{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,3]],"date-time":"2022-04-03T13:24:27Z","timestamp":1648992267410},"reference-count":10,"publisher":"Elsevier BV","issue":"1-5","license":[{"start":{"date-parts":[[1986,12,1]],"date-time":"1986-12-01T00:00:00Z","timestamp":533779200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Microprocessing and Microprogramming"],"published-print":{"date-parts":[[1986,12]]},"DOI":"10.1016\/0165-6074(86)90065-7","type":"journal-article","created":{"date-parts":[[2003,8,8]],"date-time":"2003-08-08T04:56:11Z","timestamp":1060318571000},"page":"355-362","source":"Crossref","is-referenced-by-count":2,"title":["Intelligence driven test sequence generator for VLSI design"],"prefix":"10.1016","volume":"18","author":[{"given":"Alaa Mohseni","family":"Behbahani","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Frederick J.","family":"Hill","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mayank R.","family":"Patel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"78","reference":[{"key":"10.1016\/0165-6074(86)90065-7_BIB1","series-title":"Digital System: Hardware Organization and Design","author":"Hill","year":"1978"},{"issue":"No. 2","key":"10.1016\/0165-6074(86)90065-7_BIB2","doi-asserted-by":"crossref","first-page":"157","DOI":"10.1109\/TC.1981.6312183","article-title":"Structure specification with a procedural hardware description language","volume":"Vol. C-30","author":"Hill","year":"1981","journal-title":"IEEE Trans. Comput."},{"key":"10.1016\/0165-6074(86)90065-7_BIB3","doi-asserted-by":"crossref","first-page":"490","DOI":"10.1109\/TC.1977.1674866","article-title":"SCIRTSS: A Search System for Sequential Circuit Test Sequences","author":"Hill","year":"1977","journal-title":"IEEE Transactions on Computers"},{"key":"10.1016\/0165-6074(86)90065-7_BIB4","series-title":"Proc. 1st. PCCC","article-title":"Fault Detection Test Generation at the Register Transfer Design Level","author":"Chiang","year":"1982"},{"key":"10.1016\/0165-6074(86)90065-7_BIB5","doi-asserted-by":"crossref","DOI":"10.1109\/MDT.1984.5005617","article-title":"HITEST: A Knowledge-Based Test Genration System","author":"Bending","year":"1984","journal-title":"IEEE Design and Test of Computers"},{"issue":"No. 1","key":"10.1016\/0165-6074(86)90065-7_BIB6","doi-asserted-by":"crossref","DOI":"10.1109\/TC.1982.1675879","article-title":"Design for Testability \u2014A Survey","volume":"Vol. C-31","author":"Williams","year":"1982","journal-title":"IEEE Transactions on Computers"},{"key":"10.1016\/0165-6074(86)90065-7_BIB7","article-title":"Functional Level Simulator for Universal AHPL","author":"Alsharif","year":"1983"},{"key":"10.1016\/0165-6074(86)90065-7_BIB8","article-title":"Intelligence Driven Automatic Test Sequence Generator for VLSI","author":"Alaa","year":"1984"},{"key":"10.1016\/0165-6074(86)90065-7_BIB9","series-title":"The Design and Analysis of Computer Algorithms","author":"Aho","year":"1974"},{"key":"10.1016\/0165-6074(86)90065-7_BIB10","series-title":"Proceedings 17th ACM-IEEE Design Automation Conference","first-page":"84","article-title":"Test Generation Costs Analysis and Projections","author":"Goel","year":"1980"}],"container-title":["Microprocessing and Microprogramming"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:0165607486900657?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:0165607486900657?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,3,15]],"date-time":"2019-03-15T02:53:58Z","timestamp":1552618438000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/0165607486900657"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1986,12]]},"references-count":10,"journal-issue":{"issue":"1-5","published-print":{"date-parts":[[1986,12]]}},"alternative-id":["0165607486900657"],"URL":"https:\/\/doi.org\/10.1016\/0165-6074(86)90065-7","relation":{},"ISSN":["0165-6074"],"issn-type":[{"value":"0165-6074","type":"print"}],"subject":[],"published":{"date-parts":[[1986,12]]}}}