{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T03:21:20Z","timestamp":1781839280184,"version":"3.54.5"},"reference-count":30,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[2013,7,24]],"date-time":"2013-07-24T00:00:00Z","timestamp":1374624000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Int J Syst Assur Eng Manag"],"published-print":{"date-parts":[[2014,9]]},"DOI":"10.1007\/s13198-013-0181-6","type":"journal-article","created":{"date-parts":[[2013,7,24]],"date-time":"2013-07-24T12:22:53Z","timestamp":1374668573000},"page":"399-406","source":"Crossref","is-referenced-by-count":35,"title":["A NHPP based software reliability model and optimal release policy with logistic\u2013exponential test coverage under imperfect debugging"],"prefix":"10.1007","volume":"5","author":[{"given":"S.","family":"Chatterjee","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"J. B.","family":"Singh","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2013,7,24]]},"reference":[{"issue":"8","key":"181_CR1","doi-asserted-by":"crossref","first-page":"986","DOI":"10.1057\/palgrave.jors.2602061","volume":"57","author":"T Bhaskar","year":"2006","unstructured":"Bhaskar T, Kumar UD (2006) A cost model for N-version programming with imperfect debugging. J Oper Res Soc 57(8):986\u2013994","journal-title":"J Oper Res Soc"},{"key":"181_CR2","unstructured":"Cai X, Lyu MR (2007) Software reliability modelling with test coverage experimentation and measurement with a fault tolerant software project. In: Proceedings of international symposium on software reliability engineering, pp 17\u201326"},{"issue":"4","key":"181_CR3","doi-asserted-by":"crossref","first-page":"391","DOI":"10.1080\/00207729708929399","volume":"28","author":"S Chatterjee","year":"1997","unstructured":"Chatterjee S, Misra RB, Alam SS (1997) Joint effect of test effort and learning factor on software reliability and optimal release policy. Int J Syst Sci 28(4):391\u2013396","journal-title":"Int J Syst Sci"},{"key":"181_CR4","doi-asserted-by":"crossref","unstructured":"Fujiwara T, Park JY, Park JH (2007). Evaluation and applications of MVFs in coverage for coverage-based NHPP SRGM frameworks. In: Proceedings of 5th international conference on software engineering research, management and applications, pp 385\u2013392","DOI":"10.1109\/SERA.2007.85"},{"issue":"3","key":"181_CR5","doi-asserted-by":"crossref","first-page":"206","DOI":"10.1109\/TR.1979.5220566","volume":"28","author":"AL Goel","year":"1979","unstructured":"Goel AL, Okumoto K (1979) Time-dependent error-detection rate models for software reliability and other performance measures. IEEE Trans Reliab 28(3):206\u2013211","journal-title":"IEEE Trans Reliab"},{"key":"181_CR6","doi-asserted-by":"crossref","first-page":"85","DOI":"10.1023\/A:1018923329647","volume":"8","author":"G Gokhale","year":"1999","unstructured":"Gokhale G, Trivedi KS (1999) A time\/structure based software reliability model. Ann Softw Eng 8:85\u2013121","journal-title":"Ann Softw Eng"},{"key":"181_CR7","doi-asserted-by":"crossref","unstructured":"Gokhale SS, Philip T, Marinos PN, Trivedi KS (1996) Unifications of finite failure non-homogeneous Poisson process models through test coverage. In: Proceedings of the 7th IEEE international symposium on software reliability engineering, White Plains, New York, pp 299\u2013307","DOI":"10.1109\/ISSRE.1996.558886"},{"issue":"4","key":"181_CR8","doi-asserted-by":"crossref","first-page":"583","DOI":"10.1109\/TR.2005.859230","volume":"54","author":"CY Huang","year":"2005","unstructured":"Huang CY, Lyu MR (2005) Optimal release time for software systems considering cost, testing-effort, and test efficiency. IEEE Trans Reliab 54(4):583\u2013591","journal-title":"IEEE Trans Reliab"},{"key":"181_CR9","doi-asserted-by":"crossref","first-page":"49","DOI":"10.1016\/0951-8320(92)90021-C","volume":"35","author":"PK Kapur","year":"1992","unstructured":"Kapur PK, Bhalla VK (1992) Optimal release policy for flexible software reliability growth model. Reliab Eng Syst Saf 35:49\u201354","journal-title":"Reliab Eng Syst Saf"},{"key":"181_CR10","doi-asserted-by":"crossref","first-page":"2547","DOI":"10.1080\/00207728908910332","volume":"20","author":"PK Kapur","year":"1989","unstructured":"Kapur PK, Garg RB (1989) Cost reliability optimum release policies for a software system under penalty cost. Int J Syst Sci 20:2547\u20132562","journal-title":"Int J Syst Sci"},{"key":"181_CR11","doi-asserted-by":"crossref","DOI":"10.1142\/4011","volume-title":"Contribution to hardware and software reliability","author":"PK Kapur","year":"1999","unstructured":"Kapur PK, Garg RB, Kumar S (1999) Contribution to hardware and software reliability. World Scientific Press, Singapore"},{"issue":"3","key":"181_CR12","doi-asserted-by":"crossref","first-page":"252","DOI":"10.1002\/nav.20279","volume":"55","author":"Y Lan","year":"2008","unstructured":"Lan Y, Leemis L (2008) The logistic\u2013exponential survival distribution. Naval Res Logist 55(3):252\u2013264","journal-title":"Naval Res Logist"},{"key":"181_CR13","unstructured":"Li H, Li Qiuying, Lu M (2008) Student paper: software reliability modelling with logistic test coverage function. In: Proceedings of 19th international symposium on software reliability engineering, pp 319\u2013320"},{"key":"181_CR14","volume-title":"Handbook of software reliability engineering","author":"MR Lyu","year":"1996","unstructured":"Lyu MR (1996) Handbook of software reliability engineering. IEEE Computer Society Press\/McGraw Hill, New York"},{"issue":"4","key":"181_CR15","doi-asserted-by":"crossref","first-page":"420","DOI":"10.1109\/TR.2002.804489","volume":"51","author":"YK Malaiya","year":"2002","unstructured":"Malaiya YK, Li MN, Bieman JM, Karcich R (2002) Software reliability growth model with test coverage. IEEE Trans Reliab 51(4):420\u2013426","journal-title":"IEEE Trans Reliab"},{"key":"181_CR16","doi-asserted-by":"crossref","first-page":"315","DOI":"10.1016\/0164-1212(79)90033-5","volume":"1","author":"K Okumoto","year":"1980","unstructured":"Okumoto K, Goel AL (1980) Optimal release time for software system based on reliability and cost criteria. J Syst Softw 1:315\u2013318","journal-title":"J Syst Softw"},{"issue":"1","key":"181_CR18","first-page":"53","volume":"8","author":"JY Park","year":"2007","unstructured":"Park JY, Hwang YS, Fujiwara T (2007a) Generalization of the testing-domain dependent NHPP SRGM and its application. Int J Reliab Appl 8(1):53\u201366","journal-title":"Int J Reliab Appl"},{"issue":"3","key":"181_CR19","doi-asserted-by":"crossref","first-page":"497","DOI":"10.5351\/CKSS.2007.14.3.497","volume":"14","author":"JY Park","year":"2007","unstructured":"Park JY, Lee G, Park JH (2007b) A class of discrete time coverage growth functions for software reliability engineering. Korean Commun Stat 14(3):497\u2013506","journal-title":"Korean Commun Stat"},{"issue":"6","key":"181_CR20","doi-asserted-by":"crossref","first-page":"875","DOI":"10.5351\/CKSS.2008.15.6.875","volume":"15","author":"JY Park","year":"2008","unstructured":"Park JY, Lee G, Park JH (2008a) A general coverage-based NHPP SRGM framework. Commun Korean Stat Soc 15(6):875\u2013881","journal-title":"Commun Korean Stat Soc"},{"key":"181_CR21","doi-asserted-by":"crossref","first-page":"241","DOI":"10.1016\/j.jkss.2008.01.002","volume":"37","author":"JY Park","year":"2008","unstructured":"Park JY, Lee G, Park JH (2008b) A class of coverage growth functions and its practical application. J Korean Stat Soc 37:241\u2013247","journal-title":"J Korean Stat Soc"},{"issue":"5","key":"181_CR22","doi-asserted-by":"crossref","first-page":"455","DOI":"10.1080\/00207729608929237","volume":"27","author":"H Pham","year":"1996","unstructured":"Pham H (1996) A software cost model with imperfect debugging random life cycle and penalty cost. Int J Syst Sci 27(5):455\u2013463","journal-title":"Int J Syst Sci"},{"key":"181_CR23","doi-asserted-by":"crossref","DOI":"10.1007\/1-84628-295-0","volume-title":"System software reliability","author":"H Pham","year":"2006","unstructured":"Pham H (2006) System software reliability. Springer, London"},{"key":"181_CR24","doi-asserted-by":"crossref","first-page":"71","DOI":"10.1109\/12.743412","volume":"28","author":"H Pham","year":"1999","unstructured":"Pham H, Zhang Z (1999) A software cost model with warranty cost. IEEE Trans Comput 28:71\u201375","journal-title":"IEEE Trans Comput"},{"key":"181_CR25","doi-asserted-by":"crossref","first-page":"443","DOI":"10.1016\/S0377-2217(02)00181-9","volume":"145","author":"H Pham","year":"2003","unstructured":"Pham H, Zhang Z (2003) NHPP software reliability and cost models with testing coverage. Eur J Oper Res 145:443\u2013454","journal-title":"Eur J Oper Res"},{"issue":"2","key":"181_CR26","doi-asserted-by":"crossref","first-page":"169","DOI":"10.1109\/24.784276","volume":"48","author":"H Pham","year":"1999","unstructured":"Pham H, Nordmann L, Zhang X (1999) A general imperfect software debugging model with S-shaped fault detection rate. IEEE Trans Reliab 48(2):169\u2013175","journal-title":"IEEE Trans Reliab"},{"issue":"2","key":"181_CR27","first-page":"387","volume":"2","author":"SM Rafi","year":"2010","unstructured":"Rafi SM, Rao KN, Akthar S (2010) Software reliability growth model with logistic\u2013exponential test-effort function and analysis of software release policy. Int J Comput Sci Eng 2(2):387\u2013399","journal-title":"Int J Comput Sci Eng"},{"key":"181_CR28","unstructured":"Wei DP, Liu LL (2010) An improved software reliability model incorporating debugging time lag. In: Second international conference on advanced computer control (ICACC), vol 3, pp 83\u201386"},{"key":"181_CR29","doi-asserted-by":"crossref","DOI":"10.1142\/1390","volume-title":"Software reliability modelling","author":"M Xie","year":"1991","unstructured":"Xie M (1991) Software reliability modelling. World Scientific Press, Singapore"},{"issue":"5","key":"181_CR30","doi-asserted-by":"crossref","first-page":"422","DOI":"10.1109\/TR.1985.5222222","volume":"34","author":"S Yamada","year":"1985","unstructured":"Yamada S, Osaki S (1985) Cost-reliability optimal release policies for software systems. IEEE Trans Reliab 34(5):422\u2013424","journal-title":"IEEE Trans Reliab"},{"key":"181_CR31","first-page":"422","volume":"12","author":"S Yamada","year":"1983","unstructured":"Yamada S, Ohba M, Osaki S (1983) S-shaped reliability growth modelling for software error detection. IEEE Trans Reliab 12:422\u2013424","journal-title":"IEEE Trans Reliab"}],"container-title":["International Journal of System Assurance Engineering and Management"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s13198-013-0181-6.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s13198-013-0181-6\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s13198-013-0181-6","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,7,19]],"date-time":"2019-07-19T05:14:38Z","timestamp":1563513278000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s13198-013-0181-6"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,7,24]]},"references-count":30,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2014,9]]}},"alternative-id":["181"],"URL":"https:\/\/doi.org\/10.1007\/s13198-013-0181-6","relation":{},"ISSN":["0975-6809","0976-4348"],"issn-type":[{"value":"0975-6809","type":"print"},{"value":"0976-4348","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,7,24]]}}}