{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,1]],"date-time":"2022-04-01T11:10:25Z","timestamp":1648811425784},"reference-count":6,"publisher":"Elsevier BV","issue":"5","license":[{"start":{"date-parts":[[1985,1,1]],"date-time":"1985-01-01T00:00:00Z","timestamp":473385600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Pattern Recognition"],"published-print":{"date-parts":[[1985,1]]},"DOI":"10.1016\/0031-3203(85)90026-3","type":"journal-article","created":{"date-parts":[[2003,6,30]],"date-time":"2003-06-30T18:41:01Z","timestamp":1056998461000},"page":"357-359","source":"Crossref","is-referenced-by-count":0,"title":["Using probabilities in analyzing two dimensional spatial patterns"],"prefix":"10.1016","volume":"18","author":[{"given":"Virginia","family":"Foard Flack","sequence":"first","affiliation":[]}],"member":"78","reference":[{"key":"10.1016\/0031-3203(85)90026-3_BIB1","doi-asserted-by":"crossref","first-page":"385","DOI":"10.2307\/2281779","article-title":"Maps based on probabilities","volume":"54","author":"Choynowski","year":"1959","journal-title":"J. Am. statist. Ass."},{"key":"10.1016\/0031-3203(85)90026-3_BIB2","doi-asserted-by":"crossref","first-page":"540","DOI":"10.1109\/JSSC.1977.1050952","article-title":"Modification of Poisson statistics: modeling defects induced by diffusion","author":"Paz","year":"1977","journal-title":"IEEE J. Solid-St. Circuits SC-12"},{"key":"10.1016\/0031-3203(85)90026-3_BIB3","doi-asserted-by":"crossref","first-page":"487","DOI":"10.1016\/0038-1101(82)90161-7","article-title":"A simple method for modeling VLSI yields","volume":"25","author":"Stapper","year":"1982","journal-title":"Solid-St. Electron."},{"key":"10.1016\/0031-3203(85)90026-3_BIB4","first-page":"126","article-title":"What level of LSI is best for you?","volume":"43","author":"Moore","year":"1970","journal-title":"Electronics"},{"key":"10.1016\/0031-3203(85)90026-3_BIB5","doi-asserted-by":"crossref","first-page":"537","DOI":"10.1109\/JSSC.1975.1050655","article-title":"On a composite model to the IC yield problem","author":"Stapper","year":"1975","journal-title":"IEEE J. Solid-St. Circuits SC-10"},{"key":"10.1016\/0031-3203(85)90026-3_BIB6","doi-asserted-by":"crossref","first-page":"555","DOI":"10.1016\/0038-1101(85)90125-X","article-title":"Introducing dependency into IC yield models","volume":"28","author":"Flack","year":"1985","journal-title":"Solid-St. Electron."}],"container-title":["Pattern Recognition"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:0031320385900263?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:0031320385900263?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,3,18]],"date-time":"2019-03-18T10:21:24Z","timestamp":1552904484000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/0031320385900263"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1985,1]]},"references-count":6,"journal-issue":{"issue":"5","published-print":{"date-parts":[[1985,1]]}},"alternative-id":["0031320385900263"],"URL":"https:\/\/doi.org\/10.1016\/0031-3203(85)90026-3","relation":{},"ISSN":["0031-3203"],"issn-type":[{"value":"0031-3203","type":"print"}],"subject":[],"published":{"date-parts":[[1985,1]]}}}