{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,18]],"date-time":"2026-05-18T12:17:37Z","timestamp":1779106657110,"version":"3.51.4"},"reference-count":36,"publisher":"Elsevier BV","license":[{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/legal\/tdmrep-license"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-017"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-012"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-004"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["elsevier.com","sciencedirect.com"],"crossmark-restriction":true},"short-container-title":["Engineering Applications of Artificial Intelligence"],"published-print":{"date-parts":[[2026,8]]},"DOI":"10.1016\/j.engappai.2026.114867","type":"journal-article","created":{"date-parts":[[2026,4,19]],"date-time":"2026-04-19T06:10:23Z","timestamp":1776579023000},"page":"114867","update-policy":"https:\/\/doi.org\/10.1016\/elsevier_cm_policy","source":"Crossref","is-referenced-by-count":0,"special_numbering":"P1","title":["Defect detection of monocrystalline silicon wafers for photovoltaic applications using an improved you only look once version 8 small algorithm"],"prefix":"10.1016","volume":"177","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9808-0648","authenticated-orcid":false,"given":"Wenbo","family":"Bi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xinyu","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Na","family":"Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xu","family":"Xing","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lu","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hao","family":"Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"78","reference":[{"key":"10.1016\/j.engappai.2026.114867_bib1","doi-asserted-by":"crossref","DOI":"10.1016\/j.apenergy.2024.124088","article-title":"Creating a renewable energy-powered energy system: extreme scenarios and novel solutions for large-scale renewable power integration","volume":"374","author":"Arabzadeh","year":"2024","journal-title":"Appl. Energy"},{"key":"10.1016\/j.engappai.2026.114867_bib2","author":"Cai"},{"key":"10.1016\/j.engappai.2026.114867_bib3","doi-asserted-by":"crossref","DOI":"10.1016\/j.engappai.2024.107866","article-title":"Improved YOLOv8-GD deep learning model for defect detection in electroluminescence images of solar photovoltaic modules","volume":"131","author":"Cao","year":"2024","journal-title":"Eng. Appl. Artif. Intell."},{"key":"10.1016\/j.engappai.2026.114867_bib4","first-page":"1","article-title":"Detection of surface defects in solar cells by bidirectional-path feature pyramid group-wise attention detector","volume":"71","author":"Chen","year":"2022","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"10.1016\/j.engappai.2026.114867_bib5","doi-asserted-by":"crossref","first-page":"314","DOI":"10.1038\/s41377-025-01981-0","article-title":"Reconfigurable nonlinear pancharatnam-berry diffractive optics with photopatterned ferroelectric nematics","volume":"14","author":"Chen","year":"2025","journal-title":"Light Sci. Appl."},{"key":"10.1016\/j.engappai.2026.114867_bib6","series-title":"2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR\u201905). Presented at the 2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR\u201905)","first-page":"886","article-title":"Histograms of oriented gradients for human detection","author":"Dalal","year":"2005"},{"key":"10.1016\/j.engappai.2026.114867_bib7","doi-asserted-by":"crossref","first-page":"165","DOI":"10.1109\/TCPMT.2024.3503561","article-title":"A high coupling coefficient and symmetric transformer based on TSV","volume":"15","author":"Deng","year":"2025","journal-title":"IEEE Trans. Compon. Packag. Manuf. Technol."},{"key":"10.1016\/j.engappai.2026.114867_bib8","doi-asserted-by":"crossref","first-page":"203","DOI":"10.1016\/j.solener.2023.04.066","article-title":"Progress of PV cell technology: feasibility of building materials, cost, performance, and stability","volume":"258","author":"Fazal","year":"2023","journal-title":"Sol. Energy"},{"key":"10.1016\/j.engappai.2026.114867_bib9","series-title":"2008 IEEE Conference on Computer Vision and Pattern Recognition. Presented at the 2008 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)","first-page":"1","article-title":"A discriminatively trained, multiscale, deformable part model","author":"Felzenszwalb","year":"2008"},{"key":"10.1016\/j.engappai.2026.114867_bib10","first-page":"8686","article-title":"Convolutional neural network based efficient detector for multicrystalline photovoltaic cells defect detection","volume":"45","author":"Fu","year":"2023","journal-title":"Energy Sources, Part A Recovery, Util. Environ. Eff."},{"key":"10.1016\/j.engappai.2026.114867_bib11","author":"Han"},{"key":"10.1016\/j.engappai.2026.114867_bib12","author":"He"},{"key":"10.1016\/j.engappai.2026.114867_bib13","doi-asserted-by":"crossref","first-page":"39849","DOI":"10.1109\/JSEN.2025.3615108","article-title":"Feasibility study of mechanical stress wave detection in power semiconductor devices using bare FBG sensors","volume":"25","author":"He","year":"2025","journal-title":"IEEE Sens. J."},{"key":"10.1016\/j.engappai.2026.114867_bib14","author":"Howard"},{"key":"10.1016\/j.engappai.2026.114867_bib15","doi-asserted-by":"crossref","first-page":"561","DOI":"10.3390\/electronics12030561","article-title":"GBH-YOLOv5: ghost convolution with BottleneckCSP and tiny target prediction head incorporating YOLOv5 for PV panel defect detection","volume":"12","author":"Li","year":"2023","journal-title":"Electronics"},{"key":"10.1016\/j.engappai.2026.114867_bib16","doi-asserted-by":"crossref","DOI":"10.1016\/j.asoc.2025.113260","article-title":"A lightweight YOLOv8-based model with squeeze-and-excitation version 2 for crack detection of pipelines","volume":"177","author":"Li","year":"2025","journal-title":"Appl. Soft Comput."},{"key":"10.1016\/j.engappai.2026.114867_bib17","doi-asserted-by":"crossref","first-page":"71026","DOI":"10.1109\/ACCESS.2023.3294344","article-title":"Solar cell surface defect detection based on optimized YOLOv5","volume":"11","author":"Lu","year":"2023","journal-title":"IEEE Access"},{"key":"10.1016\/j.engappai.2026.114867_bib18","article-title":"Surface formation, morphology, integrity and wire marks in diamond wire slicing of mono-crystalline silicon in the photovoltaic industry","volume":"488\u2013489","author":"Qiu","year":"2022","journal-title":"Wear"},{"key":"10.1016\/j.engappai.2026.114867_bib19","doi-asserted-by":"crossref","DOI":"10.1016\/j.jclepro.2022.133864","article-title":"Recent progress towards photovoltaics' circular economy","volume":"373","author":"Rabaia","year":"2022","journal-title":"J. Clean. Prod."},{"key":"10.1016\/j.engappai.2026.114867_bib20","doi-asserted-by":"crossref","DOI":"10.1016\/j.apenergy.2024.123286","article-title":"Accelerating renewables: unveiling the role of green energy markets","volume":"366","author":"Rao","year":"2024","journal-title":"Appl. Energy"},{"key":"10.1016\/j.engappai.2026.114867_bib21","doi-asserted-by":"crossref","first-page":"1137","DOI":"10.1109\/TPAMI.2016.2577031","article-title":"Faster R-CNN: towards real-time object detection with region proposal networks","volume":"39","author":"Ren","year":"2017","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"10.1016\/j.engappai.2026.114867_bib22","doi-asserted-by":"crossref","DOI":"10.1016\/j.ymssp.2025.113117","article-title":"A multi-expert diffusion model for surface defect detection of valve cores in special control valve equipment systems","volume":"237","author":"Shen","year":"2025","journal-title":"Mech. Syst. Signal Process."},{"key":"10.1016\/j.engappai.2026.114867_bib23","article-title":"Subsurface defect area quantification of reinforced concrete structures with array ultrasound and dual-scale neural network","volume":"111","author":"Shu","year":"2025","journal-title":"J. Build. Eng."},{"key":"10.1016\/j.engappai.2026.114867_bib24","doi-asserted-by":"crossref","first-page":"4084","DOI":"10.1109\/TII.2020.3008021","article-title":"Deep learning-based solar-cell manufacturing defect detection with complementary attention network","volume":"17","author":"Su","year":"2021","journal-title":"IEEE Trans. Ind. Inf."},{"key":"10.1016\/j.engappai.2026.114867_bib25","doi-asserted-by":"crossref","first-page":"4675","DOI":"10.1109\/TIM.2019.2900961","article-title":"Classification of manufacturing defects in multicrystalline solar cells with novel feature descriptor","volume":"68","author":"Su","year":"2019","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"10.1016\/j.engappai.2026.114867_bib26","doi-asserted-by":"crossref","first-page":"419","DOI":"10.1016\/j.aei.2015.01.014","article-title":"Defect detection in multi-crystal solar cells using clustering with uniformity measures","volume":"29","author":"Tsai","year":"2015","journal-title":"Adv. Eng. Inform."},{"key":"10.1016\/j.engappai.2026.114867_bib27","first-page":"1","article-title":"Automatic finger interruption detection in electroluminescence images of multicrystalline solar cells","author":"Tseng","year":"2015","journal-title":"Math. Probl Eng."},{"key":"10.1016\/j.engappai.2026.114867_bib28","series-title":"Proceedings of the 2001 IEEE Computer Society Conference on Computer Vision and Pattern Recognition. CVPR 2001. Presented at the 2001 IEEE Computer Society Conference on Computer Vision and Pattern Recognition. CVPR 2001","article-title":"Rapid object detection using a boosted cascade of simple features","author":"Viola","year":"2001"},{"key":"10.1016\/j.engappai.2026.114867_bib29","doi-asserted-by":"crossref","first-page":"979","DOI":"10.1007\/s11802-025-6029-2","article-title":"YOLO-DBS: efficient target detection in complex underwater scene images based on improved YOLOv8","volume":"24","author":"Wang","year":"2025","journal-title":"J. Ocean Univ. China"},{"key":"10.1016\/j.engappai.2026.114867_bib30","doi-asserted-by":"crossref","first-page":"10661","DOI":"10.1109\/TPEL.2025.3549769","article-title":"A novel short-circuit protection scheme for silicon carbide (SiC) MOSFET module considering operation temperature","volume":"40","author":"Wen","year":"2025","journal-title":"IEEE Trans. Power Electron."},{"key":"10.1016\/j.engappai.2026.114867_bib31","doi-asserted-by":"crossref","DOI":"10.1016\/j.measurement.2024.114970","article-title":"ESMNet: an enhanced YOLOv7-based approach to detect surface defects in precision metal workpieces","volume":"235","author":"Xu","year":"2024","journal-title":"Measurement"},{"key":"10.1016\/j.engappai.2026.114867_bib32","doi-asserted-by":"crossref","first-page":"625","DOI":"10.1007\/s11227-025-07135-8","article-title":"A vision-based inspection system for pharmaceutical production line","volume":"81","author":"Xu","year":"2025","journal-title":"J. Supercomput."},{"key":"10.1016\/j.engappai.2026.114867_bib33","doi-asserted-by":"crossref","first-page":"1203","DOI":"10.1109\/TCPMT.2025.3566026","article-title":"Numerical Analysis and Optimization of Chip-Level Drop Impact Reliability for Chiplet Based on Si Interposer","volume":"15","author":"Yin","year":"2025","journal-title":"IEEE Trans. Compon. Packag. Manuf. Technol."},{"key":"10.1016\/j.engappai.2026.114867_bib34","doi-asserted-by":"crossref","DOI":"10.1016\/j.measurement.2025.117579","article-title":"In-situ robot joint stiffness identification using an eye-in-hand camera with optimal measurement pose selection","volume":"253","author":"Yin","year":"2025","journal-title":"Measurement"},{"key":"10.1016\/j.engappai.2026.114867_bib35","doi-asserted-by":"crossref","DOI":"10.3389\/frai.2025.1638772","article-title":"Enhanced YOLOv8 for industrial polymer films: a semi-supervised framework for micron-scale defect detection","volume":"8","author":"Yu","year":"2025","journal-title":"Front. Artif. Intell."},{"key":"10.1016\/j.engappai.2026.114867_bib36","doi-asserted-by":"crossref","DOI":"10.1016\/j.cma.2025.118355","article-title":"Uncertain constitutive model for metals in the presence of inherent defects","volume":"447","author":"Zhu","year":"2025","journal-title":"Comput. Methods Appl. Mech. Eng."}],"container-title":["Engineering Applications of Artificial Intelligence"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0952197626011498?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0952197626011498?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2026,5,18]],"date-time":"2026-05-18T11:56:17Z","timestamp":1779105377000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0952197626011498"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,8]]},"references-count":36,"alternative-id":["S0952197626011498"],"URL":"https:\/\/doi.org\/10.1016\/j.engappai.2026.114867","relation":{},"ISSN":["0952-1976"],"issn-type":[{"value":"0952-1976","type":"print"}],"subject":[],"published":{"date-parts":[[2026,8]]},"assertion":[{"value":"Elsevier","name":"publisher","label":"This article is maintained by"},{"value":"Defect detection of monocrystalline silicon wafers for photovoltaic applications using an improved you only look once version 8 small algorithm","name":"articletitle","label":"Article Title"},{"value":"Engineering Applications of Artificial Intelligence","name":"journaltitle","label":"Journal Title"},{"value":"https:\/\/doi.org\/10.1016\/j.engappai.2026.114867","name":"articlelink","label":"CrossRef DOI link to publisher maintained version"},{"value":"article","name":"content_type","label":"Content Type"},{"value":"\u00a9 2026 Elsevier Ltd. All rights are reserved, including those for text and data mining, AI training, and similar technologies.","name":"copyright","label":"Copyright"}],"article-number":"114867"}}