{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,1]],"date-time":"2022-04-01T18:44:26Z","timestamp":1648838666776},"reference-count":6,"publisher":"Elsevier BV","issue":"1-5","license":[{"start":{"date-parts":[[1988,8,1]],"date-time":"1988-08-01T00:00:00Z","timestamp":586396800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Microprocessing and Microprogramming"],"published-print":{"date-parts":[[1988,8]]},"DOI":"10.1016\/0165-6074(88)90097-x","type":"journal-article","created":{"date-parts":[[2003,9,3]],"date-time":"2003-09-03T17:14:48Z","timestamp":1062609288000},"page":"461-468","source":"Crossref","is-referenced-by-count":1,"title":["Error retracing and fault localization techniques within Simueva, a system for evaluation of simulation results"],"prefix":"10.1016","volume":"24","author":[{"given":"Rainer","family":"Buschke","sequence":"first","affiliation":[]},{"given":"Klaus","family":"Lagemann","sequence":"additional","affiliation":[]}],"member":"78","reference":[{"key":"10.1016\/0165-6074(88)90097-X_BIB1","series-title":"Proc. of COMPEURO87","article-title":"SIMUEVA, a CAD Program Package for Efficient Analysis of Simulation Results","author":"Buschke","year":"1987"},{"key":"10.1016\/0165-6074(88)90097-X_BIB2","series-title":"Proc. of EUROMICRO87","article-title":"Computer Aided Evaluation of Simulation Results, the SIMUEVA Program Package","author":"Buschke","year":"1987"},{"key":"10.1016\/0165-6074(88)90097-X_BIB3","series-title":"Proc. of 24th ACM\/IEEE Design Automation Conference","article-title":"Demand Driven Simulation: BACKSIM","author":"Smith","year":"1987"},{"key":"10.1016\/0165-6074(88)90097-X_BIB4","article-title":"Methods for Comparison and Extraction of IC Structure Descriptions","author":"Holfert","year":"1988"},{"key":"10.1016\/0165-6074(88)90097-X_BIB5","series-title":"Proc. of 1st. Europ. Conf. on Electr. and Optic. Beam Testing of IC","article-title":"An Integrated Debugging System Based on E-Beam Test","author":"Guiguet","year":"1987"},{"issue":"No. 6","key":"10.1016\/0165-6074(88)90097-X_BIB6","doi-asserted-by":"crossref","DOI":"10.1109\/TC.1984.1676477","article-title":"Verification Testing \u2014 a Pseudo-Exhaustive Test Technique","volume":"Vol.C-33","author":"McCluskey","year":"1984","journal-title":"IEEE Transactions on Computers"}],"container-title":["Microprocessing and Microprogramming"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:016560748890097X?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:016560748890097X?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,2,25]],"date-time":"2019-02-25T09:53:50Z","timestamp":1551088430000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/016560748890097X"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1988,8]]},"references-count":6,"journal-issue":{"issue":"1-5","published-print":{"date-parts":[[1988,8]]}},"alternative-id":["016560748890097X"],"URL":"https:\/\/doi.org\/10.1016\/0165-6074(88)90097-x","relation":{},"ISSN":["0165-6074"],"issn-type":[{"value":"0165-6074","type":"print"}],"subject":[],"published":{"date-parts":[[1988,8]]}}}