{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,19]],"date-time":"2025-09-19T08:29:55Z","timestamp":1758270595124,"version":"3.40.3"},"publisher-location":"Cham","reference-count":36,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783030638290"},{"type":"electronic","value":"9783030638306"}],"license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020]]},"DOI":"10.1007\/978-3-030-63830-6_12","type":"book-chapter","created":{"date-parts":[[2020,11,18]],"date-time":"2020-11-18T10:08:18Z","timestamp":1605694098000},"page":"137-149","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":3,"title":["Auto-Classifier: A Robust Defect Detector Based on an AutoML Head"],"prefix":"10.1007","author":[{"given":"Vasco","family":"Lopes","sequence":"first","affiliation":[]},{"given":"Lu\u00eds A.","family":"Alexandre","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2020,11,19]]},"reference":[{"key":"12_CR1","unstructured":"Baker, B., Gupta, O., Naik, N., Raskar, R.: Designing neural network architectures using reinforcement learning. In: ICLR 2017 (2017)"},{"issue":"12","key":"12_CR2","doi-asserted-by":"publisher","first-page":"7405","DOI":"10.1109\/TGRS.2016.2601622","volume":"54","author":"G Cheng","year":"2016","unstructured":"Cheng, G., Zhou, P., Han, J.: Learning rotation-invariant convolutional neural networks for object detection in VHR optical remote sensing images. IEEE Trans. Geosci. Remote Sens. 54(12), 7405\u20137415 (2016)","journal-title":"IEEE Trans. Geosci. Remote Sens."},{"key":"12_CR3","series-title":"The Springer Series on Challenges in Machine Learning","doi-asserted-by":"publisher","first-page":"113","DOI":"10.1007\/978-3-030-05318-5_6","volume-title":"Automated Machine Learning","author":"M Feurer","year":"2019","unstructured":"Feurer, M., Klein, A., Eggensperger, K., Springenberg, J.T., Blum, M., Hutter, F.: Auto-sklearn: efficient and robust automated machine learning. In: Hutter, F., Kotthoff, L., Vanschoren, J. (eds.) Automated Machine Learning. TSSCML, pp. 113\u2013134. Springer, Cham (2019). https:\/\/doi.org\/10.1007\/978-3-030-05318-5_6"},{"issue":"12","key":"12_CR4","doi-asserted-by":"publisher","first-page":"4381","DOI":"10.3390\/s18124381","volume":"18","author":"E Garcia Plaza","year":"2018","unstructured":"Garcia Plaza, E., Lopez, P., Gonzalez, E.: Multi-sensor data fusion for real-time surface quality control in automated machining systems. Sensors 18(12), 4381 (2018)","journal-title":"Sensors"},{"key":"12_CR5","unstructured":"Gijsbers, P., LeDell, E., Thomas, J., Poirier, S., Bischl, B., Vanschoren, J.: An open source automl benchmark. In: ICMLW on Automated Machine Learning (2019)"},{"key":"12_CR6","volume-title":"Deep Learning","author":"I Goodfellow","year":"2016","unstructured":"Goodfellow, I., Bengio, Y., Courville, A.: Deep Learning. MIT Press, Cambridge (2016)"},{"key":"12_CR7","unstructured":"H2O.ai: H2O AutoML, June 2017. http:\/\/docs.h2o.ai\/h2o\/latest-stable\/h2o-docs\/automl.html. h2O version 3.30.0.1"},{"key":"12_CR8","doi-asserted-by":"crossref","unstructured":"He, K., Zhang, X., Ren, S., Sun, J.: Deep residual learning for image recognition. In: CVPR (2016)","DOI":"10.1109\/CVPR.2016.90"},{"key":"12_CR9","doi-asserted-by":"crossref","unstructured":"Huang, G., Liu, Z., Van Der Maaten, L., Weinberger, K.Q.: Densely connected convolutional networks. In: CVPR, pp. 2261\u20132269 (2017)","DOI":"10.1109\/CVPR.2017.243"},{"key":"12_CR10","doi-asserted-by":"crossref","unstructured":"Hutter, F., Kotthoff, L., Vanschoren, J.: Automated Machine Learning. Springer, Cham (2019)","DOI":"10.1007\/978-3-030-05318-5"},{"key":"12_CR11","doi-asserted-by":"crossref","unstructured":"Kocbek, S., Gabrys, B.: Automated machine learning techniques in prognostics of railway track defects. In: ICDMW. IEEE (2019)","DOI":"10.1109\/ICDMW.2019.00115"},{"key":"12_CR12","unstructured":"Kotthoff, L., Thornton, C., Hoos, H.H., Hutter, F., Leyton-Brown, K.: Auto-weka 2.0: automatic model selection and hyperparameter optimization in weka. J. Mach. Learn. Res. 18(1), 826\u2013830 (2017)"},{"key":"12_CR13","doi-asserted-by":"publisher","first-page":"7553","DOI":"10.1038\/nature14539","volume":"521","author":"Y LeCun","year":"2015","unstructured":"LeCun, Y., Bengio, Y., Hinton, G.: Deep learning. Nature 521, 7553 (2015)","journal-title":"Nature"},{"key":"12_CR14","doi-asserted-by":"publisher","first-page":"51","DOI":"10.1016\/j.autcon.2017.01.019","volume":"78","author":"G Li","year":"2017","unstructured":"Li, G., Zhao, X., Du, K., Ru, F., Zhang, Y.: Recognition and evaluation of bridge cracks with modified active contour model and greedy search-based support vector machine. Autom. Constr. 78, 51\u201361 (2017)","journal-title":"Autom. Constr."},{"key":"12_CR15","unstructured":"Liu, H., Simonyan, K., Yang, Y.: DARTS: differentiable architecture search. In: ICLR (2019)"},{"issue":"2","key":"12_CR16","doi-asserted-by":"publisher","first-page":"171","DOI":"10.1016\/S0262-8856(02)00152-X","volume":"21","author":"EN Malamas","year":"2003","unstructured":"Malamas, E.N., Petrakis, E.G., Zervakis, M., Petit, L., Legat, J.D.: A survey on industrial vision systems, applications and tools. Image Vision Comput. 21(2), 171\u2013188 (2003)","journal-title":"Image Vision Comput."},{"key":"12_CR17","doi-asserted-by":"crossref","unstructured":"Mendoza, H., et al.: Towards automatically-tuned deep neural networks. In: AutoML: Methods, Sytems, Challenges, December 2018","DOI":"10.1007\/978-3-030-05318-5_7"},{"issue":"6","key":"12_CR18","doi-asserted-by":"publisher","first-page":"344","DOI":"10.1108\/09576069810238709","volume":"9","author":"A Mital","year":"1998","unstructured":"Mital, A., Govindaraju, M., Subramani, B.: A comparison between manual and hybrid methods in parts inspection. Integr. Manuf. Syst. 9(6), 344\u2013349 (1998)","journal-title":"Integr. Manuf. Syst."},{"key":"12_CR19","unstructured":"Pham, H., Guan, M., Zoph, B., Le, Q., Dean, J.: Efficient neural architecture search via parameters sharing. In: ICML (2018)"},{"issue":"6088","key":"12_CR20","doi-asserted-by":"publisher","first-page":"533","DOI":"10.1038\/323533a0","volume":"323","author":"DE Rumelhart","year":"1986","unstructured":"Rumelhart, D.E., Hinton, G.E., Williams, R.J.: Learning representations by back-propagating errors. Nature 323(6088), 533\u2013536 (1986)","journal-title":"Nature"},{"key":"12_CR21","doi-asserted-by":"publisher","first-page":"85","DOI":"10.1016\/j.neunet.2014.09.003","volume":"61","author":"J Schmidhuber","year":"2015","unstructured":"Schmidhuber, J.: Deep learning in neural networks: an overview. Neural Netw. 61, 85\u2013117 (2015)","journal-title":"Neural Netw."},{"key":"12_CR22","doi-asserted-by":"crossref","unstructured":"Schmugge, S.J., Rice, L., Lindberg, J., Grizziy, R., Joffey, C., Shin, M.C.: Crack segmentation by leveraging multiple frames of varying illumination. In: WACV, March 2017","DOI":"10.1109\/WACV.2017.121"},{"issue":"1","key":"12_CR23","doi-asserted-by":"publisher","first-page":"531","DOI":"10.1016\/j.cirp.2012.03.131","volume":"61","author":"B Scholz-Reiter","year":"2012","unstructured":"Scholz-Reiter, B., Weimer, D., Thamer, H.: Automated surface inspection of cold-formed micro-parts. CIRP Ann. 61(1), 531\u2013534 (2012)","journal-title":"CIRP Ann."},{"key":"12_CR24","doi-asserted-by":"crossref","unstructured":"Siebel, N.T., Sommer, G.: Learning defect classifiers for visual inspection images by neuro-evolution using weakly labelled training data. In: IEEE CEC (2008)","DOI":"10.1109\/CEC.2008.4631331"},{"key":"12_CR25","unstructured":"Simonyan, K., Zisserman, A.: Very deep convolutional networks for large-scale image recognition. In: ICLR (2015)"},{"key":"12_CR26","unstructured":"Sohn, K., Lee, H.: Learning invariant representations with local transformations. In: ICML (2012)"},{"key":"12_CR27","doi-asserted-by":"crossref","unstructured":"Timm, F., Barth, E.: Non-parametric texture defect detection using weibull features. In: Image Processing: Machine Vision Applications IV (2011)","DOI":"10.1117\/12.872463"},{"key":"12_CR28","doi-asserted-by":"crossref","unstructured":"Villalba-Diez, J., Schmidt, D., Gevers, R., Ordieres-Mer\u00e9, J., Buchwitz, M., Wellbrock, W.: Deep learning for industrial computer vision quality control in the printing industry 4.0. Sensors 19(18), 3987 (2019)","DOI":"10.3390\/s19183987"},{"issue":"1","key":"12_CR29","doi-asserted-by":"publisher","first-page":"417","DOI":"10.1016\/j.cirp.2016.04.072","volume":"65","author":"D Weimer","year":"2016","unstructured":"Weimer, D., Scholz-Reiter, B., Shpitalni, M.: Design of deep convolutional neural network architectures for automated feature extraction in industrial inspection. CIRP Ann. 65(1), 417\u2013420 (2016)","journal-title":"CIRP Ann."},{"key":"12_CR30","unstructured":"Wieler, M., Hahn, T.: Weakly supervised learning for industrial optical inspection. In: DAGM Symposium in 2007 (2007)"},{"issue":"3","key":"12_CR31","doi-asserted-by":"publisher","first-page":"1","DOI":"10.5565\/rev\/elcvia.268","volume":"7","author":"X Xie","year":"2008","unstructured":"Xie, X.: A review of recent advances in surface defect detection using texture analysis techniques. ELCVIA 7(3), 1\u201322 (2008)","journal-title":"ELCVIA"},{"key":"12_CR32","unstructured":"Zela, A., Elsken, T., Saikia, T., Marrakchi, Y., Brox, T., Hutter, F.: Understanding and robustifying differentiable architecture search. In: ICLR (2020)"},{"key":"12_CR33","doi-asserted-by":"crossref","unstructured":"Zhang, L., Yang, F., Zhang, Y.D., Zhu, Y.J.: Road crack detection using deep convolutional neural network. In: ICIP (2016)","DOI":"10.1109\/ICIP.2016.7533052"},{"key":"12_CR34","doi-asserted-by":"crossref","unstructured":"Zhong, Z., Yan, J., Wu, W., Shao, J., Liu, C.L.: Practical block-wise neural network architecture generation. In: CVPR (2018)","DOI":"10.1109\/CVPR.2018.00257"},{"key":"12_CR35","unstructured":"Zoph, B., Le, Q.V.: Neural architecture search with reinforcement learning. In: ICLR (2017)"},{"key":"12_CR36","doi-asserted-by":"crossref","unstructured":"Zoph, B., Vasudevan, V., Shlens, J., Le, Q.V.: Learning transferable architectures for scalable image recognition. In: CVPR (2018)","DOI":"10.1109\/CVPR.2018.00907"}],"container-title":["Lecture Notes in Computer Science","Neural Information Processing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-63830-6_12","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,7]],"date-time":"2024-03-07T14:06:38Z","timestamp":1709820398000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-030-63830-6_12"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"ISBN":["9783030638290","9783030638306"],"references-count":36,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-63830-6_12","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2020]]},"assertion":[{"value":"19 November 2020","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ICONIP","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Neural Information Processing","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Bangkok","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Thailand","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2020","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"18 November 2020","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"22 November 2020","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"27","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"iconip2020","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/www.apnns.org\/ICONIP2020","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Single-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"CMT","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"618","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"187","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"189","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"30% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3.18","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3.68","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"No","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Due to COVID-19 pandemic the conference was held virtually.","order":10,"name":"additional_info_on_review_process","label":"Additional Info on Review Process","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}