{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,16]],"date-time":"2026-06-16T14:13:37Z","timestamp":1781619217196,"version":"3.54.5"},"reference-count":32,"publisher":"Elsevier BV","license":[{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/legal\/tdmrep-license"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-017"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-012"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-004"}],"funder":[{"DOI":"10.13039\/501100007957","name":"Chongqing Municipal Education Commission","doi-asserted-by":"publisher","award":["KJQN202501106"],"award-info":[{"award-number":["KJQN202501106"]}],"id":[{"id":"10.13039\/501100007957","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["elsevier.com","sciencedirect.com"],"crossmark-restriction":true},"short-container-title":["Microelectronics Journal"],"published-print":{"date-parts":[[2026,6]]},"DOI":"10.1016\/j.mejo.2026.107144","type":"journal-article","created":{"date-parts":[[2026,3,2]],"date-time":"2026-03-02T20:40:16Z","timestamp":1772484016000},"page":"107144","update-policy":"https:\/\/doi.org\/10.1016\/elsevier_cm_policy","source":"Crossref","is-referenced-by-count":0,"special_numbering":"C","title":["A TI-ADC calibration method based on structured pruning neural network with multi-tone signal pre-training"],"prefix":"10.1016","volume":"172","author":[{"given":"Tiehu","family":"Li","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yang","family":"Zhou","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ning","family":"Dang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Dechuan","family":"Fang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Peng","family":"Chen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xiaojun","family":"Fu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Daiguo","family":"Xu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Maoguo","family":"Gong","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Junyi","family":"Jiang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jun-an","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"78","reference":[{"issue":"3","key":"10.1016\/j.mejo.2026.107144_b1","first-page":"322","article-title":"A 14-bit 500-MS\/s time-interleaved ADC with autocorrelation-based time skew calibration","volume":"66","author":"Wang","year":"2019","journal-title":"IEEE Trans. Circuits Syst. II: Express Briefs"},{"issue":"6","key":"10.1016\/j.mejo.2026.107144_b2","doi-asserted-by":"crossref","first-page":"887","DOI":"10.1109\/TVLSI.2023.3235393","article-title":"A novel two-stage timing mismatch calibration technique for time-interleaved ADCs","volume":"31","author":"Lu","year":"2023","journal-title":"IEEE Trans. Very Large Scale Integr. (VLSI) Syst."},{"key":"10.1016\/j.mejo.2026.107144_b3","series-title":"2024 IEEE International Symposium on Circuits and Systems","first-page":"1","article-title":"Utilization of noise-shaping in mixed-signal timing-skew mismatch calibration of TI-ADCs","author":"Mafi","year":"2024"},{"key":"10.1016\/j.mejo.2026.107144_b4","series-title":"2016 IEEE International Solid-State Circuits Conference","first-page":"464","article-title":"27.5 A 4GS\/s time-interleaved RF ADC in 65nm CMOS with 4GHz input bandwidth","author":"Straayer","year":"2016"},{"key":"10.1016\/j.mejo.2026.107144_b5","first-page":"1","article-title":"A 12-bit 40-MS\/s pipelined SAR ADC for ultrasonic nondestructive testing applications","volume":"75","author":"Liang","year":"2026","journal-title":"EEE Trans. Instrumentation"},{"issue":"6","key":"10.1016\/j.mejo.2026.107144_b6","doi-asserted-by":"crossref","first-page":"1515","DOI":"10.1109\/TCSI.2016.2645978","article-title":"Fully digital feedforward background calibration of clock skews for sub-sampling TIADCs using the polyphase decomposition","volume":"64","author":"Le Duc","year":"2017","journal-title":"IEEE Trans. Circuits Syst. I. Regul. Pap."},{"issue":"6","key":"10.1016\/j.mejo.2026.107144_b7","first-page":"1896","article-title":"An all-digital background calibration technique for M-channel downsampling time-interleaved ADCs based on interpolation","volume":"70","author":"Han","year":"2023","journal-title":"IEEE Trans. Circuits Syst. II: Express Briefs"},{"key":"10.1016\/j.mejo.2026.107144_b8","series-title":"2021 International Conference on Computational Science and Computational Intelligence","first-page":"1643","article-title":"Gain and DC offset mismatch correction in TI-ADC system using adaptive filter","author":"Mehta","year":"2021"},{"issue":"3","key":"10.1016\/j.mejo.2026.107144_b9","doi-asserted-by":"crossref","first-page":"1061","DOI":"10.1109\/TCSI.2023.3343415","article-title":"A high accuracy and bandwidth digital background calibration technique for timing skew in TI-ADCs","volume":"71","author":"Dang","year":"2024","journal-title":"IEEE Trans. Circuits Syst. I. Regul. Pap."},{"key":"10.1016\/j.mejo.2026.107144_b10","series-title":"2015 IEEE Symposium on Communications and Vehicular Technology in the Benelux","first-page":"1","article-title":"Offset mismatch calibration for TI-ADCs in high-speed OFDM systems","author":"Huynh","year":"2015"},{"issue":"8","key":"10.1016\/j.mejo.2026.107144_b11","doi-asserted-by":"crossref","first-page":"2012","DOI":"10.1109\/TNS.2024.3422277","article-title":"Machine-learning-based mismatch calibration for time-interleaved ADCs","volume":"71","author":"Qin","year":"2024","journal-title":"IEEE Trans. Nucl. Sci."},{"issue":"8","key":"10.1016\/j.mejo.2026.107144_b12","doi-asserted-by":"crossref","first-page":"2503","DOI":"10.1109\/TCSI.2018.2794529","article-title":"All-digital blind background calibration technique for any channel time-interleaved ADC","volume":"65","author":"Qiu","year":"2018","journal-title":"IEEE Trans. Circuits Syst. I. Regul. Pap."},{"key":"10.1016\/j.mejo.2026.107144_b13","first-page":"1","article-title":"Multi-term cosine-sum windows-assisted DFT-IDFT-based minimum-segment calibration for SAR ADCs","author":"Wang","year":"2025","journal-title":"IEEE Trans. Circuits Syst. I. Regul. Pap."},{"issue":"8","key":"10.1016\/j.mejo.2026.107144_b14","first-page":"1008","article-title":"A neural network-enhanced digital background calibration algorithm for residue amplifier nonlinearity in pipelined ADCs","volume":"72","author":"Peng","year":"2025","journal-title":"IEEE Trans. Circuits Syst. II: Express Briefs"},{"key":"10.1016\/j.mejo.2026.107144_b15","series-title":"2023 IEEE International Symposium on Circuits and Systems","first-page":"1","article-title":"A convolutional neural network based calibration scheme for pipelined ADC","author":"Liu","year":"2023"},{"key":"10.1016\/j.mejo.2026.107144_b16","doi-asserted-by":"crossref","DOI":"10.1016\/j.mejo.2025.106645","article-title":"A digital background calibration method for SAR ADC based on dual-layer feedforward neural network","volume":"159","author":"Li","year":"2025","journal-title":"Microelectron. J."},{"key":"10.1016\/j.mejo.2026.107144_b17","article-title":"A digital background calibration scheme for non-linearity of SAR adc using back-propagation algorithm","volume":"114","author":"wei Lu","year":"2021","journal-title":"Microelectron. J."},{"key":"10.1016\/j.mejo.2026.107144_b18","series-title":"2021 IEEE International Symposium on Circuits and Systems","first-page":"1","article-title":"A partially binarized and fixed neural network based calibrator for SAR-pipelined ADCs achieving 95.0-dB SFDR","author":"Chen","year":"2021"},{"issue":"11","key":"10.1016\/j.mejo.2026.107144_b19","doi-asserted-by":"crossref","first-page":"5067","DOI":"10.1109\/TCSI.2024.3429309","article-title":"Artificial neural network based calibration for a 12 b 250 MS\/s pipelined-SAR ADC with ring amplifier in 40-nm CMOS","volume":"71","author":"Liu","year":"2024","journal-title":"IEEE Trans. Circuits Syst. I. Regul. Pap."},{"key":"10.1016\/j.mejo.2026.107144_b20","series-title":"ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference","first-page":"189","article-title":"Machine learning based prior-knowledge-free calibration for split pipelined-SAR ADCs with open-loop amplifiers achieving 93.7-dB SFDR","author":"Zhang","year":"2019"},{"key":"10.1016\/j.mejo.2026.107144_b21","series-title":"2019 IEEE MTT-S International Wireless Symposium","first-page":"1","article-title":"A novel calibration method of gain and time-skew mismatches for time-interleaved ADCs based on neural network","author":"Qiu","year":"2019"},{"issue":"12","key":"10.1016\/j.mejo.2026.107144_b22","doi-asserted-by":"crossref","first-page":"4944","DOI":"10.1109\/TCSI.2022.3201016","article-title":"High-speed and time-interleaved ADCs using additive-neural-network-based calibration for nonlinear amplitude and phase distortion","volume":"69","author":"Zhai","year":"2022","journal-title":"IEEE Trans. Circuits Syst. I. Regul. Pap."},{"key":"10.1016\/j.mejo.2026.107144_b23","series-title":"2023 IEEE International Symposium on Circuits and Systems","first-page":"1","article-title":"A neural network based calibration technique for TI-ADCs with derivative information","author":"Peng","year":"2023"},{"issue":"7","key":"10.1016\/j.mejo.2026.107144_b24","doi-asserted-by":"crossref","first-page":"1184","DOI":"10.1109\/TVLSI.2024.3390220","article-title":"A new artificial neural network-based calibration mechanism for ADCs: A time-interleaved ADC case study","volume":"32","author":"Lu","year":"2024","journal-title":"IEEE Trans. Very Large Scale Integr. (VLSI) Syst."},{"issue":"7","key":"10.1016\/j.mejo.2026.107144_b25","first-page":"3283","article-title":"A novel calibration algorithm for ADCs based on inverse mapping by neural network","volume":"71","author":"Peng","year":"2024","journal-title":"IEEE Trans. Circuits Syst. II: Express Briefs"},{"issue":"5","key":"10.1016\/j.mejo.2026.107144_b26","doi-asserted-by":"crossref","DOI":"10.1587\/elex.22.20240758","article-title":"A 14 bit 10 MS\/s TI SAR ADC with neural network calibration","volume":"22","author":"Song","year":"2025","journal-title":"IEICE Electron. Express"},{"key":"10.1016\/j.mejo.2026.107144_b27","series-title":"2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology","first-page":"1","article-title":"Deep compression methods for neural network-based SAR-pipelined ADC calibrator","author":"Zhou","year":"2020"},{"issue":"12","key":"10.1016\/j.mejo.2026.107144_b28","doi-asserted-by":"crossref","first-page":"10558","DOI":"10.1109\/TPAMI.2024.3447085","article-title":"A survey on deep neural network pruning: Taxonomy, comparison, analysis, and recommendations","volume":"46","author":"Cheng","year":"2024","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"10.1016\/j.mejo.2026.107144_b29","series-title":"Computational Science and Its Applications \u2013 ICCSA 2025 Workshops","first-page":"230","article-title":"Variance-guided structured pruning for optimized convolutional neural networks","author":"Shah","year":"2026"},{"key":"10.1016\/j.mejo.2026.107144_b30","series-title":"Lightweight and post-training structured pruning for on-device large lanaguage models","author":"Xu","year":"2025"},{"issue":"9","key":"10.1016\/j.mejo.2026.107144_b31","doi-asserted-by":"crossref","first-page":"6486","DOI":"10.1109\/TPAMI.2024.3382294","article-title":"Towards understanding convergence and generalization of adamw","volume":"46","author":"Zhou","year":"2024","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"10.1016\/j.mejo.2026.107144_b32","series-title":"2021 5th IEEE Electron Devices Technology & Manufacturing Conference","first-page":"1","article-title":"A neural network-based harmonic suppression algorithm for medium-to-high resolution ADCs","author":"Peng","year":"2021"}],"container-title":["Microelectronics Journal"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S1879239126001001?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S1879239126001001?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T08:03:34Z","timestamp":1777622614000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S1879239126001001"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,6]]},"references-count":32,"alternative-id":["S1879239126001001"],"URL":"https:\/\/doi.org\/10.1016\/j.mejo.2026.107144","relation":{},"ISSN":["1879-2391"],"issn-type":[{"value":"1879-2391","type":"print"}],"subject":[],"published":{"date-parts":[[2026,6]]},"assertion":[{"value":"Elsevier","name":"publisher","label":"This article is maintained by"},{"value":"A TI-ADC calibration method based on structured pruning neural network with multi-tone signal pre-training","name":"articletitle","label":"Article Title"},{"value":"Microelectronics Journal","name":"journaltitle","label":"Journal Title"},{"value":"https:\/\/doi.org\/10.1016\/j.mejo.2026.107144","name":"articlelink","label":"CrossRef DOI link to publisher maintained version"},{"value":"article","name":"content_type","label":"Content Type"},{"value":"\u00a9 2026 Elsevier Ltd. All rights are reserved, including those for text and data mining, AI training, and similar technologies.","name":"copyright","label":"Copyright"}],"article-number":"107144"}}