{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,25]],"date-time":"2025-02-25T05:25:33Z","timestamp":1740461133839,"version":"3.37.3"},"reference-count":65,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2024,11,18]],"date-time":"2024-11-18T00:00:00Z","timestamp":1731888000000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2024,11,18]],"date-time":"2024-11-18T00:00:00Z","timestamp":1731888000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Int J Syst Assur Eng Manag"],"published-print":{"date-parts":[[2025,2]]},"DOI":"10.1007\/s13198-024-02586-3","type":"journal-article","created":{"date-parts":[[2024,11,18]],"date-time":"2024-11-18T12:44:29Z","timestamp":1731933869000},"page":"532-551","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Dynamic learner selection for cross-project fault prediction"],"prefix":"10.1007","volume":"16","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8789-5932","authenticated-orcid":false,"given":"Yogita","family":"Khatri","sequence":"first","affiliation":[]},{"given":"Urvashi Rahul","family":"Saxena","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2024,11,18]]},"reference":[{"issue":"3","key":"2586_CR1","doi-asserted-by":"publisher","first-page":"94","DOI":"10.6025\/jnt\/2018\/9\/3\/94-101","volume":"9","author":"B Arasteh","year":"2018","unstructured":"Arasteh B (2018) Software fault-prediction using combination of neural network and naive bayes algorithm. J Netw Technol 9(3):94\u2013101. https:\/\/doi.org\/10.6025\/jnt\/2018\/9\/3\/94-101","journal-title":"J Netw Technol"},{"key":"2586_CR2","doi-asserted-by":"publisher","DOI":"10.1007\/S10586-024-04486-4\/TABLES\/26","author":"B Arasteh","year":"2024","unstructured":"Arasteh B, Arasteh K, Ghaffari A, Ghanbarzadeh R (2024) A new binary chaos-based metaheuristic algorithm for software defect prediction. Cluster Comput. https:\/\/doi.org\/10.1007\/S10586-024-04486-4\/TABLES\/26","journal-title":"Cluster Comput"},{"issue":"10","key":"2586_CR3","doi-asserted-by":"publisher","first-page":"751","DOI":"10.1109\/32.544352","volume":"22","author":"VR Basili","year":"1996","unstructured":"Basili VR, Briand LC, Melo WL (1996) A validation of object-oriented design metrics as quality indicators. IEEE Trans Softw Eng 22(10):751\u2013761. https:\/\/doi.org\/10.1109\/32.544352","journal-title":"IEEE Trans Softw Eng"},{"key":"2586_CR4","first-page":"281","volume":"13","author":"J Bergstra","year":"2012","unstructured":"Bergstra J, Ca JB, Ca YB (2012) Random search for hyper-parameter optimization yoshua bengio. J Mach Learn Res 13:281\u2013305","journal-title":"J Mach Learn Res"},{"issue":"2","key":"2586_CR5","doi-asserted-by":"publisher","first-page":"294","DOI":"10.1007\/S10664-013-9292-6\/TABLES\/11","volume":"20","author":"N Bettenburg","year":"2015","unstructured":"Bettenburg N, Nagappan M, Hassan AE (2015) Towards improving statistical modeling of software engineering data: think locally, act globally! Empir Softw Eng 20(2):294\u2013335. https:\/\/doi.org\/10.1007\/S10664-013-9292-6\/TABLES\/11","journal-title":"Empir Softw Eng"},{"issue":"2","key":"2586_CR6","doi-asserted-by":"publisher","first-page":"525","DOI":"10.1007\/s11219-016-9353-3","volume":"26","author":"D Bowes","year":"2018","unstructured":"Bowes D, Hall T, Petri\u0107 J (2018) Software defect prediction: do different classifiers find the same defects? Softw Qual J 26(2):525\u2013552. https:\/\/doi.org\/10.1007\/s11219-016-9353-3","journal-title":"Softw Qual J"},{"issue":"8","key":"2586_CR7","doi-asserted-by":"publisher","first-page":"1040","DOI":"10.1016\/J.INS.2008.12.001","volume":"179","author":"C Catal","year":"2009","unstructured":"Catal C, Diri B (2009) Investigating the effect of dataset size, metrics sets, and feature selection techniques on software fault prediction problem. Inf Sci (n y) 179(8):1040\u20131058. https:\/\/doi.org\/10.1016\/J.INS.2008.12.001","journal-title":"Inf Sci (n y)"},{"issue":"1","key":"2586_CR8","doi-asserted-by":"publisher","first-page":"67","DOI":"10.1016\/j.infsof.2015.01.014","volume":"62","author":"L Chen","year":"2015","unstructured":"Chen L, Fang B, Shang Z, Tang Y (2015) Negative samples reduction in cross-company software defects prediction. Inf Softw Technol 62(1):67\u201377. https:\/\/doi.org\/10.1016\/j.infsof.2015.01.014","journal-title":"Inf Softw Technol"},{"key":"2586_CR9","doi-asserted-by":"publisher","DOI":"10.1186\/S13040-023-00322-4","author":"D Chicco","year":"2023","unstructured":"Chicco D, Jurman G (2023) The matthews correlation coefficient (MCC) should replace the ROC AUC as the standard metric for assessing binary classification. BioData Min. https:\/\/doi.org\/10.1186\/S13040-023-00322-4","journal-title":"BioData Min"},{"issue":"6","key":"2586_CR10","doi-asserted-by":"publisher","first-page":"476","DOI":"10.1109\/32.295895","volume":"20","author":"SR Chidamber","year":"1994","unstructured":"Chidamber SR, Kemerer CF (1994) A metrics suite for object oriented design. IEEE Trans Softw Eng 20(6):476\u2013493. https:\/\/doi.org\/10.1109\/32.295895","journal-title":"IEEE Trans Softw Eng"},{"doi-asserted-by":"crossref","unstructured":"Cruz AEC, Ochimizu K (2009) Towards logistic regression models for predicting fault-prone code across software projects. In: 2009 3rd International Symposium on Empirical Software Engineering and Measurement. pp 460\u2013463","key":"2586_CR11","DOI":"10.1109\/ESEM.2009.5316002"},{"issue":"1","key":"2586_CR12","doi-asserted-by":"publisher","first-page":"195","DOI":"10.1016\/j.inffus.2017.09.010","volume":"41","author":"RMO Cruz","year":"2018","unstructured":"Cruz RMO, Sabourin R, Cavalcanti GDC (2018) Dynamic classifier selection: recent advances and perspectives. Inf Fus 41(1):195\u2013216. https:\/\/doi.org\/10.1016\/j.inffus.2017.09.010","journal-title":"Inf Fus"},{"issue":"4","key":"2586_CR13","doi-asserted-by":"publisher","first-page":"531","DOI":"10.1007\/s10664-011-9173-9","volume":"17","author":"M D\u2019Ambros","year":"2012","unstructured":"D\u2019Ambros M, Lanza M, Robbes R (2012) Evaluating defect prediction approaches: a benchmark and an extensive comparison. Empir Softw Eng 17(4):531\u2013577. https:\/\/doi.org\/10.1007\/s10664-011-9173-9","journal-title":"Empir Softw Eng"},{"key":"2586_CR14","first-page":"1","volume":"7","author":"J Dem\u02c7","year":"1993","unstructured":"Dem\u02c7 J (1993) Statistical comparisons of classifiers over multiple data sets. J Mach Learn Res 7:1\u201330","journal-title":"J Mach Learn Res"},{"issue":"1","key":"2586_CR15","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1111\/J.2517-6161.1977.TB01600.X","volume":"39","author":"AP Dempster","year":"1977","unstructured":"Dempster AP, Laird NM, Rubin DB (1977) Maximum likelihood from incomplete data via the EM algorithm. J Roy Stat Soc: Ser B (Methodol) 39(1):1\u201322. https:\/\/doi.org\/10.1111\/J.2517-6161.1977.TB01600.X","journal-title":"J Roy Stat Soc: Ser B (Methodol)"},{"key":"2586_CR16","volume-title":"Introduction to machine learning","author":"A Ethem","year":"2010","unstructured":"Ethem A (2010) Introduction to machine learning. MIT Press"},{"key":"2586_CR17","doi-asserted-by":"publisher","first-page":"789","DOI":"10.1109\/ICSE.2015.91","volume":"1","author":"B Ghotra","year":"2015","unstructured":"Ghotra B, McIntosh S, Hassan AE (2015) Revisiting the impact of classification techniques on the performance of defect prediction models. Proc Int Conf Softw Eng 1:789\u2013800. https:\/\/doi.org\/10.1109\/ICSE.2015.91","journal-title":"Proc Int Conf Softw Eng"},{"issue":"10","key":"2586_CR18","doi-asserted-by":"publisher","first-page":"897","DOI":"10.1109\/TSE.2005.112","volume":"31","author":"T Gyim\u00f3thy","year":"2005","unstructured":"Gyim\u00f3thy T, Ferenc R, Siket I (2005) Empirical validation of object-oriented metrics on open source software for fault prediction. IEEE Trans Softw Eng 31(10):897\u2013910. https:\/\/doi.org\/10.1109\/TSE.2005.112","journal-title":"IEEE Trans Softw Eng"},{"issue":"6","key":"2586_CR19","doi-asserted-by":"publisher","first-page":"96","DOI":"10.1109\/MS.2011.138","volume":"28","author":"T Hall","year":"2011","unstructured":"Hall T, Beecham S, Bowes D et al (2011) Developing fault-prediction models: what the research can show industry. IEEE Softw 28(6):96\u201399. https:\/\/doi.org\/10.1109\/MS.2011.138","journal-title":"IEEE Softw"},{"doi-asserted-by":"crossref","unstructured":"Herbold S (2013) Training data selection for cross-project defect prediction. In: ACM International Conference Proceeding Series. Association for Computing Machinery, pp 1\u201310","key":"2586_CR20","DOI":"10.1145\/2499393.2499395"},{"issue":"9","key":"2586_CR21","doi-asserted-by":"publisher","first-page":"811","DOI":"10.1109\/TSE.2017.2724538","volume":"44","author":"S Herbold","year":"2018","unstructured":"Herbold S, Trautsch A, Grabowski J (2018) A comparative study to benchmark cross-project defect prediction approaches. IEEE Trans Softw Eng 44(9):811\u2013833. https:\/\/doi.org\/10.1109\/TSE.2017.2724538","journal-title":"IEEE Trans Softw Eng"},{"issue":"4","key":"2586_CR22","doi-asserted-by":"publisher","first-page":"1866","DOI":"10.1007\/S10664-016-9468-Y\/METRICS","volume":"22","author":"S Herbold","year":"2017","unstructured":"Herbold S, Trautsch A, Grabowski J (2017) Global vs. local models for cross-project defect prediction: a replication study. Empir Softw Eng 22(4):1866\u20131902. https:\/\/doi.org\/10.1007\/S10664-016-9468-Y\/METRICS","journal-title":"Empir Softw Eng"},{"doi-asserted-by":"crossref","unstructured":"Hosseini S, Turhan B, Mantyl M (2016) Search based training data selection for cross project defect prediction. In: ACM International Conference Proceeding Series. Association for Computing Machinery, New York, New York, USA, pp 1\u201310","key":"2586_CR23","DOI":"10.1145\/2972958.2972964"},{"unstructured":"I. Webb Geoffrey, Sammut Claude, Perlich Claudia, Horv\u00e1th Tam\u00e1s (2011) Leave-One-Out Cross-Validation, Encyclopedia of Machine Learning. Springer US","key":"2586_CR24"},{"doi-asserted-by":"crossref","unstructured":"Jureczko M, Madeyski L (2010) Towards identifying software project clusters with regard to defect prediction. In: ACM International Conference Proceeding Series. ACM Press, New York, New York, USA, pp 1\u201310","key":"2586_CR25","DOI":"10.1145\/1868328.1868342"},{"doi-asserted-by":"crossref","unstructured":"Kawata K, Amasaki S, Yokogawa T (2015) Improving relevancy filter methods for cross-project defect prediction. In: Proceedings\u20143rd International Conference on Applied Computing and Information Technology and 2nd International Conference on Computational Science and Intelligence, ACIT-CSI 2015. pp 2\u20137","key":"2586_CR26","DOI":"10.1109\/ACIT-CSI.2015.104"},{"key":"2586_CR27","doi-asserted-by":"publisher","first-page":"263","DOI":"10.1007\/s11334-020-00380-5","volume":"18","author":"Y Khatri","year":"2021","unstructured":"Khatri Y, Singh SK (2021) Cross project defect prediction: a comprehensive survey with its SWOT analysis. Innov Syst Softw Eng 18:263\u2013281. https:\/\/doi.org\/10.1007\/s11334-020-00380-5","journal-title":"Innov Syst Softw Eng"},{"issue":"1","key":"2586_CR28","doi-asserted-by":"publisher","first-page":"154","DOI":"10.1007\/S13198-022-01831-X\/METRICS","volume":"14","author":"Y Khatri","year":"2023","unstructured":"Khatri Y, Singh SK (2023a) An effective feature selection based cross-project defect prediction model for software quality improvement. Int J Syst Assur Eng Manag 14(1):154\u2013172. https:\/\/doi.org\/10.1007\/S13198-022-01831-X\/METRICS","journal-title":"Int J Syst Assur Eng Manag"},{"key":"2586_CR29","doi-asserted-by":"publisher","first-page":"1503","DOI":"10.1007\/S13198-023-01957-6","volume":"15","author":"Y Khatri","year":"2023","unstructured":"Khatri Y, Singh SK (2023b) Predictive software maintenance utilizing cross-project data. Int J Syst Assur Eng Manag 15:1503\u20131518. https:\/\/doi.org\/10.1007\/S13198-023-01957-6","journal-title":"Int J Syst Assur Eng Manag"},{"key":"2586_CR30","doi-asserted-by":"publisher","DOI":"10.1016\/J.SCICO.2022.102918","author":"YK Khatri","year":"2023","unstructured":"Khatri YK, Singh SK (2023c) An effective software cross-project fault prediction model for quality improvement. Sci Comput Progr. https:\/\/doi.org\/10.1016\/J.SCICO.2022.102918","journal-title":"Sci Comput Progr"},{"issue":"3","key":"2586_CR31","doi-asserted-by":"publisher","first-page":"226","DOI":"10.1109\/34.667881","volume":"20","author":"J Kittler","year":"1998","unstructured":"Kittler J, Hatef M, Duin RPW, Matas J (1998) On combining classifiers. IEEE Trans Pattern Anal Mach Intell 20(3):226\u2013239. https:\/\/doi.org\/10.1109\/34.667881","journal-title":"IEEE Trans Pattern Anal Mach Intell"},{"issue":"4","key":"2586_CR32","doi-asserted-by":"publisher","first-page":"485","DOI":"10.1109\/TSE.2008.35","volume":"34","author":"S Lessmann","year":"2008","unstructured":"Lessmann S, Baesens B, Mues C, Pietsch S (2008) Benchmarking classification models for software defect prediction: a proposed framework and novel findings. IEEE Trans Softw Eng 34(4):485\u2013496. https:\/\/doi.org\/10.1109\/TSE.2008.35","journal-title":"IEEE Trans Softw Eng"},{"doi-asserted-by":"publisher","unstructured":"Li L, Lessmann S, Baesens B (2019) Evaluating software defect prediction performance: An updated benchmarking study. arXiv 190101726 [csSE]. https:\/\/doi.org\/10.2139\/ssrn.3312070","key":"2586_CR33","DOI":"10.2139\/ssrn.3312070"},{"issue":"3","key":"2586_CR34","doi-asserted-by":"publisher","first-page":"161","DOI":"10.1049\/IET-SEN.2017.0148","volume":"12","author":"Z Li","year":"2018","unstructured":"Li Z, Jing XY, Zhu X (2018) Progress on approaches to software defect prediction. IET Softw 12(3):161\u2013175. https:\/\/doi.org\/10.1049\/IET-SEN.2017.0148","journal-title":"IET Softw"},{"issue":"6","key":"2586_CR35","doi-asserted-by":"publisher","first-page":"852","DOI":"10.1109\/TSE.2010.51","volume":"36","author":"Y Liu","year":"2010","unstructured":"Liu Y, Khoshgoftaar TM, Seliya N (2010) Evolutionary optimization of software quality modeling with multiple repositories. IEEE Trans Softw Eng 36(6):852\u2013864. https:\/\/doi.org\/10.1109\/TSE.2010.51","journal-title":"IEEE Trans Softw Eng"},{"doi-asserted-by":"crossref","unstructured":"Ma Y, Guo L, Cukic B (2006) A Statistical Framework for the Prediction of Fault-Proneness. In: Advances in Machine Learning Applications in Software Engineering. IGI Global, pp 237\u2013263","key":"2586_CR36","DOI":"10.4018\/978-1-59140-941-1.ch010"},{"issue":"3","key":"2586_CR37","doi-asserted-by":"publisher","first-page":"248","DOI":"10.1016\/j.infsof.2011.09.007","volume":"54","author":"Y Ma","year":"2012","unstructured":"Ma Y, Luo G, Zeng X, Chen A (2012) Transfer learning for cross-company software defect prediction. Inf Softw Technol 54(3):248\u2013256. https:\/\/doi.org\/10.1016\/j.infsof.2011.09.007","journal-title":"Inf Softw Technol"},{"key":"2586_CR38","doi-asserted-by":"publisher","first-page":"504","DOI":"10.1016\/j.asoc.2014.11.023","volume":"27","author":"R Malhotra","year":"2015","unstructured":"Malhotra R (2015) A systematic review of machine learning techniques for software fault prediction. Appl Soft Comput J 27:504\u2013518. https:\/\/doi.org\/10.1016\/j.asoc.2014.11.023","journal-title":"Appl Soft Comput J"},{"issue":"6","key":"2586_CR39","doi-asserted-by":"publisher","first-page":"822","DOI":"10.1109\/TSE.2012.83","volume":"39","author":"T Menzies","year":"2013","unstructured":"Menzies T, Butcher A, Cok D et al (2013) Local versus global lessons for defect prediction and effort estimation. IEEE Trans Softw Eng 39(6):822\u2013834. https:\/\/doi.org\/10.1109\/TSE.2012.83","journal-title":"IEEE Trans Softw Eng"},{"issue":"1","key":"2586_CR40","doi-asserted-by":"publisher","first-page":"2","DOI":"10.1109\/TSE.2007.256941","volume":"33","author":"T Menzies","year":"2007","unstructured":"Menzies T, Greenwald J, Frank A (2007) Data mining static code attributes to learn defect predictors. IEEE Trans Softw Eng 33(1):2\u201313. https:\/\/doi.org\/10.1109\/TSE.2007.256941","journal-title":"IEEE Trans Softw Eng"},{"doi-asserted-by":"publisher","unstructured":"Merz CJ (1996) Dynamical Selection of Learning Algorithms. 281\u2013290. https:\/\/doi.org\/10.1007\/978-1-4612-2404-4_27","key":"2586_CR41","DOI":"10.1007\/978-1-4612-2404-4_27"},{"doi-asserted-by":"crossref","unstructured":"Nam J, Pan SJ, Kim S (2013) Transfer defect learning. In: Proceedings\u2014International Conference on Software Engineering. IEEE Computer Society, pp 382\u2013391","key":"2586_CR42","DOI":"10.1109\/ICSE.2013.6606584"},{"doi-asserted-by":"publisher","unstructured":"Nguyen TT, Nguyen TN, Phuong TM (2011) Topic-based defect prediction (NIER track). In: Proceedings\u2014International Conference on Software Engineering 932\u2013935. https:\/\/doi.org\/10.1145\/1985793.1985950","key":"2586_CR43","DOI":"10.1145\/1985793.1985950"},{"issue":"6","key":"2586_CR44","doi-asserted-by":"publisher","first-page":"1090","DOI":"10.1007\/s11390-017-1785-0","volume":"32","author":"C Ni","year":"2017","unstructured":"Ni C, Liu WS, Chen X et al (2017) A cluster based feature selection method for cross-project software defect prediction. J Comput Sci Technol 32(6):1090\u20131107. https:\/\/doi.org\/10.1007\/s11390-017-1785-0","journal-title":"J Comput Sci Technol"},{"issue":"3","key":"2586_CR45","doi-asserted-by":"publisher","first-page":"786","DOI":"10.1109\/TSE.2020.3001739","volume":"48","author":"C Ni","year":"2020","unstructured":"Ni C, Xia X, Lo D et al (2020) Revisiting supervised and unsupervised methods for effort-aware cross-project defect prediction. IEEE Trans Softw Eng 48(3):786\u2013803. https:\/\/doi.org\/10.1109\/TSE.2020.3001739","journal-title":"IEEE Trans Softw Eng"},{"doi-asserted-by":"crossref","unstructured":"Panichella A, Oliveto R, De Lucia A (2014) Cross-project defect prediction models: L\u2019Union fait la force. In: 2014 Software Evolution Week\u2014IEEE Conference on Software Maintenance, Reengineering, and Reverse Engineering, CSMR-WCRE 2014\u2014Proceedings. IEEE Computer Society, pp 164\u2013173","key":"2586_CR46","DOI":"10.1109\/CSMR-WCRE.2014.6747166"},{"key":"2586_CR47","doi-asserted-by":"publisher","DOI":"10.1016\/j.scico.2021.102611","author":"F Pecorelli","year":"2021","unstructured":"Pecorelli F, Di Nucci D (2021) Adaptive selection of classifiers for bug prediction: a large-scale empirical analysis of its performances and a benchmark study. Sci Comput Progr. https:\/\/doi.org\/10.1016\/j.scico.2021.102611","journal-title":"Sci Comput Progr"},{"issue":"4","key":"2586_CR48","doi-asserted-by":"publisher","first-page":"345","DOI":"10.1049\/iet-sen.2017.0111","volume":"12","author":"S Qiu","year":"2018","unstructured":"Qiu S, Lu L, Jiang S (2018) Multiple-components weights model for cross-project software defect prediction. IET Softw 12(4):345\u2013355. https:\/\/doi.org\/10.1049\/iet-sen.2017.0111","journal-title":"IET Softw"},{"doi-asserted-by":"publisher","unstructured":"Scanniello G, Gravino C, Marcus A, Menzies T (2013) Class level fault prediction using software clustering. In: 2013 28th IEEE\/ACM International Conference on Automated Software Engineering, ASE 2013\u2014Proceedings 640\u2013645. https:\/\/doi.org\/10.1109\/ASE.2013.6693126","key":"2586_CR49","DOI":"10.1109\/ASE.2013.6693126"},{"issue":"9","key":"2586_CR50","doi-asserted-by":"publisher","first-page":"1208","DOI":"10.1109\/TSE.2013.11","volume":"39","author":"M Shepperd","year":"2013","unstructured":"Shepperd M, Song Q, Sun Z, Mair C (2013) Data quality: some comments on the NASA software defect datasets. IEEE Trans Softw Eng 39(9):1208\u20131215. https:\/\/doi.org\/10.1109\/TSE.2013.11","journal-title":"IEEE Trans Softw Eng"},{"key":"2586_CR51","doi-asserted-by":"publisher","first-page":"297","DOI":"10.1109\/TSE.2003.1191795","volume":"29","author":"R Subramanyam","year":"2003","unstructured":"Subramanyam R, Krishnan MS (2003) Empirical analysis of CK metrics for object-oriented design complexity: implications for software defects. IEEE Trans Softw Eng 29:297\u2013310. https:\/\/doi.org\/10.1109\/TSE.2003.1191795","journal-title":"IEEE Trans Softw Eng"},{"doi-asserted-by":"publisher","unstructured":"Tantithamthavorn C, McIntosh S, Hassan AE, Matsumoto K (2016) Automated parameter optimization of classification techniques for defect prediction models. In: Proceedings\u2014International Conference on Software Engineering 14\u201322-May-2016:321\u2013332. https:\/\/doi.org\/10.1145\/2884781.2884857","key":"2586_CR52","DOI":"10.1145\/2884781.2884857"},{"issue":"1","key":"2586_CR53","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TSE.2016.2584050","volume":"43","author":"C Tantithamthavorn","year":"2017","unstructured":"Tantithamthavorn C, McIntosh S, Hassan AE, Matsumoto K (2017) An empirical comparison of model validation techniques for defect prediction models. IEEE Trans Softw Eng 43(1):1\u201318. https:\/\/doi.org\/10.1109\/TSE.2016.2584050","journal-title":"IEEE Trans Softw Eng"},{"issue":"10","key":"2586_CR54","doi-asserted-by":"publisher","first-page":"1427","DOI":"10.1109\/TSE.2013.27","volume":"39","author":"SW Thomas","year":"2013","unstructured":"Thomas SW, Nagappan M, Blostein D, Hassan AE (2013) The impact of classifier configuration and classifier combination on bug localization. IEEE Trans Softw Eng 39(10):1427\u20131443. https:\/\/doi.org\/10.1109\/TSE.2013.27","journal-title":"IEEE Trans Softw Eng"},{"doi-asserted-by":"publisher","unstructured":"Tosun A, Turhan B, Bener A (2008) Ensemble of software defect predictors: A case study. ESEM\u201908 In: Proceedings of the 2008 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement 318\u2013320. https:\/\/doi.org\/10.1145\/1414004.1414066","key":"2586_CR55","DOI":"10.1145\/1414004.1414066"},{"key":"2586_CR56","doi-asserted-by":"publisher","first-page":"540","DOI":"10.1007\/s10664-008-9103-7","volume":"14","author":"B Turhan","year":"2009","unstructured":"Turhan B, Menzies T, Bener AB, Di Stefano J (2009) On the relative value of cross-company and within-company data for defect prediction. Empir Softw Eng 14:540\u2013578. https:\/\/doi.org\/10.1007\/s10664-008-9103-7","journal-title":"Empir Softw Eng"},{"key":"2586_CR57","first-page":"4241","volume":"8","author":"W Tao","year":"2011","unstructured":"Tao W, Li W, Shi H, Liu Z (2011) Software defect prediction based on classifiers ensemble. J Inf Comput Sci 8:4241\u20134254","journal-title":"J Inf Comput Sci"},{"doi-asserted-by":"crossref","unstructured":"Watanabe S, Kaiya H, Kaijiri K (2008) Adapting a fault prediction model to allow inter language reuse. In: Proceedings\u2014International Conference on Software Engineering. pp 19\u201324","key":"2586_CR58","DOI":"10.1145\/1370788.1370794"},{"issue":"10","key":"2586_CR59","doi-asserted-by":"publisher","first-page":"977","DOI":"10.1109\/TSE.2016.2543218","volume":"42","author":"X Xia","year":"2016","unstructured":"Xia X, Lo D, Pan SJ et al (2016) HYDRA: massively compositional model for cross-project defect prediction. IEEE Trans Softw Eng 42(10):977\u2013998. https:\/\/doi.org\/10.1109\/TSE.2016.2543218","journal-title":"IEEE Trans Softw Eng"},{"doi-asserted-by":"crossref","unstructured":"Yu X, Zhang J, Zhou P, Liu J (2017) A data filtering method based on agglomerative clustering. In: Proceedings of the International Conference on Software Engineering and Knowledge Engineering, SEKE. Knowledge Systems Institute Graduate School, pp 392\u2013397","key":"2586_CR60","DOI":"10.18293\/SEKE2017-043"},{"doi-asserted-by":"publisher","unstructured":"Zhang F, Zheng Q, Zou Y, Hassan AE (2016) Cross-project defect prediction using a connectivity-based unsupervised classifier. Proceedings\u2014International Conference on Software Engineering 14\u201322-May-2016:309\u2013320. https:\/\/doi.org\/10.1145\/2884781.2884839","key":"2586_CR61","DOI":"10.1145\/2884781.2884839"},{"key":"2586_CR62","doi-asserted-by":"publisher","first-page":"264","DOI":"10.1109\/COMPSAC.2015.58","volume":"2","author":"Y Zhang","year":"2015","unstructured":"Zhang Y, Lo D, Xia X, Sun J (2015) An empirical study of classifier combination for cross-project defect prediction. Proc Int Comput Softw Appl Conf 2:264\u2013269. https:\/\/doi.org\/10.1109\/COMPSAC.2015.58","journal-title":"Proc Int Comput Softw Appl Conf"},{"issue":"6","key":"2586_CR63","doi-asserted-by":"publisher","first-page":"4537","DOI":"10.1016\/J.ESWA.2009.12.056","volume":"37","author":"J Zheng","year":"2010","unstructured":"Zheng J (2010) Cost-sensitive boosting neural networks for software defect prediction. Expert Syst Appl 37(6):4537\u20134543. https:\/\/doi.org\/10.1016\/J.ESWA.2009.12.056","journal-title":"Expert Syst Appl"},{"issue":"1","key":"2586_CR64","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/3183339","volume":"27","author":"Y Zhou","year":"2018","unstructured":"Zhou Y, Yang Y, Lu H et al (2018) How far we have progressed in the journey? An examination of cross-project defect prediction. ACM Trans Softw Eng Methodol 27(1):1\u201351. https:\/\/doi.org\/10.1145\/3183339","journal-title":"ACM Trans Softw Eng Methodol"},{"doi-asserted-by":"crossref","unstructured":"Zimmermann T, Nagappan N, Gall H, et al (2009) Cross-project defect prediction: A large scale experiment on data vs. domain vs. process. In: ESEC-FSE\u201909\u2014Proceedings of the Joint 12th European Software Engineering Conference and 17th ACM SIGSOFT Symposium on the Foundations of Software Engineering. pp 91\u2013100","key":"2586_CR65","DOI":"10.1145\/1595696.1595713"}],"container-title":["International Journal of System Assurance Engineering and Management"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s13198-024-02586-3.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s13198-024-02586-3\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s13198-024-02586-3.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,24]],"date-time":"2025-02-24T10:07:23Z","timestamp":1740391643000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s13198-024-02586-3"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,11,18]]},"references-count":65,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2025,2]]}},"alternative-id":["2586"],"URL":"https:\/\/doi.org\/10.1007\/s13198-024-02586-3","relation":{},"ISSN":["0975-6809","0976-4348"],"issn-type":[{"type":"print","value":"0975-6809"},{"type":"electronic","value":"0976-4348"}],"subject":[],"published":{"date-parts":[[2024,11,18]]},"assertion":[{"value":"9 March 2024","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"28 July 2024","order":2,"name":"revised","label":"Revised","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"23 October 2024","order":3,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"18 November 2024","order":4,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The authors have no relevant financial or non-financial interests to disclose.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflicts of interest"}},{"value":"This study does not involve any human\/animal participants.","order":3,"name":"Ethics","group":{"name":"EthicsHeading","label":"Human or animal rights"}},{"value":"This study does not involve any human\/animal participants, as a result no consent is needed.","order":4,"name":"Ethics","group":{"name":"EthicsHeading","label":"Informed consent"}}]}}