{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T17:47:16Z","timestamp":1740160036975,"version":"3.37.3"},"reference-count":7,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[2016,6,27]],"date-time":"2016-06-27T00:00:00Z","timestamp":1466985600000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Int J Syst Assur Eng Manag"],"published-print":{"date-parts":[[2016,9]]},"DOI":"10.1007\/s13198-016-0501-8","type":"journal-article","created":{"date-parts":[[2016,6,27]],"date-time":"2016-06-27T05:57:24Z","timestamp":1467007044000},"page":"325-331","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Reliability prediction of seismic switch for early detection of earthquakes around NPPs"],"prefix":"10.1007","volume":"7","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7978-2321","authenticated-orcid":false,"given":"S. V. Sreekanth","family":"Reddy","sequence":"first","affiliation":[]},{"given":"K.","family":"Rajangam","sequence":"additional","affiliation":[]},{"given":"T. V.","family":"Santhosh","sequence":"additional","affiliation":[]},{"given":"Gopika","family":"Vinod","sequence":"additional","affiliation":[]},{"given":"Shiju","family":"Varghese","sequence":"additional","affiliation":[]},{"given":"Jay","family":"Shah","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2016,6,27]]},"reference":[{"key":"501_CR1","unstructured":"Hai T, Lu L (2014) A quantitative software testing method for hardware and software integrated systems in safety critical applications, Probabilistic Safety Assessment and Management PSAM 12, June 2014"},{"key":"501_CR2","unstructured":"International Electro technical Commission (1998) \u201cIEC 61508 First Edition: Functional safety of electrical\/electronic\/programmable electronic safety\u2014related systems\u201d"},{"key":"501_CR3","unstructured":"MIL-HDBK-338B (1998) Electronic reliability design handbook"},{"key":"501_CR4","unstructured":"Relex Architect (2008) Relex Reliability Studio"},{"key":"501_CR5","unstructured":"RIAC-HDBK-217Plus (2006) Reliability prediction models"},{"key":"501_CR6","unstructured":"Technology Transfer Document: Digital Seismic Switch (2015)"},{"key":"501_CR7","unstructured":"MIL-HDBK-217F (1991) Reliability prediction of electronic equipment, Notice 1 and Notice 2"}],"container-title":["International Journal of System Assurance Engineering and Management"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s13198-016-0501-8.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s13198-016-0501-8\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s13198-016-0501-8","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,8,12]],"date-time":"2016-08-12T07:55:18Z","timestamp":1470988518000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s13198-016-0501-8"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,6,27]]},"references-count":7,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2016,9]]}},"alternative-id":["501"],"URL":"https:\/\/doi.org\/10.1007\/s13198-016-0501-8","relation":{},"ISSN":["0975-6809","0976-4348"],"issn-type":[{"type":"print","value":"0975-6809"},{"type":"electronic","value":"0976-4348"}],"subject":[],"published":{"date-parts":[[2016,6,27]]}}}