{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,22]],"date-time":"2025-02-22T00:44:10Z","timestamp":1740185050579,"version":"3.37.3"},"reference-count":6,"publisher":"Elsevier BV","issue":"9","license":[{"start":{"date-parts":[[2003,9,1]],"date-time":"2003-09-01T00:00:00Z","timestamp":1062374400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"},{"start":{"date-parts":[[2003,9,1]],"date-time":"2003-09-01T00:00:00Z","timestamp":1062374400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/legal\/tdmrep-license"},{"start":{"date-parts":[[2003,9,1]],"date-time":"2003-09-01T00:00:00Z","timestamp":1062374400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-017"},{"start":{"date-parts":[[2003,9,1]],"date-time":"2003-09-01T00:00:00Z","timestamp":1062374400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"},{"start":{"date-parts":[[2003,9,1]],"date-time":"2003-09-01T00:00:00Z","timestamp":1062374400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-012"},{"start":{"date-parts":[[2003,9,1]],"date-time":"2003-09-01T00:00:00Z","timestamp":1062374400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2003,9,1]],"date-time":"2003-09-01T00:00:00Z","timestamp":1062374400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-004"}],"funder":[{"DOI":"10.13039\/501100008530","name":"European Regional Development Fund","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100008530","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100007273","name":"Comisi\u00f3n Interministerial de Ciencia y Tecnolog\u00eda","doi-asserted-by":"publisher","award":["2FD1997-1131"],"award-info":[{"award-number":["2FD1997-1131"]}],"id":[{"id":"10.13039\/501100007273","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["elsevier.com","sciencedirect.com"],"crossmark-restriction":true},"short-container-title":["Microelectronics Journal"],"published-print":{"date-parts":[[2003,9]]},"DOI":"10.1016\/s0026-2692(03)00136-8","type":"journal-article","created":{"date-parts":[[2003,6,9]],"date-time":"2003-06-09T20:43:51Z","timestamp":1055191431000},"page":"809-813","update-policy":"https:\/\/doi.org\/10.1016\/elsevier_cm_policy","source":"Crossref","is-referenced-by-count":5,"title":["Optimisation of very low voltage TVS protection devices"],"prefix":"10.1016","volume":"34","author":[{"given":"J.","family":"Urresti","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Hidalgo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Flores","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Roig","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Rebollo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"I.","family":"Mazarredo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"78","reference":[{"key":"10.1016\/S0026-2692(03)00136-8_BIB1","unstructured":"SEMTECH, TVS Product Catalog, 1994."},{"issue":"11","key":"10.1016\/S0026-2692(03)00136-8_BIB2","first-page":"20","article-title":"Transient voltage suppressor types and application","volume":"5","author":"Clark","year":"1990","journal-title":"IEEE Trans. Electron. Devices"},{"issue":"2","key":"10.1016\/S0026-2692(03)00136-8_BIB3","first-page":"20","article-title":"The punchthrough diode","volume":"8","author":"de Cogan","year":"1977","journal-title":"Microelectronics"},{"issue":"11","key":"10.1016\/S0026-2692(03)00136-8_BIB4","doi-asserted-by":"crossref","first-page":"2037","DOI":"10.1109\/16.543049","article-title":"Punchthrough diode as the transient voltage suppressor for low-voltage electronics","volume":"43","author":"King","year":"1996","journal-title":"IEEE Trans. Electron. Devices"},{"issue":"7","key":"10.1016\/S0026-2692(03)00136-8_BIB5","doi-asserted-by":"crossref","first-page":"303","DOI":"10.1109\/55.388715","article-title":"Punchthrough transient voltage suppressor for low-voltage electronics","volume":"16","author":"King","year":"1995","journal-title":"IEEE Electron. Device Lett."},{"key":"10.1016\/S0026-2692(03)00136-8_BIB7","doi-asserted-by":"crossref","first-page":"781","DOI":"10.1088\/0370-1301\/69\/8\/301","article-title":"Avalanche injection in semiconductors","volume":"B-69","author":"Gunn","year":"1956","journal-title":"Proc. Phys. Soc."}],"container-title":["Microelectronics Journal"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026269203001368?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026269203001368?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2024,7,5]],"date-time":"2024-07-05T08:20:02Z","timestamp":1720167602000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0026269203001368"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003,9]]},"references-count":6,"journal-issue":{"issue":"9","published-print":{"date-parts":[[2003,9]]}},"alternative-id":["S0026269203001368"],"URL":"https:\/\/doi.org\/10.1016\/s0026-2692(03)00136-8","relation":{},"ISSN":["1879-2391"],"issn-type":[{"type":"print","value":"1879-2391"}],"subject":[],"published":{"date-parts":[[2003,9]]},"assertion":[{"value":"Elsevier","name":"publisher","label":"This article is maintained by"},{"value":"Optimisation of very low voltage TVS protection devices","name":"articletitle","label":"Article Title"},{"value":"Microelectronics Journal","name":"journaltitle","label":"Journal Title"},{"value":"https:\/\/doi.org\/10.1016\/S0026-2692(03)00136-8","name":"articlelink","label":"CrossRef DOI link to publisher maintained version"},{"value":"converted-article","name":"content_type","label":"Content Type"},{"value":"Copyright \u00a9 2003 Elsevier Science Ltd. All rights are reserved, including those for text and data mining, AI training, and similar technologies.","name":"copyright","label":"Copyright"}]}}