{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,9]],"date-time":"2026-03-09T11:04:33Z","timestamp":1773054273217,"version":"3.50.1"},"reference-count":25,"publisher":"Springer Science and Business Media LLC","issue":"11-12","license":[{"start":{"date-parts":[[2026,1,28]],"date-time":"2026-01-28T00:00:00Z","timestamp":1769558400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0"},{"start":{"date-parts":[[2026,1,28]],"date-time":"2026-01-28T00:00:00Z","timestamp":1769558400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0"}],"funder":[{"DOI":"10.13039\/501100008814","name":"Universidade do Minho","doi-asserted-by":"crossref","id":[{"id":"10.13039\/501100008814","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Int J Adv Manuf Technol"],"published-print":{"date-parts":[[2026,2]]},"DOI":"10.1007\/s00170-025-17378-7","type":"journal-article","created":{"date-parts":[[2026,1,28]],"date-time":"2026-01-28T14:51:59Z","timestamp":1769611919000},"page":"5993-6003","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Active learning for industrial defect detection: a study on hybrid sampling strategies"],"prefix":"10.1007","volume":"142","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9803-1670","authenticated-orcid":false,"given":"Dibet","family":"Garcia Gonzalez","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7410-517X","authenticated-orcid":false,"given":"Rui","family":"Nascimento","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7254-0346","authenticated-orcid":false,"given":"Cl\u00e1udia","family":"D. Rocha","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0593-2865","authenticated-orcid":false,"given":"Manuel","family":"F. Silva","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3747-6577","authenticated-orcid":false,"given":"V\u00edtor","family":"Filipe","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8680-4290","authenticated-orcid":false,"given":"Lu\u00eds","family":"F. Rocha","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4426-0002","authenticated-orcid":false,"given":"Lu\u00eds","family":"Gonzaga Magalh\u00e3es","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3458-7693","authenticated-orcid":false,"given":"Ant\u00f3nio","family":"Cunha","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2026,1,28]]},"reference":[{"key":"17378_CR1","doi-asserted-by":"crossref","unstructured":"Aghdam HH, Gonzalez-Garcia A, Weijer J.v.d, Lopez AM (2019) Active learning for deep detection neural networks. In: Proceedings of the ieee\/cvf international conference on computer vision (iccv)","DOI":"10.1109\/ICCV.2019.00377"},{"key":"17378_CR2","doi-asserted-by":"crossref","unstructured":"Bellini M, Pantalos G, Kaspar P, Knoll L, De-Michielis L (2021) An active deep learning method for the detection of defects in power semiconductors. In: 2021 32nd annual semi advanced semiconductor manufacturing conference (asmc) (pp 1\u20135)","DOI":"10.1109\/ASMC51741.2021.9435657"},{"key":"17378_CR3","doi-asserted-by":"crossref","unstructured":"Choi J, Elezi I, Lee H-J, Farabet C, Alvarez JM (2021) Active learning for deep object detection via probabilistic modeling. In: Proceedings of the ieee\/cvf international conference on computer vision (pp 10264\u201310273)","DOI":"10.1109\/ICCV48922.2021.01010"},{"key":"17378_CR4","unstructured":"F\u00f6llmer B, Schulze K, Wald C, Stober S, Samek W, Dewey M (2024) Active learning with the nnunet and sample selection with uncertainty-aware submodular mutual information measure.N. Burgos et al. (Eds.), Proceedings of the 7nd international conference on medical imaging with deep learning (Vol 250, pp 480\u2013503) PMLR. https:\/\/proceedings.mlr.press\/v250\/follmer24a.html"},{"key":"17378_CR5","doi-asserted-by":"publisher","unstructured":"Gao S, Jiang Y, Xia T, Li Y, Zhu Y, Xi L (2025) A multi-stage active learning framework with an instance-based sample selection algorithm for steel surface defect. Adv Eng Inf 64:103080. https:\/\/doi.org\/10.1016\/j.aei.2024.103080. https:\/\/www.sciencedirect.com\/science\/article\/pii\/S1474034624007316","DOI":"10.1016\/j.aei.2024.103080"},{"key":"17378_CR6","doi-asserted-by":"publisher","unstructured":"Garcia D, Carias J, Ad\u00e3o T, Jesus R, Cunha A, Magalh\u00e3es LG (2023) Ten years of active learning techniques and object detection: A systematic review. Appl Sci 13(19). https:\/\/doi.org\/10.3390\/app131910667. https:\/\/www.mdpi.com\/2076-3417\/13\/19\/10667","DOI":"10.3390\/app131910667"},{"key":"17378_CR7","doi-asserted-by":"publisher","first-page":"2408","DOI":"10.1111\/mice.12998","volume":"38","author":"J Guo","year":"2023","unstructured":"Guo J, Wang Q, Su S, Li Y (2023) Informativeness-guided active learning for deep learning-based fa\u00e7ade defects detection. Computer-Aided Civil and Infrastructure Eng 38:2408\u20132425. https:\/\/doi.org\/10.1111\/mice.12998","journal-title":"Computer-Aided Civil and Infrastructure Eng"},{"key":"17378_CR8","doi-asserted-by":"crossref","unstructured":"Harith S, Rajapakse C, Mahanama T, Asanka D (2024) Adaptive continual learning for defect detection in dynamic textile manufacturing. In: 2024 6th international conference on advancements in computing (icac) (pp 211\u2013216)","DOI":"10.1109\/ICAC64487.2024.10850925"},{"key":"17378_CR9","doi-asserted-by":"publisher","first-page":"102282","DOI":"10.1016\/j.displa.2022.102282","volume":"76","author":"W Huang","year":"2023","unstructured":"Huang W, Sun S, Lin X, Zhang D, Ma L (2023) Deep active learning with weighting filter for object detection. Displays 76:102282","journal-title":"Displays"},{"key":"17378_CR10","doi-asserted-by":"publisher","unstructured":"Huang W, Sun S, Lin X, Zhang D, Ma L (2023b) Deep active learning with weighting filter for object detection. Displays 76:102282. https:\/\/doi.org\/10.1016\/j.displa.2022.102282. https:\/\/www.sciencedirect.com\/science\/article\/pii\/S0141938222001020","DOI":"10.1016\/j.displa.2022.102282"},{"key":"17378_CR11","doi-asserted-by":"publisher","first-page":"25186","DOI":"10.1109\/ACCESS.2025.3537649","volume":"13","author":"P Ivanov","year":"2025","unstructured":"Ivanov P, Shtark M, Kozhevnikov A, Golyadkin M, Botov D, Makarov I (2025) Sensordbscan: Semi-supervised active learning powered method for anomaly detection and diagnosis. IEEE Access 13:25186\u201325197. https:\/\/doi.org\/10.1109\/ACCESS.2025.3537649","journal-title":"IEEE Access"},{"key":"17378_CR12","doi-asserted-by":"publisher","unstructured":"Jin Q, Yuan M, Qiao Q, Song Z (2022) One-shot active learning for image segmentation via contrastive learning and diversity-based sampling. Knowl-Based Syst 241:108278. https:\/\/doi.org\/10.1016\/j.knosys.2022.108278. https:\/\/www.sciencedirect.com\/science\/article\/pii\/S0950705122000909","DOI":"10.1016\/j.knosys.2022.108278"},{"key":"17378_CR13","unstructured":"Jocher G, Qiu J, Chaurasia A (2023) Ultralytics YOLO. https:\/\/github.com\/ultralytics\/ultralytics"},{"key":"17378_CR14","doi-asserted-by":"publisher","unstructured":"Lv X, Duan F, Jiang J-J, Fu X, Gan, L (2020) Deep active learning for surface defect detection. Sensors 20(6). https:\/\/doi.org\/10.3390\/s20061650. https:\/\/www.mdpi.com\/1424-8220\/20\/6\/1650","DOI":"10.3390\/s20061650"},{"key":"17378_CR15","doi-asserted-by":"crossref","unstructured":"Mentouri Z, Bouguettaya A, Doghmane H, Gherfi K, Bendjoudi S (2024) Comparison of traditional tool combination and deep learning methods for automatic classification of steel surface defects. In: 2024 3rd international conference on embedded systems and artificial intelligence (esai) (pp 1\u20138)","DOI":"10.1109\/ESAI62891.2024.10913550"},{"issue":"5","key":"17378_CR16","doi-asserted-by":"publisher","first-page":"2665","DOI":"10.1007\/s00170-025-15309-0","volume":"137","author":"R Nascimento","year":"2025","unstructured":"Nascimento R, Rocha CD, Gonzalez DG, Silva T, Moreira R, Silva MF, Rocha LF (2025) Automated optical system for quality inspection on reflective parts. Int J Adv Manuf Technol 137(5):2665\u20132680. https:\/\/doi.org\/10.1007\/s00170-025-15309-0","journal-title":"Int J Adv Manuf Technol"},{"key":"17378_CR17","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TIM.2024.3368494","volume":"73","author":"H Qin","year":"2024","unstructured":"Qin H, Shu L, Zhou L, Deng S, Xiao H, Sun W, Wang Y (2024) Active learning-detr: Cost-effective object detection for kitchen waste. IEEE Trans Instrumen and Measurement 73:1\u201315. https:\/\/doi.org\/10.1109\/TIM.2024.3368494","journal-title":"IEEE Trans Instrumen and Measurement"},{"issue":"5","key":"17378_CR18","doi-asserted-by":"publisher","first-page":"2943","DOI":"10.1109\/TPWRD.2024.3449801","volume":"39","author":"K Qiu","year":"2024","unstructured":"Qiu K, Cao Y, Jiang D, Chen L, Yang Q (2024) Region-based active learning for insulator defect diagnosis using aerial images of electric transmission networks. IEEE Trans Power Delivery 39(5):2943\u20132955. https:\/\/doi.org\/10.1109\/TPWRD.2024.3449801","journal-title":"IEEE Trans Power Delivery"},{"key":"17378_CR19","unstructured":"Roy S, Unmesh A, Namboodiri VP (2018) Deep active learning for object detection. Bmvc (Vol 362, p 375)"},{"key":"17378_CR20","unstructured":"Sentinel (2024) Kaimaker platform. [2024-06-05] https:\/\/www.kaimaker.com (Accessed: 2024 May 5)"},{"key":"17378_CR21","unstructured":"Settles, B (2009) Active learning literature survey (Tech. Rep.) University of Wisconsin-Madison, Computer Sciences Technical Report 1648"},{"key":"17378_CR22","doi-asserted-by":"crossref","unstructured":"Shen Y, Liu F, Zhang Z (2024) Active learning in industrial defect detection: A dynamic approach to uncertainty and representativeness. In: 2024 5th international conference on intelligent computing and human-computer interaction (ichci) (pp 635-643)","DOI":"10.1109\/ICHCI63580.2024.10808080"},{"key":"17378_CR23","doi-asserted-by":"publisher","unstructured":"Song K, Yan Y (2013) A noise robust method based on completed local binary patterns for hot-rolled steel strip surface defects. Appl Surface Sci 285:858\u2013864. https:\/\/doi.org\/10.1016\/j.apsusc.2013.09.002. https:\/\/www.sciencedirect.com\/science\/article\/pii\/S0169433213016437","DOI":"10.1016\/j.apsusc.2013.09.002"},{"key":"17378_CR24","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1080\/00207543.2024.2316279","volume":"62","author":"P Zajec","year":"2024","unstructured":"Zajec P, Ro\u017eanec J, Theodoropoulos S, Fontul M, Koehorst E, Fortuna B, Mladeni\u0107 D (2024) Few-shot learning for defect detection in manufacturing. Int J Prod Res 62:1\u201320. https:\/\/doi.org\/10.1080\/00207543.2024.2316279","journal-title":"Int J Prod Res"},{"key":"17378_CR25","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TIM.2025.3551482","volume":"74","author":"F Zuo","year":"2025","unstructured":"Zuo F, Liu J, Zhang H, Chen Z, Yan B, Wang L (2025) A complex welding defect detection method based on active learning in pipeline transportation system. IEEE Trans Instrum Meas 74:1\u201312. https:\/\/doi.org\/10.1109\/TIM.2025.3551482","journal-title":"IEEE Trans Instrum Meas"}],"container-title":["The International Journal of Advanced Manufacturing Technology"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s00170-025-17378-7.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s00170-025-17378-7","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s00170-025-17378-7.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,9]],"date-time":"2026-03-09T09:04:28Z","timestamp":1773047068000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s00170-025-17378-7"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,1,28]]},"references-count":25,"journal-issue":{"issue":"11-12","published-print":{"date-parts":[[2026,2]]}},"alternative-id":["17378"],"URL":"https:\/\/doi.org\/10.1007\/s00170-025-17378-7","relation":{},"ISSN":["0268-3768","1433-3015"],"issn-type":[{"value":"0268-3768","type":"print"},{"value":"1433-3015","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,1,28]]},"assertion":[{"value":"22 July 2025","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"30 December 2025","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"28 January 2026","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this article.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflicts of Interest"}}]}}