{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,3]],"date-time":"2022-04-03T13:56:45Z","timestamp":1648994205778},"reference-count":12,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2011,3,17]],"date-time":"2011-03-17T00:00:00Z","timestamp":1300320000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Radiol Phys Technol"],"published-print":{"date-parts":[[2011,7]]},"DOI":"10.1007\/s12194-011-0117-2","type":"journal-article","created":{"date-parts":[[2011,3,16]],"date-time":"2011-03-16T03:19:27Z","timestamp":1300245567000},"page":"164-172","source":"Crossref","is-referenced-by-count":2,"title":["Development of quality control system for flat-panel detectors"],"prefix":"10.1007","volume":"4","author":[{"given":"Atsushi","family":"Teramoto","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Takahiko","family":"Kajihara","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shoichi","family":"Suzuki","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kazuo","family":"Kinoshita","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Masatoshi","family":"Tsuzaka","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hiroshi","family":"Fujita","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2011,3,17]]},"reference":[{"key":"117_CR1","doi-asserted-by":"crossref","unstructured":"Rowlands J, Kasap S Amorphous semiconductors usher in digital X-ray imaging. Phys Today. 1997:24\u201330","DOI":"10.1063\/1.881994"},{"key":"117_CR2","doi-asserted-by":"crossref","first-page":"213","DOI":"10.1016\/S0040-6090(98)01179-1","volume":"337","author":"JP Moy","year":"1999","unstructured":"Moy JP. Large area X-ray detectors based on amorphous silicon technology. Thin Solid Films. 1999;337:213\u201321.","journal-title":"Thin Solid Films"},{"key":"117_CR3","doi-asserted-by":"crossref","first-page":"79","DOI":"10.1016\/0969-806X(94)90203-8","volume":"43","author":"GR Hopkinson","year":"1994","unstructured":"Hopkinson GR. Radiation effects on solid state imaging devices. Radiat Phys chem. 1994;43:79\u201391.","journal-title":"Radiat Phys chem"},{"key":"117_CR4","doi-asserted-by":"crossref","first-page":"703","DOI":"10.1109\/23.322792","volume":"41","author":"JM Boudry","year":"1994","unstructured":"Boudry JM, Antonuk LE. Radiation damage of amorphous silicon photodiode sensors. IEEE Trans Nucl Sci. 1994;41:703\u20137.","journal-title":"IEEE Trans Nucl Sci"},{"key":"117_CR5","doi-asserted-by":"crossref","first-page":"1151","DOI":"10.1016\/S0026-2714(03)00137-9","volume":"43","author":"X-T Meng","year":"2003","unstructured":"Meng X-T, Kang A-G, Li J-H, Zhang H-Y, Yu S, Zheng Y. Effects of electron and gamma-ray irradiation on CMOS analog image sensors. Microelectron Reliab. 2003;43:1151\u20135.","journal-title":"Microelectron Reliab"},{"key":"117_CR6","doi-asserted-by":"crossref","first-page":"743","DOI":"10.1118\/1.597668","volume":"23","author":"JM Boudry","year":"1996","unstructured":"Boudry JM, Antonuk LE. Radiation damage of amorphous silicon, thin-film, field-effect transistors. Med Phys. 1996;23:743\u201354.","journal-title":"Med Phys"},{"key":"117_CR7","doi-asserted-by":"crossref","first-page":"614","DOI":"10.1118\/1.598243","volume":"25","author":"JH Siewerdsen","year":"1998","unstructured":"Siewerdsen JH, Antonuk LE, El-Mohri Y, Yorkston J, Huang W, CunninghamSiewerdsen IA. Signal, noise power spectrum, and detective quantum efficiency of indirect-detection flat-panel imagers for diagnostic radiology. Med Phys. 1998;25:614\u201328.","journal-title":"Med Phys"},{"key":"117_CR8","doi-asserted-by":"crossref","first-page":"608","DOI":"10.1118\/1.1561285","volume":"30","author":"E Samei","year":"2003","unstructured":"Samei E, Flynn MJ. An experimental comparison of detector performance for direct and indirect digital radiography systems. Med Phys. 2003;30:608\u201322.","journal-title":"Med Phys"},{"key":"117_CR9","doi-asserted-by":"crossref","first-page":"1747","DOI":"10.1118\/1.1578772","volume":"30","author":"E Samei","year":"2003","unstructured":"Samei E. Image quality in two phosphor-based flat panel digital radiographic detectors. Med Phys. 2003;30:1747\u201357.","journal-title":"Med Phys"},{"key":"117_CR10","doi-asserted-by":"crossref","first-page":"2715","DOI":"10.1118\/1.1609151","volume":"30","author":"PR Granfors","year":"2003","unstructured":"Granfors PR, Aufrichtig R, Possin GE, Giambattista BW, Huang ZS, Liu J, et al. Performance of a 41\u00d741\u00a0cm2 amorphous silicon flat panel X-ray detector designed for angiographic and R&F imaging applications. Med Phys. 2003;30:2715\u201326.","journal-title":"Med Phys"},{"key":"117_CR11","first-page":"329","volume-title":"Handbook of imaging materials","author":"SD Arthur","year":"2001","unstructured":"Arthur SD, David SW. Handbook of imaging materials. New York: Marcel Dekker; 2001. p. 329\u201368."},{"key":"117_CR12","doi-asserted-by":"crossref","first-page":"1153","DOI":"10.1109\/TASSP.1987.1165259","volume":"35","author":"PA Maragos","year":"1987","unstructured":"Maragos PA, Schafer RW. Morphological filters-Part I: their set-theoretic analysis and relations to linear shift-invariant filters. IEEE Trans ASSP. 1987;35:1153\u201369.","journal-title":"IEEE Trans ASSP"}],"container-title":["Radiological Physics and Technology"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s12194-011-0117-2.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s12194-011-0117-2\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s12194-011-0117-2","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,9]],"date-time":"2019-06-09T08:13:02Z","timestamp":1560067982000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s12194-011-0117-2"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,3,17]]},"references-count":12,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2011,7]]}},"alternative-id":["117"],"URL":"https:\/\/doi.org\/10.1007\/s12194-011-0117-2","relation":{},"ISSN":["1865-0333","1865-0341"],"issn-type":[{"value":"1865-0333","type":"print"},{"value":"1865-0341","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,3,17]]}}}