{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,14]],"date-time":"2025-11-14T17:20:22Z","timestamp":1763140822159},"reference-count":29,"publisher":"Springer Science and Business Media LLC","issue":"1","license":[{"start":{"date-parts":[[2015,12,22]],"date-time":"2015-12-22T00:00:00Z","timestamp":1450742400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Int J Syst Assur Eng Manag"],"published-print":{"date-parts":[[2016,3]]},"DOI":"10.1007\/s13198-015-0410-2","type":"journal-article","created":{"date-parts":[[2015,12,22]],"date-time":"2015-12-22T18:03:53Z","timestamp":1450807433000},"page":"25-34","update-policy":"http:\/\/dx.doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":8,"title":["An intelligent technique for condition based self-maintenance of aluminum electrolytic capacitors"],"prefix":"10.1007","volume":"7","author":[{"given":"Neeraj","family":"Khera","sequence":"first","affiliation":[]},{"given":"Shakeb A.","family":"Khan","sequence":"additional","affiliation":[]},{"given":"Tariqul","family":"Islam","sequence":"additional","affiliation":[]},{"given":"A. K.","family":"Agarwala","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2015,12,22]]},"reference":[{"issue":"4","key":"410_CR1","doi-asserted-by":"crossref","first-page":"1644","DOI":"10.1109\/TIA.2010.2049972","volume":"46","author":"K Abdennadher","year":"2010","unstructured":"Abdennadher K, Venet P, R\u00e9tif J, Rosset C (2010) A real-time predictive maintenance system of aluminum electrolytic capacitors used in uninterrupted power supplies. IEEE Trans Ind Appl 46(4):1644\u20131652","journal-title":"IEEE Trans Ind Appl"},{"key":"410_CR2","unstructured":"Alvsten B (1995) Electrolytic capacitors theory and application, vol 1. RIFA Electrolytics, pp 1\u201368"},{"issue":"8","key":"410_CR3","doi-asserted-by":"crossref","first-page":"3230","DOI":"10.1109\/TIE.2009.2022077","volume":"56","author":"A Amaral","year":"2009","unstructured":"Amaral A, Cardoso A (2009) A simple offline technique for evaluating the condition of aluminum electrolytic capacitors. IEEE Trans Ind Electron 56(8):3230\u20133237","journal-title":"IEEE Trans Ind Electron"},{"issue":"4","key":"410_CR4","doi-asserted-by":"crossref","first-page":"325","DOI":"10.1007\/s13198-012-0085-x","volume":"2","author":"A Amaral","year":"2011","unstructured":"Amaral A, Cardoso A (2011) Condition monitoring of electrolytic capacitors. Int J Syst Assur Eng Manag 2(4):325\u2013332. doi: 10.1007\/s13198-012-0085-x","journal-title":"Int J Syst Assur Eng Manag"},{"issue":"3","key":"410_CR5","doi-asserted-by":"crossref","first-page":"315","DOI":"10.1049\/iet-pel.2011.0163","volume":"5","author":"A Amaral","year":"2012","unstructured":"Amaral A, Cardoso A (2012) On-line fault detection of aluminium electrolytic capacitors, in step-down DC\u2013DC converters, using input current and output voltage ripple. IET Power Electron 5(3):315\u2013322","journal-title":"IET Power Electron"},{"key":"410_CR6","unstructured":"Analog Technologies (2013) ATE1-49 TEC modules, pp 1\u20135. http:\/\/www.analogtechnologies.com\/document\/ATE1-49.pdf"},{"issue":"6","key":"410_CR7","doi-asserted-by":"crossref","first-page":"835","DOI":"10.1016\/S0026-2714(02)00021-5","volume":"42","author":"A Dehbi","year":"2002","unstructured":"Dehbi A, Wondrak W, Ousten Y, Danto Y (2002) High temperature reliability testing of aluminum and tantalum electrolytic capacitors. Microelectron Reliab 42(6):835\u2013840","journal-title":"Microelectron Reliab"},{"issue":"6","key":"410_CR8","doi-asserted-by":"crossref","first-page":"1430","DOI":"10.1109\/TIA.2005.858258","volume":"41","author":"M Gasperi","year":"2005","unstructured":"Gasperi M (2005) Life prediction modeling of bus capacitors in ac variable-frequency drives. IEEE Trans Ind Appl 41(6):1430\u20131435","journal-title":"IEEE Trans Ind Appl"},{"issue":"9","key":"410_CR9","doi-asserted-by":"crossref","first-page":"1395","DOI":"10.1109\/TCPMT.2011.2159304","volume":"1","author":"M Gupta","year":"2011","unstructured":"Gupta M, Sayer M, Mukhopadhyay S (2011) Ultrathin thermoelectric devices for on-chip Peltier cooling. IEEE Trans Compon Packag Manuf Technol 1(9):1395\u20131405","journal-title":"IEEE Trans Compon Packag Manuf Technol"},{"issue":"1","key":"410_CR10","doi-asserted-by":"crossref","first-page":"4","DOI":"10.1109\/TPWRD.2002.801425","volume":"18","author":"Y Han","year":"2003","unstructured":"Han Y, Song Y (2003) Condition monitoring techniques for electrical equipment-a literature survey. IEEE Trans Power Deliv 18(1):4\u201313","journal-title":"IEEE Trans Power Deliv"},{"issue":"6","key":"410_CR11","doi-asserted-by":"crossref","first-page":"641","DOI":"10.1007\/s10836-010-5175-6","volume":"26","author":"Jari Hannu","year":"2010","unstructured":"Hannu Jari, Saikkonen T, H\u00e4kkinen J, Karttunen J, Moilanen M (2010) Enabling remote testing: embedded test controller and mixed signal test architecture. J Electron Test 26(6):641\u2013658","journal-title":"J Electron Test"},{"issue":"4","key":"410_CR12","doi-asserted-by":"crossref","first-page":"355","DOI":"10.1109\/63.261004","volume":"8","author":"K Harada","year":"1993","unstructured":"Harada K, Katsuki A, Fujiwara M (1993) Use of ESR for deterioration diagnosis of electrolytic capacitor. IEEE Trans Power Electron 8(4):355\u2013361","journal-title":"IEEE Trans Power Electron"},{"issue":"2","key":"410_CR13","doi-asserted-by":"crossref","first-page":"109","DOI":"10.1155\/APEC.2.109","volume":"2","author":"F Hayatee","year":"1975","unstructured":"Hayatee F (1975) Heat dissipation and ripple current rating in electrolytic capacitors. Hindawi ElectroCompon Sci Technol 2(2):109\u2013114","journal-title":"Hindawi ElectroCompon Sci Technol"},{"issue":"2","key":"410_CR14","doi-asserted-by":"crossref","first-page":"16","DOI":"10.1109\/MSPEC.2003.1176509","volume":"40","author":"C Holzman","year":"2003","unstructured":"Holzman C (2003) Leaking capacitors muck up motherboards. News Anal IEEE Spectr 40(2):16\u201317","journal-title":"News Anal IEEE Spectr"},{"key":"410_CR15","unstructured":"Khan SA, Khera N, Islam T, Agarwala AK (2012) A simple technique for monitoring ESR of aluminum electrolytic capacitor at variable frequencies. In: Proceedings of international conference on advances in power conversion and energy technologies, pp 259\u2013264"},{"issue":"6","key":"410_CR16","doi-asserted-by":"crossref","first-page":"701","DOI":"10.1007\/s10836-014-5491-3","volume":"30","author":"SA Khan","year":"2014","unstructured":"Khan SA, Khera N, Islam T, Agarwala AK (2014a) On-line condition monitoring and maintenance of power electronic converters. J Electron Test 30(6):701\u2013709","journal-title":"J Electron Test"},{"key":"410_CR17","doi-asserted-by":"crossref","unstructured":"Khan SA, Khera N, Islam T, Agarwala AK (2014) An online method for condition based maintenance of aluminum electrolytic capacitors. In: Proceedings of IEEE conference on recent advances in engineering and computer sciences, pp 1\u20135","DOI":"10.1109\/RAECS.2014.6799592"},{"issue":"5","key":"410_CR18","doi-asserted-by":"crossref","first-page":"1606","DOI":"10.1109\/TIA.2008.2002220","volume":"44","author":"K Lee","year":"2008","unstructured":"Lee K, Kim M, Yoon J, Yoo J (2008) Condition monitoring of DC-Link electrolytic capacitors in adjustable-speed drives. IEEE Trans Ind Appl 44(5):1606\u20131613","journal-title":"IEEE Trans Ind Appl"},{"key":"410_CR19","unstructured":"Nichicon Corporation (2002) Technical notes. Kyoto, pp 1\u201328. CAT.8101D. http:\/\/www.nichicon.co.jp\/english\/products\/pdf\/aluminum.pdf"},{"key":"410_CR20","doi-asserted-by":"crossref","unstructured":"Sankaran V, Rees F, Avant C (1997) Electrolytic capacitor life testing and prediction. In: Proceedings of IEEE conference on industry applications, pp 1058\u20131065","DOI":"10.1109\/IAS.1997.628992"},{"issue":"1","key":"410_CR21","doi-asserted-by":"crossref","first-page":"591","DOI":"10.1109\/TPEL.2012.2192503","volume":"28","author":"Y Song","year":"2013","unstructured":"Song Y, Wang B (2013) Survey on reliability of power electronic systems. IEEE Trans Power Electron 28(1):591\u2013604","journal-title":"IEEE Trans Power Electron"},{"issue":"4","key":"410_CR22","doi-asserted-by":"crossref","first-page":"465","DOI":"10.1049\/iet-pel.2009.0146","volume":"3","author":"K Tsang","year":"2010","unstructured":"Tsang K, Chan W (2010) Simple method for measuring the equivalent series inductance and resistance of electrolytic capacitors. IET Power Electron 3(4):465\u2013471","journal-title":"IET Power Electron"},{"key":"410_CR23","unstructured":"Vishay BC components (2007) Aluminium capacitors: document number: 28356, Vishay, March 2007"},{"issue":"1","key":"410_CR24","doi-asserted-by":"crossref","first-page":"16","DOI":"10.1109\/2943.974353","volume":"8","author":"P Venet","year":"2002","unstructured":"Venet P, Perisse F, El-Husseini M, Rojat G (2002) Realization of smart electrolytic capacitor circuit. IEEE Ind Appl Mag 8(1):16\u201320","journal-title":"IEEE Ind Appl Mag"},{"key":"410_CR25","doi-asserted-by":"crossref","first-page":"89","DOI":"10.1007\/s00202-004-0265-z","volume":"88","author":"P Venet","year":"2006","unstructured":"Venet P, Rojat G, R\u00e9tif J (2006) Simple model of an electrolytic capacitor taking into account the temperature and aging time. J Electr Eng 88:89\u201395. doi: 10.1007\/s00202-004-0265-z","journal-title":"J Electr Eng"},{"issue":"2","key":"410_CR26","doi-asserted-by":"crossref","first-page":"493","DOI":"10.1109\/TPEL.2010.2059713","volume":"26","author":"M Vogelsberger","year":"2011","unstructured":"Vogelsberger M, Wiesinger T, Ertl H (2011) Life-cycle monitoring and voltage-managing unit for dc-link electrolytic capacitors in PWM converters. IEEE Trans Power Electron 26(2):493\u2013503","journal-title":"IEEE Trans Power Electron"},{"key":"410_CR27","doi-asserted-by":"crossref","unstructured":"Wang H, Zhou D, Blaabjerg F (2013) A reliability-oriented design method for power electronic converters. In: Proceedings of IEEE applied power electronics conference and exposition, pp 2291\u20132298","DOI":"10.1109\/APEC.2013.6520713"},{"issue":"3","key":"410_CR28","doi-asserted-by":"crossref","first-page":"1441","DOI":"10.1109\/TIA.2011.2124436","volume":"47","author":"S Yang","year":"2011","unstructured":"Yang S, Bryant A, Mawby P, Xiang D, Ran L, Tavner P (2011) An industry-based survey of reliability in power electronic converters. IEEE Trans Ind Appl 47(3):1441\u20131451","journal-title":"IEEE Trans Ind Appl"},{"key":"410_CR29","unstructured":"ZVEL (2008) Handbook for robustness validation of automotive electrical\/electronic modules"}],"container-title":["International Journal of System Assurance Engineering and Management"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s13198-015-0410-2.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s13198-015-0410-2\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s13198-015-0410-2","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,2]],"date-time":"2019-06-02T14:48:50Z","timestamp":1559486930000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s13198-015-0410-2"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,12,22]]},"references-count":29,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2016,3]]}},"alternative-id":["410"],"URL":"https:\/\/doi.org\/10.1007\/s13198-015-0410-2","relation":{},"ISSN":["0975-6809","0976-4348"],"issn-type":[{"value":"0975-6809","type":"print"},{"value":"0976-4348","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,12,22]]}}}