{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,4]],"date-time":"2022-04-04T09:55:43Z","timestamp":1649066143655},"reference-count":9,"publisher":"Elsevier BV","issue":"6","license":[{"start":{"date-parts":[[1989,7,1]],"date-time":"1989-07-01T00:00:00Z","timestamp":615254400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Microprocessors and Microsystems"],"published-print":{"date-parts":[[1989,7]]},"DOI":"10.1016\/0141-9331(89)90046-x","type":"journal-article","created":{"date-parts":[[2003,3,15]],"date-time":"2003-03-15T06:33:26Z","timestamp":1047710006000},"page":"382-386","source":"Crossref","is-referenced-by-count":0,"title":["Techniques for user testing of the 68882"],"prefix":"10.1016","volume":"13","author":[{"given":"Mark","family":"Marshall","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"78","reference":[{"key":"10.1016\/0141-9331(89)90046-X_BIB1","author":"Motorola","year":"1988"},{"key":"10.1016\/0141-9331(89)90046-X_BIB2","doi-asserted-by":"crossref","first-page":"44","DOI":"10.1109\/MM.1983.291185","article-title":"The MC68881 floating-point coprocessor","author":"Huntsman","year":"1983","journal-title":"IEEE Micro"},{"key":"10.1016\/0141-9331(89)90046-X_BIB3","series-title":"Proc. 1984 Int. Test Conf.","first-page":"660","article-title":"Functional test generation of digital LSI\/VLSI systems using machine symbolic execution technique","author":"Lin","year":"1984"},{"key":"10.1016\/0141-9331(89)90046-X_BIB4","series-title":"Proc. 1985 Int. Test Conf.","first-page":"752","article-title":"Test teatures of the MC68881 floating-point coprocessor","author":"Basto","year":"1985"},{"key":"10.1016\/0141-9331(89)90046-X_BIB5","series-title":"Proc. 1983 Int. Test Conf.","first-page":"682","article-title":"Functional test vector generation for digital LSI\/VLSI devices","author":"Middleton","year":"1983"},{"key":"10.1016\/0141-9331(89)90046-X_BIB6","article-title":"LEAD: A microprocessor testing tool","author":"Schuseim","year":"1976"},{"key":"10.1016\/0141-9331(89)90046-X_BIB7","series-title":"Proc. 1986 Int. Test Conf.","first-page":"386","article-title":"An MC68020 users test program","author":"Henshaw","year":"1986"},{"key":"10.1016\/0141-9331(89)90046-X_BIB8","first-page":"47","article-title":"Tutorial: LSI testing","author":"Sohl","year":"1978"},{"key":"10.1016\/0141-9331(89)90046-X_BIB9","series-title":"Proc. 1986 Int. Test Conf.","first-page":"913","article-title":"Functional testing of microprocessor-like architecture","author":"Kildiran","year":"1986"}],"container-title":["Microprocessors and Microsystems"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:014193318990046X?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:014193318990046X?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,3,25]],"date-time":"2019-03-25T07:55:35Z","timestamp":1553500535000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/014193318990046X"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1989,7]]},"references-count":9,"journal-issue":{"issue":"6","published-print":{"date-parts":[[1989,7]]}},"alternative-id":["014193318990046X"],"URL":"https:\/\/doi.org\/10.1016\/0141-9331(89)90046-x","relation":{},"ISSN":["0141-9331"],"issn-type":[{"value":"0141-9331","type":"print"}],"subject":[],"published":{"date-parts":[[1989,7]]}}}