabhushan, P.: Foreground text segmentation in complex color document images using Gabor filters. Signal Image Video Process. 6(4), 669\u2013678 (2012)","journal-title":"Signal Image Video Process."},{"key":"1219_CR29","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4757-6017-0","volume-title":"Nonlinear Digital Filters","author":"I Pitas","year":"1990","unstructured":"Pitas, I., Venetsanopoulos, A.N.: Nonlinear Digital Filters, vol. 84. Springer, New York (1990)"},{"issue":"3","key":"1219_CR30","doi-asserted-by":"crossref","first-page":"283","DOI":"10.1016\/0734-189X(86)90002-2","volume":"35","author":"J Serra","year":"1986","unstructured":"Serra, J.: Introduction to mathematical morphology. Comput. Vis. Graph. Image Process. 35(3), 283\u2013305 (1986)","journal-title":"Comput. Vis. Graph. Image Process."},{"key":"1219_CR31","volume-title":"Morphological Image Analysis: Principles and Applications","author":"P Soille","year":"2003","unstructured":"Soille, P.: Morphological Image Analysis: Principles and Applications. Springer, New York (2003)"},{"issue":"3","key":"1219_CR32","doi-asserted-by":"crossref","first-page":"279","DOI":"10.1117\/1.482677","volume":"8","author":"L Comer","year":"1999","unstructured":"Comer, L., Delp, E.J.: Morphological operations for color image processing. J. Electron. Imaging 8(3), 279\u2013289 (1999)","journal-title":"J. Electron. Imaging"},{"key":"1219_CR33","doi-asserted-by":"crossref","DOI":"10.1117\/3.501104","volume-title":"Hands-on Morphological Image Processing","author":"ER Dougherty","year":"2003","unstructured":"Dougherty, E.R., Lotufo, R.A.: Hands-on Morphological Image Processing, vol. 59. SPIE Press, Bellingham (2003)"},{"key":"1219_CR34","doi-asserted-by":"crossref","unstructured":"Beyerer, J., Le\u00f3n, F.P., Frese, C.: Morphological image processing. In: Machine Vision, pp. 607\u2013647. Springer (2016)","DOI":"10.1007\/978-3-662-47794-6_12"}],"container-title":["Signal, Image and Video Processing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s11760-017-1219-z\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11760-017-1219-z.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s11760-017-1219-z.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,8,10]],"date-time":"2022-08-10T21:30:35Z","timestamp":1660167035000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s11760-017-1219-z"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,12,19]]},"references-count":34,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2018,5]]}},"alternative-id":["1219"],"URL":"https:\/\/doi.org\/10.1007\/s11760-017-1219-z","relation":{},"ISSN":["1863-1703","1863-1711"],"issn-type":[{"type":"print","value":"1863-1703"},{"type":"electronic","value":"1863-1711"}],"subject":[],"published":{"date-parts":[[2017,12,19]]}}}