{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,23]],"date-time":"2026-10-23T19:19:03Z","timestamp":1792783143935,"version":"4.5.0"},"reference-count":17,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2024,5,11]],"date-time":"2024-05-11T00:00:00Z","timestamp":1715385600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0"},{"start":{"date-parts":[[2024,5,11]],"date-time":"2024-05-11T00:00:00Z","timestamp":1715385600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0"}],"funder":[{"name":"VLAIO\/Imec-ICON","award":["HBC.2022.0094"],"award-info":[{"award-number":["HBC.2022.0094"]}]},{"name":"VLAIO\/Imec-ICON","award":["HBC.2022.0094"],"award-info":[{"award-number":["HBC.2022.0094"]}]},{"name":"VLAIO\/Imec-ICON","award":["HBC.2022.0094"],"award-info":[{"award-number":["HBC.2022.0094"]}]},{"name":"VLAIO\/Imec-ICON","award":["HBC.2022.0094"],"award-info":[{"award-number":["HBC.2022.0094"]}]}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Nondestruct Eval"],"published-print":{"date-parts":[[2024,6]]},"abstract":"<jats:title>Abstract<\/jats:title>\n                  <jats:p>\n                    Accurate 3D mesh registration is essential in many industrial applications of X-ray imaging, as it allows quality assessment and inspection of manufactured objects. Conventional methods rely mainly on time-consuming and expensive X-ray computed tomography (X-CT) or ancillary camera systems. Instead, we propose a novel approach for efficient 3D multi-mesh registration in few-view industrial X-ray imaging scenarios. Our approach harnesses the capabilities of CAD-ASTRA, an X-ray mesh projector, compatible with the ASTRA toolbox and popular GPU libraries such as CuPy and PyTorch, for the simulation of X-ray projec tions from a known object surface mesh. As a differentiable program, CAD-ASTRA allows iterative improvement of the objects\u2019 position in space by back-propagation of a differentiable measure of the projection error. The potential of this approach is demonstrated through tests on simultaneous multiple object registration in a poly-chromatic imaging, even in cases where the spectral characteristics of the imaging system are unknown. Results from a diverse set of real experiments highlight the efficacy of mesh registration, achieving successful registrations even when only two projections at a 10\n                    <jats:inline-formula>\n                      <jats:alternatives>\n                        <jats:tex-math>$$^\\circ $$<\/jats:tex-math>\n                        <mml:math xmlns:mml=\"http:\/\/www.w3.org\/1998\/Math\/MathML\">\n                          <mml:msup>\n                            <mml:mrow\/>\n                            <mml:mo>\u2218<\/mml:mo>\n                          <\/mml:msup>\n                        <\/mml:math>\n                      <\/jats:alternatives>\n                    <\/jats:inline-formula>\n                    angle relative to the scanning system center are available. The mesh projector facilitates resource-efficient registration in industrial applications with few viewpoints, thereby reducing the demand for resources and eliminating the need for X-CT reconstruction.\n                  <\/jats:p>","DOI":"10.1007\/s10921-024-01071-y","type":"journal-article","created":{"date-parts":[[2024,5,11]],"date-time":"2024-05-11T10:01:38Z","timestamp":1715421698000},"update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":9,"title":["Practical Multi-Mesh Registration for Few-View Poly-Chromatic X-Ray Inspection"],"prefix":"10.1007","volume":"43","author":[{"given":"Domenico","family":"Iuso","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Pavel","family":"Paramonov","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jan","family":"De Beenhouwer","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jan","family":"Sijbers","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2024,5,11]]},"reference":[{"key":"1071_CR1","doi-asserted-by":"publisher","unstructured":"Tan, Y., Ohtake, Y., Yatagawa, T., Suzuki, H.: Matching of cad model projections and x-ray projection images for shape inspection of metal assemblies. 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