{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,2]],"date-time":"2025-11-02T16:36:32Z","timestamp":1762101392865},"reference-count":28,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[2013,2,9]],"date-time":"2013-02-09T00:00:00Z","timestamp":1360368000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Appl. Phys. A"],"published-print":{"date-parts":[[2013,11]]},"DOI":"10.1007\/s00339-013-7602-x","type":"journal-article","created":{"date-parts":[[2013,2,9]],"date-time":"2013-02-09T02:41:03Z","timestamp":1360377663000},"page":"817-824","source":"Crossref","is-referenced-by-count":8,"title":["Effects of oxygen partial pressure on the ferroelectric properties of pulsed laser deposited Ba0.8Sr0.2TiO3 thin films"],"prefix":"10.1007","volume":"113","author":[{"given":"J. P. B.","family":"Silva","sequence":"first","affiliation":[]},{"given":"K. C.","family":"Sekhar","sequence":"additional","affiliation":[]},{"given":"A.","family":"Almeida","sequence":"additional","affiliation":[]},{"given":"J.","family":"Agostinho\u00a0Moreira","sequence":"additional","affiliation":[]},{"given":"M.","family":"Pereira","sequence":"additional","affiliation":[]},{"given":"M. J. M.","family":"Gomes","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2013,2,9]]},"reference":[{"key":"7602_CR1","doi-asserted-by":"crossref","first-page":"1083","DOI":"10.1103\/RevModPhys.77.1083","volume":"77","author":"M. Dawber","year":"2005","unstructured":"M. Dawber, K.M. Rabe, J.F. Scott, Rev. Mod. Phys. 77, 1083 (2005)","journal-title":"Rev. Mod. Phys."},{"key":"7602_CR2","doi-asserted-by":"crossref","first-page":"204","DOI":"10.1016\/j.tsf.2004.08.171","volume":"491","author":"P.K. Sharma","year":"2005","unstructured":"P.K. Sharma, G.L. Messing, D.K. Agrawal, Thin Solid Films 491, 204 (2005)","journal-title":"Thin Solid Films"},{"key":"7602_CR3","doi-asserted-by":"crossref","first-page":"1299","DOI":"10.1016\/j.ceramint.2006.04.012","volume":"33","author":"W. Hu","year":"2007","unstructured":"W. Hu, C. Yang, W. Zhang, G. Liu, Ceram. Int. 33, 1299 (2007)","journal-title":"Ceram. Int."},{"key":"7602_CR4","doi-asserted-by":"crossref","first-page":"1017","DOI":"10.1016\/j.optmat.2007.05.004","volume":"30","author":"I. Aulika","year":"2008","unstructured":"I. Aulika, J. Pokorny, V. Zauls, K. Kundzins, M. Rutkis, J. Petzelt, Opt. Mater. 30, 1017 (2008)","journal-title":"Opt. Mater."},{"key":"7602_CR5","doi-asserted-by":"crossref","first-page":"591","DOI":"10.1007\/s00339-003-2234-1","volume":"80","author":"X.H. Hu","year":"2005","unstructured":"X.H. Hu, H.L.W. Chan, C.L. Choy, K.H. Wong, Appl. Phys. A 80, 591 (2005)","journal-title":"Appl. Phys. A"},{"key":"7602_CR6","doi-asserted-by":"crossref","first-page":"3343","DOI":"10.1021\/cm0603349","volume":"18","author":"Z. Fu","year":"2006","unstructured":"Z. Fu, A. Wu, P.M. Vilarinho, Chem. Mater. 18, 3343 (2006)","journal-title":"Chem. Mater."},{"key":"7602_CR7","doi-asserted-by":"crossref","first-page":"3416","DOI":"10.1016\/j.tsf.2007.11.122","volume":"516","author":"G.C. Jha","year":"2008","unstructured":"G.C. Jha, S.K. Ray, I. Manna, Thin Solid Films 516, 3416 (2008)","journal-title":"Thin Solid Films"},{"key":"7602_CR8","doi-asserted-by":"crossref","first-page":"860","DOI":"10.1016\/S0167-9317(02)01012-2","volume":"66","author":"T. Zhang","year":"2003","unstructured":"T. Zhang, H. Gu, J. Liu, Microelectron. Eng. 66, 860 (2003)","journal-title":"Microelectron. Eng."},{"key":"7602_CR9","first-page":"453","volume":"279","author":"T. Delage","year":"2004","unstructured":"T. Delage, C. Champeaux, A. Catherinot, J.F. Seaux, V. Madrangeas, D. Cros, Thin Solid Films 279, 453\u2013454 (2004)","journal-title":"Thin Solid Films"},{"key":"7602_CR10","doi-asserted-by":"crossref","first-page":"1200","DOI":"10.1063\/1.1289272","volume":"77","author":"Y. Gim","year":"2000","unstructured":"Y. Gim, T. Hudson, Y. Fan, C. Kwon, A.T. Findikoglu, B.J. Gibbons, B.H. Park, Q.X. Jia, Appl. Phys. Lett. 77, 1200 (2000)","journal-title":"Appl. Phys. Lett."},{"key":"7602_CR11","doi-asserted-by":"crossref","first-page":"1745","DOI":"10.1016\/j.ceramint.2003.12.136","volume":"30","author":"D.Y. Wang","year":"2004","unstructured":"D.Y. Wang, C.L. Mak, K.H. Wong, H.L.W. Chan, C.L. Choy, Ceram. Int. 30, 1745 (2004)","journal-title":"Ceram. Int."},{"key":"7602_CR12","doi-asserted-by":"crossref","first-page":"7965","DOI":"10.1063\/1.362346","volume":"79","author":"H.F. Cheng","year":"1996","unstructured":"H.F. Cheng, J. Appl. Phys. 79, 7965 (1996)","journal-title":"J. Appl. Phys."},{"key":"7602_CR13","doi-asserted-by":"crossref","first-page":"91","DOI":"10.1016\/S0040-6090(01)00781-7","volume":"386","author":"F.M. Pontes","year":"2001","unstructured":"F.M. Pontes, E. Longo, E.R. Leite, J.A. Varela, Thin Solid Films 386, 91 (2001)","journal-title":"Thin Solid Films"},{"key":"7602_CR14","doi-asserted-by":"crossref","first-page":"2282","DOI":"10.1088\/0022-3727\/39\/10\/043","volume":"39","author":"X.H. Zhu","year":"2006","unstructured":"X.H. Zhu, Q.D. Meng, L.P. Yong, Y.S. He, B.L. Cheng, D.N. Zheng, J. Phys. D, Appl. Phys. 39, 2282 (2006)","journal-title":"J. Phys. D, Appl. Phys."},{"key":"7602_CR15","doi-asserted-by":"crossref","first-page":"12","DOI":"10.1080\/10584580802085849","volume":"97","author":"C. Borderon","year":"2008","unstructured":"C. Borderon, D. Averty, R. Seveno, H.W. Gundel, Integr. Ferroelectr. 97, 12 (2008)","journal-title":"Integr. Ferroelectr."},{"key":"7602_CR16","doi-asserted-by":"crossref","first-page":"112","DOI":"10.1080\/10584580701320404","volume":"91","author":"C. Fu","year":"2007","unstructured":"C. Fu, F. Pan, W. Cai, Integr. Ferroelectr. 91, 112 (2007)","journal-title":"Integr. Ferroelectr."},{"key":"7602_CR17","volume":"100","author":"P. Zubko","year":"2006","unstructured":"P. Zubko, D.J. Jung, J.F. Scott, J. Appl. Phys. 100, 114113 (2006)","journal-title":"J. Appl. Phys."},{"key":"7602_CR18","volume":"112","author":"J.P.B. Silva","year":"2012","unstructured":"J.P.B. Silva, K.C. Sekhar, A. Almeida, J. Agostinho Moreira, J. Mart\u00edn-S\u00e1nchez, M. Pereira, A. Khodorov, M.J.M. Gomes, J.\u00a0Appl. Phys. 112, 044105 (2012)","journal-title":"J.\u00a0Appl. Phys."},{"key":"7602_CR19","doi-asserted-by":"crossref","DOI":"10.1063\/1.3490187","volume":"108","author":"K. Sahoo","year":"2010","unstructured":"K. Sahoo, D. Misra, D.C. Agrawal, Y.N. Mohapatra, S.B. Majumder, R.S. Katiyar, J. Appl. Phys. 108, 074112 (2010)","journal-title":"J. Appl. Phys."},{"key":"7602_CR20","doi-asserted-by":"crossref","first-page":"4642","DOI":"10.1063\/1.1789631","volume":"96","author":"A. Vorobiev","year":"2004","unstructured":"A. Vorobiev, P. Rundqvist, K. Khamchane, S. Gevorgian, J. Appl. Phys. 96, 4642 (2004)","journal-title":"J. Appl. Phys."},{"key":"7602_CR21","doi-asserted-by":"crossref","DOI":"10.1063\/1.2202115","volume":"99","author":"P. Ehrhart","year":"2006","unstructured":"P. Ehrhart, R. Thomas, J. Appl. Phys. 99, 114108 (2006)","journal-title":"J. Appl. Phys."},{"key":"7602_CR22","doi-asserted-by":"crossref","first-page":"3533","DOI":"10.1063\/1.122827","volume":"73","author":"S. Zafar","year":"1998","unstructured":"S. Zafar, R.E. Jones, B. Jiang, B. White, V. Kaushik, S. Gillespie, Appl. Phys. Lett. 73, 3533 (1998)","journal-title":"Appl. Phys. Lett."},{"key":"7602_CR23","doi-asserted-by":"crossref","first-page":"9288","DOI":"10.1063\/1.1473675","volume":"91","author":"Z.G. Ban","year":"2002","unstructured":"Z.G. Ban, S.P. Alpay, J. Appl. Phys. 91, 9288 (2002)","journal-title":"J. Appl. Phys."},{"key":"7602_CR24","doi-asserted-by":"crossref","first-page":"33","DOI":"10.1080\/00150190500315012","volume":"329","author":"M. Kumar","year":"2005","unstructured":"M. Kumar, S.C. Roy, M.C. Bhatnagar, S. Agarwal, G.L. Sharma, Ferroelectrics 329, 33 (2005)","journal-title":"Ferroelectrics"},{"key":"7602_CR25","doi-asserted-by":"crossref","first-page":"82","DOI":"10.1016\/j.tsf.2005.03.055","volume":"485","author":"C. Wang","year":"2005","unstructured":"C. Wang, B.L. Cheng, S.Y. Wang, H.B. Lu, Y.L. Zhou, Z.H. Chen, G.Z. Yang, Thin Solid Films 485, 82 (2005)","journal-title":"Thin Solid Films"},{"key":"7602_CR26","doi-asserted-by":"crossref","DOI":"10.1103\/PhysRevLett.100.097601","volume":"100","author":"A. Gruverman","year":"2008","unstructured":"A. Gruverman, D. Wu, J.F. Scott, Phys. Rev. Lett. 100, 097601 (2008)","journal-title":"Phys. Rev. Lett."},{"key":"7602_CR27","doi-asserted-by":"crossref","DOI":"10.1143\/APEX.1.091601","volume":"1","author":"K.C. Sekhar","year":"2008","unstructured":"K.C. Sekhar, A. Nautiyal, R. Nath, Appl. Phys. Express 1, 091601 (2008)","journal-title":"Appl. Phys. Express"},{"key":"7602_CR28","doi-asserted-by":"crossref","DOI":"10.1063\/1.1926403","volume":"86","author":"L. Pintilie","year":"2005","unstructured":"L. Pintilie, M. Lisca, M. Alexe, Appl. Phys. Lett. 86, 192902 (2005)","journal-title":"Appl. Phys. Lett."}],"container-title":["Applied Physics A"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s00339-013-7602-x.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s00339-013-7602-x\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s00339-013-7602-x","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,28]],"date-time":"2019-05-28T12:48:06Z","timestamp":1559047686000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s00339-013-7602-x"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,2,9]]},"references-count":28,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2013,11]]}},"alternative-id":["7602"],"URL":"https:\/\/doi.org\/10.1007\/s00339-013-7602-x","relation":{},"ISSN":["0947-8396","1432-0630"],"issn-type":[{"value":"0947-8396","type":"print"},{"value":"1432-0630","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,2,9]]}}}