{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,3]],"date-time":"2026-07-03T05:21:33Z","timestamp":1783056093614,"version":"3.54.6"},"reference-count":50,"publisher":"Elsevier BV","license":[{"start":{"date-parts":[[2026,9,1]],"date-time":"2026-09-01T00:00:00Z","timestamp":1788220800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"},{"start":{"date-parts":[[2026,9,1]],"date-time":"2026-09-01T00:00:00Z","timestamp":1788220800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/legal\/tdmrep-license"},{"start":{"date-parts":[[2026,9,1]],"date-time":"2026-09-01T00:00:00Z","timestamp":1788220800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-017"},{"start":{"date-parts":[[2026,9,1]],"date-time":"2026-09-01T00:00:00Z","timestamp":1788220800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"},{"start":{"date-parts":[[2026,9,1]],"date-time":"2026-09-01T00:00:00Z","timestamp":1788220800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-012"},{"start":{"date-parts":[[2026,9,1]],"date-time":"2026-09-01T00:00:00Z","timestamp":1788220800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,9,1]],"date-time":"2026-09-01T00:00:00Z","timestamp":1788220800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-004"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62304055"],"award-info":[{"award-number":["62304055"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2021YFB3600100"],"award-info":[{"award-number":["2021YFB3600100"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["elsevier.com","sciencedirect.com"],"crossmark-restriction":true},"short-container-title":["Digital Signal Processing"],"published-print":{"date-parts":[[2026,9]]},"DOI":"10.1016\/j.dsp.2026.106211","type":"journal-article","created":{"date-parts":[[2026,4,30]],"date-time":"2026-04-30T20:15:29Z","timestamp":1777580129000},"page":"106211","update-policy":"https:\/\/doi.org\/10.1016\/elsevier_cm_policy","source":"Crossref","is-referenced-by-count":0,"special_numbering":"C","title":["A robust model for fast and reliable surface defect detection in Micro-LED production"],"prefix":"10.1016","volume":"180","author":[{"given":"Yuantao","family":"Chen","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yian","family":"Yin","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"YuQian","family":"Song","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6651-5582","authenticated-orcid":false,"given":"Zheng","family":"Gong","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"78","reference":[{"issue":"6","key":"10.1016\/j.dsp.2026.106211_bib0001","doi-asserted-by":"crossref","DOI":"10.1002\/lpor.202100427","article-title":"Recent progress in micro-LED-based display technologies","volume":"16","author":"Anwar","year":"2022","journal-title":"Laser. Photon. Rev."},{"key":"10.1016\/j.dsp.2026.106211_bib0002","doi-asserted-by":"crossref","first-page":"0047","DOI":"10.34133\/research.0047","article-title":"Integration technology of micro-LED for next-generation display","volume":"6","author":"Chen","year":"2023","journal-title":"Research."},{"key":"10.1016\/j.dsp.2026.106211_bib0003","doi-asserted-by":"crossref","first-page":"1332","DOI":"10.1002\/sdtp.17356","article-title":"P-11.14: the impact of defects on the performance of micro-LED devices: a simulation study","volume":"55","author":"Ye","year":"2024","journal-title":"SID Symp. Dig. Tech. Pap."},{"issue":"1","key":"10.1016\/j.dsp.2026.106211_bib0004","doi-asserted-by":"crossref","first-page":"25","DOI":"10.1007\/s42493-024-00103-z","article-title":"Deep learning-based detection of defects in wafer buffer zone during semiconductor packaging process","volume":"6","author":"Kim","year":"2024","journal-title":"Multiscale Sci. Eng."},{"key":"10.1016\/j.dsp.2026.106211_bib0005","series-title":"2022 IEEE 23rd Latin American Test Symposium (LATS)","first-page":"1","article-title":"SMART-IC: smart monitoring and production optimization for zero-waste semiconductor manufacturing","author":"Alamin","year":"2022"},{"issue":"46","key":"10.1016\/j.dsp.2026.106211_bib0006","doi-asserted-by":"crossref","DOI":"10.1088\/1361-6463\/ad6ce3","article-title":"Challenges of high-yield manufacture in micro-light-emitting diodes displays: chip fabrication, mass transfer, and detection","volume":"57","author":"Yu","year":"2024","journal-title":"J. Phys. D. Appl. Phys."},{"key":"10.1016\/j.dsp.2026.106211_bib0007","series-title":"Metrology, Inspection, and Process Control XXXVI","article-title":"Deep learning-based defect classification and detection in SEM images","author":"Dey","year":"2022"},{"issue":"7","key":"10.1016\/j.dsp.2026.106211_bib0008","doi-asserted-by":"crossref","first-page":"11821","DOI":"10.3934\/mbe.2023526","article-title":"A full-flow inspection method based on machine vision to detect wafer surface defects","volume":"20","author":"Yu","year":"2023","journal-title":"Math. Biosci. Eng.: MBE"},{"issue":"5","key":"10.1016\/j.dsp.2026.106211_bib0009","doi-asserted-by":"crossref","first-page":"582","DOI":"10.37188\/CJLCD.2022-0392","article-title":"Research progress on wafer-level Micro-LED chip inspection technologies","volume":"38","author":"Su","year":"2023","journal-title":"Chin. J. Liq. Cryst. Disp."},{"issue":"1","key":"10.1016\/j.dsp.2026.106211_bib0010","doi-asserted-by":"crossref","first-page":"203","DOI":"10.1109\/JESTIE.2023.3326092","article-title":"Deep learning-based visual recognition for inline defects in production of semiconductors","volume":"5","author":"Limam","year":"2023","journal-title":"IEEE J. Emerg. Sel. Top. Ind. Electron."},{"issue":"11","key":"10.1016\/j.dsp.2026.106211_bib0011","doi-asserted-by":"crossref","first-page":"3297","DOI":"10.1007\/s00170-021-07774-0","article-title":"Development of an adaptive template for fast detection of lithographic patterns of light-emitting diode chips","volume":"117","author":"Weng","year":"2021","journal-title":"Int. J. Adv. Manuf. Technol."},{"key":"10.1016\/j.dsp.2026.106211_bib0012","doi-asserted-by":"crossref","DOI":"10.1016\/j.measurement.2021.109316","article-title":"Automatic defect detection and segmentation of tunnel surface using modified Mask R-CNN","volume":"178","author":"Xu","year":"2021","journal-title":"Measurement"},{"key":"10.1016\/j.dsp.2026.106211_bib0013","first-page":"28","article-title":"Faster r-cnn: towards real-time object detection with region proposal networks","author":"Ren","year":"2015","journal-title":"Adv. Neural Inf. Process. Syst."},{"issue":"9","key":"10.1016\/j.dsp.2026.106211_bib0014","doi-asserted-by":"crossref","first-page":"1678","DOI":"10.3390\/app8091678","article-title":"Research on a surface defect detection algorithm based on MobileNet-SSD","volume":"8","author":"Li","year":"2018","journal-title":"Appl. Sci."},{"issue":"2","key":"10.1016\/j.dsp.2026.106211_bib0015","doi-asserted-by":"crossref","first-page":"565","DOI":"10.1007\/s12559-022-10061-z","article-title":"Surface defect detection algorithm based on feature-enhanced YOLO","volume":"15","author":"Xie","year":"2023","journal-title":"Cogn. Comput."},{"key":"10.1016\/j.dsp.2026.106211_bib0016","doi-asserted-by":"crossref","DOI":"10.1016\/j.dsp.2024.104474","article-title":"Micro LED defect detection with self-attention mechanism-based neural network","volume":"149","author":"Zhong","year":"2024","journal-title":"Digit. Signal. Process."},{"key":"10.1016\/j.dsp.2026.106211_bib0017","series-title":"Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition","first-page":"16965","article-title":"Detrs beat yolos on real-time object detection","author":"Zhao","year":"2024"},{"key":"10.1016\/j.dsp.2026.106211_bib0018","series-title":"Proceedings of the IEEE conference on computer vision and pattern recognition","first-page":"770","article-title":"Deep residual learning for image recognition","author":"He","year":"2016"},{"issue":"16","key":"10.1016\/j.dsp.2026.106211_bib0019","doi-asserted-by":"crossref","first-page":"7657","DOI":"10.3390\/app11167657","article-title":"Surface defect detection methods for industrial products: a review","volume":"11","author":"Chen","year":"2021","journal-title":"Appl. Sci."},{"issue":"1","key":"10.1016\/j.dsp.2026.106211_bib0020","doi-asserted-by":"crossref","DOI":"10.1155\/2023\/4096164","article-title":"LED chip defect detection method based on a hybrid algorithm","volume":"2023","author":"Zheng","year":"2023","journal-title":"Int. J. Intell. Syst."},{"key":"10.1016\/j.dsp.2026.106211_bib0021","first-page":"1","article-title":"Dual entropy-controlled convolutional neural network for Mini\/Micro LED defect recognition","volume":"72","author":"Wang","year":"2023","journal-title":"IEEe Trans. Instrum. Meas."},{"issue":"8","key":"10.1016\/j.dsp.2026.106211_bib0022","first-page":"174","article-title":"Global feature compression convolutional neural network for mini\/micro-LED chip defect detection","volume":"45","author":"Tian","year":"2024","journal-title":"J. Instrum. Control"},{"issue":"9","key":"10.1016\/j.dsp.2026.106211_bib0023","doi-asserted-by":"crossref","first-page":"274","DOI":"10.1007\/s10462-025-11253-3","article-title":"YOLO advances to its genesis: a decadal and comprehensive review of the you only look once (YOLO) series","volume":"58","author":"Sapkota","year":"2025","journal-title":"Artif. Intell. Rev."},{"key":"10.1016\/j.dsp.2026.106211_bib0024","doi-asserted-by":"crossref","DOI":"10.1016\/j.aei.2021.101255","article-title":"SMD LED chips defect detection using a YOLOv3-dense model","volume":"47","author":"Chen","year":"2021","journal-title":"Adv. Eng. Inform."},{"key":"10.1016\/j.dsp.2026.106211_bib0025","doi-asserted-by":"crossref","DOI":"10.1016\/j.optlaseng.2024.108116","article-title":"Efficient Micro-LED defect detection based on microscopic vision and deep learning","volume":"177","author":"Chen","year":"2024","journal-title":"Opt. Lasers. Eng."},{"key":"10.1016\/j.dsp.2026.106211_bib0026","unstructured":"Zhu X., Su W., Lu L., et al. Deformable detr: deformable transformers for end-to-end object detection. arXiv preprint arXiv:2010.04159, 2020."},{"key":"10.1016\/j.dsp.2026.106211_bib0027","series-title":"Proceedings of the IEEE\/CVF international conference on computer vision","first-page":"2988","article-title":"Dynamic detr: end-to-end object detection with dynamic attention","author":"Dai","year":"2021"},{"key":"10.1016\/j.dsp.2026.106211_bib0028","series-title":"Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition","first-page":"13619","article-title":"Dn-detr: accelerate detr training by introducing query denoising","author":"Li","year":"2022"},{"key":"10.1016\/j.dsp.2026.106211_bib0029","unstructured":"Zhang H., Li F., Liu S., et al. Dino: detr with improved denoising anchor boxes for end-to-end object detection. arXiv preprint arXiv:2203.03605, 2022."},{"key":"10.1016\/j.dsp.2026.106211_bib0030","series-title":"Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition","first-page":"16965","article-title":"Detrs beat yolos on real-time object detection","author":"Zhao","year":"2024"},{"key":"10.1016\/j.dsp.2026.106211_bib0031","author":"Zhang"},{"key":"10.1016\/j.dsp.2026.106211_bib0032","series-title":"Proceedings of the IEEE conference on computer vision and pattern recognition","first-page":"2117","article-title":"Feature pyramid networks for object detection","author":"Lin","year":"2017"},{"key":"10.1016\/j.dsp.2026.106211_bib0033","series-title":"2024 5th International Conference on Computer Engineering and Application (ICCEA)","first-page":"1464","article-title":"Research on rail defect recognition method based on improved RT-DETR model","author":"Liu","year":"2024"},{"key":"10.1016\/j.dsp.2026.106211_bib0034","series-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition","first-page":"6246","article-title":"Swift parameter-free attention network for efficient super-resolution","author":"Wan","year":"2024"},{"issue":"6","key":"10.1016\/j.dsp.2026.106211_bib0035","doi-asserted-by":"crossref","first-page":"1562","DOI":"10.3390\/s20061562","article-title":"Deep metallic surface defect detection: the new benchmark and detection network","volume":"20","author":"Lv","year":"2020","journal-title":"Sensors"},{"key":"10.1016\/j.dsp.2026.106211_bib0036","series-title":"ICASSP 2022-2022 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)","first-page":"3803","article-title":"FDSNeT: an accurate real-time surface defect segmentation network","author":"Zhang","year":"2022"},{"key":"10.1016\/j.dsp.2026.106211_bib0037","series-title":"Proceedings of the European conference on computer vision (ECCV)","first-page":"3","article-title":"Cbam: convolutional block attention module","author":"Woo","year":"2018"},{"key":"10.1016\/j.dsp.2026.106211_bib0038","series-title":"Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition","first-page":"13713","article-title":"Coordinate attention for efficient mobile network design","author":"Hou","year":"2021"},{"issue":"3","key":"10.1016\/j.dsp.2026.106211_bib0039","doi-asserted-by":"crossref","first-page":"3769","DOI":"10.1109\/TNNLS.2022.3197918","article-title":"Cascaded attention: adaptive and gated graph attention network for multiagent reinforcement learning","volume":"35","author":"Qi","year":"2022","journal-title":"IEEe Trans. Neural Netw. Learn. Syst."},{"key":"10.1016\/j.dsp.2026.106211_bib0040","series-title":"International conference on machine learning. PMLR","first-page":"11863","article-title":"Simam: a simple, parameter-free attention module for convolutional neural networks","author":"Yang","year":"2021"},{"key":"10.1016\/j.dsp.2026.106211_bib0041","doi-asserted-by":"crossref","DOI":"10.1016\/j.compbiomed.2024.107917","article-title":"Accurate leukocyte detection based on deformable-DETR and multi-level feature fusion for aiding diagnosis of blood diseases","volume":"170","author":"Chen","year":"2024","journal-title":"Comput. Biol. Med"},{"key":"10.1016\/j.dsp.2026.106211_bib0042","series-title":"Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition","first-page":"13713","article-title":"Coordinate attention for efficient mobile network design","author":"Hou","year":"2021"},{"key":"10.1016\/j.dsp.2026.106211_bib0043","unstructured":"Xu W., Wan Y. ELA: efficient local attention for deep convolutional neural networks. arXiv preprint arXiv:2403.01123, 2024."},{"key":"10.1016\/j.dsp.2026.106211_bib0044","series-title":"2023 IEEE International Conference on Mechatronics and Automation (ICMA)","first-page":"1581","article-title":"A small target detection algorithm for aerial images","author":"Wang","year":"2023"},{"key":"10.1016\/j.dsp.2026.106211_bib0045","series-title":"Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition","first-page":"5513","article-title":"Unireplknet: a universal perception large-kernel convnet for audio video point cloud time-series and image recognition","author":"Ding","year":"2024"},{"key":"10.1016\/j.dsp.2026.106211_bib0046","unstructured":"Wei H., Liu X., Xu S., et al. DWRSeg: rethinking efficient acquisition of multi-scale contextual information for real-time semantic segmentation. arXiv preprint arXiv:2212.01173, 2022."},{"key":"10.1016\/j.dsp.2026.106211_bib0047","series-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition","first-page":"6246","article-title":"Swift parameter-free attention network for efficient super-resolution","author":"Wan","year":"2024"},{"key":"10.1016\/j.dsp.2026.106211_bib0048","doi-asserted-by":"crossref","DOI":"10.1016\/j.optlaseng.2025.109082","article-title":"MDCA-DETR: DETR with multi-channel deformable convolution and coordinate attention for mini-LED wafer surface defects detection","volume":"193","author":"Lin","year":"2025","journal-title":"Opt. Lasers. Eng."},{"issue":"1","key":"10.1016\/j.dsp.2026.106211_bib0049","doi-asserted-by":"crossref","DOI":"10.1088\/2631-8695\/adbab4","article-title":"An efficient lightweight detection model for steel surface defects with dynamic deformable head","volume":"7","author":"Li","year":"2025","journal-title":"Eng. Res. Express"},{"issue":"3","key":"10.1016\/j.dsp.2026.106211_bib0050","doi-asserted-by":"crossref","first-page":"263","DOI":"10.1007\/s11760-025-03819-z","article-title":"SF-YOLO: designed based on tiny feature for PCB surface defect detection and deployment in embedded systems","volume":"19","author":"Zhang","year":"2025","journal-title":"Signal. Image Video Process."}],"container-title":["Digital Signal Processing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S1051200426003301?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S1051200426003301?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2026,7,3]],"date-time":"2026-07-03T05:06:29Z","timestamp":1783055189000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S1051200426003301"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,9]]},"references-count":50,"alternative-id":["S1051200426003301"],"URL":"https:\/\/doi.org\/10.1016\/j.dsp.2026.106211","relation":{},"ISSN":["1051-2004"],"issn-type":[{"value":"1051-2004","type":"print"}],"subject":[],"published":{"date-parts":[[2026,9]]},"assertion":[{"value":"Elsevier","name":"publisher","label":"This article is maintained by"},{"value":"A robust model for fast and reliable surface defect detection in Micro-LED production","name":"articletitle","label":"Article Title"},{"value":"Digital Signal Processing","name":"journaltitle","label":"Journal Title"},{"value":"https:\/\/doi.org\/10.1016\/j.dsp.2026.106211","name":"articlelink","label":"CrossRef DOI link to publisher maintained version"},{"value":"article","name":"content_type","label":"Content Type"},{"value":"\u00a9 2026 Elsevier Inc. All rights are reserved, including those for text and data mining, AI training, and similar technologies.","name":"copyright","label":"Copyright"}],"article-number":"106211"}}