{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,9]],"date-time":"2026-03-09T20:07:21Z","timestamp":1773086841037,"version":"3.50.1"},"reference-count":14,"publisher":"Elsevier BV","issue":"3","license":[{"start":{"date-parts":[[1993,3,1]],"date-time":"1993-03-01T00:00:00Z","timestamp":730944000000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Journal of Systems and Software"],"published-print":{"date-parts":[[1993,3]]},"DOI":"10.1016\/0164-1212(93)90064-5","type":"journal-article","created":{"date-parts":[[2003,8,8]],"date-time":"2003-08-08T00:31:55Z","timestamp":1060302715000},"page":"207-216","source":"Crossref","is-referenced-by-count":62,"title":["Semantic metrics for software testability"],"prefix":"10.1016","volume":"20","author":[{"given":"Jeffrey M.","family":"Voas","sequence":"first","affiliation":[]},{"given":"Keith W.","family":"Miller","sequence":"additional","affiliation":[]}],"member":"78","reference":[{"key":"10.1016\/0164-1212(93)90064-5_BIB1","doi-asserted-by":"crossref","first-page":"41","DOI":"10.1109\/52.73748","article-title":"Predicting Where Faults Can Hide From Testing","volume":"8","author":"Voas","year":"1991","journal-title":"IEEE Software"},{"key":"10.1016\/0164-1212(93)90064-5_BIB2","series-title":"Proceedings of the 9th Software Reliability Symposium, Denver Section of the IEEE Reliability Society","article-title":"Improving software reliability by estimating the fault hiding ability of a program before it is written","author":"Voas","year":"1991"},{"key":"10.1016\/0164-1212(93)90064-5_BIB3","series-title":"Structured Programming","author":"Dahl","year":"1972"},{"key":"10.1016\/0164-1212(93)90064-5_BIB4","doi-asserted-by":"crossref","first-page":"553","DOI":"10.1109\/32.87281","article-title":"Testability of Software Components","volume":"SE-17","author":"Freedman","year":"1991","journal-title":"IEEE Trans. Software Eng."},{"key":"10.1016\/0164-1212(93)90064-5_BIB5","article-title":"High-Density ICs Need Design-For-Testing Methods","volume":"33","author":"Markowitz","year":"1988","journal-title":"EDN"},{"key":"10.1016\/0164-1212(93)90064-5_BIB6","article-title":"Level-Sensitive Scan Design Tests Chips, Boards, Systems","author":"Berglund","year":"1979","journal-title":"Electronics"},{"key":"10.1016\/0164-1212(93)90064-5_BIB7","unstructured":"J. Voas and L. J. Morell, Applying sensitivity analysis estimates to a minimum failure probability for software testing, in Proceedings of the 8th Pacific Northwest Software Quality Conference, Portland, Oregon, pp. 362\u2013371."},{"key":"10.1016\/0164-1212(93)90064-5_BIB8","series-title":"Proceedings of the Pacific Northwest Software Quality Conference, PNSQC Inc.","first-page":"234","article-title":"Hardware testing and software IC's","author":"Hoffman","year":"1989"},{"key":"10.1016\/0164-1212(93)90064-5_BIB9","series-title":"Reliable Software Through Composite Design","author":"Myers","year":"1975"},{"key":"10.1016\/0164-1212(93)90064-5_BIB10","doi-asserted-by":"crossref","first-page":"34","DOI":"10.1109\/C-M.1978.218136","article-title":"Hints on Test Data Selection: Help for the Practicing Programmer","volume":"11","author":"DeMillo","year":"1978","journal-title":"IEEE Comp."},{"key":"10.1016\/0164-1212(93)90064-5_BIB11","doi-asserted-by":"crossref","first-page":"25","DOI":"10.1002\/stvr.4370020105","article-title":"The Revealing Power of a Test Case","volume":"2","author":"Voas","year":"1992","journal-title":"J. Software Test. Verficat. Reliabil."},{"key":"10.1016\/0164-1212(93)90064-5_BIB12","article-title":"CONFLICT Specification","author":"Shimeall","year":"1990"},{"key":"10.1016\/0164-1212(93)90064-5_BIB13","series-title":"Proceedings of the 1990 IEEE Southeastcon, IEEE Region 6","first-page":"379","article-title":"Propagation and infection analysis (PIA) applied to debugging","author":"Voas","year":"1990"},{"key":"10.1016\/0164-1212(93)90064-5_BIB14","doi-asserted-by":"crossref","first-page":"717","DOI":"10.1109\/32.153381","article-title":"PIE: A Dynamic Failure-Based Technique","volume":"18","author":"Voas","year":"1992","journal-title":"IEEE Trans. Software Eng."}],"container-title":["Journal of Systems and Software"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:0164121293900645?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:0164121293900645?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,3,14]],"date-time":"2019-03-14T22:57:41Z","timestamp":1552604261000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/0164121293900645"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1993,3]]},"references-count":14,"journal-issue":{"issue":"3","published-print":{"date-parts":[[1993,3]]}},"alternative-id":["0164121293900645"],"URL":"https:\/\/doi.org\/10.1016\/0164-1212(93)90064-5","relation":{},"ISSN":["0164-1212"],"issn-type":[{"value":"0164-1212","type":"print"}],"subject":[],"published":{"date-parts":[[1993,3]]}}}