{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,7]],"date-time":"2026-10-07T21:50:32Z","timestamp":1791409832847,"version":"4.3.3"},"reference-count":56,"publisher":"Elsevier BV","license":[{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/legal\/tdmrep-license"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-017"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-012"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-004"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52177133"],"award-info":[{"award-number":["52177133"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52375490"],"award-info":[{"award-number":["52375490"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["elsevier.com","sciencedirect.com"],"crossmark-restriction":true},"short-container-title":["Reliability Engineering & System Safety"],"published-print":{"date-parts":[[2026,6]]},"DOI":"10.1016\/j.ress.2026.112211","type":"journal-article","created":{"date-parts":[[2026,1,10]],"date-time":"2026-01-10T16:05:14Z","timestamp":1768061114000},"page":"112211","update-policy":"https:\/\/doi.org\/10.1016\/elsevier_cm_policy","source":"Crossref","is-referenced-by-count":2,"special_numbering":"C","title":["A hybrid modeling framework for predicting the multilayer ceramic capacitor reliability under thermal-electrical coupling operating conditions"],"prefix":"10.1016","volume":"270","author":[{"given":"Donghui","family":"Li","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yuguang","family":"Zhong","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xue","family":"Zhou","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Guofu","family":"Zhai","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Rui","family":"Kang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"78","reference":[{"key":"10.1016\/j.ress.2026.112211_bib0001","doi-asserted-by":"crossref","first-page":"1448","DOI":"10.1109\/TDEI.2012.6260022","article-title":"Breakdown voltages in ceramic capacitors with cracks","volume":"19","author":"Teverovsky","year":"2012","journal-title":"IEEE Trans Dielectr Electr Insul"},{"key":"10.1016\/j.ress.2026.112211_bib0002","doi-asserted-by":"crossref","DOI":"10.35848\/1882-0786\/abf319","article-title":"Infiltration of water vapor into multi-layer ceramic capacitors under highly accelerated temperature and humidity stress tests","volume":"14","author":"Saito","year":"2021","journal-title":"Appl Phys Express"},{"key":"10.1016\/j.ress.2026.112211_bib0003","doi-asserted-by":"crossref","DOI":"10.1016\/j.ress.2022.108945","article-title":"Remaining useful life estimation for two-phase nonlinear degradation processes","volume":"230","author":"Hu","year":"2023","journal-title":"Reliab Eng Syst Saf"},{"key":"10.1016\/j.ress.2026.112211_bib0004","doi-asserted-by":"crossref","first-page":"1297","DOI":"10.3390\/electronics12061297","article-title":"Multilayer ceramic capacitors: an overview of failure mechanisms, perspectives, and challenges","volume":"12","author":"Laadjal","year":"2023","journal-title":"Electronics"},{"key":"10.1016\/j.ress.2026.112211_bib0005","doi-asserted-by":"crossref","first-page":"34","DOI":"10.1109\/TCP.1965.1135088","article-title":"Application of the eyring model to capacitor aging data","volume":"12","author":"Endicott","year":"1965","journal-title":"IEEE Trans Compon Parts"},{"key":"10.1016\/j.ress.2026.112211_bib0006","doi-asserted-by":"crossref","DOI":"10.1016\/j.ress.2024.110471","article-title":"A hybrid battery degradation model combining arrhenius equation and neural network for capacity prediction under time-varying operating conditions","volume":"252","author":"Chen","year":"2024","journal-title":"Reliab Eng Syst Saf"},{"key":"10.1016\/j.ress.2026.112211_bib0007","doi-asserted-by":"crossref","first-page":"616","DOI":"10.1038\/s41598-024-51254-w","article-title":"Thermal activation energy on electrical degradation process in BaTiO3 based multilayer ceramic capacitors for lifetime reliability","volume":"14","author":"Chun","year":"2024","journal-title":"Sci Rep"},{"key":"10.1016\/j.ress.2026.112211_bib0008","first-page":"3052","article-title":"Investigation of mean-time-to-failure measurements from AlGaN\/GaN high-electron-mobility transistors using Eyring Model","volume":"10","author":"Chakraborty","year":"2021","journal-title":"Electronics (Basel)"},{"key":"10.1016\/j.ress.2026.112211_bib0009","doi-asserted-by":"crossref","first-page":"1110","DOI":"10.1002\/qre.3458","article-title":"A bayesian generalized Eyring-Weibull accelerated life testing model","volume":"40","author":"Smit","year":"2024","journal-title":"Qual Reliab Eng Int"},{"key":"10.1016\/j.ress.2026.112211_bib0010","doi-asserted-by":"crossref","DOI":"10.1063\/5.0138806","article-title":"Utilizing time domain electrical methods to monitor MLCCs\u2019 degradation","volume":"122","author":"Yousefian","year":"2023","journal-title":"Appl Phys Lett"},{"key":"10.1016\/j.ress.2026.112211_bib0011","series-title":"2023 IEEE Int. Workshop Metrol. Automot. MetroAutomotive, Modena, Italy: IEEE","first-page":"51","article-title":"Exponential degradation model for remaining useful life estimation of electrolytic capacitors","author":"Patrizi","year":"2023"},{"key":"10.1016\/j.ress.2026.112211_bib0012","doi-asserted-by":"crossref","first-page":"4772","DOI":"10.3390\/en16124772","article-title":"A comprehensive teview of degradation prediction methods for an automotive proton exchange membrane fuel cell","volume":"16","author":"Nguyen","year":"2023","journal-title":"Energies"},{"key":"10.1016\/j.ress.2026.112211_bib0013","doi-asserted-by":"crossref","first-page":"118","DOI":"10.1080\/08982112.2023.2268703","article-title":"A reliability prediction method considering degradation self-acceleration effect in DC-link electrolytic capacitor","volume":"36","author":"Ye","year":"2024","journal-title":"Qual Eng"},{"key":"10.1016\/j.ress.2026.112211_bib0014","doi-asserted-by":"crossref","first-page":"9739","DOI":"10.1109\/TIE.2025.3544193","article-title":"Cumulative degradation modeling of electrolytic capacitors considering stress interactions in industrial applications","volume":"72","author":"Sun","year":"2025","journal-title":"IEEE Trans Ind Electron"},{"key":"10.1016\/j.ress.2026.112211_bib0015","doi-asserted-by":"crossref","DOI":"10.1016\/j.ress.2024.110705","article-title":"An adaptive RUL prediction approach for cutting tools incorporated with interpretability and uncertainty","volume":"256","author":"Wang","year":"2025","journal-title":"Reliab Eng Syst Saf"},{"key":"10.1016\/j.ress.2026.112211_bib0016","article-title":"Synthesis, microstructure, dielectric properties, and insulation resistance of SrTiO\u2083 grain boundary layer ceramic capacitors","author":"Bai","year":"2023","journal-title":"J Ceram Sci Technol"},{"key":"10.1016\/j.ress.2026.112211_bib0017","doi-asserted-by":"crossref","first-page":"445","DOI":"10.1007\/s43207-021-00121-9","article-title":"Characterizing electrical breakdowns upon reoxidation atmosphere for reliable multilayer ceramic capacitors","volume":"58","author":"Lee","year":"2021","journal-title":"J Korean Ceram Soc"},{"key":"10.1016\/j.ress.2026.112211_bib0018","doi-asserted-by":"crossref","first-page":"2533","DOI":"10.1016\/j.jeurceramsoc.2020.11.051","article-title":"Dielectric breakdown behavior of ferroelectric ceramics: the role of pores","volume":"41","author":"Cai","year":"2021","journal-title":"J Eur Ceram Soc"},{"key":"10.1016\/j.ress.2026.112211_bib0019","doi-asserted-by":"crossref","first-page":"SFFC02","DOI":"10.35848\/1347-4065\/ac15a7","article-title":"Hydrogen infiltration into BaTiO3 -based dielectrics for multi-layer ceramic capacitors under highly accelerated temperature and humidity stress test","volume":"60","author":"Saito","year":"2021","journal-title":"Jpn J Appl Phys"},{"key":"10.1016\/j.ress.2026.112211_bib0020","doi-asserted-by":"crossref","first-page":"1653","DOI":"10.3390\/polym14091653","article-title":"Investigation into layer number effect on breakdown strength of multi-layer polymer films","volume":"14","author":"Zhao","year":"2022","journal-title":"Polymers"},{"key":"10.1016\/j.ress.2026.112211_bib0021","doi-asserted-by":"crossref","first-page":"9878","DOI":"10.1016\/j.ceramint.2023.12.313","article-title":"Experimental evaluation of saturation capacitance in aging phenomena in multi-layer ceramic capacitors (MLCCs)","volume":"50","author":"Kim","year":"2024","journal-title":"Ceram Int"},{"key":"10.1016\/j.ress.2026.112211_bib0022","first-page":"1","article-title":"Prediction of breakdown field strength for large-area and multi-layer film dielectrics","author":"Chen","year":"2022","journal-title":"IEEE Trans Dielectr Electr Insul"},{"key":"10.1016\/j.ress.2026.112211_bib0023","doi-asserted-by":"crossref","DOI":"10.1016\/j.sse.2024.108895","article-title":"SPICE simulation of the time-dependent clustering model for dielectric breakdown","volume":"215","author":"Salvador","year":"2024","journal-title":"Solid-State Electron"},{"key":"10.1016\/j.ress.2026.112211_bib0024","doi-asserted-by":"crossref","first-page":"1969","DOI":"10.1016\/j.jeurceramsoc.2020.10.052","article-title":"Observation of an electrical breakdown at ZnO Schottky contacts in varistors","volume":"41","author":"Kaufmann","year":"2021","journal-title":"J Eur Ceram Soc"},{"key":"10.1016\/j.ress.2026.112211_bib0025","doi-asserted-by":"crossref","first-page":"191","DOI":"10.1109\/TED.2022.3223645","article-title":"Analysis of breakdown-voltage increase on SiC junction barrier schottky diode under negative bias stress","volume":"70","author":"Jin","year":"2023","journal-title":"IEEE Trans Electron Devices"},{"key":"10.1016\/j.ress.2026.112211_bib0026","doi-asserted-by":"crossref","first-page":"663","DOI":"10.1109\/TDEI.2020.009240","article-title":"Breakdown and self-healing in tantalum capacitors","volume":"28","author":"Teverovsky","year":"2021","journal-title":"IEEE Trans Dielectr Electr Insul"},{"key":"10.1016\/j.ress.2026.112211_bib0027","doi-asserted-by":"crossref","DOI":"10.1016\/j.ress.2025.111401","article-title":"A hybrid deep survival model for failure modeling of water distribution networks coupling physical survival and data reconstruction","volume":"264","author":"Wang","year":"2025","journal-title":"Reliab Eng Syst Saf"},{"key":"10.1016\/j.ress.2026.112211_bib0028","series-title":"2024 6thInternational Conference on Energy Systems and Electrical Power (ICESEP), Wuhan, China: IEEE","first-page":"1491","article-title":"CNN-LSTM based circuit breaker fault prediction model research","author":"Zhang","year":"2024"},{"key":"10.1016\/j.ress.2026.112211_bib0029","article-title":"Industrial big data analysis strategy based on automatic data classification and interpretable knowledge graph","volume":"5","author":"Ren","year":"2025","journal-title":"J Mater Inform"},{"key":"10.1016\/j.ress.2026.112211_bib0030","doi-asserted-by":"crossref","first-page":"405","DOI":"10.1007\/s00170-023-11874-4","article-title":"Knowledge-graph-based multi-domain model integration method for digital-twin workshops","volume":"128","author":"Wang","year":"2023","journal-title":"Int J Adv Manuf Technol"},{"key":"10.1016\/j.ress.2026.112211_bib0031","doi-asserted-by":"crossref","first-page":"2500","DOI":"10.1080\/09540091.2022.2131737","article-title":"AMGNET: multi-scale graph neural networks for flow field prediction","volume":"34","author":"Yang","year":"2022","journal-title":"Connect Sci"},{"key":"10.1016\/j.ress.2026.112211_bib0032","doi-asserted-by":"crossref","first-page":"826","DOI":"10.1109\/TCYB.2024.3491634","article-title":"Aeroengine bearing time-varying skidding assessment with prior knowledge-embedded dual feedback spatial-temporal GCN","volume":"55","author":"Ma","year":"2025","journal-title":"IEEE Trans Cybern"},{"key":"10.1016\/j.ress.2026.112211_bib0033","doi-asserted-by":"crossref","first-page":"1011","DOI":"10.52783\/jes.3428","article-title":"Knowledge graph construction and digital twin modeling integrating multi-modal data","volume":"20","author":"Fangzhou","year":"2024","journal-title":"J Electr Syst"},{"key":"10.1016\/j.ress.2026.112211_bib0034","doi-asserted-by":"crossref","DOI":"10.1016\/j.ress.2024.109991","article-title":"Digital twin-driven graph domain adaptation neural network for remaining useful life prediction of rolling bearing","volume":"245","author":"Cui","year":"2024","journal-title":"Reliab Eng Syst Saf"},{"key":"10.1016\/j.ress.2026.112211_bib0035","doi-asserted-by":"crossref","DOI":"10.1016\/j.ress.2025.111089","article-title":"A comprehensive belief reliability analysis method for electronic systems considering the effect of failure mechanisms","volume":"261","author":"Wang","year":"2025","journal-title":"Reliab Eng Syst Saf"},{"key":"10.1016\/j.ress.2026.112211_bib0036","doi-asserted-by":"crossref","first-page":"2571","DOI":"10.1111\/j.1551-2916.2010.03900.x","article-title":"A phenomenological model on phase transitions in nanocrystalline barium titanate ceramic","volume":"93","author":"Sun","year":"2010","journal-title":"J Am Ceram Soc"},{"key":"10.1016\/j.ress.2026.112211_bib0037","doi-asserted-by":"crossref","first-page":"1433","DOI":"10.1111\/j.1151-2916.2000.tb01407.x","article-title":"Finite-element analysis of ceramic multilayer capacitors: failure probability caused by wave soldering and bending loads","volume":"83","author":"Franken","year":"2000","journal-title":"J Am Ceram Soc"},{"key":"10.1016\/j.ress.2026.112211_bib0038","series-title":"A general reliability model for ni-batio3-based multilayer ceramic capacitors","author":"Liu","year":"2014"},{"key":"10.1016\/j.ress.2026.112211_bib0039","doi-asserted-by":"crossref","first-page":"273","DOI":"10.1111\/jace.17433","article-title":"Grain size engineered high-performance nanograined BaTiO3 -based ceramics: experimental and numerical prediction","volume":"104","author":"Zhu","year":"2021","journal-title":"J Am Ceram Soc"},{"key":"10.1016\/j.ress.2026.112211_bib0040","doi-asserted-by":"crossref","first-page":"1434","DOI":"10.1016\/j.ress.2007.10.008","article-title":"Weibull extension model: a Bayes study using Markov chain Monte Carlo simulation","volume":"93","author":"Gupta","year":"2008","journal-title":"Reliab Eng Syst Saf"},{"key":"10.1016\/j.ress.2026.112211_bib0041","doi-asserted-by":"crossref","first-page":"325","DOI":"10.1016\/j.procir.2025.08.057","article-title":"A method for predicting the dielectric strength of batch MLCCs based on grain structural parameters","volume":"136","author":"Li","year":"2025","journal-title":"Procedia CIRP"},{"key":"10.1016\/j.ress.2026.112211_bib0042","doi-asserted-by":"crossref","first-page":"173","DOI":"10.1016\/j.jallcom.2019.01.009","article-title":"Tuning the microstructure of BaTiO3@SiO2 core-shell nanoparticles for high energy storage composite ceramics","volume":"784","author":"Xu","year":"2019","journal-title":"J Alloys Compd"},{"key":"10.1016\/j.ress.2026.112211_bib0043","doi-asserted-by":"crossref","DOI":"10.3866\/PKU.WHXB202304015","article-title":"Reliability mechanisms of the ultrathin-layered BaTiO3-based BME MLCC","volume":"40","author":"Zhu","year":"2024","journal-title":"Acta Phys-Chim Sin"},{"key":"10.1016\/j.ress.2026.112211_bib0044","doi-asserted-by":"crossref","first-page":"217","DOI":"10.1007\/s12530-020-09345-2","article-title":"Automatic tuning of hyperparameters using bayesian optimization","volume":"12","author":"Victoria","year":"2021","journal-title":"Evol Syst"},{"key":"10.1016\/j.ress.2026.112211_bib0045","first-page":"1","article-title":"Investigation on the reliability calculation method of gravity dam based on CNN-LSTM and Monte Carlo method","author":"Li","year":"2024","journal-title":"Netw Comput Neural Syst"},{"key":"10.1016\/j.ress.2026.112211_bib0046","doi-asserted-by":"crossref","first-page":"945","DOI":"10.3390\/s23020945","article-title":"Solar power prediction using dual stream CNN-LSTM architecture","volume":"23","author":"Alharkan","year":"2023","journal-title":"Sensors"},{"key":"10.1016\/j.ress.2026.112211_bib0047","doi-asserted-by":"crossref","first-page":"2382","DOI":"10.1109\/TR.2024.3381579","article-title":"Fault detection based on causal discovery and graph convolutional network for complex mechatronic systems","volume":"74","author":"Wang","year":"2025","journal-title":"IEEE Trans Reliab"},{"key":"10.1016\/j.ress.2026.112211_bib0048","doi-asserted-by":"crossref","first-page":"4221","DOI":"10.3390\/app12094221","article-title":"Prediction of machine failure in industry 4.0: a hybrid CNN-LSTM framework","volume":"12","author":"Wahid","year":"2022","journal-title":"Appl Sci"},{"key":"10.1016\/j.ress.2026.112211_bib0049","doi-asserted-by":"crossref","DOI":"10.1016\/j.ress.2022.108869","article-title":"Remaining useful life prediction of aero-engine enabled by fusing knowledge and deep learning models","volume":"229","author":"Li","year":"2023","journal-title":"Reliab Eng Syst Saf"},{"key":"10.1016\/j.ress.2026.112211_bib0050","doi-asserted-by":"crossref","DOI":"10.1016\/j.est.2024.111346","article-title":"A sequence to sequence prediction model for remaining useful life of lithium-ion batteries with Bayesian optimisation process visualization","volume":"87","author":"Xie","year":"2024","journal-title":"J Energy Storage"},{"key":"10.1016\/j.ress.2026.112211_bib0051","first-page":"1","article-title":"Bayesian-driven optimization of MDCNN-LSTM-RSA: a new model for predicting aeroengine RUL","author":"Anping","year":"2025","journal-title":"IEEE Trans Reliab"},{"key":"10.1016\/j.ress.2026.112211_bib0052","unstructured":"Fixed capacitors for use in electronic equipment - Part 1-1: Generic specification 2022."},{"key":"10.1016\/j.ress.2026.112211_bib0053","doi-asserted-by":"crossref","DOI":"10.1016\/j.ress.2025.111604","article-title":"Physics-informed ensemble learning for robust tunnel-induced building settlement with sparse field measurement","volume":"265","author":"Zhang","year":"2026","journal-title":"Reliab Eng Syst Saf"},{"key":"10.1016\/j.ress.2026.112211_bib0054","doi-asserted-by":"crossref","first-page":"400","DOI":"10.1016\/j.microrel.2005.05.008","article-title":"Moisture induced degradation of multilayer ceramic capacitors","volume":"46","author":"Donahoe","year":"2006","journal-title":"Microelectron Reliab"},{"key":"10.1016\/j.ress.2026.112211_bib0055","unstructured":"Gal Y., Ghahramani Z. Dropout as a bayesian approximation: representing model uncertainty in deep learning 2015. https:\/\/doi.org\/10.48550\/ARXIV.1506.02142."},{"key":"10.1016\/j.ress.2026.112211_bib0056","doi-asserted-by":"crossref","first-page":"211","DOI":"10.1109\/TCPMT.2024.3359598","article-title":"Analysis method of multilayer ceramic capacitor fracture by the phase-field","volume":"14","author":"Li","year":"2024","journal-title":"IEEE Trans Compon Packag Manuf Technol"}],"container-title":["Reliability Engineering & System Safety"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S095183202600027X?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S095183202600027X?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2026,10,7]],"date-time":"2026-10-07T21:03:40Z","timestamp":1791407020000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S095183202600027X"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,6]]},"references-count":56,"alternative-id":["S095183202600027X"],"URL":"https:\/\/doi.org\/10.1016\/j.ress.2026.112211","relation":{},"ISSN":["0951-8320"],"issn-type":[{"value":"0951-8320","type":"print"}],"subject":[],"published":{"date-parts":[[2026,6]]},"assertion":[{"value":"Elsevier","name":"publisher","label":"This article is maintained by"},{"value":"A hybrid modeling framework for predicting the multilayer ceramic capacitor reliability under thermal-electrical coupling operating conditions","name":"articletitle","label":"Article Title"},{"value":"Reliability Engineering & System Safety","name":"journaltitle","label":"Journal Title"},{"value":"https:\/\/doi.org\/10.1016\/j.ress.2026.112211","name":"articlelink","label":"CrossRef DOI link to publisher maintained version"},{"value":"article","name":"content_type","label":"Content Type"},{"value":"\u00a9 2026 Elsevier Ltd. All rights are reserved, including those for text and data mining, AI training, and similar technologies.","name":"copyright","label":"Copyright"}],"article-number":"112211"}}