{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T08:03:25Z","timestamp":1777622605374,"version":"3.51.4"},"reference-count":27,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[2025,1,28]],"date-time":"2025-01-28T00:00:00Z","timestamp":1738022400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2025,1,28]],"date-time":"2025-01-28T00:00:00Z","timestamp":1738022400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"funder":[{"name":"Natural Science Research Project of Anhui Educational Committee","award":["No.2023AH030081"],"award-info":[{"award-number":["No.2023AH030081"]}]}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["SIViP"],"published-print":{"date-parts":[[2025,3]]},"DOI":"10.1007\/s11760-025-03819-z","type":"journal-article","created":{"date-parts":[[2025,1,28]],"date-time":"2025-01-28T18:47:49Z","timestamp":1738090069000},"update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":7,"title":["SF-YOLO: designed based on tiny feature for PCB surface defect detection and deployment in embedded systems"],"prefix":"10.1007","volume":"19","author":[{"given":"Kaikai","family":"Zhang","sequence":"first","affiliation":[]},{"given":"Yanyan","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Shengzhe","family":"Shi","sequence":"additional","affiliation":[]},{"given":"Qingqing","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Xinying","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Zhao","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"Chun","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Sheng","family":"Liu","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2025,1,28]]},"reference":[{"issue":"1","key":"3819_CR1","doi-asserted-by":"publisher","first-page":"109","DOI":"10.3390\/s20010109","volume":"20","author":"A Angelopoulos","year":"2019","unstructured":"Angelopoulos, A., Michailidis, E.T., Nomikos, N., Trakadas, P., Hatziefremidis, A., Voliotis, S., Zahariadis, T.: Tackling faults in the industry 4.0 era-a survey of machine-learning solutions and key aspects. Sensors 20(1), 109 (2019)","journal-title":"Sensors"},{"issue":"5","key":"3819_CR2","doi-asserted-by":"publisher","first-page":"2766","DOI":"10.3390\/s23052766","volume":"23","author":"J-H Park","year":"2023","unstructured":"Park, J.-H., Kim, Y.-S., Seo, H., Cho, Y.-J.: Analysis of training deep learning models for PCB defect detection. Sensors 23(5), 2766 (2023)","journal-title":"Sensors"},{"key":"3819_CR3","doi-asserted-by":"publisher","DOI":"10.1016\/j.resconrec.2021.105963","volume":"177","author":"IA Soomro","year":"2022","unstructured":"Soomro, I.A., Ahmad, A., Raza, R.H.: Printed circuit board identification using deep convolutional neural networks to facilitate recycling. Resour. Conserv. Recycl. 177, 105963 (2022)","journal-title":"Resour. Conserv. Recycl."},{"key":"3819_CR4","doi-asserted-by":"publisher","first-page":"557","DOI":"10.1016\/j.jmsy.2023.08.019","volume":"70","author":"Y Zhou","year":"2023","unstructured":"Zhou, Y., Yuan, M., Zhang, J., Ding, G., Qin, S.: Review of vision-based defect detection research and its perspectives for printed circuit board. J. Manuf. Syst. 70, 557\u2013578 (2023)","journal-title":"J. Manuf. Syst."},{"key":"3819_CR5","first-page":"1","volume":"72","author":"J Yang","year":"2023","unstructured":"Yang, J., Liu, Z., Du, W., Zhang, S.: A PCB defect detector based on coordinate feature refinement. IEEE Trans. Instrum. Meas. 72, 1\u201310 (2023)","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"3819_CR6","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2023.106359","volume":"123","author":"W Jiang","year":"2023","unstructured":"Jiang, W., Li, T., Zhang, S., Chen, W., Yang, J.: PCB defects target detection combining multi-scale and attention mechanism. Eng. Appl. Artif. Intell. 123, 106359 (2023)","journal-title":"Eng. Appl. Artif. Intell."},{"issue":"4","key":"3819_CR7","first-page":"537","volume":"8","author":"D Ziou","year":"1998","unstructured":"Ziou, D., Tabbone, S.: Edge detection techniques-an overview. Pattern Recognit. Image Anal. Adv. Math. Theory Appl. 8(4), 537\u2013559 (1998)","journal-title":"Pattern Recognit. Image Anal. Adv. Math. Theory Appl."},{"key":"3819_CR8","doi-asserted-by":"crossref","unstructured":"Shekhar, H., Jagadish, M., Fahanus, S.M., Sunil\u00a0Kumar, T.: Image processing techniques for PCB board fault analysis with object extraction and measurements. In: Soft Computing for Security Applications: Proceedings of ICSCS 2022, pp. 31\u201340. Springer, New York (2022)","DOI":"10.1007\/978-981-19-3590-9_3"},{"issue":"1","key":"3819_CR9","doi-asserted-by":"publisher","first-page":"10","DOI":"10.1007\/s11554-023-01272-0","volume":"20","author":"J Ma","year":"2023","unstructured":"Ma, J., Cheng, X.: Fast segmentation algorithm of PCB image using 2d OTSU improved by adaptive genetic algorithm and integral image. J. Real-Time Image Process. 20(1), 10 (2023)","journal-title":"J. Real-Time Image Process."},{"issue":"2","key":"3819_CR10","doi-asserted-by":"publisher","first-page":"110","DOI":"10.1049\/trit.2019.0019","volume":"4","author":"R Ding","year":"2019","unstructured":"Ding, R., Dai, L., Li, G., Liu, H.: TDD-net: a tiny defect detection network for printed circuit boards. CAAI Trans. Intell. Technol. 4(2), 110\u2013116 (2019)","journal-title":"CAAI Trans. Intell. Technol."},{"key":"3819_CR11","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2021.115673","volume":"185","author":"H Zhang","year":"2021","unstructured":"Zhang, H., Jiang, L., Li, C.: Cs-resnet: Cost-sensitive residual convolutional neural network for PCB cosmetic defect detection. Expert Syst. Appl. 185, 115673 (2021)","journal-title":"Expert Syst. Appl."},{"key":"3819_CR12","doi-asserted-by":"crossref","unstructured":"Liu, W., Anguelov, D., Erhan, D., Szegedy, C., Reed, S., Fu, C.-Y., Berg, A.C.: Ssd: Single shot multibox detector. In: Computer Vision\u2013ECCV 2016: 14th European Conference, Amsterdam, The Netherlands, October 11\u201314, 2016, Proceedings, Part I 14, pp. 21\u201337, Springer, New York (2016)","DOI":"10.1007\/978-3-319-46448-0_2"},{"key":"3819_CR13","doi-asserted-by":"crossref","unstructured":"Tan, M., Pang, R., Le, Q.V.: Efficientdet: Scalable and efficient object detection. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition, pp. 10781\u201310790 (2020)","DOI":"10.1109\/CVPR42600.2020.01079"},{"key":"3819_CR14","doi-asserted-by":"crossref","unstructured":"Redmon, J.: You only look once: Unified, real-time object detection. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (2016)","DOI":"10.1109\/CVPR.2016.91"},{"key":"3819_CR15","doi-asserted-by":"crossref","unstructured":"Girshick, R., Donahue, J., Darrell, T., Malik, J.: Rich feature hierarchies for accurate object detection and semantic segmentation. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 580\u2013587 (2014)","DOI":"10.1109\/CVPR.2014.81"},{"issue":"6","key":"3819_CR16","doi-asserted-by":"publisher","first-page":"1137","DOI":"10.1109\/TPAMI.2016.2577031","volume":"39","author":"S Ren","year":"2016","unstructured":"Ren, S., He, K., Girshick, R., Sun, J.: Faster R-CNN: Towards real-time object detection with region proposal networks. IEEE Trans. Pattern Anal. Mach. Intell. 39(6), 1137\u20131149 (2016)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"3819_CR17","doi-asserted-by":"publisher","first-page":"108335","DOI":"10.1109\/ACCESS.2020.3001349","volume":"8","author":"B Hu","year":"2020","unstructured":"Hu, B., Wang, J.: Detection of PCB surface defects with improved faster-RCNN and feature pyramid network. IEEE Access 8, 108335\u2013108345 (2020)","journal-title":"IEEE Access"},{"key":"3819_CR18","first-page":"912","volume":"38","author":"J Wu","year":"2021","unstructured":"Wu, J., Cheng, Y., Shao, J., Yang, D.: A defect detection method for PCB based on the improved yolov4. Chin. J. Sci. Instrum. 38, 912\u2013917 (2021)","journal-title":"Chin. J. Sci. Instrum."},{"key":"3819_CR19","doi-asserted-by":"publisher","DOI":"10.3389\/fphy.2021.708097","volume":"9","author":"Y Zhang","year":"2021","unstructured":"Zhang, Y., Xie, F., Huang, L., Shi, J., Yang, J., Li, Z.: A lightweight one-stage defect detection network for small object based on dual attention mechanism and PAFPN. Front. Phys. 9, 708097 (2021)","journal-title":"Front. Phys."},{"issue":"21","key":"3819_CR20","doi-asserted-by":"publisher","first-page":"20910","DOI":"10.1109\/JSEN.2022.3208580","volume":"22","author":"W Xuan","year":"2022","unstructured":"Xuan, W., Jian-She, G., Bo-Jie, H., Zong-Shan, W., Hong-Wei, D., Jie, W.: A lightweight modified YOLOX network using coordinate attention mechanism for PCB surface defect detection. IEEE Sens. J. 22(21), 20910\u201320920 (2022)","journal-title":"IEEE Sens. J."},{"key":"3819_CR21","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2021.116178","volume":"190","author":"X Liu","year":"2022","unstructured":"Liu, X., Hu, J., Wang, H., Zhang, Z., Lu, X., Sheng, C., Song, S., Nie, J.: Gaussian-IOU loss: Better learning for bounding box regression on PCB component detection. Expert Syst. Appl. 190, 116178 (2022)","journal-title":"Expert Syst. Appl."},{"issue":"08","key":"3819_CR22","doi-asserted-by":"publisher","first-page":"2150024","DOI":"10.1142\/S0219876221500249","volume":"18","author":"O Rukundo","year":"2021","unstructured":"Rukundo, O.: Evaluation of rounding functions in nearest neighbor interpolation. Int. J. Comput. Methods 18(08), 2150024 (2021)","journal-title":"Int. J. Comput. Methods"},{"key":"3819_CR23","doi-asserted-by":"crossref","unstructured":"Xu, J., Li, Z., Du, B., Zhang, M., Liu, J.: Reluplex made more practical: Leaky relu. In: 2020 IEEE Symposium on Computers and Communications (ISCC), pp. 1\u20137, IEEE (2020)","DOI":"10.1109\/ISCC50000.2020.9219587"},{"key":"3819_CR24","doi-asserted-by":"crossref","unstructured":"Zheng, Z., Wang, P., Liu, W., Li, J., Ye, R., Ren, D.: Distance-IOU loss: Faster and better learning for bounding box regression. In: Proceedings of the AAAI Conference on Artificial Intelligence, vol. 34, pp. 12993\u201313000 (2020)","DOI":"10.1609\/aaai.v34i07.6999"},{"key":"3819_CR25","unstructured":"Zhang, H., Zhang, S.: Shape-iou: More accurate metric considering bounding box shape and scale. arXiv preprint (2023). arXiv:2312.17663"},{"key":"3819_CR26","doi-asserted-by":"crossref","unstructured":"Yuan, M., Zhou, Y., Ren, X., Zhi, H., Zhang, J., Chen, H.: YOLO-HMC: An improved method for PCB surface defect detection. IEEE Trans. Instrum. Meas. (2024)","DOI":"10.1109\/TIM.2024.3351241"},{"issue":"1","key":"3819_CR27","doi-asserted-by":"publisher","first-page":"23000","DOI":"10.1038\/s41598-024-74416-2","volume":"14","author":"K Zhang","year":"2024","unstructured":"Zhang, K., Wang, Y., Shi, S., Wang, Q., Wang, C., Liu, S.: Improved yolov5 algorithm combined with depth camera and embedded system for blind indoor visual assistance. Sci. Rep. 14(1), 23000 (2024)","journal-title":"Sci. Rep."}],"container-title":["Signal, Image and Video Processing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s11760-025-03819-z.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s11760-025-03819-z\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s11760-025-03819-z.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,13]],"date-time":"2025-02-13T14:50:50Z","timestamp":1739458250000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s11760-025-03819-z"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,1,28]]},"references-count":27,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2025,3]]}},"alternative-id":["3819"],"URL":"https:\/\/doi.org\/10.1007\/s11760-025-03819-z","relation":{},"ISSN":["1863-1703","1863-1711"],"issn-type":[{"value":"1863-1703","type":"print"},{"value":"1863-1711","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,1,28]]},"assertion":[{"value":"15 June 2024","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"24 December 2024","order":2,"name":"revised","label":"Revised","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"4 January 2025","order":3,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"28 January 2025","order":4,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflict of interest"}}],"article-number":"263"}}