{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T23:40:54Z","timestamp":1762040454966,"version":"build-2065373602"},"reference-count":20,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2021,9,18]],"date-time":"2021-09-18T00:00:00Z","timestamp":1631923200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2021,9,18]],"date-time":"2021-09-18T00:00:00Z","timestamp":1631923200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"funder":[{"DOI":"10.13039\/501100004763","name":"Natural Science Foundation of Inner Mongolia","doi-asserted-by":"publisher","award":["2020LH01002"],"award-info":[{"award-number":["2020LH01002"]}],"id":[{"id":"10.13039\/501100004763","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"national natural science foundation of china","doi-asserted-by":"publisher","award":["11861049"],"award-info":[{"award-number":["11861049"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Int J Syst Assur Eng Manag"],"published-print":{"date-parts":[[2022,4]]},"DOI":"10.1007\/s13198-021-01343-0","type":"journal-article","created":{"date-parts":[[2021,9,18]],"date-time":"2021-09-18T04:02:21Z","timestamp":1631937741000},"page":"818-831","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":3,"title":["Reliability analysis of log-normal distribution with nonconstant parameters under constant-stress model"],"prefix":"10.1007","volume":"13","author":[{"given":"Wei","family":"Cui","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5889-1326","authenticated-orcid":false,"given":"Zai-zai","family":"Yan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiu-yun","family":"Peng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gai-mei","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2021,9,18]]},"reference":[{"issue":"9","key":"1343_CR1","first-page":"327","volume":"3","author":"S Anwar","year":"2014","unstructured":"Anwar S (2014) Estimation of constant-stress partially accelerated life test plans for Rayleigh distribution using type-II censoring. Int J Eng Sci Res Technol 3(9):327\u2013332","journal-title":"Int J Eng Sci Res Technol"},{"key":"1343_CR2","doi-asserted-by":"crossref","unstructured":"Balakrishnan N, Aggarwala R (2000) Progressively censoring: theory. In: Methods and applications. Birkh\u00e4user, Boston","DOI":"10.1007\/978-1-4612-1334-5"},{"key":"1343_CR3","doi-asserted-by":"crossref","unstructured":"Boyko KC, Gerlach DL (1989) Time dependent dielectric breakdown of 210A oxides. In: 27th International reliability physics symposium, pp 1\u20138","DOI":"10.1109\/IRPS.1989.362231"},{"issue":"1","key":"1343_CR4","doi-asserted-by":"crossref","first-page":"69","DOI":"10.1080\/10618600.1999.10474802","volume":"8","author":"M Chen","year":"1999","unstructured":"Chen M, Shao Q (1999) Monte Carlo estimation of Bayesian credible and HPD intervals. J Comput Graph Stat 8(1):69\u201392","journal-title":"J Comput Graph Stat"},{"issue":"2","key":"1343_CR5","doi-asserted-by":"publisher","first-page":"337","DOI":"10.2307\/2347565","volume":"41","author":"WR Gilks","year":"1992","unstructured":"Gilks WR, Wild P (1992) Adaptive rejection sampling for Gibbs sampling. Appl Stat 41(2):337\u2013348","journal-title":"Appl Stat"},{"issue":"5","key":"1343_CR6","doi-asserted-by":"publisher","first-page":"913","DOI":"10.1109\/16.299673","volume":"36","author":"P Hiergeist","year":"1989","unstructured":"Hiergeist P, Spizer A, Rohl S (1989) Lifetime of oxide and oxide-nitro-oxide dielectrics within trench capacitors for DRAMs. IEEE Trans Electron Devices 36(5):913\u2013919","journal-title":"IEEE Trans Electron Devices"},{"issue":"4","key":"1343_CR7","doi-asserted-by":"publisher","first-page":"633","DOI":"10.1007\/s11223-015-9699-y","volume":"47","author":"AA Ismail","year":"2015","unstructured":"Ismail AA (2015) Bayesian estimation under constant-stress Partially accelerated life test for Pareto distribution with type-I censoring. Strength Mater 47(4):633\u2013641","journal-title":"Strength Mater"},{"issue":"1","key":"1343_CR8","first-page":"21","volume":"39","author":"AC Kimber","year":"1990","unstructured":"Kimber AC (1990) Exploratory data analysis for possibly censored data from skewed distribution. J R Stat Soc Appl Stat 39(1):21\u201330","journal-title":"J R Stat Soc Appl Stat"},{"key":"1343_CR9","volume-title":"Statistical models and methods for lifetime data","author":"JF Lawless","year":"2003","unstructured":"Lawless JF (2003) Statistical models and methods for lifetime data. Wiley, Hoboken"},{"issue":"3","key":"1343_CR10","doi-asserted-by":"publisher","first-page":"329","DOI":"10.1080\/08982112.2015.1037393","volume":"27","author":"SS Lv","year":"2015","unstructured":"Lv SS, Niu Z, Qu L, He S (2015) Reliability modeling of accelerated life tests with both random effects and nonconstant shape parameters. Qual Eng 27(3):329\u2013340","journal-title":"Qual Eng"},{"issue":"2","key":"1343_CR11","doi-asserted-by":"publisher","first-page":"373","DOI":"10.18576\/jsap\/060212","volume":"6","author":"MAW Mahmoud","year":"2017","unstructured":"Mahmoud MAW, El-Sagheer RM, Nagaty H (2017) Inference for constant-stress partially accelerated life test model with progressive type-II censoring scheme. J Stat Appl Probab 6(2):373\u2013383","journal-title":"J Stat Appl Probab"},{"key":"1343_CR12","first-page":"71","volume":"36","author":"CA Meeter","year":"1994","unstructured":"Meeter CA, Meeker WQ (1994) Optimum accelerated life test with a nonconstant scale parameter. Technometrics 36:71\u201383","journal-title":"Technometrics"},{"issue":"2","key":"1343_CR14","doi-asserted-by":"publisher","first-page":"69","DOI":"10.1520\/JTE10700J","volume":"12","author":"W Nelson","year":"1984","unstructured":"Nelson W (1984) Fitting of fatigue curves with constant standard deviation to data with runouts. J Test Eval 12(2):69\u201377","journal-title":"J Test Eval"},{"issue":"2","key":"1343_CR15","doi-asserted-by":"publisher","first-page":"659","DOI":"10.1016\/j.ejor.2008.07.009","volume":"197","author":"JH Seo","year":"2009","unstructured":"Seo JH, Jung M, Kim CM (2009) Design of accelerated life test sampling plans with a nonconstant shape parameters. Eur J Oper Res 197(2):659\u2013666","journal-title":"Eur J Oper Res"},{"issue":"2","key":"1343_CR16","doi-asserted-by":"publisher","first-page":"2080","DOI":"10.4028\/www.scientific.net\/AMR.712-715.2080","volume":"712\u2013715","author":"YM Shi","year":"2013","unstructured":"Shi YM, Jin L, Wei C, Yue H (2013) Constant-stress accelerated life test with competing risks under progressive type-II hybrid censoring. J Adv Mater Res 712\u2013715(2):2080\u20132083","journal-title":"J Adv Mater Res"},{"key":"1343_CR17","doi-asserted-by":"publisher","first-page":"478","DOI":"10.1016\/j.cam.2018.03.039","volume":"342","author":"L Wang","year":"2018","unstructured":"Wang L (2018) Estimation of exponential population with nonconstant parameters under constant-stress model. J Comput Appl Math 342:478\u2013494","journal-title":"J Comput Appl Math"},{"key":"1343_CR18","doi-asserted-by":"publisher","first-page":"539","DOI":"10.1016\/j.cam.2018.05.012","volume":"343","author":"L Wang","year":"2018","unstructured":"Wang L (2018) Estimation of constant-stress accelerated life test for Weibull distribution with nonconstant shape parameter. J Comput Appl Math 343:539\u2013555","journal-title":"J Comput Appl Math"},{"issue":"2","key":"1343_CR19","first-page":"119","volume":"12","author":"A Xu","year":"2016","unstructured":"Xu A, Fu J, Tang Y, Guan Q (2016) Bayesian analysis of constant-stress accelerated life test for the Weibull distribution using noninformative priors. Appl Math Model 12(2):119\u2013126","journal-title":"Appl Math Model"},{"key":"1343_CR20","doi-asserted-by":"publisher","first-page":"28","DOI":"10.1016\/j.cam.2017.05.048","volume":"330","author":"Z Yan","year":"2017","unstructured":"Yan Z, Zhu T, Peng X, Li X (2017) Reliability analysis for multi-level stress testing with Weibull regression model under the general progressively type-II censored data. J Comput Appl Math 330:28\u201340","journal-title":"J Comput Appl Math"},{"issue":"4","key":"1343_CR21","first-page":"363","volume":"29","author":"G Zheng","year":"2013","unstructured":"Zheng G, Shi Y (2013) Statistical analysis in constant-stress accelerated life tests for generalized exponential distribution based on adaptive type-II progressive hybrid censored data. Chin J Appl Probab Stat 29(4):363\u2013380","journal-title":"Chin J Appl Probab Stat"}],"container-title":["International Journal of System Assurance Engineering and Management"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s13198-021-01343-0.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s13198-021-01343-0\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s13198-021-01343-0.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T15:05:20Z","timestamp":1725807920000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s13198-021-01343-0"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,9,18]]},"references-count":20,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2022,4]]}},"alternative-id":["1343"],"URL":"https:\/\/doi.org\/10.1007\/s13198-021-01343-0","relation":{},"ISSN":["0975-6809","0976-4348"],"issn-type":[{"type":"print","value":"0975-6809"},{"type":"electronic","value":"0976-4348"}],"subject":[],"published":{"date-parts":[[2021,9,18]]},"assertion":[{"value":"7 May 2021","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"28 August 2021","order":2,"name":"revised","label":"Revised","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"30 August 2021","order":3,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"18 September 2021","order":4,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The authors declare that they have no competing interests.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflict of interest"}}]}}