{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,29]],"date-time":"2026-05-29T08:03:21Z","timestamp":1780041801452,"version":"3.53.1"},"reference-count":71,"publisher":"Elsevier BV","license":[{"start":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T00:00:00Z","timestamp":1777593600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"},{"start":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T00:00:00Z","timestamp":1777593600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/legal\/tdmrep-license"},{"start":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T00:00:00Z","timestamp":1777593600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-017"},{"start":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T00:00:00Z","timestamp":1777593600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"},{"start":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T00:00:00Z","timestamp":1777593600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-012"},{"start":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T00:00:00Z","timestamp":1777593600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T00:00:00Z","timestamp":1777593600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-004"}],"content-domain":{"domain":["elsevier.com","sciencedirect.com"],"crossmark-restriction":true},"short-container-title":["Journal of Computer Languages"],"published-print":{"date-parts":[[2026,5]]},"DOI":"10.1016\/j.cola.2026.101400","type":"journal-article","created":{"date-parts":[[2026,4,7]],"date-time":"2026-04-07T23:35:41Z","timestamp":1775604941000},"page":"101400","update-policy":"https:\/\/doi.org\/10.1016\/elsevier_cm_policy","source":"Crossref","is-referenced-by-count":0,"special_numbering":"C","title":["A multi-level complexity metric suite for software quality measurement and machine learning\u2013based software defect prediction"],"prefix":"10.1016","volume":"87","author":[{"given":"Manpreet","family":"Singh","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jitender Kumar","family":"Chhabra","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"78","reference":[{"key":"10.1016\/j.cola.2026.101400_bib1","series-title":"2023 IEEE 23rd International Conference on Software Quality, Reliability, and Security (QRS)","first-page":"488","article-title":"Software code quality measurement: implications from metric distributions","author":"Jin","year":"2023"},{"key":"10.1016\/j.cola.2026.101400_bib2","series-title":"Evolution Analysis of Software Quality Metrics in an open-source Java Project: a Case Study on Testng","author":"Sambaturu","year":"2025"},{"key":"10.1016\/j.cola.2026.101400_bib3","series-title":"2012 28th IEEE International Conference on Software Maintenance (ICSM)","first-page":"326","article-title":"A systematic mapping study on dynamic metrics and software quality","author":"Tahir","year":"2012"},{"key":"10.1016\/j.cola.2026.101400_bib4","article-title":"Data-oriented QMOOD model for quality assessment of multi-client software applications","volume":"51","author":"\u00d6z\u00e7evik","year":"2024","journal-title":"Eng. Sci. Technol. Int. J."},{"key":"10.1016\/j.cola.2026.101400_bib5","doi-asserted-by":"crossref","DOI":"10.1016\/j.cola.2023.101253","article-title":"Improved software fault prediction using new code metrics and machine learning algorithms","volume":"78","author":"Singh","year":"2024","journal-title":"Journal of Computer Languages"},{"key":"10.1016\/j.cola.2026.101400_bib6","doi-asserted-by":"crossref","DOI":"10.1016\/j.asoc.2024.112082","article-title":"Machine learning based improved cross-project software defect prediction using new structural features in object-oriented software","volume":"165","author":"Singh","year":"2024","journal-title":"Appl. Soft Comput."},{"key":"10.1016\/j.cola.2026.101400_bib7","series-title":"Unveiling Hybrid Cyclomatic Complexity: a Comprehensive Analysis and Evaluation as an Integral Feature in Automatic Defect Prediction Models","author":"Cernau","year":"2025"},{"issue":"2","key":"10.1016\/j.cola.2026.101400_bib8","doi-asserted-by":"crossref","first-page":"111","DOI":"10.1016\/0164-1212(93)90077-B","article-title":"Object-oriented metrics that predict maintainability","volume":"23","author":"Li","year":"1993","journal-title":"J. Syst. Software"},{"issue":"6","key":"10.1016\/j.cola.2026.101400_bib9","doi-asserted-by":"crossref","first-page":"476","DOI":"10.1109\/32.295895","article-title":"A metrics suite for object-oriented design","volume":"20","author":"Chidamber","year":"1994","journal-title":"IEEE Trans. Software Eng."},{"issue":"1","key":"10.1016\/j.cola.2026.101400_bib10","doi-asserted-by":"crossref","first-page":"91","DOI":"10.1109\/32.748920","article-title":"A unified framework for coupling measurement in object-oriented systems","volume":"25","author":"Briand","year":"2002","journal-title":"IEEE Trans. Software Eng."},{"key":"10.1016\/j.cola.2026.101400_bib11","series-title":"European Conference on Software Process Improvement","first-page":"492","article-title":"Applying the ISO\/IEC 25010 quality models to software product","author":"Estdale","year":"2018"},{"key":"10.1016\/j.cola.2026.101400_bib12","series-title":"Object-Oriented Software Engineering: Measuring and Controlling the Development Process","author":"Brito","year":"1994"},{"issue":"1","key":"10.1016\/j.cola.2026.101400_bib13","doi-asserted-by":"crossref","first-page":"4","DOI":"10.1109\/32.979986","article-title":"A hierarchical model for object-oriented design quality assessment","volume":"28","author":"Bansiya","year":"2002","journal-title":"IEEE Trans. Software Eng."},{"key":"10.1016\/j.cola.2026.101400_bib14","series-title":"Object-Oriented Software Metrics: a Practical Guide","author":"Lorenz","year":"1994"},{"issue":"2","key":"10.1016\/j.cola.2026.101400_bib15","doi-asserted-by":"crossref","first-page":"111","DOI":"10.1016\/0164-1212(93)90077-B","article-title":"Object-oriented metrics that predict maintainability","volume":"23","author":"Li","year":"1993","journal-title":"J. Syst. Software"},{"issue":"10","key":"10.1016\/j.cola.2026.101400_bib16","doi-asserted-by":"crossref","first-page":"8675","DOI":"10.1016\/j.jksuci.2021.09.010","article-title":"With-in-project defect prediction using bootstrap aggregation based diverse ensemble learning technique","volume":"34","author":"Bhutamapuram","year":"2022","journal-title":"Journal of King Saud University-Computer and Information Sciences"},{"issue":"17","key":"10.1016\/j.cola.2026.101400_bib17","doi-asserted-by":"crossref","first-page":"3120","DOI":"10.3390\/math10173120","article-title":"Deep learning-based software defect prediction via semantic key features of source code\u2014systematic survey","volume":"10","author":"Abdu","year":"2022","journal-title":"Mathematics"},{"key":"10.1016\/j.cola.2026.101400_bib18","doi-asserted-by":"crossref","DOI":"10.1016\/j.engappai.2023.106110","article-title":"An intuitionistic fuzzy representation-based software bug severity prediction approach for imbalanced severity classes","volume":"122","author":"Panda","year":"2023","journal-title":"Eng. Appl. Artif. Intell."},{"issue":"2","key":"10.1016\/j.cola.2026.101400_bib19","doi-asserted-by":"crossref","first-page":"911","DOI":"10.1109\/TR.2022.3151125","article-title":"An unsupervised software fault prediction approach using threshold derivation","volume":"71","author":"Kumar","year":"2022","journal-title":"IEEE Trans. Reliab."},{"key":"10.1016\/j.cola.2026.101400_bib20","doi-asserted-by":"crossref","DOI":"10.1016\/j.asoc.2022.109069","article-title":"Diversity based imbalance learning approach for software fault prediction using machine learning models","volume":"124","author":"Manchala","year":"2022","journal-title":"Appl. Soft Comput."},{"issue":"2","key":"10.1016\/j.cola.2026.101400_bib21","doi-asserted-by":"crossref","first-page":"747","DOI":"10.1109\/TR.2022.3158949","article-title":"Generative oversampling methods for handling imbalanced data in software fault prediction","volume":"71","author":"Rathore","year":"2022","journal-title":"IEEE Trans. Reliab."},{"issue":"4","key":"10.1016\/j.cola.2026.101400_bib22","first-page":"938","article-title":"Multiple-classifiers in software quality engineering: combining predictors to improve software fault prediction ability","volume":"23","author":"Yucalar","year":"2020","journal-title":"Eng. Sci. Technol. Int. J."},{"issue":"4","key":"10.1016\/j.cola.2026.101400_bib23","doi-asserted-by":"crossref","first-page":"1355","DOI":"10.1109\/TR.2020.2996261","article-title":"WR-ELM: weighted regularization extreme learning machine for imbalance learning in software fault prediction","volume":"69","author":"Bal","year":"2020","journal-title":"IEEE Trans. Reliab."},{"key":"10.1016\/j.cola.2026.101400_bib24","doi-asserted-by":"crossref","DOI":"10.1016\/j.eswa.2023.121251","article-title":"Parameter tuning for software fault prediction with different variants of differential evolution","volume":"237","author":"Nikravesh","year":"2024","journal-title":"Expert Syst. Appl."},{"key":"10.1016\/j.cola.2026.101400_bib25","doi-asserted-by":"crossref","first-page":"27","DOI":"10.1016\/j.eswa.2018.12.033","article-title":"Iterated feature selection algorithms with layered recurrent neural network for software fault prediction","volume":"122","author":"Turabieh","year":"2019","journal-title":"Expert Syst. Appl."},{"key":"10.1016\/j.cola.2026.101400_bib26","doi-asserted-by":"crossref","first-page":"696","DOI":"10.1016\/j.asoc.2019.02.008","article-title":"A fuzzy-filtered neuro-fuzzy framework for software fault prediction for inter-version and inter-project evaluation","volume":"77","author":"Juneja","year":"2019","journal-title":"Appl. Soft Comput."},{"issue":"4","key":"10.1016\/j.cola.2026.101400_bib27","doi-asserted-by":"crossref","first-page":"297","DOI":"10.1109\/TSE.2003.1191795","article-title":"Empirical analysis of ck metrics for object-oriented design complexity: implications for software defects","volume":"29","author":"Subramanyam","year":"2003","journal-title":"IEEE Trans. Software Eng."},{"issue":"2","key":"10.1016\/j.cola.2026.101400_bib28","doi-asserted-by":"crossref","first-page":"848","DOI":"10.1109\/TR.2021.3060937","article-title":"Simplified deep forest model based just-in-time defect prediction for android mobile apps","volume":"70","author":"Zhao","year":"2021","journal-title":"IEEE Trans. Reliab."},{"issue":"3","key":"10.1016\/j.cola.2026.101400_bib29","doi-asserted-by":"crossref","first-page":"1294","DOI":"10.1109\/TR.2021.3061618","article-title":"The impact of duplicate changes on just-in-time defect prediction","volume":"71","author":"Duan","year":"2021","journal-title":"IEEE Trans. Reliab."},{"key":"10.1016\/j.cola.2026.101400_bib30","doi-asserted-by":"crossref","DOI":"10.1016\/j.jss.2022.111245","article-title":"Interpretability application of the just-in-time software defect prediction model","volume":"188","author":"Zheng","year":"2022","journal-title":"J. Syst. Software"},{"issue":"1","key":"10.1016\/j.cola.2026.101400_bib31","doi-asserted-by":"crossref","first-page":"268","DOI":"10.1109\/TSE.2022.3150153","article-title":"Cross-project online just-in-time software defect prediction","volume":"49","author":"Tabassum","year":"2022","journal-title":"IEEE Trans. Software Eng."},{"issue":"12","key":"10.1016\/j.cola.2026.101400_bib32","doi-asserted-by":"crossref","first-page":"1267","DOI":"10.1109\/TSE.2018.2877612","article-title":"Deep semantic feature learning for software defect prediction","volume":"46","author":"Wang","year":"2018","journal-title":"IEEE Trans. Software Eng."},{"key":"10.1016\/j.cola.2026.101400_bib33","unstructured":"Yang, Y., & Li, G. Code Vulnerability Detection Based on Graph Neural Network."},{"key":"10.1016\/j.cola.2026.101400_bib34","doi-asserted-by":"crossref","DOI":"10.1016\/j.cola.2020.100979","article-title":"PathPair2Vec: an AST path pair-based code representation method for defect prediction","volume":"59","author":"Shi","year":"2020","journal-title":"Journal of Computer Languages"},{"issue":"16","key":"10.1016\/j.cola.2026.101400_bib35","doi-asserted-by":"crossref","first-page":"7877","DOI":"10.1007\/s00500-022-06830-5","article-title":"Software defect prediction employing BiLSTM and BERT-based semantic feature","volume":"26","author":"Uddin","year":"2022","journal-title":"Soft Comput."},{"key":"10.1016\/j.cola.2026.101400_bib36","doi-asserted-by":"crossref","first-page":"50","DOI":"10.1016\/j.patrec.2022.04.039","article-title":"Cross-project defect prediction based on G-LSTM model","volume":"160","author":"Xing","year":"2022","journal-title":"Pattern Recognit. Lett."},{"key":"10.1016\/j.cola.2026.101400_bib37","doi-asserted-by":"crossref","first-page":"108870","DOI":"10.1109\/ACCESS.2022.3213844","article-title":"Cognitive complexity and graph convolutional approach over control flow graph for software defect prediction","volume":"10","author":"Gupta","year":"2022","journal-title":"IEEE Access"},{"issue":"2","key":"10.1016\/j.cola.2026.101400_bib38","doi-asserted-by":"crossref","first-page":"850","DOI":"10.1109\/TR.2022.3161581","article-title":"ACGDP: an augmented code graph-based system for software defect prediction","volume":"71","author":"Xu","year":"2022","journal-title":"IEEE Trans. Reliab."},{"key":"10.1016\/j.cola.2026.101400_bib39","doi-asserted-by":"crossref","DOI":"10.1016\/j.jss.2021.111108","article-title":"Precise learning of source code contextual semantics via hierarchical dependence structure and graph attention networks","volume":"184","author":"Zhao","year":"2022","journal-title":"J. Syst. Software"},{"key":"10.1016\/j.cola.2026.101400_bib40","doi-asserted-by":"crossref","first-page":"161","DOI":"10.1016\/j.aej.2024.10.034","article-title":"Cross-project software defect prediction based on the reduction and hybridization of software metrics","volume":"112","author":"Abdu","year":"2025","journal-title":"Alex. Eng. J."},{"issue":"2","key":"10.1016\/j.cola.2026.101400_bib41","doi-asserted-by":"crossref","first-page":"820","DOI":"10.1109\/TR.2024.3354965","article-title":"Software defect prediction based on deep representation learning of source code from contextual syntax and semantic graph","volume":"73","author":"Abdu","year":"2024","journal-title":"IEEE Trans. Reliab."},{"issue":"5","key":"10.1016\/j.cola.2026.101400_bib42","doi-asserted-by":"crossref","first-page":"1281","DOI":"10.1109\/TSE.2024.3381235","article-title":"MASTER: Multi-source transfer weighted ensemble learning for multiple sources cross-project defect prediction","volume":"50","author":"Tong","year":"2024","journal-title":"IEEE Trans. Software Eng."},{"issue":"2","key":"10.1016\/j.cola.2026.101400_bib43","doi-asserted-by":"crossref","first-page":"711","DOI":"10.1109\/TR.2020.3047396","article-title":"Software defect prediction based on gated hierarchical LSTMs","volume":"70","author":"Wang","year":"2021","journal-title":"IEEE Trans. Reliab."},{"key":"10.1016\/j.cola.2026.101400_bib44","doi-asserted-by":"crossref","DOI":"10.1016\/j.infsof.2022.107057","article-title":"Software defect prediction with semantic and structural information of codes based on graph neural networks","volume":"152","author":"Zhou","year":"2022","journal-title":"Inf. Software Technol."},{"issue":"2","key":"10.1016\/j.cola.2026.101400_bib45","doi-asserted-by":"crossref","first-page":"512","DOI":"10.1109\/TR.2022.3165115","article-title":"Gated homogeneous fusion networks with jointed feature extraction for defect prediction","volume":"71","author":"Fang","year":"2022","journal-title":"IEEE Trans. Reliab."},{"key":"10.1016\/j.cola.2026.101400_bib46","doi-asserted-by":"crossref","first-page":"182","DOI":"10.1016\/j.infsof.2018.10.004","article-title":"Software defect prediction based on kernel PCA and weighted extreme learning machine","volume":"106","author":"Xu","year":"2019","journal-title":"Inf. Software Technol."},{"key":"10.1016\/j.cola.2026.101400_bib47","series-title":"2018 IEEE 25th International Conference on Software Analysis, Evolution and Reengineering (SANER)","first-page":"209","article-title":"Cross-version defect prediction via hybrid active learning with kernel principal component analysis","author":"Xu","year":"2018"},{"key":"10.1016\/j.cola.2026.101400_bib48","series-title":"Proceedings of the 38th ACM\/SIGAPP Symposium on Applied Computing","first-page":"1469","article-title":"Source code metrics for software defects prediction","author":"Rebro","year":"2023"},{"issue":"4","key":"10.1016\/j.cola.2026.101400_bib49","doi-asserted-by":"crossref","first-page":"308","DOI":"10.1109\/TSE.1976.233837","article-title":"A complexity measure","author":"McCabe","year":"1976","journal-title":"IEEE Trans. Software Eng."},{"key":"10.1016\/j.cola.2026.101400_bib50","series-title":"Elements of Software Science (Operating and Programming Systems Series)","author":"Halstead","year":"1977"},{"key":"10.1016\/j.cola.2026.101400_bib51","series-title":"European Conference on Object-Oriented Programming","first-page":"242","article-title":"Object oriented product metrics for quality assessment (Workshop 9)","author":"Sahraoui","year":"1998"},{"key":"10.1016\/j.cola.2026.101400_bib67","series-title":"Proceedings of the 29th International Conference on Evaluation and Assessment in Software Engineering","first-page":"647","article-title":"Co-Change graph entropy: a new process metric for defect prediction","author":"Ethari","year":"2025"},{"key":"10.1016\/j.cola.2026.101400_bib68","series-title":"Predicting Post-release Defects with Knowledge Units (Kus) of Programming Languages: an Empirical Study","author":"Ahasanuzzaman","year":"2024"},{"key":"10.1016\/j.cola.2026.101400_bib69","series-title":"2009 IEEE 31st International Conference on Software Engineering","first-page":"78","article-title":"Predicting faults using the complexity of code changes","author":"Hassan","year":"2009"},{"issue":"4","key":"10.1016\/j.cola.2026.101400_bib52","doi-asserted-by":"crossref","first-page":"303","DOI":"10.1142\/S0218539399000292","article-title":"Logistic regression modeling of software quality","volume":"6","author":"Khoshgoftaar","year":"1999","journal-title":"Int. J. Reliab. Qual. Saf. Eng."},{"issue":"4","key":"10.1016\/j.cola.2026.101400_bib53","doi-asserted-by":"crossref","first-page":"485","DOI":"10.1109\/TSE.2008.35","article-title":"Benchmarking classification models for software defect prediction: a proposed framework and novel findings","volume":"34","author":"Lessmann","year":"2008","journal-title":"IEEE Trans. Software Eng."},{"issue":"1","key":"10.1016\/j.cola.2026.101400_bib54","doi-asserted-by":"crossref","first-page":"154","DOI":"10.1007\/s10664-012-9218-8","article-title":"Software defect prediction using Bayesian networks","volume":"19","author":"Okutan","year":"2014","journal-title":"Empir. Softw. Eng."},{"key":"10.1016\/j.cola.2026.101400_bib55","series-title":"2017 IEEE International Conference on Software Quality, Reliability and Security (QRS)","first-page":"318","article-title":"Software defect prediction via convolutional neural network","author":"Li","year":"2017"},{"issue":"4","key":"10.1016\/j.cola.2026.101400_bib56","doi-asserted-by":"crossref","first-page":"443","DOI":"10.1049\/iet-sen.2019.0149","article-title":"Software defect prediction via LSTM","volume":"14","author":"Deng","year":"2020","journal-title":"IET Softw."},{"key":"10.1016\/j.cola.2026.101400_bib57","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1145\/3360588","article-title":"Improving bug detection via context-based code representation learning and attention-based neural networks","volume":"3","author":"Li","year":"2019","journal-title":"Proceedings of the ACM on Programming Languages"},{"key":"10.1016\/j.cola.2026.101400_bib58","series-title":"Proceedings of the ACM\/IEEE 42nd International Conference on Software Engineering","first-page":"578","article-title":"Software visualization and deep transfer learning for effective software defect prediction","author":"Chen","year":"2020"},{"issue":"2","key":"10.1016\/j.cola.2026.101400_bib59","doi-asserted-by":"crossref","first-page":"1939","DOI":"10.1007\/s13369-021-06088-3","article-title":"An improved method for training data selection for cross-project defect prediction","volume":"47","author":"Bhat","year":"2022","journal-title":"Arabian J. Sci. Eng."},{"issue":"5","key":"10.1016\/j.cola.2026.101400_bib60","doi-asserted-by":"crossref","first-page":"540","DOI":"10.1007\/s10664-008-9103-7","article-title":"On the relative value of cross-company and within-company data for defect prediction","volume":"14","author":"Turhan","year":"2009","journal-title":"Empir. Softw. Eng."},{"key":"10.1016\/j.cola.2026.101400_bib61","series-title":"2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE)","first-page":"57","article-title":"Multi-source cross project defect prediction with joint wasserstein distance and ensemble learning","author":"Zou","year":"2021"},{"issue":"2","key":"10.1016\/j.cola.2026.101400_bib62","doi-asserted-by":"crossref","first-page":"199","DOI":"10.1109\/TNN.2010.2091281","article-title":"Domain adaptation via transfer component analysis","volume":"22","author":"Pan","year":"2010","journal-title":"IEEE Trans. Neural Network."},{"issue":"10","key":"10.1016\/j.cola.2026.101400_bib63","doi-asserted-by":"crossref","first-page":"977","DOI":"10.1109\/TSE.2016.2543218","article-title":"Hydra: massively compositional model for cross-project defect prediction","volume":"42","author":"Xia","year":"2016","journal-title":"IEEE Trans. Software Eng."},{"key":"10.1016\/j.cola.2026.101400_bib64","doi-asserted-by":"crossref","first-page":"103","DOI":"10.1016\/j.neucom.2018.12.091","article-title":"Collective transfer learning for defect prediction","volume":"416","author":"Chen","year":"2020","journal-title":"Neurocomputing"},{"key":"10.1016\/j.cola.2026.101400_bib65","doi-asserted-by":"crossref","first-page":"164","DOI":"10.1016\/j.jss.2017.03.044","article-title":"Source code metrics: a systematic mapping study","volume":"128","author":"Nu\u00f1ez-Varela","year":"2017","journal-title":"J. Syst. Software"},{"issue":"5","key":"10.1016\/j.cola.2026.101400_bib66","first-page":"150","article-title":"Analysis of source lines of code (SLOC) metric","volume":"2","author":"Bhatt","year":"2012","journal-title":"International Journal of Emerging Technology and Advanced Engineering"},{"key":"10.1016\/j.cola.2026.101400_bib70","unstructured":"Singh, M., & Chhabra, J. K. An Improved and Faster Software Fault Prediction Model Based on New Object-Oriented Features Using Machine Learning. Available at SSRN 4496802."},{"key":"10.1016\/j.cola.2026.101400_bib71","doi-asserted-by":"crossref","DOI":"10.1016\/j.cola.2024.101301","article-title":"An efficient instance selection algorithm for fast training of support vector machine for cross-project software defect prediction pairs","volume":"81","author":"Singh","year":"2024","journal-title":"Journal of Computer Languages"}],"container-title":["Journal of Computer Languages"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S259011842600016X?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S259011842600016X?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2026,5,29]],"date-time":"2026-05-29T07:20:50Z","timestamp":1780039250000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S259011842600016X"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,5]]},"references-count":71,"alternative-id":["S259011842600016X"],"URL":"https:\/\/doi.org\/10.1016\/j.cola.2026.101400","relation":{},"ISSN":["2590-1184"],"issn-type":[{"value":"2590-1184","type":"print"}],"subject":[],"published":{"date-parts":[[2026,5]]},"assertion":[{"value":"Elsevier","name":"publisher","label":"This article is maintained by"},{"value":"A multi-level complexity metric suite for software quality measurement and machine learning\u2013based software defect prediction","name":"articletitle","label":"Article Title"},{"value":"Journal of Computer Languages","name":"journaltitle","label":"Journal Title"},{"value":"https:\/\/doi.org\/10.1016\/j.cola.2026.101400","name":"articlelink","label":"CrossRef DOI link to publisher maintained version"},{"value":"article","name":"content_type","label":"Content Type"},{"value":"\u00a9 2026 Elsevier Ltd. All rights are reserved, including those for text and data mining, AI training, and similar technologies.","name":"copyright","label":"Copyright"}],"article-number":"101400"}}