{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,28]],"date-time":"2022-03-28T21:43:35Z","timestamp":1648503815279},"reference-count":7,"publisher":"Elsevier BV","issue":"1-5","license":[{"start":{"date-parts":[[1991,8,1]],"date-time":"1991-08-01T00:00:00Z","timestamp":681004800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Microprocessing and Microprogramming"],"published-print":{"date-parts":[[1991,8]]},"DOI":"10.1016\/0165-6074(91)90396-b","type":"journal-article","created":{"date-parts":[[2003,8,8]],"date-time":"2003-08-08T04:56:10Z","timestamp":1060318570000},"page":"525-530","source":"Crossref","is-referenced-by-count":4,"title":["Opart: A hardware-description language for test generation"],"prefix":"10.1016","volume":"32","author":[{"given":"J\u00f3zsef","family":"Sziray","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zsolt","family":"Nagy","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"78","reference":[{"key":"10.1016\/0165-6074(91)90396-B_BIB1","series-title":"The First Hungarian Custom Circuits Conference, Proceedings","first-page":"303","article-title":"The test-design program system DIAS","author":"Sziray","year":"1987"},{"key":"10.1016\/0165-6074(91)90396-B_BIB2","doi-asserted-by":"crossref","first-page":"223","DOI":"10.1109\/TC.1980.1675554","article-title":"Functional level primitives in test generation","volume":"Vol. C-29","author":"Breuer","year":"1980","journal-title":"IEEE Trans. on Computers"},{"key":"10.1016\/0165-6074(91)90396-B_BIB3","doi-asserted-by":"crossref","first-page":"39","DOI":"10.1109\/MC.1974.6323496","article-title":"Concurrent simulation of nearly identical digital networks","volume":"Vol. 7","author":"Ulrich","year":"1974","journal-title":"Computer"},{"key":"10.1016\/0165-6074(91)90396-B_BIB4","series-title":"Diagnosis and Reliable Design of Digital Systems","author":"Breuer","year":"1976"},{"issue":"No. 1\u20132","key":"10.1016\/0165-6074(91)90396-B_BIB5","first-page":"3","article-title":"Test calculation for logic networks by composite justification","volume":"Vol. 5","author":"Sziray","year":"1979","journal-title":"Digital Processes"},{"key":"10.1016\/0165-6074(91)90396-B_BIB6","series-title":"Discrete Simulation and Related Fields","first-page":"223","article-title":"Functional level test calculation and fault simulation for logic networks","author":"Sziray","year":"1982"},{"key":"10.1016\/0165-6074(91)90396-B_BIB7","doi-asserted-by":"crossref","first-page":"278","DOI":"10.1147\/rd.104.0278","article-title":"Diagnosis of automata failures: a calculus and a method","volume":"Vol 10","author":"Roth","year":"1966","journal-title":"IBM Journal of Research and Development"}],"container-title":["Microprocessing and Microprogramming"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:016560749190396B?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:016560749190396B?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,3,15]],"date-time":"2019-03-15T01:30:31Z","timestamp":1552613431000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/016560749190396B"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1991,8]]},"references-count":7,"journal-issue":{"issue":"1-5","published-print":{"date-parts":[[1991,8]]}},"alternative-id":["016560749190396B"],"URL":"https:\/\/doi.org\/10.1016\/0165-6074(91)90396-b","relation":{},"ISSN":["0165-6074"],"issn-type":[{"value":"0165-6074","type":"print"}],"subject":[],"published":{"date-parts":[[1991,8]]}}}