{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,20]],"date-time":"2026-05-20T04:26:19Z","timestamp":1779251179703,"version":"3.51.4"},"reference-count":48,"publisher":"Springer Science and Business Media LLC","issue":"4","license":[{"start":{"date-parts":[[2016,5,14]],"date-time":"2016-05-14T00:00:00Z","timestamp":1463184000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Int J Syst Assur Eng Manag"],"published-print":{"date-parts":[[2016,12]]},"DOI":"10.1007\/s13198-016-0470-y","type":"journal-article","created":{"date-parts":[[2016,5,14]],"date-time":"2016-05-14T17:08:32Z","timestamp":1463245712000},"page":"427-434","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":17,"title":["Testing effort based modeling to determine optimal release and patching time of software"],"prefix":"10.1007","volume":"7","author":[{"given":"Anshul","family":"Tickoo","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P. K.","family":"Kapur","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A. K.","family":"Shrivastava","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sunil K.","family":"Khatri","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2016,5,14]]},"reference":[{"issue":"1","key":"470_CR1","doi-asserted-by":"crossref","first-page":"89","DOI":"10.1108\/02656711011009335","volume":"27","author":"N Ahmad","year":"2010","unstructured":"Ahmad N, Khan MGM, Rafi LS (2010) A study of testing-effort dependent inflection S-shaped software reliability growth models with imperfect debugging. Int J Qual Reliab Manag 27(1):89\u2013110","journal-title":"Int J Qual Reliab Manag"},{"key":"470_CR2","unstructured":"Apple (2015) https:\/\/www.apple.com\/softwareupdate . Accessed 24 Sept 2015"},{"issue":"3","key":"470_CR3","doi-asserted-by":"crossref","first-page":"465","DOI":"10.1287\/mnsc.1050.0440","volume":"52","author":"A Arora","year":"2006","unstructured":"Arora A, Caulkins JP, Telang R (2006) Research note: sell first, fix later: impact of patching on software quality. Manag Sci 52(3):465\u2013471","journal-title":"Manag Sci"},{"key":"470_CR4","doi-asserted-by":"crossref","first-page":"642","DOI":"10.1287\/mnsc.1070.0771","volume":"54","author":"A Arora","year":"2008","unstructured":"Arora A, Telang R, Xu H (2008) Optimal policy for software vulnerability disclosure. Manag Sci 54:642\u2013656","journal-title":"Manag Sci"},{"key":"470_CR5","doi-asserted-by":"crossref","first-page":"657","DOI":"10.1287\/mnsc.1070.0794","volume":"54","author":"H Cavusoglu","year":"2008","unstructured":"Cavusoglu H, Zhang J (2008) Security patch management: Share the burden or share the damage? Manag Sci 54:657\u2013670","journal-title":"Manag Sci"},{"issue":"3","key":"470_CR6","doi-asserted-by":"crossref","first-page":"399","DOI":"10.1007\/s13198-013-0181-6","volume":"5","author":"S Chatterjee","year":"2014","unstructured":"Chatterjee S, Singh JB (2014) A NHPP based software reliability model and optimal release policy with logistic\u2013exponential test coverage under imperfect debugging. Int J Syst Assur Eng Manag 5(3):399\u2013406","journal-title":"Int J Syst Assur Eng Manag"},{"issue":"3","key":"470_CR7","doi-asserted-by":"crossref","first-page":"462","DOI":"10.1287\/ijoc.2014.0638","volume":"27","author":"D Dey","year":"2015","unstructured":"Dey D, Lahiri A, Zhang G (2015) Optimal policies for security patch management. INFORMS J Comput 27(3):462\u2013477","journal-title":"INFORMS J Comput"},{"key":"470_CR8","doi-asserted-by":"crossref","first-page":"206","DOI":"10.1109\/TR.1979.5220566","volume":"R-28","author":"AL Goel","year":"1979","unstructured":"Goel AL, Okumoto K (1979) Time-dependent error-detection rate model for software reliability and other performance measures. IEEE Trans Reliab R-28:206\u2013211","journal-title":"IEEE Trans Reliab"},{"key":"470_CR9","unstructured":"HP (2015) http:\/\/www.zdnet.com\/hp-to-begin-charging-for-firmware-updates-and-service-packs-for-servers-7000026110 . Accessed 24 July 2015"},{"key":"470_CR10","unstructured":"Huang CY, Kuo SY, Lyu MR, Lo JH (2000) Quantitative software modeling from testing to operation. In: Proceedings of 11th international symposium on software reliability engineering, San Jose, California, 9\u201311 Oct 2000"},{"issue":"3","key":"470_CR11","doi-asserted-by":"crossref","first-page":"261","DOI":"10.1109\/TR.2002.801847","volume":"51","author":"CY Huang","year":"2002","unstructured":"Huang CY, Kuo SY (2002) Analysis of incorporating logistic testing-effort function into software reliability modeling. IEEE Trans Reliab 51(3):261\u2013270","journal-title":"IEEE Trans Reliab"},{"issue":"2","key":"470_CR12","doi-asserted-by":"crossref","first-page":"283","DOI":"10.1109\/TC.2009.103","volume":"59","author":"CY Huang","year":"2010","unstructured":"Huang CY, Lin CT (2010) Analysis of software reliability modeling considering testing compression factor and failure-to-fault relationship. IEEE Trans Comput 59(2):283\u2013288","journal-title":"IEEE Trans Comput"},{"key":"470_CR13","doi-asserted-by":"crossref","first-page":"583","DOI":"10.1109\/TR.2005.859230","volume":"54","author":"C-Y Huang","year":"2005","unstructured":"Huang C-Y, Lyu MR (2005) Optimal release time for software systems considering cost, testing-effort, and test efficiency. IEEE Trans Reliab 54:583\u2013591","journal-title":"IEEE Trans Reliab"},{"issue":"2","key":"470_CR14","first-page":"91","volume":"2","author":"CY Huang","year":"2005","unstructured":"Huang CY, Lin CT, Su YS (2005) Modeling and prediction of software operational reliability. Int J Technol Eng Educ 2(2):91\u2013100","journal-title":"Int J Technol Eng Educ"},{"issue":"2","key":"470_CR15","doi-asserted-by":"crossref","first-page":"198","DOI":"10.1109\/TR.2007.895301","volume":"56","author":"CY Huang","year":"2007","unstructured":"Huang CY, Kuo SK, Lyu MR (2007) An assessment of testing-effort dependent software reliability growth models. IEEE Trans Reliab 56(2):198\u2013211","journal-title":"IEEE Trans Reliab"},{"key":"470_CR16","doi-asserted-by":"crossref","first-page":"8","DOI":"10.4236\/jsea.2013.64A002","volume":"6","author":"S Inoue","year":"2013","unstructured":"Inoue S, Yamada S (2013) Lognormal process software reliability modeling with testing-effort. J Softw Eng Appl 6:8\u201314","journal-title":"J Softw Eng Appl"},{"issue":"1","key":"470_CR17","doi-asserted-by":"crossref","first-page":"33","DOI":"10.1142\/S021759590500042X","volume":"22","author":"M Jain","year":"2005","unstructured":"Jain M, Priya K (2005) Software reliability issues under operational and testing constraints. Asia Pac J Oper Res 22(1):33\u201349","journal-title":"Asia Pac J Oper Res"},{"issue":"3","key":"470_CR18","doi-asserted-by":"crossref","first-page":"635","DOI":"10.1287\/isre.1110.0379","volume":"23","author":"Z Jiang","year":"2012","unstructured":"Jiang Z, Sarkar S, Jacob VS (2012) Post-release testing and software release policy for enterprise-level systems. Inf Syst Res 23(3):635\u2013657","journal-title":"Inf Syst Res"},{"issue":"9","key":"470_CR19","doi-asserted-by":"crossref","first-page":"1563","DOI":"10.1080\/00207729108910731","volume":"22","author":"PK Kapur","year":"1990","unstructured":"Kapur PK, Garg RB (1990) Optimal release policies for software systems with testing effort. Int J Syst Sci 22(9):1563\u20131571","journal-title":"Int J Syst Sci"},{"key":"470_CR20","doi-asserted-by":"crossref","unstructured":"Kapur PK, Singh O, Shrivastava AK, Singh JNP (2015) A software up-gradation model with testing effort and two types of imperfect debugging. In: IEEE Xplore conference proceedings of international conference on futuristic trends in computational analysis and knowledge management, held at Amity University Greater Noida Campus, UP on 25\u201327 Feb 2015, pp 613\u2013618","DOI":"10.1109\/ABLAZE.2015.7154935"},{"issue":"4","key":"470_CR21","doi-asserted-by":"crossref","first-page":"340","DOI":"10.1080\/02286203.2007.11442435","volume":"27","author":"PK Kapur","year":"2007","unstructured":"Kapur PK, Goswami DN, Bardhan A (2007) A general software reliability growth model with testing effort dependent learning process. Int J Model Simul 27(4):340\u2013346","journal-title":"Int J Model Simul"},{"issue":"7","key":"470_CR22","doi-asserted-by":"crossref","first-page":"1298","DOI":"10.1016\/j.apm.2007.04.002","volume":"32","author":"PK Kapur","year":"2008","unstructured":"Kapur PK, Goswami DN, Bardhan A, Singh O (2008) Flexible software reliability growth model with testing effort dependent learning process. Appl Math Model 32(7):1298\u20131307","journal-title":"Appl Math Model"},{"issue":"8","key":"470_CR23","first-page":"521","volume":"4","author":"PK Kapur","year":"2009","unstructured":"Kapur PK, Ompal S, Aggarwal AG, Kumar R (2009) Unified framework for developing testing effort dependent software reliability growth models. WSEAS Trans Syst 4(8):521\u2013531","journal-title":"WSEAS Trans Syst"},{"key":"470_CR24","doi-asserted-by":"crossref","DOI":"10.1007\/978-0-85729-204-9","volume-title":"Software reliability assessment with OR applications","author":"PK Kapur","year":"2011","unstructured":"Kapur PK, Pham H, Gupta A, Jha PC (2011) Software reliability assessment with OR applications. Springer, London"},{"key":"470_CR25","doi-asserted-by":"crossref","unstructured":"Kapur PK, Shrivastava AK (2015) When to release and stop testing of a software: a new insight, international conference on reliability, Infocom Technology and Optimization (trends and future directions), held during 2\u20134 Oct 2015 at Amity University, Noida, Uttar Pradesh, pp 1\u20136","DOI":"10.1109\/ICRITO.2015.7359202"},{"issue":"3","key":"470_CR26","doi-asserted-by":"crossref","first-page":"310","DOI":"10.1109\/24.974129","volume":"50","author":"SY Kuo","year":"2001","unstructured":"Kuo SY, Huang CY, Lyu MR (2001) Framework for modeling software reliability, using various testing-efforts and fault-detection rates. IEEE Trans Reliab 50(3):310\u2013321","journal-title":"IEEE Trans Reliab"},{"issue":"11","key":"470_CR27","doi-asserted-by":"crossref","first-page":"3560","DOI":"10.1016\/j.apm.2010.03.006","volume":"34","author":"X Li","year":"2010","unstructured":"Li X, Xie M, Ng SH (2010) Sensitivity analysis of release time of software reliability models incorporating testing effort with multiple change-points. Appl Math Model 34(11):3560\u20133570","journal-title":"Appl Math Model"},{"issue":"1","key":"470_CR28","doi-asserted-by":"crossref","first-page":"190","DOI":"10.1109\/JSEE.2015.00024","volume":"26","author":"Q Li","year":"2015","unstructured":"Li Q, Li H, Lu M (2015) Incorporating S-shaped testing-effort functions into NHPP software reliability model with imperfect debugging. J Syst Eng Electron 26(1):190\u2013207","journal-title":"J Syst Eng Electron"},{"key":"470_CR29","doi-asserted-by":"crossref","first-page":"1025","DOI":"10.1016\/j.jss.2007.10.002","volume":"81","author":"CT Lin","year":"2008","unstructured":"Lin CT, Huang CY (2008) Enhancing and measuring the predictive capabilities of testing-effort dependent software reliability models. J Syst Softw 81:1025\u20131038","journal-title":"J Syst Softw"},{"key":"470_CR30","doi-asserted-by":"crossref","first-page":"3","DOI":"10.1016\/j.jss.2004.06.025","volume":"76","author":"JH Lo","year":"2005","unstructured":"Lo JH, Huang CY, Chen IY, Kuo SY, Lyu MR (2005) Reliability assessment and sensitivity analysis of software reliability growth modeling based on software module structure. J Syst Softw 76:3\u201313","journal-title":"J Syst Softw"},{"key":"470_CR31","doi-asserted-by":"publisher","DOI":"10.1177\/1748006x15586507","author":"C Luo","year":"2015","unstructured":"Luo C, Okamura H, Dohi T (2015) Optimal planning for open source software updates. Proc IMechE Part O J Risk Reliab. doi: 10.1177\/1748006x15586507","journal-title":"Proc IMechE Part O J Risk Reliab"},{"key":"470_CR32","unstructured":"Musa JD (2004) Software reliability engineering: more reliable software, faster and cheaper, 2nd edn, McGraw-Hill, New Delhi"},{"issue":"4","key":"470_CR33","doi-asserted-by":"crossref","first-page":"428","DOI":"10.1147\/rd.284.0428","volume":"28","author":"M Obha","year":"1984","unstructured":"Obha M (1984) Software reliability analysis models. IBM J. Research Devlopment 28(4):428\u2013443","journal-title":"IBM J. Research Devlopment"},{"key":"470_CR34","doi-asserted-by":"crossref","unstructured":"Okamura H, Tokuzane M, Dohi T (2009) Optimal security patch release timing under non-homogeneous vulnerability-discovery processes. In: Proceedings of the 20th international symposium on software reliability engineering (ISSRE \u201809), Mysuru, India, 2009, pp 120\u2013128","DOI":"10.1109\/ISSRE.2009.19"},{"issue":"4","key":"470_CR35","doi-asserted-by":"crossref","first-page":"531","DOI":"10.1109\/24.556576","volume":"45","author":"A Pasquini","year":"1996","unstructured":"Pasquini A, Crespo A, Matrella P (1996) Sensitivity of reliability-growth models to operational profile errors vs testing accuracy. IEEE Trans Reliab 45(4):531\u2013540","journal-title":"IEEE Trans Reliab"},{"key":"470_CR36","doi-asserted-by":"crossref","first-page":"37","DOI":"10.1016\/j.ress.2014.01.004","volume":"126","author":"R Peng","year":"2014","unstructured":"Peng R, Li YF, Zhang WJ, Hu QP (2014) Testing effort dependent software reliability model for imperfect debugging process considering both detection and correction. Reliab Eng Syst Saf 126:37\u201343","journal-title":"Reliab Eng Syst Saf"},{"key":"470_CR37","doi-asserted-by":"crossref","DOI":"10.1007\/1-84628-295-0","volume-title":"System software reliability","author":"H Pham","year":"2006","unstructured":"Pham H (2006) System software reliability. Springer, London"},{"issue":"2","key":"470_CR38","first-page":"23","volume":"2","author":"J Singh","year":"2012","unstructured":"Singh J, Singh O, Aggrawal D, Anand A, Singh I (2012) A flexible reliability growth model for various releases of software under the influence of testing resources. J Pure Appl Sci Technol NLSS 2(2):23\u201335","journal-title":"J Pure Appl Sci Technol NLSS"},{"issue":"1","key":"470_CR39","doi-asserted-by":"crossref","first-page":"83","DOI":"10.1007\/s13198-014-0246-1","volume":"6","author":"O Singh","year":"2015","unstructured":"Singh O, Kapur PK, Shrivastava AK, Kumar V (2015) Release time problem with multiple constraints. Int J Syst Assur Eng Manag 6(1):83\u201391","journal-title":"Int J Syst Assur Eng Manag"},{"issue":"1","key":"470_CR40","doi-asserted-by":"crossref","first-page":"19","DOI":"10.1109\/TR.1986.4335332","volume":"35","author":"S Yamada","year":"1986","unstructured":"Yamada S, Ohtera H, Narihisa H (1986) Software reliability growth models with testing-effort. Reliab IEEE Trans 35(1):19\u201323","journal-title":"Reliab IEEE Trans"},{"key":"470_CR41","doi-asserted-by":"crossref","first-page":"323","DOI":"10.1016\/S0951-8320(00)00069-7","volume":"70","author":"B Yang","year":"2000","unstructured":"Yang B, Xie M (2000) A study of operational and testing reliability in software reliability analysis. Reliab Eng Syst Saf 70:323\u2013329","journal-title":"Reliab Eng Syst Saf"},{"key":"470_CR42","doi-asserted-by":"publisher","DOI":"10.1007\/s10479-015-1959-5","author":"B Zachariah","year":"2015","unstructured":"Zachariah B (2015) Optimal stopping time in software testing based on failure size approach. Ann Oper Res. doi: 10.1007\/s10479-015-1959-5","journal-title":"Ann Oper Res"},{"issue":"1","key":"470_CR43","doi-asserted-by":"crossref","first-page":"21","DOI":"10.12733\/jics20102148","volume":"12","author":"N Zhang","year":"2015","unstructured":"Zhang N (2015) Queue-based FDP and FCP analysis with detection effort and correction effort. J Inf Comput Sci 12(1):21\u201329","journal-title":"J Inf Comput Sci"},{"issue":"19","key":"470_CR44","first-page":"7991","volume":"8","author":"N Zhang","year":"2012","unstructured":"Zhang N, Cui G, Liu H (2012) Considering detection effort and correction effort for software reliability analysis. J Comput Inf Syst 8(19):7991\u20138000","journal-title":"J Comput Inf Syst"},{"issue":"6","key":"470_CR45","first-page":"310","volume":"8","author":"N Zhang","year":"2013","unstructured":"Zhang N, Cui G, Liu H (2013) Software reliability analysis using queuing based model with testing effort. J Softw 8(6):310\u2013317","journal-title":"J Softw"},{"issue":"2","key":"470_CR46","first-page":"310","volume":"9","author":"C Zhang","year":"2014","unstructured":"Zhang C, Cui G, Liu H (2014) A unified And flexible framework of imperfect debugging dependent SRGMs with testing-effort. J Multimed 9(2):310\u2013317","journal-title":"J Multimed"},{"key":"470_CR47","doi-asserted-by":"publisher","unstructured":"Zhao J, Liu H, Cui G, Yang XZ (2005) Software reliability growth model from testing to operation. In: Proceedings of the 21st IEEE international conference on software maintenance (ICSM'05), 26\u201329 Sept 2005, pp 691\u2013694. doi: 10.1109\/ICSM.2005.82","DOI":"10.1109\/ICSM.2005.82"},{"issue":"8","key":"470_CR48","first-page":"1992","volume":"10","author":"Q Zhao","year":"2012","unstructured":"Zhao Q, Zheng J, Li J (2012) Software reliability modeling with testing-effort function and imperfect debugging. TELKOMNIKA 10(8):1992\u20131998","journal-title":"TELKOMNIKA"}],"container-title":["International Journal of System Assurance Engineering and Management"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s13198-016-0470-y.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s13198-016-0470-y\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s13198-016-0470-y.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s13198-016-0470-y","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,7]],"date-time":"2019-09-07T17:44:04Z","timestamp":1567878244000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s13198-016-0470-y"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5,14]]},"references-count":48,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2016,12]]}},"alternative-id":["470"],"URL":"https:\/\/doi.org\/10.1007\/s13198-016-0470-y","relation":{},"ISSN":["0975-6809","0976-4348"],"issn-type":[{"value":"0975-6809","type":"print"},{"value":"0976-4348","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,5,14]]}}}