{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,4]],"date-time":"2026-06-04T17:22:23Z","timestamp":1780593743211,"version":"3.54.1"},"reference-count":37,"publisher":"Springer Science and Business Media LLC","issue":"1","license":[{"start":{"date-parts":[[2011,3,1]],"date-time":"2011-03-01T00:00:00Z","timestamp":1298937600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Int J Syst Assur Eng Manag"],"published-print":{"date-parts":[[2011,3]]},"DOI":"10.1007\/s13198-011-0055-8","type":"journal-article","created":{"date-parts":[[2011,4,21]],"date-time":"2011-04-21T09:14:19Z","timestamp":1303377259000},"page":"66-77","source":"Crossref","is-referenced-by-count":30,"title":["Imperfect preventive maintenance policies for two-process cumulative damage model of degradation and random shocks"],"prefix":"10.1007","volume":"2","author":[{"given":"Yaping","family":"Wang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hoang","family":"Pham","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2011,4,22]]},"reference":[{"issue":"1","key":"55_CR1","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1016\/S0378-7796(98)00044-3","volume":"50","author":"AR Abdelaziz","year":"1999","unstructured":"Abdelaziz AR (1999) A fuzzy-based power system reliability evaluation. Electr Power Syst Res 50(1):1\u20135","journal-title":"Electr Power Syst Res"},{"issue":"4","key":"55_CR2","first-page":"460","volume":"46","author":"SJ Bae","year":"2005","unstructured":"Bae SJ, Kvam PH (2005) A nonlinear random coefficients model for degradation testing. Technometrics 46(4):460\u2013469","journal-title":"Technometrics"},{"issue":"3","key":"55_CR3","doi-asserted-by":"crossref","first-page":"542","DOI":"10.1109\/TR.2006.879661","volume":"55","author":"J-M Bai","year":"2006","unstructured":"Bai J-M, Ze-Hui L, Kong X-B (2006) Generalized shock models based on a cluster point process. IEEE Trans Reliab 55(3):542\u2013550","journal-title":"IEEE Trans Reliab"},{"key":"55_CR4","doi-asserted-by":"crossref","first-page":"1123","DOI":"10.1016\/j.ress.2007.09.008","volume":"93","author":"J Chen","year":"2008","unstructured":"Chen J, Li Z (2008) An extended extreme shock maintenance model for a deteriorating system. Reliab Eng Syst Saf 93:1123\u20131129","journal-title":"Reliab Eng Syst Saf"},{"key":"55_CR5","unstructured":"Chiodo E, Mazzanti G (2006) Indirect reliability estimation for electric devices via a dynamic \u2018stress-strength\u2019 model. In: SPEEDAM 2006 international symposium on power electronics, electrical drives, automation and motion, Taormina"},{"key":"55_CR6","doi-asserted-by":"crossref","first-page":"29","DOI":"10.1016\/S0045-7949(97)00153-3","volume":"67","author":"M Ciampoli","year":"1998","unstructured":"Ciampoli M (1998) Time dependent reliability of structural systems subject to deterioration. Comput Struct 67:29\u201335","journal-title":"Comput Struct"},{"issue":"2","key":"55_CR7","doi-asserted-by":"crossref","first-page":"418","DOI":"10.1016\/j.ress.2008.04.002","volume":"94","author":"E Deloux","year":"2009","unstructured":"Deloux E, Castanier B, Berenguer C (2009) Predictive maintenance policy for a gradually deteriorating system subject to stress. Reliab Eng Syst Saf 94(2):418\u2013431","journal-title":"Reliab Eng Syst Saf"},{"issue":"3","key":"55_CR8","doi-asserted-by":"crossref","first-page":"307","DOI":"10.1016\/j.fss.2007.06.004","volume":"159","author":"Y Ding","year":"2008","unstructured":"Ding Y, Lisnianski A (2008) Fuzzy universal generating functions for multi-state system reliability assessment. Fuzzy Sets Syst 159(3):307\u2013324","journal-title":"Fuzzy Sets Syst"},{"key":"55_CR9","volume-title":"Reliability and degradation of semiconductor lasers and LEDs","author":"M Fukada","year":"1991","unstructured":"Fukada M (1991) Reliability and degradation of semiconductor lasers and LEDs. Artech House, Boston"},{"issue":"3","key":"55_CR10","doi-asserted-by":"crossref","first-page":"541","DOI":"10.2307\/3318501","volume":"7","author":"A Gut","year":"2001","unstructured":"Gut A (2001) Mixed shock models. Bernoulli 7(3):541\u2013555","journal-title":"Bernoulli"},{"issue":"1","key":"55_CR11","doi-asserted-by":"crossref","first-page":"88","DOI":"10.1109\/24.855541","volume":"49","author":"MM Hosseini","year":"2000","unstructured":"Hosseini MM, Kerr RM, Randall RB (2000) An inspection model with minimal and major maintenance for a system with deterioration and Poisson failures. IEEE Trans Reliab 49(1):88\u2013987","journal-title":"IEEE Trans Reliab"},{"issue":"3","key":"55_CR12","doi-asserted-by":"crossref","first-page":"371","DOI":"10.1109\/TR.2002.802891","volume":"51","author":"G-A Klutke","year":"2002","unstructured":"Klutke G-A, Yang Y (2002) The availability of inspected systems subject to shocks and graceful degradation. IEEE Trans Reliab 51(3):371\u2013374","journal-title":"IEEE Trans Reliab"},{"issue":"5","key":"55_CR13","doi-asserted-by":"crossref","first-page":"1693","DOI":"10.1016\/j.jspi.2008.05.027","volume":"139","author":"A Lehmann","year":"2009","unstructured":"Lehmann A (2009) Joint modeling of degradation and failure time data. J Stat Plan Inference 139(5):1693\u20131706","journal-title":"J Stat Plan Inference"},{"key":"55_CR14","first-page":"127","volume":"20","author":"Z Li","year":"1984","unstructured":"Li Z (1984) Some probability distribution on Poisson shocks and its application in city traffic. J Lanzhou Univ 20:127\u2013136","journal-title":"J Lanzhou Univ"},{"issue":"2","key":"55_CR15","doi-asserted-by":"crossref","first-page":"297","DOI":"10.1109\/TR.2005.847278","volume":"54","author":"WJ Li","year":"2005","unstructured":"Li WJ, Pham H (2005a) Reliability modeling of multi-state degraded systems with multi-competing failures and random shocks. IEEE Trans Reliab 54(2):297\u2013303","journal-title":"IEEE Trans Reliab"},{"issue":"2","key":"55_CR16","doi-asserted-by":"crossref","first-page":"318","DOI":"10.1109\/TR.2005.847264","volume":"54","author":"WJ Li","year":"2005","unstructured":"Li WJ, Pham H (2005b) An inspection-maintenance model for systems with multiple competing processes. IEEE Trans Reliab 54(2):318\u2013327","journal-title":"IEEE Trans Reliab"},{"key":"55_CR17","doi-asserted-by":"crossref","first-page":"161","DOI":"10.2307\/1269661","volume":"35","author":"CJ Lu","year":"1993","unstructured":"Lu CJ, Meeker WQ (1993) Using degradation measures to estimate of time-to-failure distribution. Technometrics 35:161\u2013176","journal-title":"Technometrics"},{"key":"55_CR18","first-page":"405","volume":"27","author":"F Mallor","year":"2003","unstructured":"Mallor F, Santos J (2003a) \u201cClassification of shock model in system reliability\u201d, Monografias del Semin. Matem Garcia de Galdeano 27:405\u2013412","journal-title":"Matem Garcia de Galdeano"},{"issue":"2","key":"55_CR19","doi-asserted-by":"crossref","first-page":"427","DOI":"10.1007\/BF02595723","volume":"12","author":"F Mallor","year":"2003","unstructured":"Mallor F, Santos J (2003b) Reliability of systems subject to shocks with a stochastic dependence for the damages. Test 12(2):427\u2013444","journal-title":"Test"},{"issue":"1","key":"55_CR20","doi-asserted-by":"crossref","first-page":"5410","DOI":"10.1007\/s10958-006-0306-4","volume":"138","author":"F Mallor","year":"2006","unstructured":"Mallor F, Omey E, Santos J (2006) Asymptotic results for a run and cumulative mixed shock model. J Math Sci 138(1):5410\u20135414","journal-title":"J Math Sci"},{"issue":"3","key":"55_CR21","doi-asserted-by":"crossref","first-page":"824","DOI":"10.1061\/(ASCE)0733-9445(1994)120:3(824)","volume":"120","author":"Y Mori","year":"1994","unstructured":"Mori Y, Ellingwood BR (1994) Maintaining: reliability of concrete structures I: role of inspection\/repair. Struct Eng 120(3):824\u2013845","journal-title":"Struct Eng"},{"key":"55_CR22","volume-title":"Shock and damage models in reliability theory","author":"T Nakagawa","year":"2007","unstructured":"Nakagawa T (2007) Shock and damage models in reliability theory. Springer, NY"},{"key":"55_CR23","unstructured":"Peng H, Feng Q, Coit DW (2009) Reliability modeling for MEMS devices subjected to multiple dependent competing failure processes. In: Proceedings of the 2009 industrial engineering research conference, Miami"},{"key":"55_CR24","doi-asserted-by":"crossref","unstructured":"Peng H, Feng Q, Coit DW (2009) Simultaneous quality and reliability optimization for microengines subject to degradation. IEEE Trans Reliab 58(1)","DOI":"10.1109\/TR.2008.2011672"},{"issue":"11","key":"55_CR25","doi-asserted-by":"crossref","first-page":"1393","DOI":"10.1080\/00207720903353617","volume":"41","author":"A Persona","year":"2010","unstructured":"Persona A, Sgarbossa F, Pham H (2010) Age replacement policy in a random environment using systemability. Int J Syst Sci 41(11):1393\u20131397","journal-title":"Int J Syst Sci"},{"key":"55_CR26","unstructured":"Pham H (2005) A new mathematical reliability function considering operational environments. Int J Performab Eng 1(2)"},{"key":"55_CR27","doi-asserted-by":"crossref","first-page":"425","DOI":"10.1016\/S0377-2217(96)00099-9","volume":"94","author":"H Pham","year":"1996","unstructured":"Pham H, Wang H (1996) Imperfect maintenance. Eur J Oper Res 94:425\u2013438","journal-title":"Eur J Oper Res"},{"key":"55_CR28","doi-asserted-by":"crossref","first-page":"22","DOI":"10.1016\/j.ress.2007.03.022","volume":"94","author":"A Sanchez","year":"2009","unstructured":"Sanchez A, Carlos S, Martorell S, Jose F (2009) Villanueva, \u201cAddressing imperfect maintenance modeling uncertainty in unavailability and cost based optimization\u201d. Reliab Eng Syst Saf 94:22\u201332","journal-title":"Reliab Eng Syst Saf"},{"key":"55_CR29","doi-asserted-by":"crossref","first-page":"313","DOI":"10.1016\/S0895-7177(00)00101-1","volume":"31","author":"T Satow","year":"2000","unstructured":"Satow T, Teramoto K, Nakagawa T (2000) Optimal replacement policy for a cumulative damage model with time deterioration. Math Comput Model 31:313\u2013319","journal-title":"Math Comput Model"},{"issue":"4","key":"55_CR30","doi-asserted-by":"crossref","first-page":"429","DOI":"10.1109\/TSMCC.2010.2042713","volume":"40","author":"F Sgarbossa","year":"2010","unstructured":"Sgarbossa F, Pham H (2010) A cost analysis of systems subject to random field environments and reliability. IEEE Trans Syst Man Cybernet C 40(4):429\u2013437","journal-title":"IEEE Trans Syst Man Cybernet C"},{"key":"55_CR31","doi-asserted-by":"crossref","unstructured":"Tanner DM, Smith NF, Irwin LW, Eaton WP, Helgesen KS, Clement JJ, Miller WM, Walraven JA, Peterson KA, Tangyunyong P, Dugger MT, Miller SL (2000) MEMS reliability: infrastructure, test structures, experiments, and failure modes. Sandia National Laboratories, Albuquerque, NM 87185-1081","DOI":"10.2172\/750344"},{"key":"55_CR32","unstructured":"van Noortwijk JM, Pandey MD (2003) A stochastic deterioration process for time-dependent reliability analysis. In: Proceedings of the eleventh IFIP WG 7.5 working conference on reliability and optimization of structural systems, pp 259\u2013265"},{"key":"55_CR33","doi-asserted-by":"crossref","first-page":"1651","DOI":"10.1016\/j.ress.2006.11.003","volume":"92","author":"JM Noortwijk van","year":"2007","unstructured":"van Noortwijk JM, Van der Weide JAM, Kallen MJ, Pandey MD (2007) Gamma processes and peaks-over-threshold distribution for time-dependent reliability. Reliab Eng Syst Saf 92:1651\u20131658","journal-title":"Reliab Eng Syst Saf"},{"key":"55_CR34","volume-title":"Reliability and optimal maintenance","author":"H Wang","year":"2006","unstructured":"Wang H, Pham H (2006) Reliability and optimal maintenance. Springer, NY"},{"issue":"6","key":"55_CR35","doi-asserted-by":"crossref","first-page":"577","DOI":"10.1016\/j.spl.2006.08.008","volume":"77","author":"L Zehui","year":"2007","unstructured":"Zehui L, Kong X (2007) Life behavior of \u03b4-shock model. Stat Probab Lett 77(6):577\u2013587","journal-title":"Stat Probab Lett"},{"issue":"2","key":"55_CR36","doi-asserted-by":"crossref","first-page":"340","DOI":"10.1109\/TR.2007.895306","volume":"56","author":"L Zehui","year":"2007","unstructured":"Zehui L, Zhao P (2007) Reliability analysis on the \u03b4-shock model of complex systems. IEEE Trans Reliab 56(2):340\u2013348","journal-title":"IEEE Trans Reliab"},{"issue":"1","key":"55_CR37","doi-asserted-by":"crossref","first-page":"9","DOI":"10.1109\/24.765922","volume":"48","author":"MJ Zuo","year":"1999","unstructured":"Zuo MJ, Jiang R, Yam RCM (1999) Approaches for reliability modeling of continuous-state devices. IEEE Trans Reliab 48(1):9\u201318","journal-title":"IEEE Trans Reliab"}],"container-title":["International Journal of System Assurance Engineering and Management"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s13198-011-0055-8.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s13198-011-0055-8\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s13198-011-0055-8","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,10]],"date-time":"2019-06-10T05:46:51Z","timestamp":1560145611000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s13198-011-0055-8"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,3]]},"references-count":37,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2011,3]]}},"alternative-id":["55"],"URL":"https:\/\/doi.org\/10.1007\/s13198-011-0055-8","relation":{},"ISSN":["0975-6809","0976-4348"],"issn-type":[{"value":"0975-6809","type":"print"},{"value":"0976-4348","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,3]]}}}