{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,1]],"date-time":"2022-04-01T12:21:47Z","timestamp":1648815707865},"reference-count":18,"publisher":"Elsevier BV","issue":"2","license":[{"start":{"date-parts":[[1992,6,1]],"date-time":"1992-06-01T00:00:00Z","timestamp":707356800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Journal of Visual Communication and Image Representation"],"published-print":{"date-parts":[[1992,6]]},"DOI":"10.1016\/1047-3203(92)90015-l","type":"journal-article","created":{"date-parts":[[2005,12,15]],"date-time":"2005-12-15T18:00:20Z","timestamp":1134669620000},"page":"194-202","source":"Crossref","is-referenced-by-count":0,"title":["Morphological algorithms for visual analysis of integrated circuits"],"prefix":"10.1016","volume":"3","author":[{"given":"Jordi","family":"Vitria`","sequence":"first","affiliation":[]},{"given":"Xavier","family":"Binefa","sequence":"additional","affiliation":[]},{"given":"Juan Jose\u00b4","family":"Villanueva","sequence":"additional","affiliation":[]}],"member":"78","reference":[{"key":"10.1016\/1047-3203(92)90015-L_bib1","series-title":"Proceedings, SPIE Integrated Circuit Metrology, Inspection, and Process Control III","first-page":"519","article-title":"A machine vision architecture for integrated circuit inspection","author":"d'Agostino","year":"1989"},{"key":"10.1016\/1047-3203(92)90015-L_bib2","series-title":"Proceedings, 7th International Conference on Pattern Recognition","article-title":"Automatic inspection of VLSI masks","author":"Arunkumar","year":"1985"},{"key":"10.1016\/1047-3203(92)90015-L_bib3","article-title":"Traitement d'Images pour l'Investigation de Circuits Integres VLSI. Application d la Microscopie Acoustique","author":"Grzymek","year":"1985"},{"key":"10.1016\/1047-3203(92)90015-L_bib4","doi-asserted-by":"crossref","DOI":"10.1109\/34.3863","article-title":"An automatic wafer inspection system using pipelined image processing techniques","volume":"10","author":"Yoda","year":"1988","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"10.1016\/1047-3203(92)90015-L_bib5","doi-asserted-by":"crossref","first-page":"347","DOI":"10.1016\/0167-8655(83)90074-0","article-title":"A new domain for image analysis: VLSI circuit testing with romuald, specialized in parallel image processing","volume":"1","author":"Merac","year":"1983","journal-title":"Pattern Recognition Lett."},{"key":"10.1016\/1047-3203(92)90015-L_bib6","series-title":"Proceedings, 7th International Conference on Patter Recognition","article-title":"An automatic visual inspection system for Isi photomasks","author":"Okamoto","year":"1980"},{"key":"10.1016\/1047-3203(92)90015-L_bib7","series-title":"Proceedings, IEEE Conference on Pattern Recognition and Image Processing","first-page":"87","article-title":"Automatic optical identification of faults in bubble memory overlay patterns","author":"Klein","year":"1979"},{"key":"10.1016\/1047-3203(92)90015-L_bib8","doi-asserted-by":"crossref","first-page":"463","DOI":"10.1016\/0167-9317(89)90101-9","article-title":"Methods for masks defects detection using local criteria","volume":"9","author":"Sischka","year":"1989","journal-title":"Microelectron. Engrg."},{"key":"10.1016\/1047-3203(92)90015-L_bib9","doi-asserted-by":"crossref","first-page":"205","DOI":"10.1007\/BF01212360","article-title":"The p300: A system for automatic patterned wafer inspection","volume":"1","author":"Dom","year":"1988","journal-title":"Mach. Vision Appl."},{"issue":"6","key":"10.1016\/1047-3203(92)90015-L_bib10","doi-asserted-by":"crossref","DOI":"10.1109\/TPAMI.1983.4767449","article-title":"Integrated testing and algorithms for visual inspection of integrated circuits","volume":"5","author":"Pau","year":"1983","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"10.1016\/1047-3203(92)90015-L_bib11","doi-asserted-by":"crossref","first-page":"227","DOI":"10.1016\/0167-8655(87)90068-7","article-title":"A production system for Isi chip anatomizing","volume":"5","author":"Yuan","year":"1987","journal-title":"Pattern Recognition Lett."},{"key":"10.1016\/1047-3203(92)90015-L_bib12","article-title":"Analysis technology for VLSI fabrication","volume":"75","author":"Meierant","year":"1987"},{"key":"10.1016\/1047-3203(92)90015-L_bib13","series-title":"Machine Vision for Inspection and Measurement","article-title":"Efficient depth recovery through inverse optics","author":"Subarao","year":"1989"},{"key":"10.1016\/1047-3203(92)90015-L_bib14","series-title":"Proceedings, IEEE International Conference on Computer Vision and Pattern Recognition","first-page":"476","article-title":"A depth recovery algorithm using defocus information","author":"Hwang","year":"1989"},{"key":"10.1016\/1047-3203(92)90015-L_bib15","series-title":"Proceedings, IEEE International Conference on Computer Vision and Pattern Recognition","first-page":"504","article-title":"Pyramid based depth from focus","author":"Darrell","year":"1988"},{"key":"10.1016\/1047-3203(92)90015-L_bib16","series-title":"Proceedings, IEEE International Conference on Computer Vision","first-page":"498","article-title":"Depth recovery from blurred edges","author":"Subbarao","year":"1988"},{"key":"10.1016\/1047-3203(92)90015-L_bib17","first-page":"240","article-title":"Determining watersheds in digital pictures via flooding simulations","volume":"Vol. 1360","author":"Soille","year":"1990"},{"key":"10.1016\/1047-3203(92)90015-L_bib18","author":"Serra","year":"1988"}],"container-title":["Journal of Visual Communication and Image Representation"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:104732039290015L?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:104732039290015L?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,1,19]],"date-time":"2019-01-19T14:55:21Z","timestamp":1547909721000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/104732039290015L"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1992,6]]},"references-count":18,"journal-issue":{"issue":"2","published-print":{"date-parts":[[1992,6]]}},"alternative-id":["104732039290015L"],"URL":"https:\/\/doi.org\/10.1016\/1047-3203(92)90015-l","relation":{},"ISSN":["1047-3203"],"issn-type":[{"value":"1047-3203","type":"print"}],"subject":[],"published":{"date-parts":[[1992,6]]}}}