{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,2]],"date-time":"2022-04-02T06:49:27Z","timestamp":1648882167245},"reference-count":12,"publisher":"Elsevier BV","issue":"1-5","license":[{"start":{"date-parts":[[1989,8,1]],"date-time":"1989-08-01T00:00:00Z","timestamp":617932800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Microprocessing and Microprogramming"],"published-print":{"date-parts":[[1989,8]]},"DOI":"10.1016\/0165-6074(89)90133-6","type":"journal-article","created":{"date-parts":[[2003,9,3]],"date-time":"2003-09-03T17:14:48Z","timestamp":1062609288000},"page":"687-693","source":"Crossref","is-referenced-by-count":1,"title":["Data exchange formats for testing"],"prefix":"10.1016","volume":"27","author":[{"given":"Johannes","family":"Pfeifer","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michael","family":"Wahl","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hans","family":"Wojtkowiak","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"78","reference":[{"key":"10.1016\/0165-6074(89)90133-6_BIB1","series-title":"Computer Aided Design Interchange Format Version 2.2","author":"Candlin","year":"1987"},{"key":"10.1016\/0165-6074(89)90133-6_BIB2","series-title":"Tektronix Event Waveform Data File Specification Version 0.1.0","author":"Carner","year":"1986"},{"key":"10.1016\/0165-6074(89)90133-6_BIB3","series-title":"Tektronix State Waveform Data File Specification Version 0.1.0","author":"Carner","year":"1986"},{"key":"10.1016\/0165-6074(89)90133-6_BIB4","series-title":"Electronic Design Interchange Format Version 2 0 0","year":"1987"},{"key":"10.1016\/0165-6074(89)90133-6_BIB5","series-title":"Neutral Code Format Specification revision 3.3","year":"1988"},{"key":"10.1016\/0165-6074(89)90133-6_BIB6","series-title":"EDIF Technical Memo","author":"Kachmar","year":"1988"},{"key":"10.1016\/0165-6074(89)90133-6_BIB7","series-title":"Designer's Guide to EDIF - Part 3","author":"Marx","year":"1987"},{"key":"10.1016\/0165-6074(89)90133-6_BIB8","series-title":"Integrating Design and Test","author":"Parker","year":"1987"},{"key":"10.1016\/0165-6074(89)90133-6_BIB9","series-title":"Stimulus Data Interchange Format","author":"Pieper","year":"1987"},{"key":"10.1016\/0165-6074(89)90133-6_BIB10","article-title":"State of the EDIF Test Extension - A Report about the Activities of the European EDIF Test Working Group","author":"Wahl","year":"1988"},{"key":"10.1016\/0165-6074(89)90133-6_BIB11","series-title":"European Test Conference","article-title":"The Use of a Test Specification Format in Automatic Test Program Generation","author":"Verhelst","year":"1989"},{"key":"10.1016\/0165-6074(89)90133-6_BIB12","series-title":"Proceedings International Test Conference","article-title":"Interfacing Design to Test Using the Electronic Design Interchange Format","author":"Etherington","year":"1987"}],"container-title":["Microprocessing and Microprogramming"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:0165607489901336?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:0165607489901336?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,2,25]],"date-time":"2019-02-25T09:56:51Z","timestamp":1551088611000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/0165607489901336"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1989,8]]},"references-count":12,"journal-issue":{"issue":"1-5","published-print":{"date-parts":[[1989,8]]}},"alternative-id":["0165607489901336"],"URL":"https:\/\/doi.org\/10.1016\/0165-6074(89)90133-6","relation":{},"ISSN":["0165-6074"],"issn-type":[{"value":"0165-6074","type":"print"}],"subject":[],"published":{"date-parts":[[1989,8]]}}}