{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T21:14:08Z","timestamp":1783718048341,"version":"3.55.0"},"reference-count":27,"publisher":"Elsevier BV","license":[{"start":{"date-parts":[[2026,10,1]],"date-time":"2026-10-01T00:00:00Z","timestamp":1790812800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"},{"start":{"date-parts":[[2026,10,1]],"date-time":"2026-10-01T00:00:00Z","timestamp":1790812800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/legal\/tdmrep-license"},{"start":{"date-parts":[[2026,10,1]],"date-time":"2026-10-01T00:00:00Z","timestamp":1790812800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-017"},{"start":{"date-parts":[[2026,10,1]],"date-time":"2026-10-01T00:00:00Z","timestamp":1790812800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"},{"start":{"date-parts":[[2026,10,1]],"date-time":"2026-10-01T00:00:00Z","timestamp":1790812800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-012"},{"start":{"date-parts":[[2026,10,1]],"date-time":"2026-10-01T00:00:00Z","timestamp":1790812800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,10,1]],"date-time":"2026-10-01T00:00:00Z","timestamp":1790812800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-004"}],"content-domain":{"domain":["elsevier.com","sciencedirect.com"],"crossmark-restriction":true},"short-container-title":["Microelectronics Journal"],"published-print":{"date-parts":[[2026,10]]},"DOI":"10.1016\/j.mejo.2026.107357","type":"journal-article","created":{"date-parts":[[2026,7,1]],"date-time":"2026-07-01T23:43:32Z","timestamp":1782949412000},"page":"107357","update-policy":"https:\/\/doi.org\/10.1016\/elsevier_cm_policy","source":"Crossref","is-referenced-by-count":0,"special_numbering":"C","title":["A 12-bit 200-MS\/s pipelined SAR ADC with a closed-loop inverter-based residue amplifier and GRO-based time-domain quantization"],"prefix":"10.1016","volume":"176","author":[{"given":"XiaoHong","family":"Zhong","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"HuanLin","family":"Xie","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"KeJing","family":"Chen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-5324-2839","authenticated-orcid":false,"given":"ChunBing","family":"Guo","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"78","reference":[{"issue":"12","key":"10.1016\/j.mejo.2026.107357_bib1","doi-asserted-by":"crossref","first-page":"2912","DOI":"10.1109\/JSSC.2015.2467183","article-title":"A 12b 250 MS\/s pipelined ADC with virtual ground reference buffers","volume":"50","author":"Boo","year":"2015","journal-title":"IEEE J. Solid State Circ."},{"issue":"12","key":"10.1016\/j.mejo.2026.107357_bib2","doi-asserted-by":"crossref","first-page":"2901","DOI":"10.1109\/JSSC.2015.2463094","article-title":"A 1 mW 71.5 dB SNDR 50 MS\/s 13 bit fully differential ring amplifier based SAR-assisted pipeline ADC","volume":"50","author":"Lim","year":"2015","journal-title":"IEEE J. Solid State Circ."},{"issue":"5","key":"10.1016\/j.mejo.2026.107357_bib3","doi-asserted-by":"crossref","first-page":"1446","DOI":"10.1109\/JSSC.2018.2886327","article-title":"A 12-Bit, 300-MS\/s single-channel Pipelined-SAR ADC with an open-loop MDAC","volume":"54","author":"Wu","year":"2019","journal-title":"IEEE J. Solid State Circ."},{"issue":"1","key":"10.1016\/j.mejo.2026.107357_bib4","first-page":"16","article-title":"A 14b 180MS\/s Pipeline-SAR ADC with adaptive-region-selection technique and gain error calibration","volume":"71","author":"Hao","year":"2024","journal-title":"IEEE Trans. Circuits Syst. II Express Briefs"},{"issue":"7","key":"10.1016\/j.mejo.2026.107357_bib5","first-page":"1174","article-title":"An 11-bit 100-MS\/s Pipelined-SAR ADC reusing PVT-stabilized dynamic comparator in 65-nm CMOS","volume":"67","author":"Zhang","year":"2020","journal-title":"IEEE Trans. Circuits Syst. II Express Briefs"},{"issue":"4","key":"10.1016\/j.mejo.2026.107357_bib6","doi-asserted-by":"crossref","first-page":"859","DOI":"10.1109\/JSSC.2011.2108133","article-title":"A SAR-assisted two-stage pipeline ADC","volume":"46","author":"Lee","year":"2011","journal-title":"IEEE J. Solid State Circ."},{"key":"10.1016\/j.mejo.2026.107357_bib7","series-title":"2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC), Xi'An, China","first-page":"1","article-title":"A 12-bit 200MS\/s Pipelined-SAR ADC in 65-nm CMOS with 61.9 dB SNDR","author":"Liu","year":"2019"},{"issue":"1","key":"10.1016\/j.mejo.2026.107357_bib8","doi-asserted-by":"crossref","first-page":"260","DOI":"10.1109\/JSSC.2024.3412090","article-title":"A 12-bit 1.5-GS\/s single-channel pipelined SAR ADC with a pipelined residue amplification stage","volume":"60","author":"Shen","year":"2025","journal-title":"IEEE J. Solid State Circ."},{"issue":"12","key":"10.1016\/j.mejo.2026.107357_bib9","doi-asserted-by":"crossref","first-page":"2928","DOI":"10.1109\/JSSC.2012.2217865","article-title":"Ring amplifiers for switched capacitor circuits","volume":"47","author":"Hershberg","year":"2012","journal-title":"IEEE J. Solid State Circ."},{"issue":"2","key":"10.1016\/j.mejo.2026.107357_bib10","doi-asserted-by":"crossref","first-page":"403","DOI":"10.1109\/JSSC.2018.2879923","article-title":"A single-channel, 600-MS\/s, 12-b, ringamp-based pipelined ADC in 28-nm CMOS","volume":"54","author":"Lagos","year":"2019","journal-title":"IEEE J. Solid State Circ."},{"issue":"4","key":"10.1016\/j.mejo.2026.107357_bib11","first-page":"423","article-title":"A 12-bit 200-MS\/s SAR ADC with capacitor-reuse-based redundant weighting technique","volume":"73","author":"Li","year":"2026","journal-title":"IEEE Trans. Circuits Syst. II Express Briefs"},{"issue":"11","key":"10.1016\/j.mejo.2026.107357_bib12","doi-asserted-by":"crossref","first-page":"3051","DOI":"10.1109\/JSSC.2020.3011753","article-title":"A 7-bit 900-MS\/s 2-Then-3-bit\/cycle SAR ADC with background offset calibration","volume":"55","author":"Li","year":"2020","journal-title":"IEEE J. Solid State Circ."},{"issue":"3","key":"10.1016\/j.mejo.2026.107357_bib13","first-page":"244","article-title":"A 0.95-mW 6-b 700-MS\/s single-channel loop-unrolled SAR ADC in 40-nm CMOS","volume":"64","author":"Chen","year":"2017","journal-title":"IEEE Trans. Circuits Syst. II Express Briefs"},{"issue":"7","key":"10.1016\/j.mejo.2026.107357_bib14","doi-asserted-by":"crossref","first-page":"2038","DOI":"10.1109\/JSSC.2019.2907401","article-title":"A 2.3-mW, 1-GHz, 8-Bit fully time-based two-step ADC using a high-linearity dynamic VTC","volume":"54","author":"Ohhata","year":"2019","journal-title":"IEEE J. Solid State Circ."},{"issue":"12","key":"10.1016\/j.mejo.2026.107357_bib15","doi-asserted-by":"crossref","first-page":"3225","DOI":"10.1109\/JSSC.2020.3012776","article-title":"An 8-Bit 10-GS\/s 16\u00d7Interpolation-Based time-domain ADC with <1.5-ps uncalibrated quantization steps","volume":"55","author":"Zhang","year":"2020","journal-title":"IEEE J. Solid State Circ."},{"key":"10.1016\/j.mejo.2026.107357_bib16","series-title":"2024 IEEE European Solid-State Electronics Research Conference (ESSERC), Bruges, Belgium","first-page":"73","article-title":"A 3.32mW 300MS\/s 13b pipelined SAR ADC using a time-assisted ringamp with dynamic slew rate and low-supply bias","author":"Jiang","year":"2024"},{"key":"10.1016\/j.mejo.2026.107357_bib17","series-title":"2022 IEEE Custom Integrated Circuits Conference (CICC), Newport Beach, CA, USA","first-page":"1","article-title":"A calibration-free 13b 625MS\/s tri-state Pipelined-SAR ADC with PVT-insensitive inverter-based residue amplifier","author":"Guo","year":"2022"},{"issue":"2","key":"10.1016\/j.mejo.2026.107357_bib18","doi-asserted-by":"crossref","first-page":"443","DOI":"10.1109\/JSSC.2024.3408468","article-title":"A single-channel 12-b 2-GS\/s PVT-robust pipelined ADC with sturdy ring amplifier and time-domain quantizer","volume":"60","author":"Cao","year":"2025","journal-title":"IEEE J. Solid State Circ."},{"issue":"10","key":"10.1016\/j.mejo.2026.107357_bib19","doi-asserted-by":"crossref","first-page":"2444","DOI":"10.1109\/JSSC.2012.2204543","article-title":"A single-channel, 1.25-GS\/s, 6-bit, 6.08-mW asynchronous successive-approximation ADC with improved feedback delay in 40-nm CMOS","volume":"47","author":"Jiang","year":"2012","journal-title":"IEEE J. Solid State Circ."},{"key":"10.1016\/j.mejo.2026.107357_bib20","doi-asserted-by":"crossref","DOI":"10.1016\/j.mejo.2024.106522","article-title":"A time-interleaved 2b\/Cycle SAR ADC with sign-inversion method for timing-skew calibration","volume":"156","author":"Tian","year":"2025","journal-title":"Microelectron. J."},{"key":"10.1016\/j.mejo.2026.107357_bib21","series-title":"2020 IEEE International Symposium on Circuits and Systems (ISCAS), Seville, Spain","first-page":"1","article-title":"An effective transconductance controlled offset calibration for dynamic comparators","author":"Lee","year":"2020"},{"issue":"1","key":"10.1016\/j.mejo.2026.107357_bib22","doi-asserted-by":"crossref","first-page":"288","DOI":"10.1109\/JSSC.2018.2870554","article-title":"A 65-nm CMOS 6-bit 2.5-GS\/s 7.5-mW 8\u00d7Time-Domain interpolating flash ADC with sequential slope-matching offset calibration","volume":"54","author":"Oh","year":"2019","journal-title":"IEEE J. Solid State Circ."},{"issue":"11","key":"10.1016\/j.mejo.2026.107357_bib23","doi-asserted-by":"crossref","first-page":"3179","DOI":"10.1109\/JSSC.2023.3282412","article-title":"A 0.004-mm2 3.65-mW 7-Bit 2-GS\/s single-channel GRO-based time-domain ADC incorporating deadzone elimination and On-Chip folding-offset calibration in 28-nm CMOS","volume":"58","author":"Zhang","year":"2023","journal-title":"IEEE J. Solid State Circ."},{"issue":"2","key":"10.1016\/j.mejo.2026.107357_bib24","doi-asserted-by":"crossref","first-page":"566","DOI":"10.1109\/JSSC.2025.3579913","article-title":"A hybrid voltage-time domain pipelined ADC with reference-embedded time-domain residues","volume":"61","author":"Lim","year":"2026","journal-title":"IEEE J. Solid State Circ."},{"issue":"10","key":"10.1016\/j.mejo.2026.107357_bib25","doi-asserted-by":"crossref","first-page":"2883","DOI":"10.1109\/JSSC.2023.3272640","article-title":"A 12-Bit 260-MS\/s Pipelined-SAR ADC with Ring-TDC-Based fine quantizer for automatic cross-domain scale alignment","volume":"58","author":"Zhao","year":"2023","journal-title":"IEEE J. Solid State Circ."},{"issue":"12","key":"10.1016\/j.mejo.2026.107357_bib26","first-page":"2843","article-title":"A 28-nm CMOS 12-Bit 250-MS\/s voltage-current-time domain 3-Stage pipelined ADC","volume":"67","author":"Moon","year":"2020","journal-title":"IEEE Trans. Circuits Syst. II Express Briefs"},{"key":"10.1016\/j.mejo.2026.107357_bib27","series-title":"2023 IEEE Custom Integrated Circuits Conference (CICC), San Antonio, TX, USA","first-page":"1","article-title":"A 4.6K to 400K functional PVT-robust ringamp-based 250MS\/s 12b pipelined ADC with pole-aware bias calibration","author":"Yamashita","year":"2023"}],"container-title":["Microelectronics Journal"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S1879239126003139?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S1879239126003139?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T20:26:01Z","timestamp":1783715161000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S1879239126003139"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,10]]},"references-count":27,"alternative-id":["S1879239126003139"],"URL":"https:\/\/doi.org\/10.1016\/j.mejo.2026.107357","relation":{},"ISSN":["1879-2391"],"issn-type":[{"value":"1879-2391","type":"print"}],"subject":[],"published":{"date-parts":[[2026,10]]},"assertion":[{"value":"Elsevier","name":"publisher","label":"This article is maintained by"},{"value":"A 12-bit 200-MS\/s pipelined SAR ADC with a closed-loop inverter-based residue amplifier and GRO-based time-domain quantization","name":"articletitle","label":"Article Title"},{"value":"Microelectronics Journal","name":"journaltitle","label":"Journal Title"},{"value":"https:\/\/doi.org\/10.1016\/j.mejo.2026.107357","name":"articlelink","label":"CrossRef DOI link to publisher maintained version"},{"value":"article","name":"content_type","label":"Content Type"},{"value":"\u00a9 2026 Elsevier Ltd. All rights are reserved, including those for text and data mining, AI training, and similar technologies.","name":"copyright","label":"Copyright"}],"article-number":"107357"}}