{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,17]],"date-time":"2026-07-17T18:09:29Z","timestamp":1784311769029,"version":"3.55.0"},"reference-count":33,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2016,3,16]],"date-time":"2016-03-16T00:00:00Z","timestamp":1458086400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Int J Syst Assur Eng Manag"],"published-print":{"date-parts":[[2017,6]]},"DOI":"10.1007\/s13198-016-0437-z","type":"journal-article","created":{"date-parts":[[2016,3,18]],"date-time":"2016-03-18T19:05:02Z","timestamp":1458327902000},"page":"318-333","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":6,"title":["Assessing lifetime performance index of Weibull distributed products using progressive type II right censored samples"],"prefix":"10.1007","volume":"8","author":[{"given":"Sanku","family":"Dey","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0169-4094","authenticated-orcid":false,"given":"Vikas Kumar","family":"Sharma","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"M. Z.","family":"Anis","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Babita","family":"Yadav","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2016,3,16]]},"reference":[{"key":"437_CR1","doi-asserted-by":"crossref","first-page":"93","DOI":"10.1016\/j.cam.2012.09.006","volume":"239","author":"MV Ahmadi","year":"2013","unstructured":"Ahmadi MV, Doostparast M, Ahmadi J (2013) On the estimating the lifetime performance index with weibull distribution based on progressive first-failure censoring scheme. J Comput Appl Math 239:93\u2013102","journal-title":"J Comput Appl Math"},{"issue":"3","key":"437_CR2","doi-asserted-by":"crossref","first-page":"347","DOI":"10.1111\/j.1751-5823.2008.00060.x","volume":"76","author":"AMZ Anis","year":"2008","unstructured":"Anis AMZ (2008) Basic process capability indices: an expository review. Int Stat Rev 76(3):347\u2013367","journal-title":"Int Stat Rev"},{"key":"437_CR3","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4612-1334-5","volume-title":"Progressive censoring: theory, methods and applications","author":"N Balakrishnan","year":"2000","unstructured":"Balakrishnan N, Aggarwala R (2000) Progressive censoring: theory, methods and applications. Birkhuser, Boston"},{"key":"437_CR4","doi-asserted-by":"crossref","first-page":"277","DOI":"10.1080\/0094965021000033530","volume":"73","author":"N Balakrishnan","year":"2003","unstructured":"Balakrishnan N, Lin CT (2003) On the distribution of a test for exponentiality based on progressively type-II right censored spacings. J Stat Comput Simul 73:277\u2013283","journal-title":"J Stat Comput Simul"},{"key":"437_CR5","volume-title":"Goodness-of-fit tests and model validity","author":"N Balakrishnan","year":"2002","unstructured":"Balakrishnan N, Ng HKT, Kannan N (2002) A test of exponentiality based on spacings for progressively type-II censored data. In: Huber-Carol C et al (eds) Goodness-of-fit tests and model validity. Birkhauser, Boston"},{"key":"437_CR6","first-page":"53","volume":"19","author":"HT Chen","year":"2002","unstructured":"Chen HT, Tong LI, Chen KS (2002) Assessing the lifetime performance of electronic components by confidence interval. J Chin Inst Ind Eng 19:53\u201360","journal-title":"J Chin Inst Ind Eng"},{"key":"437_CR7","first-page":"66","volume":"6","author":"MH Chen","year":"1998","unstructured":"Chen MH, Shao QM (1998) Monte carlo estimation of Bayesian credible and HPD intervals. J Comput Graph Stat 6:66\u201392","journal-title":"J Comput Graph Stat"},{"key":"437_CR8","doi-asserted-by":"crossref","first-page":"350","DOI":"10.1111\/j.2517-6161.1978.tb01048.x","volume":"40","author":"MH Gail","year":"1978","unstructured":"Gail MH, Gastwirth JL (1978) A scale-free goodness-of-fit test for the exponential distribution based on the gini statistic. J R Stat Soc Series B Stat Methodol 40:350\u2013357","journal-title":"J R Stat Soc Series B Stat Methodol"},{"key":"437_CR9","doi-asserted-by":"crossref","first-page":"721","DOI":"10.1109\/TPAMI.1984.4767596","volume":"6","author":"S Geman","year":"1984","unstructured":"Geman S, Geman D (1984) Stochastic relaxation, Gibbs distributions and the Bayesian restoration of images. IEEE Trans Pattern Anal Mach Intell 6:721\u2013741","journal-title":"IEEE Trans Pattern Anal Mach Intell"},{"key":"437_CR10","doi-asserted-by":"crossref","first-page":"97","DOI":"10.1093\/biomet\/57.1.97","volume":"55","author":"WK Hastings","year":"1970","unstructured":"Hastings WK (1970) Monte Carlo sampling methods using Markov chains and their applications. Biometrika 55:97\u2013109","journal-title":"Biometrika"},{"key":"437_CR11","doi-asserted-by":"publisher","DOI":"10.1155\/2012\/717184","author":"CW Hong","year":"2012","unstructured":"Hong CW, Lee WC, Wu JW (2012) Computational procedure of performance assessment of lifetime index of products for the weibull distribution with the progressive first-failure-censored sampling plan. J Appl Math. doi: 10.1155\/2012\/717184","journal-title":"J Appl Math"},{"key":"437_CR12","doi-asserted-by":"crossref","first-page":"336","DOI":"10.1016\/j.amc.2006.05.199","volume":"184","author":"CW Hong","year":"2007","unstructured":"Hong CW, Wu JW, Cheng CH (2007) Computational procedure of performance assessment of lifetime index of businesses for the pareto lifetime model with the right type II censored sample. J Appl Math Comput 184:336\u2013350","journal-title":"J Appl Math Comput"},{"key":"437_CR13","doi-asserted-by":"crossref","first-page":"698","DOI":"10.1016\/j.asoc.2007.05.008","volume":"8","author":"CW Hong","year":"2008","unstructured":"Hong CW, Wu JW, Cheng CH (2008) Computational procedure of performance assessment of lifetime index of pareto lifetime businesses based on confidence interval. Appl Soft Comput 8:698\u2013705","journal-title":"Appl Soft Comput"},{"key":"437_CR14","volume-title":"Theory and technique of variation research","author":"LG Johnson","year":"1964","unstructured":"Johnson LG (1964) Theory and technique of variation research. Elsevier, Amsterdam"},{"key":"437_CR15","doi-asserted-by":"crossref","first-page":"41","DOI":"10.1080\/00224065.1986.11978984","volume":"18","author":"VE Kane","year":"1986","unstructured":"Kane VE (1986) Process capability indices. J Qual Technol 18:41\u201352","journal-title":"J Qual Technol"},{"key":"437_CR16","doi-asserted-by":"crossref","DOI":"10.1137\/1.9781611971576","volume-title":"Pitmans measure of closeness: a comparison of statistical estimators","author":"JP Keating","year":"1993","unstructured":"Keating JP, Mason RL, Sen PK (1993) Pitmans measure of closeness: a comparison of statistical estimators. Society for Industrial and Applied Mathematics, Philadelphia, PA"},{"key":"437_CR17","doi-asserted-by":"crossref","first-page":"281","DOI":"10.1016\/j.matcom.2011.07.005","volume":"82","author":"H Krishna","year":"2011","unstructured":"Krishna H, Kumar K (2011) Reliability estimation in lindley distribution with progressively type-II right censored sample. Math Comput Simul 82:281\u2013294","journal-title":"Math Comput Simul"},{"key":"437_CR18","doi-asserted-by":"crossref","first-page":"1007","DOI":"10.1080\/00949655.2011.647027","volume":"83","author":"H Krishna","year":"2013","unstructured":"Krishna H, Kumar K (2013) Reliability estimation in generalized inverted exponential distribution with progressively type II censored sample. J Stat Comput Simul 83:1007\u20131019","journal-title":"J Stat Comput Simul"},{"key":"437_CR19","doi-asserted-by":"crossref","first-page":"330","DOI":"10.1007\/s13198-014-0267-9","volume":"6","author":"K Kumar","year":"2015","unstructured":"Kumar K, Krishna H, Garg R (2015) Estimation of $$p(y>x)$$ p ( y > x ) in lindley distribution using progressively first failure censoring. Int J Syst Assur Eng Manag 6:330\u2013341","journal-title":"Int J Syst Assur Eng Manag"},{"key":"437_CR20","volume-title":"Statistical models and methods for lifetime data","author":"JF Lawless","year":"1982","unstructured":"Lawless JF (1982) Statistical models and methods for lifetime data. Wiley, New York"},{"key":"437_CR21","doi-asserted-by":"crossref","first-page":"296","DOI":"10.1109\/TR.2013.2241197","volume":"62","author":"HM Lee","year":"2013","unstructured":"Lee HM, Wu J, Lei C (2013a) Assessing the lifetime performance index of exponential products with step-stress accelerated life-testing data. IEEE Trans Reliab 62:296\u2013304","journal-title":"IEEE Trans Reliab"},{"key":"437_CR22","doi-asserted-by":"crossref","first-page":"648","DOI":"10.1016\/j.cam.2009.04.018","volume":"231","author":"WC Lee","year":"2009","unstructured":"Lee WC, Wu JW, Hong CW (2009) Assessing the lifetime performance index of products with the exponential distribution under progressively type-ii right censored samples. J Comput Appl Math 231:648\u2013656","journal-title":"J Comput Appl Math"},{"key":"437_CR23","doi-asserted-by":"publisher","DOI":"10.1155\/2013\/547209","author":"WC Lee","year":"2013","unstructured":"Lee WC, Wu JW, Hong CW, Hong SF (2013) Evaluating the lifetime performance index based on the Bayesian estimation for the Rayleigh lifetime products with the upper record values. J Appl Math. doi: 10.1155\/2013\/547209","journal-title":"J Appl Math"},{"key":"437_CR24","doi-asserted-by":"crossref","first-page":"1676","DOI":"10.1016\/j.cam.2010.09.009","volume":"235","author":"WC Lee","year":"2011","unstructured":"Lee WC, Wu JW, Hong ML, Lin LS, Chan RL (2011) Assessing the lifetime performance index of Rayleigh products based on the Bayesian estimation under progressive type-II right censored samples. J Comput Appl Math 235:1676\u20131688","journal-title":"J Comput Appl Math"},{"key":"437_CR25","doi-asserted-by":"crossref","first-page":"1217","DOI":"10.1016\/j.apm.2009.08.013","volume":"34","author":"WC Lee","year":"2010","unstructured":"Lee WC, Wu JW, Lei CL (2010) Evaluating the lifetime performance index for the exponential lifetime products. Appl Math Model 34:1217\u20131224","journal-title":"Appl Math Model"},{"key":"437_CR26","volume-title":"Theory of point estimation","author":"EL Lehmann","year":"1998","unstructured":"Lehmann EL, Casella G (1998) Theory of point estimation, 2nd edn. Springer, New York","edition":"2"},{"key":"437_CR27","doi-asserted-by":"crossref","first-page":"273","DOI":"10.6028\/jres.057.033","volume":"57","author":"J Lieblein","year":"1956","unstructured":"Lieblein J, Zelen M (1956) Statistical investigation of the fatigue life deep groove ball bearings. J Res Natl Bur Stand 57:273\u2013316","journal-title":"J Res Natl Bur Stand"},{"key":"437_CR28","volume-title":"Introduction to statistical quality control","author":"DC Montgomery","year":"1985","unstructured":"Montgomery DC (1985) Introduction to statistical quality control. Wiley, New York"},{"key":"437_CR29","doi-asserted-by":"crossref","first-page":"421","DOI":"10.1016\/S0026-2714(96)00071-6","volume":"37","author":"JN Pan","year":"1997","unstructured":"Pan JN, Wu SL (1997) Process capability analysis for non-normal relay test data. Microelectron Reliab 37:421\u2013428","journal-title":"Microelectron Reliab"},{"key":"437_CR30","doi-asserted-by":"crossref","first-page":"402","DOI":"10.1016\/j.amc.2013.07.058","volume":"222","author":"SK Singh","year":"2013","unstructured":"Singh SK, Singh U, Sharma VK (2013) Expected total test time and Bayesian estimation for generalized lindley distribution under progressively type-II censored sample where removals follow the beta-binomial probability law. Appl Math Comput 222:402\u2013419","journal-title":"Appl Math Comput"},{"key":"437_CR31","doi-asserted-by":"crossref","first-page":"812","DOI":"10.1108\/02656710210434757","volume":"19","author":"LI Tong","year":"2002","unstructured":"Tong LI, Chen KS, Chen HT (2002) Statistical testing for assessing the performance of lifetime index of electronic components with exponential distribution. Int J Qual Reliab Manag 19:812\u2013824","journal-title":"Int J Qual Reliab Manag"},{"key":"437_CR32","doi-asserted-by":"crossref","first-page":"116","DOI":"10.1016\/j.amc.2007.01.010","volume":"190","author":"JW Wu","year":"2007","unstructured":"Wu JW, Lee HM, Lei CL (2007) Computational testing algorithmic procedure of assessment for lifetime performance index of products with two-parameter exponential distribution. Appl Math Comput 190:116\u2013125","journal-title":"Appl Math Comput"},{"key":"437_CR33","doi-asserted-by":"crossref","first-page":"251","DOI":"10.1002\/qre.1115","volume":"27","author":"BJ Yum","year":"2011","unstructured":"Yum BJ, Kim KW (2011) A bibliography of the literature on process capability indices: 2000\u20132009. Qual Reliab Eng Int 27:251\u2013268","journal-title":"Qual Reliab Eng Int"}],"container-title":["International Journal of System Assurance Engineering and Management"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s13198-016-0437-z\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s13198-016-0437-z.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s13198-016-0437-z","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s13198-016-0437-z.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,15]],"date-time":"2024-06-15T03:28:52Z","timestamp":1718422132000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s13198-016-0437-z"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,3,16]]},"references-count":33,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2017,6]]}},"alternative-id":["437"],"URL":"https:\/\/doi.org\/10.1007\/s13198-016-0437-z","relation":{},"ISSN":["0975-6809","0976-4348"],"issn-type":[{"value":"0975-6809","type":"print"},{"value":"0976-4348","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,3,16]]}}}