{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T21:32:01Z","timestamp":1775079121476,"version":"3.50.1"},"reference-count":18,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2015,5,14]],"date-time":"2015-05-14T00:00:00Z","timestamp":1431561600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Cryptogr Eng"],"published-print":{"date-parts":[[2015,6]]},"DOI":"10.1007\/s13389-015-0102-5","type":"journal-article","created":{"date-parts":[[2015,5,13]],"date-time":"2015-05-13T21:27:54Z","timestamp":1431552474000},"page":"85-94","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":21,"title":["Reversing stealthy dopant-level circuits"],"prefix":"10.1007","volume":"5","author":[{"given":"Takeshi","family":"Sugawara","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Daisuke","family":"Suzuki","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ryoichi","family":"Fujii","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shigeaki","family":"Tawa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ryohei","family":"Hori","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mitsuru","family":"Shiozaki","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Takeshi","family":"Fujino","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2015,5,14]]},"reference":[{"key":"102_CR1","unstructured":"Becker, G.T., Regazzoni, F., Paar, C., Burleson, W.P.: Stealthy dopant-level hardware trojans, CHES2013. LNCS 8086,197\u2013214 (2013)"},{"issue":"10","key":"102_CR2","doi-asserted-by":"crossref","first-page":"1523","DOI":"10.1007\/s10854-011-0459-x","volume":"22","author":"R Rosenkranz","year":"2011","unstructured":"Rosenkranz, R.: Failure localization with active and passive voltage contrast in FIB and SEM. J Mater Sci Mater Electron 22(10), 1523\u20131535 (2011)","journal-title":"J Mater Sci Mater Electron"},{"key":"102_CR3","unstructured":"Shiozaki, M., Hori, R., Fujino, T.: Diffusion programmable device: the device to prevent reverse engineering. In: Proceedings of IACR Cryptology ePrint Archive 2014\/109 (2014)"},{"key":"102_CR4","unstructured":"Nohl, K., Evans, D., Starbug, Pl\u00f6tz, H.: Reverse-engineering a cryptographic RFID tag. In: Proceedings of the 17th USENIX Security Symposium (2008)"},{"key":"102_CR5","unstructured":"Torrance, R., James, D.: The state-of-the-art in IC reverse engineering, CHES 2009. LNCS 5747, 363\u2013381 (2009)"},{"key":"102_CR6","unstructured":"Slashdot: stealthy dopant-level hardware trojans. http:\/\/hardware.slashdot.org\/story\/13\/09\/13\/1228216\/stealthy-dopant-level-hardware-trojans"},{"key":"102_CR7","unstructured":"Tarnovsky, C.: (In)security of Commonly Found Smart Cards, Invited Talk II, CHES 2012 (2012)"},{"key":"102_CR8","doi-asserted-by":"crossref","unstructured":"Boit, C.: Security risks posed by modern ic debug and diagnosis tools, keynote talk I. In: Proceedings of 10th Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC 2013) (2013)","DOI":"10.1109\/FDTC.2013.13"},{"key":"102_CR9","volume-title":"CMOS Digital Integrated Circuits Analysis and Design","author":"SM Kang","year":"2002","unstructured":"Kang, S.M., Leblebici, Y.: CMOS Digital Integrated Circuits Analysis and Design. McGraw-Hill, New York (2002)"},{"key":"102_CR10","doi-asserted-by":"crossref","unstructured":"Rajendran, J., Sam, M., Sinanoglu, O., Karri, R.: Security analysis of integrated circuit camouflaging. In: Proceedings of 2013 ACM SIGSAC Conference on Computer and Communications Security, pp 709\u2013720 (2013)","DOI":"10.1145\/2508859.2516656"},{"key":"102_CR11","unstructured":"SypherMedia International. Circuit Camouflage Technology, SMI IP Protection and Anti-Tamper Technologies. White Paper Version 1.9.8j, Mar 2012 (2012)"},{"key":"102_CR12","unstructured":"Reverse engineering integrated circuits with degate. http:\/\/www.degate.org\/"},{"issue":"4","key":"102_CR13","doi-asserted-by":"crossref","first-page":"402","DOI":"10.5573\/JSTS.2013.13.4.402","volume":"13","author":"H Chen","year":"2013","unstructured":"Chen, H., Fan, R., Lou, H., Kuo, M., Huang, Y.: Mechanism and application of NMOS leakage with intra-well isolation breakdown by voltage contrast detection. J. Semicond. Technol. Sci. 13(4), 402\u2013409 (2013)","journal-title":"J. Semicond. Technol. Sci."},{"key":"102_CR14","unstructured":"Joint Interpretation Library, Application of Attack Potential to Smartcards v. 2.7 (2009)"},{"key":"102_CR15","unstructured":"Electron Microscope Lab. at UC Berkeley, Charges for training and use of EML facilities (11\/2013). http:\/\/em-lab.berkeley.edu\/EML\/charge.php"},{"key":"102_CR16","unstructured":"Silicon zoo, Megamos chip XOR gate. http:\/\/www.siliconzoo.org\/megamos.html"},{"key":"102_CR17","unstructured":"Yang, M., Liang, S., Wu, L., Lai, L., Su, J., Niou, C., Wen, Y., Zhu, Y.: Application of passive voltage contrast fault isolation on 65nm SRAM single bit failure. In: Proceedings of 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (2009)"},{"key":"102_CR18","unstructured":"Cryptographic Hardware Project at Tohoku Univ., Aoki Lab. http:\/\/www.aoki.ecei.tohoku.ac.jp\/crypto\/web\/cores.html"}],"container-title":["Journal of Cryptographic Engineering"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s13389-015-0102-5.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s13389-015-0102-5\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s13389-015-0102-5","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,2]],"date-time":"2019-06-02T16:14:49Z","timestamp":1559492089000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s13389-015-0102-5"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,5,14]]},"references-count":18,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2015,6]]}},"alternative-id":["102"],"URL":"https:\/\/doi.org\/10.1007\/s13389-015-0102-5","relation":{},"ISSN":["2190-8508","2190-8516"],"issn-type":[{"value":"2190-8508","type":"print"},{"value":"2190-8516","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,5,14]]}}}