{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,16]],"date-time":"2026-07-16T15:33:16Z","timestamp":1784215996814,"version":"3.55.0"},"reference-count":50,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2024,4,23]],"date-time":"2024-04-23T00:00:00Z","timestamp":1713830400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2024,4,23]],"date-time":"2024-04-23T00:00:00Z","timestamp":1713830400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"funder":[{"name":"PERSYVAL-Lab","award":["ANR-11-LABX-0025-01"],"award-info":[{"award-number":["ANR-11-LABX-0025-01"]}]},{"name":"PERSYVAL-Lab","award":["ANR-11-LABX-0025-01"],"award-info":[{"award-number":["ANR-11-LABX-0025-01"]}]},{"name":"PERSYVAL-Lab","award":["ANR-11-LABX-0025-01"],"award-info":[{"award-number":["ANR-11-LABX-0025-01"]}]},{"name":"PERSYVAL-Lab","award":["ANR-11-LABX-0025-01"],"award-info":[{"award-number":["ANR-11-LABX-0025-01"]}]},{"name":"PERSYVAL-Lab","award":["ANR-11-LABX-0025-01"],"award-info":[{"award-number":["ANR-11-LABX-0025-01"]}]},{"name":"PERSYVAL-Lab","award":["ANR-11-LABX-0025-01"],"award-info":[{"award-number":["ANR-11-LABX-0025-01"]}]},{"DOI":"10.13039\/501100001665","name":"Agence Nationale de la Recherche","doi-asserted-by":"publisher","award":["ANR-15-IDEX-02"],"award-info":[{"award-number":["ANR-15-IDEX-02"]}],"id":[{"id":"10.13039\/501100001665","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001665","name":"Agence Nationale de la Recherche","doi-asserted-by":"publisher","award":["ANR-15-IDEX-02"],"award-info":[{"award-number":["ANR-15-IDEX-02"]}],"id":[{"id":"10.13039\/501100001665","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001665","name":"Agence Nationale de la Recherche","doi-asserted-by":"publisher","award":["ANR-15-IDEX-02"],"award-info":[{"award-number":["ANR-15-IDEX-02"]}],"id":[{"id":"10.13039\/501100001665","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001665","name":"Agence Nationale de la Recherche","doi-asserted-by":"publisher","award":["ANR-15-IDEX-02"],"award-info":[{"award-number":["ANR-15-IDEX-02"]}],"id":[{"id":"10.13039\/501100001665","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001665","name":"Agence Nationale de la Recherche","doi-asserted-by":"publisher","award":["ANR-15-IDEX-02"],"award-info":[{"award-number":["ANR-15-IDEX-02"]}],"id":[{"id":"10.13039\/501100001665","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001665","name":"Agence Nationale de la Recherche","doi-asserted-by":"publisher","award":["ANR-15-IDEX-02"],"award-info":[{"award-number":["ANR-15-IDEX-02"]}],"id":[{"id":"10.13039\/501100001665","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Cryptogr Eng"],"published-print":{"date-parts":[[2024,6]]},"DOI":"10.1007\/s13389-024-00352-6","type":"journal-article","created":{"date-parts":[[2024,4,23]],"date-time":"2024-04-23T19:06:01Z","timestamp":1713899161000},"page":"325-342","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":6,"title":["Cross-layer analysis of clock glitch fault injection while fetching variable-length instructions"],"prefix":"10.1007","volume":"14","author":[{"given":"Ihab","family":"Alshaer","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Gijs","family":"Burghoorn","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Brice","family":"Colombier","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Christophe","family":"Deleuze","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Vincent","family":"Beroulle","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Paolo","family":"Maistri","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2024,4,23]]},"reference":[{"issue":"2","key":"352_CR1","doi-asserted-by":"publisher","first-page":"370","DOI":"10.1109\/JPROC.2005.862424","volume":"94","author":"H Bar-El","year":"2006","unstructured":"Bar-El, H., Choukri, H., Naccache, D., Tunstall, M., Whelan, C.: The sorcerer\u2019s apprentice guide to fault attacks. Proc. IEEE 94(2), 370\u2013382 (2006)","journal-title":"Proc. IEEE"},{"issue":"3","key":"352_CR2","doi-asserted-by":"publisher","first-page":"305","DOI":"10.1109\/TDMR.2005.853449","volume":"5","author":"RC Baumann","year":"2005","unstructured":"Baumann, R.C.: Radiation-induced soft errors in advanced semiconductor technologies. IEEE Trans. Device Mater. Reliab. 5(3), 305\u2013316 (2005)","journal-title":"IEEE Trans. Device Mater. Reliab."},{"key":"352_CR3","doi-asserted-by":"crossref","unstructured":"Colombier, B., Menu, A., Dutertre, J.-M., Mo\u00ebllic, P.-A., Rigaud, J.-B., Danger, J.-L.: Laser-induced single-bit faults in flash memory: instructions corruption on a 32-bit microcontroller. In: 2019 IEEE International Symposium on Hardware Oriented Security and Trust (HOST), pp. 1\u201310. IEEE, McLean, United States (2019)","DOI":"10.1109\/HST.2019.8741030"},{"key":"352_CR4","doi-asserted-by":"crossref","unstructured":"Werner, V., Maingault, L., Potet, M.: An end-to-end approach for multi-fault attack vulnerability assessment. In: Workshop on Fault Detection and Tolerance in Cryptography, pp. 10\u201317. IEEE, Milan, Italy (2020)","DOI":"10.1109\/FDTC51366.2020.00009"},{"key":"352_CR5","doi-asserted-by":"crossref","unstructured":"Rivi\u00e8re, L., Najm, Z., Rauzy, P., Danger, J.-L., Bringer, J., Sauvage, L.: High precision fault injections on the instruction cache of ARMv7-M architectures. In: 2015 IEEE International Symposium on Hardware Oriented Security and Trust (HOST), pp. 62\u201367 (2015)","DOI":"10.1109\/HST.2015.7140238"},{"key":"352_CR6","doi-asserted-by":"crossref","unstructured":"Proy, J., Heydemann, K., Berzati, A., Maj\u00e9ric, F., Cohen, A.: A first ISA-level characterization of EM pulse effects on superscalar microarchitectures: a secure software perspective. In: Proceedings of the 14th International Conference on Availability, Reliability and Security, ARES 2019, Canterbury, UK, August 26-29, 2019, pp. 7\u20131710. ACM","DOI":"10.1145\/3339252.3339253"},{"key":"352_CR7","doi-asserted-by":"crossref","unstructured":"Timmers, N., Spruyt, A., Witteman, M.: Controlling PC on ARM using fault injection. In: 2016 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), pp. 25\u201335 (2016)","DOI":"10.1109\/FDTC.2016.18"},{"key":"352_CR8","doi-asserted-by":"crossref","unstructured":"Yuce, B., Ghalaty, N.F., Santapuri, H., Deshpande, C., Patrick, C., Schaumont, P.: Software fault resistance is futile: effective single-glitch attacks. In: 2016 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), pp. 47\u201358 (2016)","DOI":"10.1109\/FDTC.2016.21"},{"key":"352_CR9","doi-asserted-by":"crossref","unstructured":"Alshaer, I., Colombier, B., Deleuze, C., Beroulle, V., Maistri, P.: Microarchitecture-aware fault models: experimental evidence and cross-layer inference methodology. In: 2021 16th International Conference on Design Technology of Integrated Systems in Nanoscale Era (DTIS), pp. 1\u20136 (2021)","DOI":"10.1109\/DTIS53253.2021.9505074"},{"key":"352_CR10","doi-asserted-by":"crossref","unstructured":"Skorobogatov, S.: Local heating attacks on flash memory devices. In: 2009 IEEE International Workshop on Hardware-Oriented Security and Trust, pp. 1\u20136 (2009)","DOI":"10.1109\/HST.2009.5225028"},{"key":"352_CR11","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2022.114841","volume":"139","author":"I Alshaer","year":"2022","unstructured":"Alshaer, I., Colombier, B., Deleuze, C., Maistri, P., Beroulle, V.: Cross-layer inference methodology for microarchitecture-aware fault models. Microelectron. Reliab. 139, 114841 (2022)","journal-title":"Microelectron. Reliab."},{"key":"352_CR12","doi-asserted-by":"crossref","unstructured":"Menu, A., Dutertre, J.-M., Potin, O., Rigaud, J.-B., Danger, J.-L.: Experimental analysis of the electromagnetic instruction skip fault model. In: 2020 15th Design Technology of Integrated Systems in Nanoscale Era (DTIS), pp. 1\u20137 (2020)","DOI":"10.1109\/DTIS48698.2020.9081261"},{"key":"352_CR13","doi-asserted-by":"crossref","unstructured":"Trouchkine, T., Bouffard, G., Cl\u00e9di\u00e8re, J.: EM fault model characterization on SoCs: From different architectures to the same fault model. In: 2021 Workshop on Fault Detection and Tolerance in Cryptography (FDTC), pp. 31\u201338 (2021). IEEE","DOI":"10.1109\/FDTC53659.2021.00014"},{"key":"352_CR14","doi-asserted-by":"crossref","unstructured":"Timmers, N., Mune, C.: Escalating privileges in linux using voltage fault injection. In: 2017 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), pp. 1\u20138 (2017)","DOI":"10.1109\/FDTC.2017.16"},{"key":"352_CR15","unstructured":"Gratchoff, J., Timmers, N., Spruyt, A., Chmielewski, L.: Proving the wild jungle jump. Technical report, Technical report, University of Amsterdam (2015)"},{"key":"352_CR16","doi-asserted-by":"crossref","unstructured":"Alshaer, I., Colombier, B., Deleuze, C., Beroulle, V., Maistri, P.: Variable-length instruction set: feature or bug? In: 25th Euromicro Conference on Digital System Design, DSD 2022, Maspalomas, Spain, August 31 - Sept. 2, 2022, pp. 464\u2013471. IEEE","DOI":"10.1109\/DSD57027.2022.00068"},{"key":"352_CR17","unstructured":"Pan, H.: High performance, variable-length instruction encodings. PhD thesis, Massachusetts Institute of Technology (2002)"},{"key":"352_CR18","unstructured":"Prasad Kulkarni: 16\/32-Bit ARM-Thumb Architecture and AX Extensions. http:\/\/www.ittc.ku.edu\/~kulkarni\/research\/thumb_ax.pdf. [Accessed: March 2, 2022]"},{"key":"352_CR19","unstructured":"MIPS Technologies, Inc.: microMIPSTM Instruction Set Architecture Uncompromised Performance, Minimum System Cost . [Accessed: March 2, 2022]. https:\/\/s3-eu-west-1.amazonaws.com\/downloads-mips\/mips-documentation\/login-required\/micromips_instruction_set_architecture.pdf"},{"key":"352_CR20","unstructured":"Waterman, A., Lee, Y., Patterson, D.A., Asanovi\u0107, K.: The RISC-V compressed instruction set manual, version 1.7. EECS Department, University of California, Berkeley, UCB\/EECS-2015-157 (2015)"},{"key":"352_CR21","unstructured":"informIT: Understanding ARM Architectures. [Accessed: March 1, 2022]. https:\/\/www.informit.com\/articles\/article.aspx?p=1620207 &seqNum=3"},{"key":"352_CR22","unstructured":"Tom Shanley | Mindshare, Inc.: x86 Instruction Set Architecture. [Accessed: March 2, 2022]. https:\/\/www.mindshare.com\/files\/ebooks\/x86%20Instruction%20Set%20Architecture.pdf"},{"key":"352_CR23","unstructured":"MIPS Technologies, Inc.: MIPS32 Architecture For Programmers Volume II: The MIPS32 Instruction Set . [Accessed: March 2, 2022]. https:\/\/www.cs.cornell.edu\/courses\/cs3410\/2008fa\/MIPS_Vol2.pdf"},{"key":"352_CR24","unstructured":"MIPS Technologies, Inc.: MIPS64 Architecture For Programmers Volume II: The MIPS64 Instruction Set. [Accessed: March 2, 2022]. https:\/\/scc.ustc.edu.cn\/zlsc\/lxwycj\/200910\/W020100308600769158777.pdf"},{"key":"352_CR25","unstructured":"ARM Limited: ARM Architecture Reference Manual Thumb-2 Supplement. [Accessed: February 22, 2022]. https:\/\/developer.arm.com\/documentation\/ddi0308\/d"},{"key":"352_CR26","unstructured":"Intel Corporation: Intel\u00ae64 and IA-32 Architectures Software Developer Manuals, Volume 3A: System Programming Guide, Part 1. Intel Corporation, Santa Clara, CA (2016)"},{"key":"352_CR27","unstructured":"Advanced Micro Devices, Inc.: AMD64 Architecture Programmer\u2019s Manual Volumes 1-5. Advanced Micro Devices, Inc., Santa Clara, CA (2023). https:\/\/www.amd.com\/system\/files\/TechDocs\/40332.pdf"},{"key":"352_CR28","doi-asserted-by":"publisher","first-page":"108","DOI":"10.1016\/B978-0-12-800056-4.00003-0","volume-title":"Digital Design and Computer Architecture","author":"SL Harris","year":"2016","unstructured":"Harris, S.L., Harris, D.M.: 3 - sequential logic design. In: Harris, S.L., Harris, D.M. (eds.) Digital Design and Computer Architecture, pp. 108\u2013171. Morgan Kaufmann, Boston (2016)"},{"key":"352_CR29","unstructured":"Ankit Mahajan: Relation between clock skew and frequency of operation. https:\/\/www.linkedin.com\/pulse\/relation-between-skew-frequency-operation-ankit-mahajan\/. [Accessed: July 3, 2022]"},{"key":"352_CR30","unstructured":"Texas Instruments: Basics of SPI: Timing Requirements and Switching Characteristics. [Accessed: July 3, 2022]. https:\/\/training.ti.com\/sites\/default\/files\/docs\/adcs-spi-communications-timing-presentation.pdf"},{"key":"352_CR31","doi-asserted-by":"crossref","unstructured":"Markovic, D., Nikolic, B., Brodersen, R.: Analysis and design of low-energy flip-flops. In: Proceedings of the 2001 International Symposium on Low Power Electronics and Design, pp. 52\u201355 (2001)","DOI":"10.1145\/383082.383093"},{"key":"352_CR32","doi-asserted-by":"crossref","unstructured":"O\u2019Flynn, C., Chen, Z.D.: Chipwhisperer: An open-source platform for hardware embedded security research. In: Prouff, E. (ed.) International Workshop on Constructive Side-Channel Analysis and Secure Design. Lecture Notes in Computer Science, vol. 8622, pp. 243\u2013260. Springer, Paris, France (2014)","DOI":"10.1007\/978-3-319-10175-0_17"},{"key":"352_CR33","unstructured":"Zussa, L., Dutertre, J.-M., Cl\u00e9di\u00e8re, J., Robisson, B., Tria, A.: Investigation of timing constraints violation as a fault injection means. In: 27th Conference on Design of Circuits and Integrated Systems (DCIS), Avignon, France, p. (2012)"},{"key":"352_CR34","doi-asserted-by":"crossref","unstructured":"Zussa, L., Dutertre, J.-M., Cl\u00e9di\u00e8re, J., Tria, A.: Power supply glitch induced faults on fpga: an in-depth analysis of the injection mechanism. In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), pp. 110\u2013115 (2013)","DOI":"10.1109\/IOLTS.2013.6604060"},{"issue":"4","key":"352_CR35","doi-asserted-by":"publisher","first-page":"181","DOI":"10.1049\/iet-ifs.2010.0238","volume":"5","author":"N Selmane","year":"2011","unstructured":"Selmane, N., Bhasin, S., Guilley, S., Danger, J.: Security evaluation of application-specific integrated circuits and field programmable gate arrays against setup time violation attacks. IET Inf. Secur. 5(4), 181\u2013190 (2011)","journal-title":"IET Inf. Secur."},{"key":"352_CR36","doi-asserted-by":"crossref","unstructured":"Bayon, P., Bossuet, L., Aubert, A., Fischer, V., Poucheret, F., Robisson, B., Maurine, P.: Contactless electromagnetic active attack on ring oscillator based true random number generator. In: Schindler, W., Huss, S.A. (eds.) Constructive Side-Channel Analysis and Secure Design, pp. 151\u2013166 (2012)","DOI":"10.1007\/978-3-642-29912-4_12"},{"key":"352_CR37","doi-asserted-by":"crossref","unstructured":"Ghodrati, M., Yuce, B., Gujar, S., Deshpande, C., Nazhandali, L., Schaumont, P.: Inducing local timing fault through EM injection. In: Proceedings of the 55th Annual Design Automation Conference, DAC 2018, San Francisco, CA, USA, June 24-29, 2018, pp. 142\u201311426. ACM","DOI":"10.1109\/DAC.2018.8465836"},{"key":"352_CR38","unstructured":"Tang, A., Sethumadhavan, S., Stolfo, S.J.: CLKSCREW: exposing the perils of security-oblivious energy management. In: Kirda, E., Ristenpart, T. (eds.) 26th USENIX Security Symposium, USENIX Security 2017, Vancouver, BC, Canada, August 16-18, 2017, pp. 1057\u20131074. USENIX Association"},{"issue":"5","key":"352_CR39","doi-asserted-by":"publisher","first-page":"28","DOI":"10.1109\/MSEC.2020.2990495","volume":"18","author":"K Murdock","year":"2020","unstructured":"Murdock, K., Oswald, D.F., Garcia, F.D., Bulck, J.V., Piessens, F., Gruss, D.: Plundervolt: How a little bit of undervolting can create a lot of trouble. IEEE Secur. Priv. 18(5), 28\u201337 (2020)","journal-title":"IEEE Secur. Priv."},{"issue":"6","key":"352_CR40","doi-asserted-by":"publisher","first-page":"1130","DOI":"10.1109\/TCAD.2020.3024853","volume":"40","author":"P Qiu","year":"2021","unstructured":"Qiu, P., Wang, D., Lyu, Y., Tian, R., Wang, C., Qu, G.: Voltjockey: A new dynamic voltage scaling-based fault injection attack on intel SGX. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(6), 1130\u20131143 (2021)","journal-title":"IEEE Trans. Comput. Aided Des. Integr. Circuits Syst."},{"key":"352_CR41","unstructured":"ARM Limited: ARMv7-M Architecture Reference Manual. [Accessed: February 22, 2022]. https:\/\/developer.arm.com\/documentation\/ddi0403\/latest"},{"key":"352_CR42","doi-asserted-by":"publisher","first-page":"182","DOI":"10.1007\/978-3-642-12510-2_13","volume-title":"Smart Card Research and Advanced Application","author":"M Agoyan","year":"2010","unstructured":"Agoyan, M., Dutertre, J.-M., Naccache, D., Robisson, B., Tria, A.: When clocks fail: On critical paths and clock faults. In: Gollmann, D., Lanet, J.-L., Iguchi-Cartigny, J. (eds.) Smart Card Research and Advanced Application, pp. 182\u2013193. Springer, Berlin, Heidelberg (2010)"},{"issue":"1","key":"352_CR43","doi-asserted-by":"publisher","first-page":"88","DOI":"10.1109\/TIFS.2011.2169666","volume":"7","author":"Y Li","year":"2012","unstructured":"Li, Y., Ohta, K., Sakiyama, K.: New fault-based side-channel attack using fault sensitivity. IEEE Trans. Inf. Forensics Secur. 7(1), 88\u201397 (2012)","journal-title":"IEEE Trans. Inf. Forensics Secur."},{"key":"352_CR44","doi-asserted-by":"crossref","unstructured":"Alshaer, I., Colombier, B., Deleuze, C., Beroulle, V., Maistri, P.: Microarchitectural Insights into Unexplained Behaviors under Clock Glitch Fault Injection. In: Springer (ed.) 22nd Smart Card Research and Advanced Application Conference (CARDIS 2023). Lecture Notes in Computer Science (LNCS), pp. 1\u201320. Springer, Amsterdam, Netherlands (2023). https:\/\/hal.science\/hal-04273995","DOI":"10.1007\/978-3-031-54409-5_1"},{"key":"352_CR45","first-page":"77","volume-title":"Workshop on Fault Diagnosis and Tolerance in Cryptography 3","author":"N Moro","year":"2013","unstructured":"Moro, N., Dehbaoui, A., Heydemann, K., Robisson, B., Encrenaz, E.: Electromagnetic fault injection: Towards a fault model on a 32-bit microcontroller. In: Fischer, W., Schmidt, J. (eds.) Workshop on Fault Diagnosis and Tolerance in Cryptography 3, pp. 77\u201388. IEEE Computer Society, Los Alamitos, CA, USA (2013)"},{"key":"352_CR46","doi-asserted-by":"crossref","unstructured":"Spensky, C., Machiry, A., Burow, N., Okhravi, H., Housley, R., Gu, Z., Jamjoom, H., Kruegel, C., Vigna, G.: Glitching demystified: analyzing control-flow-based glitching attacks and defenses. In: 2021 51st Annual IEEE\/IFIP International Conference on Dependable Systems and Networks (DSN), pp. 400\u2013412 (2021). IEEE","DOI":"10.1109\/DSN48987.2021.00051"},{"key":"352_CR47","doi-asserted-by":"crossref","unstructured":"Benso, A., Di\u00a0Carlo, S., Di\u00a0Natale, G., Prinetto, P.: Static analysis of seu effects on software applications. In: Proceedings. International Test Conference, pp. 500\u2013508 (2002)","DOI":"10.1109\/TEST.2002.1041800"},{"key":"352_CR48","unstructured":"Escouteloup, M., Lashermes, R., Lanet, J.-L., Fournier, J.J.-A.: Recommendations for a radically secure ISA. In: CARRV 2020 - Workshop on Computer Architecture Research with RISC-V, pp. 1\u201322. ACM, Valence (virtual), Spain (2020). https:\/\/hal.archives-ouvertes.fr\/hal-03128242"},{"issue":"1","key":"352_CR49","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/2133375.2133377","volume":"15","author":"R Roemer","year":"2012","unstructured":"Roemer, R., Buchanan, E., Shacham, H., Savage, S.: Return-oriented programming: Systems, languages, and applications. ACM Trans. Inf. Syst. Secur. (TISSEC) 15(1), 1\u201334 (2012)","journal-title":"ACM Trans. Inf. Syst. Secur. (TISSEC)"},{"key":"352_CR50","unstructured":"Daemen, J., Rijmen, V.: Rijndael for AES. In: The Third Advanced Encryption Standard Candidate Conference, pp. 343\u2013348. National Institute of Standards and Technology, New York, USA (2000)"}],"container-title":["Journal of Cryptographic Engineering"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s13389-024-00352-6.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s13389-024-00352-6\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s13389-024-00352-6.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,16]],"date-time":"2024-11-16T22:29:29Z","timestamp":1731796169000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s13389-024-00352-6"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,23]]},"references-count":50,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2024,6]]}},"alternative-id":["352"],"URL":"https:\/\/doi.org\/10.1007\/s13389-024-00352-6","relation":{},"ISSN":["2190-8508","2190-8516"],"issn-type":[{"value":"2190-8508","type":"print"},{"value":"2190-8516","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,4,23]]},"assertion":[{"value":"27 November 2023","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"31 March 2024","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"23 April 2024","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}}]}}