{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,31]],"date-time":"2022-03-31T02:20:51Z","timestamp":1648693251223},"reference-count":28,"publisher":"Springer Science and Business Media LLC","issue":"4","license":[{"start":{"date-parts":[[2007,7,10]],"date-time":"2007-07-10T00:00:00Z","timestamp":1184025600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Constraints"],"published-print":{"date-parts":[[2007,10,4]]},"DOI":"10.1007\/s10601-007-9025-9","type":"journal-article","created":{"date-parts":[[2007,7,16]],"date-time":"2007-07-16T23:24:55Z","timestamp":1184628295000},"page":"507-538","source":"Crossref","is-referenced-by-count":0,"title":["Maxx: Test Pattern Optimisation with Local Search Over an Extended Logic"],"prefix":"10.1007","volume":"12","author":[{"given":"Francisco","family":"Azevedo","sequence":"first","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2007,7,10]]},"reference":[{"key":"9025_CR1","unstructured":"Abramovici, M., Breuer, M. A., & Friedman, A. D. (1990). Digital Systems Testing and Testable Design. IEEE Press."},{"issue":"9","key":"9025_CR2","doi-asserted-by":"crossref","first-page":"1015","DOI":"10.1109\/TC.1972.5009081","volume":"21","author":"V. D. Agrawal","year":"1972","unstructured":"Agrawal, V. D., & Agrawal, P. (1972). An automatic test generation system for ILLIAC IV logic boards. IEEE Trans. Comput. C-21(9): 1015\u20131017.","journal-title":"IEEE Trans. Comput."},{"key":"9025_CR3","unstructured":"Azevedo, F. (2003). Constraint Solving over Multi-valued Logics\u2014Application to Digital Circuits. Frontiers of Artificial Intelligence and Applications Vol 91 (pp. xviii+204). ISBN: 1 58603 304 2. IOS Press."},{"key":"9025_CR4","doi-asserted-by":"crossref","unstructured":"Azevedo, F., & Barahona, P. (1998). Generation of test patterns for differential diagnosis of digital circuits (extended abstract). In Maher, M. & Puget, J.-F., eds., Proceedings of the 4th International Conference on Principles and Practice of Constraint Programming (CP\u201998), page 462. Springer.","DOI":"10.1007\/3-540-49481-2_33"},{"key":"9025_CR5","first-page":"73","volume-title":"Proceedings of the 14th European conference on artificial intelligence (ECAI\u20192000)","author":"F. Azevedo","year":"2000","unstructured":"Azevedo, F., & Barahona, P. (2000). Differentiating diagnostic theories through constraints over an eight-valued logic. In Horn, W., ed., Proceedings of the 14th European Conference on Artificial Intelligence (ECAI\u20192000), pages 73\u201377. Amsterdam:IOS Press."},{"key":"9025_CR6","doi-asserted-by":"crossref","unstructured":"Azevedo, F., & Barahona, P. (2000). Modelling digital circuits problems with set constraints. In J. Lloyd et al. (Eds.), Proceedings of the First International Conference on Computational Logic (CL\u20192000), pages 414\u2013428. Springer.","DOI":"10.1007\/3-540-44957-4_28"},{"key":"9025_CR7","doi-asserted-by":"crossref","unstructured":"Azevedo, F., & Barahona, P. (2001). Interaction of constraint programming and local search for optimisation problems. In Walsh, T., ed., Proceedings of the 7th International Conference on Principles and Practice of Constraint Programming (CP\u201901), LNCS 2239, pages 554\u2013559. Springer.","DOI":"10.1007\/3-540-45578-7_38"},{"key":"9025_CR8","first-page":"361","volume-title":"Branch and bound methods, in the traveling salesman problem","author":"E. Balas","year":"1985","unstructured":"Balas, E., & Toth, P. (1985). Branch and Bound Methods, in the Traveling Salesman Problem, pages 361\u2013401. John Wiley & Sons."},{"issue":"11","key":"9025_CR9","doi-asserted-by":"crossref","first-page":"1364","DOI":"10.1109\/T-C.1971.223140","volume":"20","author":"M. A. Breuer","year":"1971","unstructured":"Breuer, M. A. (1971). A random and an algorithmic technique for fault detection test generation for sequential circuits. IEEE Trans. Comput. C-20(11): 1364\u20131370.","journal-title":"IEEE Trans. Comput."},{"issue":"7","key":"9025_CR10","doi-asserted-by":"crossref","first-page":"1015","DOI":"10.1109\/43.238038","volume":"12","author":"S. T. Chakradhar","year":"1993","unstructured":"Chakradhar, S. T., Agrawal, V. D., & Rothweiler, S. G. (1993). A transitive closure algorithm for test generation. IEEE Trans. Comput.-Aided Des. 12(7): 1015\u20131028.","journal-title":"IEEE Trans. Comput.-Aided Des."},{"key":"9025_CR11","unstructured":"ECRC (1994). ECLiPSe (a) user manual, (b) extensions of the user manual. Technical Report, ECRC."},{"key":"9025_CR12","unstructured":"Flores, P. F. (2001). Models and algorithms for optimization problems in digital circuits testing. Ph.D. thesis, Universidade T\u00e9cnica de Lisboa."},{"key":"9025_CR13","unstructured":"Flores, P. F., Neto, H. C., Chakrabarty, K., & Marques-Silva, J. P. (1998). A model and algorithm for computing minimum-size test patterns. In IEEE European Test Workshop (ETW), pages 147\u2013148. IEEE"},{"key":"9025_CR14","doi-asserted-by":"crossref","unstructured":"Flores, P. F., Neto, H. C., & Marques-Silva, J. P. (1998). An exact solution to the minimum-size test pattern problem. In IEEE\/ACM International Workshop on Logic Synthesis (IWLS), pages 452\u2013470. IEEE.","DOI":"10.1109\/ICCD.1998.727097"},{"key":"9025_CR15","doi-asserted-by":"crossref","unstructured":"Hellebrand, S., Reeb, B., Tarnick, S., & Wunderlich, H.-J. (1995). Pattern generation for a deterministic BIST scheme. In Proceedings of the International Conference on Computer-Aided Design. IEEE.","DOI":"10.1109\/ICCAD.1995.479997"},{"issue":"3","key":"9025_CR16","doi-asserted-by":"crossref","first-page":"242","DOI":"10.1109\/T-C.1975.224205","volume":"24","author":"O. H. Ibarra","year":"1975","unstructured":"Ibarra, O. H., & Sahni, S. (1975). Polynomially complete fault detection problems. IEEE Trans. Comput. C-24(3): 242\u2013249.","journal-title":"IEEE Trans. Comput."},{"key":"9025_CR17","unstructured":"ISCAS (1985). Special Session on ATPG, Proceedings of the IEEE Symposium on Circuits and Systems, pages 663\u2013698. ISCAS."},{"key":"9025_CR18","doi-asserted-by":"crossref","unstructured":"Krippahl, L., & Barahona, P. (1999). Applying constraint propagation to protein structure determination, in proceedings of the 5th international conference on principles and practice of constraint programming (CP\u201999). In Jaffar, J., ed., Lecture Notes in Computer Science, Vol. 1713, pages 289\u2013302. Springer-Verlag.","DOI":"10.1007\/978-3-540-48085-3_21"},{"issue":"1","key":"9025_CR19","doi-asserted-by":"crossref","first-page":"4","DOI":"10.1109\/43.108614","volume":"11","author":"T. Larrabee","year":"1992","unstructured":"Larrabee, T. (1992). Test pattern generation using boolean satisfiability. IEEE Trans. Comput.-Aided Des. 11(1): 4\u201315.","journal-title":"IEEE Trans. Comput.-Aided Des."},{"key":"9025_CR20","unstructured":"Lee, H. K., & Ha, D. S. (1993). On the Generation of Test Patterns for Combinational Circuits. Technical Report Number 12_93, Department of Electrical Engineering, Virginia Polytechnic Institute and State University."},{"key":"9025_CR21","unstructured":"Lu, F., Wang, L.-C., Cheng, K.-T., & Huang, R. C.-Y. (2003). A circuit SAT solver with signal correlation guided learning. In Proceedings of Design, Automation & Test in Europe, pages 892\u2013897. IEEE."},{"issue":"6","key":"9025_CR22","doi-asserted-by":"crossref","first-page":"630","DOI":"10.1109\/TC.1976.1674663","volume":"25","author":"P. Muth","year":"1976","unstructured":"Muth, P. (1976). A nine-valued circuit model for test generation. IEEE Trans. Comput. C\u201325(6): 630\u2013636.","journal-title":"IEEE Trans. Comput."},{"key":"9025_CR23","unstructured":"Papadimitriou, C. H., & Steiglitz, K. (1982). Combinatorial Optimization: Algorithms and Complexity. Prentice-Hall."},{"key":"9025_CR24","unstructured":"Programming Systems Group of the Swedish Institute of Computer Science (1995). SICStus Prolog User\u2019s Manual. Swedish Institute of Computer Science."},{"issue":"4","key":"9025_CR25","first-page":"278","volume":"10","author":"J. P. Roth","year":"1966","unstructured":"Roth, J. P. (1966). Diagnosis of automata failures: a calculus and a method, IBM. J. Res. Dev. 10(4): 278\u2013291.","journal-title":"J. Res. Dev."},{"key":"9025_CR26","unstructured":"Serra, M. (1997). Digital IC testing: an introduction. In Dorf, R. C., ed., Electrical Engineering Handbook. CRC Press."},{"key":"9025_CR27","doi-asserted-by":"crossref","unstructured":"Silva, J. P. M., & Sakallah, K. A. (1997). Robust search algorithms for test pattern generation. In Proceedings of the Fault-tolerant Computing Symposium, pages 152\u2013161. IEEE.","DOI":"10.1109\/FTCS.1997.614088"},{"key":"9025_CR28","unstructured":"Simonis, H. (1989). Test generation using the constraint logic programming language CHIP. In 6th International Conference on Logic Programming, pages 101\u2013112. MIT Press."}],"container-title":["Constraints"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10601-007-9025-9.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10601-007-9025-9\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10601-007-9025-9","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,30]],"date-time":"2019-05-30T19:14:13Z","timestamp":1559243653000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10601-007-9025-9"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,7,10]]},"references-count":28,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2007,10,4]]}},"alternative-id":["9025"],"URL":"https:\/\/doi.org\/10.1007\/s10601-007-9025-9","relation":{},"ISSN":["1383-7133","1572-9354"],"issn-type":[{"value":"1383-7133","type":"print"},{"value":"1572-9354","type":"electronic"}],"subject":[],"published":{"date-parts":[[2007,7,10]]}}}