{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,9]],"date-time":"2026-01-09T23:51:50Z","timestamp":1768002710522,"version":"3.49.0"},"reference-count":57,"publisher":"Springer Science and Business Media LLC","issue":"6","license":[{"start":{"date-parts":[[2023,8,10]],"date-time":"2023-08-10T00:00:00Z","timestamp":1691625600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2023,8,10]],"date-time":"2023-08-10T00:00:00Z","timestamp":1691625600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Int J Syst Assur Eng Manag"],"published-print":{"date-parts":[[2023,12]]},"DOI":"10.1007\/s13198-023-02084-y","type":"journal-article","created":{"date-parts":[[2023,8,10]],"date-time":"2023-08-10T13:02:01Z","timestamp":1691672521000},"page":"2365-2375","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Integrating Burr type testing effort functions in logistic reliability growth model with uncertainty factor"],"prefix":"10.1007","volume":"14","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0383-2059","authenticated-orcid":false,"given":"Javaid","family":"Iqbal","sequence":"first","affiliation":[]},{"given":"Nyla","family":"Manzoor","sequence":"additional","affiliation":[]},{"given":"Avinash K.","family":"Shrivastava","sequence":"additional","affiliation":[]},{"given":"Ishfaq A.","family":"Malik","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2023,8,10]]},"reference":[{"issue":"2","key":"2084_CR1","doi-asserted-by":"crossref","first-page":"211","DOI":"10.1108\/02656710810846952","volume":"25","author":"N Ahmad","year":"2008","unstructured":"Ahmad N, Bokhari MU, Quadri SMK, Khan MGM (2008) The exponentiated Weibull software reliability growth model with various testing-efforts and optimal release policy: a performance analysis. Int J Qual Reliab Manag 25(2):211\u2013235","journal-title":"Int J Qual Reliab Manag"},{"issue":"1","key":"2084_CR2","doi-asserted-by":"crossref","first-page":"28","DOI":"10.1108\/17465660910943748","volume":"4","author":"N Ahmad","year":"2009","unstructured":"Ahmad N, Khan MGM, Quadri SMK, Kumar M (2009) Modelling and analysis of software reliability with Burr type X testing-effort and release-time determination. J Model Manag 4(1):28\u201354","journal-title":"J Model Manag"},{"issue":"1","key":"2084_CR3","doi-asserted-by":"crossref","first-page":"89","DOI":"10.1108\/02656711011009335","volume":"27","author":"N Ahmad","year":"2010","unstructured":"Ahmad N, Khan MGM, Rafi LS (2010a) A study of testing-effort dependent inflection S-shaped software reliability growth models with imperfect debugging. Int J Qual Reliab Manag 27(1):89\u2013110","journal-title":"Int J Qual Reliab Manag"},{"key":"2084_CR4","doi-asserted-by":"publisher","first-page":"651","DOI":"10.1063\/1.3516395","volume":"1298","author":"N Ahmad","year":"2010","unstructured":"Ahmad N, Khan MGM, Rafi LS (2010b) Software reliability modeling incorporating log-logistic testing-effort with imperfect debugging. AIP Conf Proc 1298:651\u2013657. https:\/\/doi.org\/10.1063\/1.3516395","journal-title":"AIP Conf Proc"},{"issue":"12","key":"2084_CR5","first-page":"6","volume":"75","author":"N Ahmad","year":"2013","unstructured":"Ahmad N (2013) Software reliability growth models with log-logistic testing-effort function: a comparative study. Int J Comput Appl 75(12):6\u201311","journal-title":"Int J Comput Appl"},{"issue":"2","key":"2084_CR6","doi-asserted-by":"publisher","first-page":"1","DOI":"10.5815\/IJITCS.2013.02.01","volume":"5","author":"M Anjum","year":"2013","unstructured":"Anjum M, Haque MdA, Ahmad N (2013) Analysis and ranking of software reliability models based on weighted criteria value. Int J Inf Technol Comput Sci 5(2):1\u201314. https:\/\/doi.org\/10.5815\/IJITCS.2013.02.01","journal-title":"Int J Inf Technol Comput Sci"},{"key":"2084_CR13","unstructured":"Bayesian Information Criterion - an overview | ScienceDirect Topics. Retrieved July 1, 2022, from https:\/\/www.sciencedirect.com\/topics\/social-sciences\/bayesian-information-criterion"},{"key":"2084_CR7","doi-asserted-by":"crossref","unstructured":"Bokhari MU, Ahmad N (2007) Software reliability growth modeling for exponentiated weibull function with actual software failures data. In: Advances in Computer Science and Eng.: Reports and Monographs - Innovative Applications of Information Technology for the Developing World - Proc. of the 3rd Asian Applied Comput. Conf., AACC 2005, 2, 390\u2013395","DOI":"10.1142\/9781860948534_0062"},{"key":"2084_CR8","doi-asserted-by":"publisher","DOI":"10.4304\/jsw.9.6.1389-1400","author":"MU Bokhari","year":"2014","unstructured":"Bokhari MU, Ahmad N (2014) Incorporating Burr type XII testing-efforts into software reliability growth modeling and actual data analysis with applications. J Softw. https:\/\/doi.org\/10.4304\/jsw.9.6.1389-1400","journal-title":"J Softw"},{"key":"2084_CR9","unstructured":"Bokhari MU, Ahmad MI, Ahmad N (2007) Software reliability growth modeling for Burr type XII function: performance analysis. In: International Conference on Modeling and Optimization of Structures, Processes and System (ICMOSPS\u2019 07), Jan, 22\u201324, Durban,South Africa"},{"issue":"4","key":"2084_CR10","doi-asserted-by":"publisher","first-page":"220","DOI":"10.1080\/23302674.2014.970244","volume":"1","author":"IH Chang","year":"2014","unstructured":"Chang IH, Pham H, Lee SW, Song KY (2014) A testing-coverage software reliability model with the uncertainty of operating environments. Int J Syst Sci Oper Logist 1(4):220\u2013227. https:\/\/doi.org\/10.1080\/23302674.2014.970244","journal-title":"Int J Syst Sci Oper Logist"},{"issue":"6","key":"2084_CR11","first-page":"1724","volume":"15","author":"C Choudhary","year":"2019","unstructured":"Choudhary C, Kapur PK, Khatri SK, Shrivastava AK (2019) Effort-based release and patching time of software with warranty using change point. Int J Perform Eng 15(6):1724","journal-title":"Int J Perform Eng"},{"key":"2084_CR12","doi-asserted-by":"crossref","first-page":"367","DOI":"10.1007\/s13198-020-00955-2","volume":"11","author":"C Choudhary","year":"2020","unstructured":"Choudhary C, Kapur PK, Khatri SK, Muthukumar R, Shrivastava AK (2020) Effort based release time of software for detection and correction processes using MAUT. Int J Syst Assur Eng Manag 11:367\u2013378","journal-title":"Int J Syst Assur Eng Manag"},{"issue":"1","key":"2084_CR14","doi-asserted-by":"crossref","first-page":"012020","DOI":"10.1088\/1757-899X\/1099\/1\/012020","volume":"1099","author":"R Dhaka","year":"2021","unstructured":"Dhaka R, Pachauri B, Jain A (2021) SRGM using testing-effort function with uncertainty in operating environment. IOP Conf Ser Mater Sci Eng. 1099(1):012020","journal-title":"IOP Conf Ser Mater Sci Eng."},{"issue":"3","key":"2084_CR15","doi-asserted-by":"publisher","first-page":"206","DOI":"10.1109\/TR.1979.5220566","volume":"28","author":"AL Goel","year":"1979","unstructured":"Goel AL, Okumoto K (1979) Time-dependent error-detection rate model for software reliability and other performance measures. IEEE Trans Reliab 28(3):206\u2013211. https:\/\/doi.org\/10.1109\/TR.1979.5220566","journal-title":"IEEE Trans Reliab"},{"issue":"5","key":"2084_CR16","first-page":"741","volume":"15","author":"MdA Haque","year":"2020","unstructured":"Haque MdA, Ahmad N (2020) Key issues in software reliability growth models. Recent Adv Comput Sci Commun 15(5):741\u2013747","journal-title":"Recent Adv Comput Sci Commun"},{"key":"2084_CR17","doi-asserted-by":"publisher","DOI":"10.1142\/S0218539321500327","author":"MA Haque","year":"2021","unstructured":"Haque MA, Ahmad N (2021) A logistic growth model for software reliability estimation considering uncertain factors. Int J Reliab Qual Safety Eng. https:\/\/doi.org\/10.1142\/S0218539321500327","journal-title":"Int J Reliab Qual Safety Eng"},{"key":"2084_CR18","doi-asserted-by":"publisher","DOI":"10.1080\/02286203.2023.2201905","author":"MA Haque","year":"2023","unstructured":"Haque MA, Ahmad N (2023) Software reliability modeling under an uncertain testing environment. Int J Model Simul. https:\/\/doi.org\/10.1080\/02286203.2023.2201905","journal-title":"Int J Model Simul"},{"issue":"6","key":"2084_CR19","doi-asserted-by":"crossref","first-page":"967","DOI":"10.1142\/S021819401750036X","volume":"27","author":"K Honda","year":"2017","unstructured":"Honda K, Washizaki H, Fukazawa Y (2017) Generalized software reliability model considering uncertainty and dynamics: model and applications. Int J Softw Eng Knowl Eng 27(6):967\u2013993","journal-title":"Int J Softw Eng Knowl Eng"},{"issue":"4","key":"2084_CR20","doi-asserted-by":"crossref","first-page":"604","DOI":"10.1109\/24.273589","volume":"42","author":"S Hossain","year":"1994","unstructured":"Hossain S, Dahiya R (1994) Estimating the parameters of a non-homogeneous Poisson-process model for software reliability. IEEE Trans Reliab 42(4):604","journal-title":"IEEE Trans Reliab"},{"issue":"3","key":"2084_CR21","doi-asserted-by":"publisher","first-page":"261","DOI":"10.1109\/TR.2002.801847","volume":"51","author":"CY Huang","year":"2002","unstructured":"Huang CY, Kuo SY (2002) Analysis of incorporating logistic testing-effort function into software reliability modeling. IEEE Trans Reliab 51(3):261\u2013270. https:\/\/doi.org\/10.1109\/TR.2002.801847","journal-title":"IEEE Trans Reliab"},{"issue":"1","key":"2084_CR22","doi-asserted-by":"crossref","first-page":"1286739","DOI":"10.1080\/23311916.2017.1286739","volume":"4","author":"J Iqbal","year":"2017","unstructured":"Iqbal J (2017) Software reliability growth models: a comparison of linear and exponential fault content functions for study of imperfect debugging situations. Cogent Eng 4(1):1286739","journal-title":"Cogent Eng"},{"issue":"4","key":"2084_CR23","doi-asserted-by":"publisher","first-page":"291","DOI":"10.1049\/sej.1992.0030","volume":"7","author":"PK Kapur","year":"1992","unstructured":"Kapur PK, Garg RB (1992) A software reliability growth model for an error-removal phenomenon. Softw Eng J 7(4):291. https:\/\/doi.org\/10.1049\/sej.1992.0030","journal-title":"Softw Eng J"},{"issue":"3","key":"2084_CR24","doi-asserted-by":"crossref","first-page":"771","DOI":"10.1080\/00207540600926113","volume":"46","author":"PK Kapur","year":"2008","unstructured":"Kapur PK, Singh VB, Anand S, Yadavalli VSS (2008) Software reliability growth model with change-point and effort control using a power function of the testing time. Int J Prod Res 46(3):771\u2013787","journal-title":"Int J Prod Res"},{"key":"2084_CR25","doi-asserted-by":"crossref","DOI":"10.1007\/978-0-85729-204-9","volume-title":"Software reliability assessment with OR applications","author":"PK Kapur","year":"2011","unstructured":"Kapur PK, Pham H, Gupta A, Jha PC (2011a) Software reliability assessment with OR applications, vol 364. Springer, London"},{"issue":"1","key":"2084_CR26","doi-asserted-by":"crossref","first-page":"331","DOI":"10.1109\/TR.2010.2103590","volume":"60","author":"P Kapur","year":"2011","unstructured":"Kapur P, Pham H, Anand S, Yadav K (2011) A unified approach for developing software reliability growth models in the presence of imperfect debugging and error generation. IEEE Trans Reliab 60(1):331","journal-title":"IEEE Trans Reliab"},{"issue":"1","key":"2084_CR27","first-page":"331","volume":"13","author":"S Khurshid","year":"2021","unstructured":"Khurshid S, Shrivastava AK, Iqbal J (2021) Effort based software reliability model with fault reduction factor, change point and imperfect debugging. Int J Inf Technol 13(1):331\u2013340","journal-title":"Int J Inf Technol"},{"key":"2084_CR28","doi-asserted-by":"publisher","DOI":"10.1142\/S0218539322500139","author":"S Khurshid","year":"2022","unstructured":"Khurshid S, Iqbal J, Malik IA, Yousuf B (2022) Modelling of NHPP based software reliability growth model from the perspective of testing coverage, error propagation and fault withdrawal efficiency. Int J Reliab Qual Safety Eng. https:\/\/doi.org\/10.1142\/S0218539322500139","journal-title":"Int J Reliab Qual Safety Eng"},{"issue":"4","key":"2084_CR29","doi-asserted-by":"crossref","first-page":"368","DOI":"10.1504\/IJRS.2016.084486","volume":"10","author":"V Kumar","year":"2016","unstructured":"Kumar V, Sahni R, Shrivastava AK (2016) Two-dimensional multi-release software modelling with testing effort, time and two types of imperfect debugging. Int J Reliab Saf 10(4):368\u2013388","journal-title":"Int J Reliab Saf"},{"issue":"7","key":"2084_CR30","volume":"12","author":"Q Li","year":"2017","unstructured":"Li Q, Pham H (2017a) A testing-coverage software reliability model considering fault removal efficiency and error generation. PLoS ONE 12(7):e0181524","journal-title":"PLoS ONE"},{"key":"2084_CR31","doi-asserted-by":"crossref","first-page":"68","DOI":"10.1016\/j.apm.2017.06.034","volume":"51","author":"Q Li","year":"2017","unstructured":"Li Q, Pham H (2017b) NHPP software reliability model considering the uncertainty of operating environments with imperfect debugging and testing coverage. Appl Math Model 51:68\u201385","journal-title":"Appl Math Model"},{"key":"2084_CR32","volume-title":"Handbook of software reliability engineering","author":"MR Lyu","year":"1996","unstructured":"Lyu MR (1996) Handbook of software reliability engineering. McGraw- Hill, New York"},{"issue":"3","key":"2084_CR33","doi-asserted-by":"crossref","first-page":"179","DOI":"10.1504\/IJRS.2019.10020940","volume":"13","author":"R Majumdar","year":"2019","unstructured":"Majumdar R, Kapur PK, Khatri SK, Shrivastava AK (2019) Effort-based software release and testing stop time decisions. Int J Reliab Saf 13(3):179\u2013193","journal-title":"Int J Reliab Saf"},{"key":"2084_CR34","doi-asserted-by":"crossref","unstructured":"Ohba M (1984a) Inflection S-shaped software reliability growth model. pp 144\u2013162","DOI":"10.1007\/978-3-642-45587-2_10"},{"issue":"4","key":"2084_CR35","doi-asserted-by":"crossref","first-page":"428","DOI":"10.1147\/rd.284.0428","volume":"28","author":"M Ohba","year":"1984","unstructured":"Ohba M (1984) Software reliability analysis models. IBM J Res Dev 28(4):428\u2013443","journal-title":"IBM J Res Dev"},{"issue":"10","key":"2084_CR36","doi-asserted-by":"crossref","first-page":"1481","DOI":"10.1080\/02331934.2013.854787","volume":"63","author":"H Pham","year":"2014","unstructured":"Pham H (2014) A new software reliability model with Vtub-shaped fault-detection rate and the uncertainty of operating environments. Optimization 63(10):1481\u20131490","journal-title":"Optimization"},{"issue":"3","key":"2084_CR37","doi-asserted-by":"crossref","first-page":"145","DOI":"10.1007\/s40595-016-0065-1","volume":"3","author":"H Pham","year":"2016","unstructured":"Pham H (2016) A generalized fault-detection software reliability model subject to random operating environments. Vietnam J Comput Sci 3(3):145\u2013150","journal-title":"Vietnam J Comput Sci"},{"issue":"03","key":"2084_CR38","doi-asserted-by":"crossref","first-page":"269","DOI":"10.1142\/S0218539397000199","volume":"04","author":"H Pham","year":"1997","unstructured":"Pham H, Zhang X (1997) An NHPP software reliability model and its comparison. Int J Reliab Qual Saf Eng 04(03):269\u2013282","journal-title":"Int J Reliab Qual Saf Eng"},{"issue":"4","key":"2084_CR39","doi-asserted-by":"crossref","first-page":"322","DOI":"10.1007\/BF03398744","volume":"42","author":"H Pham","year":"2017","unstructured":"Pham H (2017) A generalized logistic software reliability growth model. Opsearch 42(4):322","journal-title":"Opsearch"},{"key":"2084_CR40","doi-asserted-by":"publisher","first-page":"107193","DOI":"10.1016\/J.RESS.2020.107193","volume":"204","author":"R Pietrantuono","year":"2020","unstructured":"Pietrantuono R, Popov P, Russo S (2020) Reliability assessment of service-based software under operational profile uncertainty. Reliab Eng Syst Safety 204:107193. https:\/\/doi.org\/10.1016\/J.RESS.2020.107193","journal-title":"Reliab Eng Syst Safety"},{"key":"2084_CR41","first-page":"27","volume":"11","author":"SMK Quadri","year":"2011","unstructured":"Quadri SMK, Ahmad N, Farooq SU (2011) Software reliability growth modeling with generalized exponential testing-effort and optimal SOFTWARE RELEASE policy. Global J Comput Sci Technol 11:27","journal-title":"Global J Comput Sci Technol"},{"issue":"3","key":"2084_CR42","doi-asserted-by":"crossref","first-page":"215","DOI":"10.1007\/BF03398682","volume":"39","author":"RN Rattihalli","year":"2002","unstructured":"Rattihalli RN, Zachariah B (2002) NHPP models for reliability of software with imperfect debugging and testing effort. Opsearch 39(3):215\u2013229","journal-title":"Opsearch"},{"issue":"7","key":"2084_CR43","doi-asserted-by":"crossref","first-page":"2358","DOI":"10.1002\/qre.2516","volume":"35","author":"I Saraf","year":"2019","unstructured":"Saraf I, Iqbal J (2019) Generalized multi-release modelling of software reliability growth models from the perspective of two types of imperfect debugging and change point. Qual Reliab Eng Int 35(7):2358\u20132370","journal-title":"Qual Reliab Eng Int"},{"issue":"4","key":"2084_CR44","doi-asserted-by":"crossref","first-page":"1814","DOI":"10.1002\/qre.3048","volume":"38","author":"I Saraf","year":"2021","unstructured":"Saraf I, Iqbal J, Shrivastava AK, Khurshid S (2021) Modelling reliability growth for multi-version open source software considering varied testing and debugging factors. Qual Reliab Eng Int 38(4):1814\u20131825","journal-title":"Qual Reliab Eng Int"},{"issue":"3","key":"2084_CR45","doi-asserted-by":"crossref","first-page":"123","DOI":"10.1504\/IJRS.2021.123275","volume":"15","author":"P Saxena","year":"2021","unstructured":"Saxena P, Singh N, Shrivastava AK, Kumar V (2021) Testing effort based SRGM and release decision under fuzzy environment. Int J Reliab Saf 15(3):123\u2013140","journal-title":"Int J Reliab Saf"},{"issue":"1","key":"2084_CR46","first-page":"166","volume":"237","author":"AK Shrivastava","year":"2023","unstructured":"Shrivastava AK, Sharma R, Pham H (2023) Software reliability and cost models with warranty and life cycle. Proc Inst Mech Eng Part O J Risk Reliab 237(1):166\u2013179","journal-title":"Proc Inst Mech Eng Part O J Risk Reliab"},{"issue":"3","key":"2084_CR47","doi-asserted-by":"crossref","first-page":"458","DOI":"10.1109\/TR.2006.879611","volume":"55","author":"X Teng","year":"2006","unstructured":"Teng X, Pham H (2006) A new methodology for predicting software reliability in the random field environments. IEEE Trans Reliab 55(3):458\u2013468","journal-title":"IEEE Trans Reliab"},{"key":"2084_CR48","doi-asserted-by":"crossref","first-page":"427","DOI":"10.1007\/s13198-016-0470-y","volume":"7","author":"A Tickoo","year":"2016","unstructured":"Tickoo A, Kapur PK, Shrivastava AK, Khatri SK (2016) Testing effort based modeling to determine optimal release and patching time of software. Int J Syst Assur Eng Manag 7:427\u2013434","journal-title":"Int J Syst Assur Eng Manag"},{"issue":"11","key":"2084_CR49","doi-asserted-by":"crossref","first-page":"69","DOI":"10.1109\/2.544240","volume":"29","author":"A Wood","year":"1996","unstructured":"Wood A (1996) Predicting software reliability. Computer 29(11):69\u201377","journal-title":"Computer"},{"issue":"1","key":"2084_CR50","doi-asserted-by":"crossref","first-page":"19","DOI":"10.1109\/TR.1986.4335332","volume":"35","author":"S Yamada","year":"1986","unstructured":"Yamada S, Ohtera H, Narihisa H (1986) Software reliability growth models with testing-effort. IEEE Trans Reliab 35(1):19\u201323","journal-title":"IEEE Trans Reliab"},{"issue":"1","key":"2084_CR51","doi-asserted-by":"crossref","first-page":"100","DOI":"10.1109\/24.210278","volume":"42","author":"S Yamada","year":"1993","unstructured":"Yamada S, Hishitani J, Osaki S (1993) Software-reliability growth with a weibull test-effort: a model & application. IEEE Trans Reliab 42(1):100\u2013106","journal-title":"IEEE Trans Reliab"},{"issue":"12","key":"2084_CR52","doi-asserted-by":"crossref","first-page":"1431","DOI":"10.1109\/TSE.1985.232179","volume":"11","author":"S Yamada","year":"1985","unstructured":"Yamada S, Osaki S (1985) Software reliability growth modeling: models and applications. IEEE Trans Softw Eng 11(12):1431\u20131437","journal-title":"IEEE Trans Softw Eng"},{"issue":"5","key":"2084_CR53","doi-asserted-by":"crossref","first-page":"475","DOI":"10.1109\/TR.1983.5221735","volume":"32","author":"S Yamada","year":"1983","unstructured":"Yamada S, Ohba M, Osaki S (1983) S-shaped reliability growth modeling for software error detection. IEEE Trans Reliab 32(5):475","journal-title":"IEEE Trans Reliab"},{"issue":"12","key":"2084_CR54","doi-asserted-by":"crossref","first-page":"2241","DOI":"10.1080\/00207729208949452","volume":"23","author":"S Yamada","year":"1992","unstructured":"Yamada S, Tokuno K, Osaki S (1992) Imperfect debugging models with fault introduction rate for software reliability assessment. Int J Syst Sci 23(12):2241","journal-title":"Int J Syst Sci"},{"issue":"1","key":"2084_CR56","doi-asserted-by":"crossref","first-page":"114","DOI":"10.1109\/TSMCA.2003.812597","volume":"33","author":"X Zhang","year":"2003","unstructured":"Zhang X, Teng X, Pham H (2003) Considering fault removal efficiency in software reliability assessment. IEEE Trans Syst Man Cybern Part A: Syst Hum 33(1):114\u2013120","journal-title":"IEEE Trans Syst Man Cybern Part A: Syst Hum"},{"issue":"1","key":"2084_CR57","doi-asserted-by":"crossref","first-page":"43","DOI":"10.1016\/S0164-1212(99)00075-8","volume":"50","author":"X Zhang","year":"2000","unstructured":"Zhang X, Pham H (2000) An analysis of factors affecting software reliability. J Syst Softw 50(1):43\u201356","journal-title":"J Syst Softw"},{"key":"2084_CR58","doi-asserted-by":"crossref","first-page":"150","DOI":"10.1016\/j.jss.2015.04.083","volume":"109","author":"M Zhu","year":"2015","unstructured":"Zhu M, Zhang X, Pham H (2015) A comparison analysis of environmental factors affecting software reliability. J Syst Softw 109:150\u2013160","journal-title":"J Syst Softw"}],"container-title":["International Journal of System Assurance Engineering and Management"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s13198-023-02084-y.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s13198-023-02084-y\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s13198-023-02084-y.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,11,14]],"date-time":"2023-11-14T14:13:06Z","timestamp":1699971186000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s13198-023-02084-y"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,8,10]]},"references-count":57,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2023,12]]}},"alternative-id":["2084"],"URL":"https:\/\/doi.org\/10.1007\/s13198-023-02084-y","relation":{},"ISSN":["0975-6809","0976-4348"],"issn-type":[{"value":"0975-6809","type":"print"},{"value":"0976-4348","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,8,10]]},"assertion":[{"value":"31 January 2023","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"26 July 2023","order":2,"name":"revised","label":"Revised","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"27 July 2023","order":3,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"10 August 2023","order":4,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"Authors have no conflict of interest.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflict of interest"}},{"value":"This research does not involve experiment on Human Participants and\/or Animals.","order":3,"name":"Ethics","group":{"name":"EthicsHeading","label":"Human participants and animals rights"}}]}}